Pub Date : 1995-01-01DOI: 10.1154/S0376030800023156
Craig D. England, Laurie Bechder, S. Zierer, Lisa Gassaway, B. Miner, S. Bill
{"title":"Metal Film Thickness Standards","authors":"Craig D. England, Laurie Bechder, S. Zierer, Lisa Gassaway, B. Miner, S. Bill","doi":"10.1154/S0376030800023156","DOIUrl":"https://doi.org/10.1154/S0376030800023156","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"86 1","pages":"707-712"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85207302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022655
Keisuke Tanaka, K. Ishihara, Y. Akiniwa
{"title":"X-Ray Stress Measurement of Hexagonal Polycrystals with [001] Fiber Texture","authors":"Keisuke Tanaka, K. Ishihara, Y. Akiniwa","doi":"10.1154/S0376030800022655","DOIUrl":"https://doi.org/10.1154/S0376030800022655","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"28 1","pages":"251-255"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82858147","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023363
Andrew Nelson, D. Tingey, T. Shoji, K. Shimizu
{"title":"A Supported Ultrathin Window for Improved Performance in Gas Flow Proportional Counters","authors":"Andrew Nelson, D. Tingey, T. Shoji, K. Shimizu","doi":"10.1154/S0376030800023363","DOIUrl":"https://doi.org/10.1154/S0376030800023363","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"83 1","pages":"881-884"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90247197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022953
H. Rosenfield, R. Barton
{"title":"Pair-Density Function of Nano-Scale Morphology in Oriented Polymer Fibers: Application to Nomex Aramid","authors":"H. Rosenfield, R. Barton","doi":"10.1154/S0376030800022953","DOIUrl":"https://doi.org/10.1154/S0376030800022953","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"49 1","pages":"523-533"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88231545","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022473
N. Gao, I. Ponomarev, Q. Xiao, W. Gibson, D. Carpenter
{"title":"Application of Tapered Monocapillary in a Laboratory Mxrf Set-Up","authors":"N. Gao, I. Ponomarev, Q. Xiao, W. Gibson, D. Carpenter","doi":"10.1154/S0376030800022473","DOIUrl":"https://doi.org/10.1154/S0376030800022473","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"101 1","pages":"81-86"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74859999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S037603080002262X
P. Gergaud, G. Dour, K. Inal, J. Lebrun
{"title":"X-Ray Determination of Stresses Distribution in a Coarse Grained Silicon Billet","authors":"P. Gergaud, G. Dour, K. Inal, J. Lebrun","doi":"10.1154/S037603080002262X","DOIUrl":"https://doi.org/10.1154/S037603080002262X","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"29 1","pages":"225-235"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79131254","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023168
S. Chipera, J. Carey, D. Bish
{"title":"Controlled-Humidity XRD Analyses: Application to the Study of Smectite Expansion/Contraction","authors":"S. Chipera, J. Carey, D. Bish","doi":"10.1154/S0376030800023168","DOIUrl":"https://doi.org/10.1154/S0376030800023168","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"86 1","pages":"713-722"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76248725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S037603080002334X
W. Elam, J. Gilfrich
{"title":"Demonstration of an X-ray Fluorescence Sensor for the Cone Penetrometer","authors":"W. Elam, J. Gilfrich","doi":"10.1154/S037603080002334X","DOIUrl":"https://doi.org/10.1154/S037603080002334X","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"18 1","pages":"861-867"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81609451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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