Pub Date : 1995-01-01DOI: 10.1154/S0376030800023326
K. Stoev, J. F. Dlouhy
{"title":"X-Ray Fluorescence Cross-Section Measurements in the Energy Range 4-18 keV","authors":"K. Stoev, J. F. Dlouhy","doi":"10.1154/S0376030800023326","DOIUrl":"https://doi.org/10.1154/S0376030800023326","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"1 1","pages":"845-855"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79146090","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023119
H. Ebel, R. Svagera, Robert Hobl, W. Kugler, Hung D Nguyen
{"title":"Depth profiling by Xrf with Variable Beam Geometry Applied to Thin Films in the Nanometer Region","authors":"H. Ebel, R. Svagera, Robert Hobl, W. Kugler, Hung D Nguyen","doi":"10.1154/S0376030800023119","DOIUrl":"https://doi.org/10.1154/S0376030800023119","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"7 1","pages":"675-682"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74720022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022539
B. Schossmann, H. Wiederschwinger, H. Ebel, J. Wernisch
{"title":"Comparison of Various Descriptions of X-Ray Tube Spectra","authors":"B. Schossmann, H. Wiederschwinger, H. Ebel, J. Wernisch","doi":"10.1154/S0376030800022539","DOIUrl":"https://doi.org/10.1154/S0376030800022539","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"127 1","pages":"127-135"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79542606","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022497
P. Chen, I. Tomov, P. Rentzepis
{"title":"Generation of 1-10 Ps Hard X-Rav Pulses for Time Resolved X-Ray Diffraction","authors":"P. Chen, I. Tomov, P. Rentzepis","doi":"10.1154/S0376030800022497","DOIUrl":"https://doi.org/10.1154/S0376030800022497","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"11 1","pages":"95-102"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87100148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022631
A. Ward, R. Hendricks
{"title":"Residual Stress in Si3N4-Passivated GaAs Wafers","authors":"A. Ward, R. Hendricks","doi":"10.1154/S0376030800022631","DOIUrl":"https://doi.org/10.1154/S0376030800022631","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"19 1","pages":"237-241"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86624859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023211
P. Wobrauschek, P. Kregsamer, W. Ladisich, R. Riede, C. Streli, S. Garbe, M. Haller, A. Knöchel, M. Radtke
{"title":"Txrf-Sources-Samples and Detectors","authors":"P. Wobrauschek, P. Kregsamer, W. Ladisich, R. Riede, C. Streli, S. Garbe, M. Haller, A. Knöchel, M. Radtke","doi":"10.1154/S0376030800023211","DOIUrl":"https://doi.org/10.1154/S0376030800023211","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"34 1","pages":"755-766"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90303036","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022886
G. Berti
{"title":"Modeling and Optimization Algorithm to Analyse Xrpd Data Via Modulation and Pseudo-Voigt Functions","authors":"G. Berti","doi":"10.1154/S0376030800022886","DOIUrl":"https://doi.org/10.1154/S0376030800022886","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"22 1","pages":"465-471"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89360423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023132
K. Sakurai, A. Iida
{"title":"Analysis of Specific Interfaces in Thin Films by X-Ray Fluorescence Using Interference Effect in Total Reflection","authors":"K. Sakurai, A. Iida","doi":"10.1154/S0376030800023132","DOIUrl":"https://doi.org/10.1154/S0376030800023132","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"49 1","pages":"695-700"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76779079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S037603080002245X
M. Schuster, H. Göbel
{"title":"Application of Graded Multilayer Optics in X-Ray Diffraction","authors":"M. Schuster, H. Göbel","doi":"10.1154/S037603080002245X","DOIUrl":"https://doi.org/10.1154/S037603080002245X","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"43 1","pages":"57-71"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74429818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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