{"title":"State of the Society","authors":"Jay Potts","doi":"10.1093/mictod/qaad102","DOIUrl":"https://doi.org/10.1093/mictod/qaad102","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140525043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Microscopic and macroscopic images, photographs, and computer-generated graphics are important components of the content published in Microscopy Today. Each type of graphic requires careful attention to its content and composition, that is, how well the image illustrates the facts being described, and its dimensions, resolution, and color balance. This paper is a brief guide to preparing acceptable content for print and digital publication.
{"title":"Preparing Figures for Publication in Microscopy Today","authors":"Bev Maleeff, Gennifer Levey, B. Price","doi":"10.1093/mictod/qaad107","DOIUrl":"https://doi.org/10.1093/mictod/qaad107","url":null,"abstract":"\u0000 Microscopic and macroscopic images, photographs, and computer-generated graphics are important components of the content published in Microscopy Today. Each type of graphic requires careful attention to its content and composition, that is, how well the image illustrates the facts being described, and its dimensions, resolution, and color balance. This paper is a brief guide to preparing acceptable content for print and digital publication.","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140521904","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Index of Advertisers","authors":"","doi":"10.1093/mictod/qaae001","DOIUrl":"https://doi.org/10.1093/mictod/qaae001","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140515786","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Product & Industry News (November 2023)","authors":"","doi":"10.1093/mictod/qaad081","DOIUrl":"https://doi.org/10.1093/mictod/qaad081","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135715338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Abstract Field emission electron probe microanalyzers (EPMA) and scanning electron microscopes (SEM) have improved in both the hardware and software. They have become workhorse instruments for imaging secondary (SE) and backscattered (BSE) electrons. Recent advancements in technology provide qualitative quantitative analysis and X-ray maps at lower kVs and higher beam current without significantly enlarging the beam diameter. On EPMAs and SEMs with W and LaB6 electron guns, spatial resolution for microanalysis was ∼1 micron. Now, with field emission (FE) guns, resolution of 300 nm for quantitative analysis and mapping of elements well below 100 nm are possible. Software has also become more user-friendly and has advanced automation algorithms that allow the “non-expert” EPMA user to collect data. However, the best part of automation sits in the user’s chair. The new EPMAs and SEMs can collect very good data, but if they don’t answer the question that is being asked, they have no use.
{"title":"What Are the Advantages of a FE-EPMA or FE-SEM (Even When Not Analyzing Submicron Features at Low kV and High Beam Current)?","authors":"Vernon Robertson","doi":"10.1093/mictod/qaad080","DOIUrl":"https://doi.org/10.1093/mictod/qaad080","url":null,"abstract":"Abstract Field emission electron probe microanalyzers (EPMA) and scanning electron microscopes (SEM) have improved in both the hardware and software. They have become workhorse instruments for imaging secondary (SE) and backscattered (BSE) electrons. Recent advancements in technology provide qualitative quantitative analysis and X-ray maps at lower kVs and higher beam current without significantly enlarging the beam diameter. On EPMAs and SEMs with W and LaB6 electron guns, spatial resolution for microanalysis was ∼1 micron. Now, with field emission (FE) guns, resolution of 300 nm for quantitative analysis and mapping of elements well below 100 nm are possible. Software has also become more user-friendly and has advanced automation algorithms that allow the “non-expert” EPMA user to collect data. However, the best part of automation sits in the user’s chair. The new EPMAs and SEMs can collect very good data, but if they don’t answer the question that is being asked, they have no use.","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135715075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"From the Editor","authors":"","doi":"10.1093/mictod/qaad092","DOIUrl":"https://doi.org/10.1093/mictod/qaad092","url":null,"abstract":"","PeriodicalId":74194,"journal":{"name":"Microscopy today","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135715334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：