{"title":"Why Is My Ouzo Cloudy?","authors":"S. Carmichael, P. Oshel","doi":"10.1093/mictod/qaad041","DOIUrl":"https://doi.org/10.1093/mictod/qaad041","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42853927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Highlights from Microscopy and Microanalysis","authors":"","doi":"10.1093/mictod/qaad043","DOIUrl":"https://doi.org/10.1093/mictod/qaad043","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135568405","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Finalists for the 2023 Microscopy Today Micrograph Awards","authors":"","doi":"10.1093/mictod/qaad046","DOIUrl":"https://doi.org/10.1093/mictod/qaad046","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43512837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Microscopy Society of America Awards: 2023 Award Winners","authors":"Jay Potts","doi":"10.1093/mictod/qaad044","DOIUrl":"https://doi.org/10.1093/mictod/qaad044","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135568407","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Overwhelmed or Apathy?","authors":"","doi":"10.1093/mictod/qaad053","DOIUrl":"https://doi.org/10.1093/mictod/qaad053","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47113122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Abstract Coherence is one of the limiting factors in off-axis electron holography applications. This paper reports methods to improve coherence ∼18-fold by using a smaller biprism and implementing a direct electron counting camera (K-camera) in combination with an imaging filter system. We achieved 0.4 nm fringe spacing with a 1.5 μm field-of-view and ∼33% fringe contrast. The maximum coherence number, N′, of ∼1.8 × 103 was achieved, where N′ is defined as the number of fringes times fringe contrast. High spatial resolution junction profile images (nm scale) of n-channel and p-channel field-effect transistors (nFET and pFET) are demonstrated with a large field-of-view (μm scale).
{"title":"Coherence Improvement of Dual-Lens Electron Holography","authors":"Yun-Yu Wang, Zhouguang Wang, Qiang Jin","doi":"10.1093/mictod/qaad027","DOIUrl":"https://doi.org/10.1093/mictod/qaad027","url":null,"abstract":"Abstract Coherence is one of the limiting factors in off-axis electron holography applications. This paper reports methods to improve coherence ∼18-fold by using a smaller biprism and implementing a direct electron counting camera (K-camera) in combination with an imaging filter system. We achieved 0.4 nm fringe spacing with a 1.5 μm field-of-view and ∼33% fringe contrast. The maximum coherence number, N′, of ∼1.8 × 103 was achieved, where N′ is defined as the number of fringes times fringe contrast. High spatial resolution junction profile images (nm scale) of n-channel and p-channel field-effect transistors (nFET and pFET) are demonstrated with a large field-of-view (μm scale).","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135509279","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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