Pub Date : 1995-01-01DOI: 10.1154/S0376030800022965
A. Wright, N. Vedishcheva, B. A. Shakhmatkin
{"title":"What Can Crystallography Tell us About the Intermediate Range Order in Borate Glasses","authors":"A. Wright, N. Vedishcheva, B. A. Shakhmatkin","doi":"10.1154/S0376030800022965","DOIUrl":"https://doi.org/10.1154/S0376030800022965","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"108 1","pages":"535-552"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72860037","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022771
B. Ballard, P. Predecki, T. Watkins, K. Kozaczek, D. Braski, C. Hubbard
{"title":"Depth Profiling Biaxial Stresses in Sputter Deposited Molybdenum Films; Use of the Cos2φ Method","authors":"B. Ballard, P. Predecki, T. Watkins, K. Kozaczek, D. Braski, C. Hubbard","doi":"10.1154/S0376030800022771","DOIUrl":"https://doi.org/10.1154/S0376030800022771","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"198 1","pages":"363-370"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74221924","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S037603080002259X
V. Hauk
{"title":"Actual Tasks of Stress Analysis by Diffraction","authors":"V. Hauk","doi":"10.1154/S037603080002259X","DOIUrl":"https://doi.org/10.1154/S037603080002259X","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"41 1","pages":"181-193"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84497246","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023314
K. Stoev, M. Vutchkov, A. Artinian, J. F. Dlouhy
{"title":"An Analytical Expression for X-Ray Fluorescence Intensity Distribution Based on the Probability Theory","authors":"K. Stoev, M. Vutchkov, A. Artinian, J. F. Dlouhy","doi":"10.1154/S0376030800023314","DOIUrl":"https://doi.org/10.1154/S0376030800023314","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"1 1","pages":"837-843"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83242257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022916
Y. Kishi, Shigenobu Takahashi, Y. Hirose
{"title":"X-Ray Fractography on Fatigue Fracture Surfaces of Mg-9mass%Al-1mass%Zn Alloy","authors":"Y. Kishi, Shigenobu Takahashi, Y. Hirose","doi":"10.1154/S0376030800022916","DOIUrl":"https://doi.org/10.1154/S0376030800022916","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"1 1","pages":"491-498"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82962658","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022515
B. Beckhoff, B. Kanngießer
{"title":"Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals","authors":"B. Beckhoff, B. Kanngießer","doi":"10.1154/S0376030800022515","DOIUrl":"https://doi.org/10.1154/S0376030800022515","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"16 1","pages":"109-117"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78706547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022758
H. Wern, L. Suominen
{"title":"Selfconsistent Evaluation of Non-Uniform Stress Profiles and X-Ray Elastic Constants from X-ray Diffraction Experiments","authors":"H. Wern, L. Suominen","doi":"10.1154/S0376030800022758","DOIUrl":"https://doi.org/10.1154/S0376030800022758","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"1 1","pages":"339-352"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89649139","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023284
V. I. Smolniakov
{"title":"The Perspectives of High-Accuracy X-Ray Fluorescence Analysis - Some Fundamental Aspects and Applications","authors":"V. I. Smolniakov","doi":"10.1154/S0376030800023284","DOIUrl":"https://doi.org/10.1154/S0376030800023284","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"122 1","pages":"815-820"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87624402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022461
C. Dozier, D. Newman, M. I. Bell, Q. Xiao, S. Espy
{"title":"Multi-Capillary and Conic Optical Elements for Parallel Beam Production","authors":"C. Dozier, D. Newman, M. I. Bell, Q. Xiao, S. Espy","doi":"10.1154/S0376030800022461","DOIUrl":"https://doi.org/10.1154/S0376030800022461","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"10 1","pages":"73-79"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90162641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022746
Y. Sakaida, Keisuke Tanaka, Shintaro Harada
{"title":"Measurement of Residual Stress Distribution of Ground Silicon Nitride by Glancing Incidence X-ray Diffraction Technique","authors":"Y. Sakaida, Keisuke Tanaka, Shintaro Harada","doi":"10.1154/S0376030800022746","DOIUrl":"https://doi.org/10.1154/S0376030800022746","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"16 1","pages":"331-338"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84415498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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