Pub Date : 1995-01-01DOI: 10.1154/S0376030800022813
Hiroyuki Tabata, Z. Yajima, Y. Hirose
{"title":"Effect of Macro and Micro Stresses on Hardness of Titanium Aluminides","authors":"Hiroyuki Tabata, Z. Yajima, Y. Hirose","doi":"10.1154/S0376030800022813","DOIUrl":"https://doi.org/10.1154/S0376030800022813","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"50 1","pages":"405-412"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73659640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023259
Dennis Brown, B. Cordis, J. V. Gilfrict, C. Dozier
{"title":"Separation of Txrf Peaks and Background Using a Spreadsheet","authors":"Dennis Brown, B. Cordis, J. V. Gilfrict, C. Dozier","doi":"10.1154/S0376030800023259","DOIUrl":"https://doi.org/10.1154/S0376030800023259","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"41 1","pages":"791-797"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80833222","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023041
D. Brower, B. Medower, Ting C. Huang
{"title":"Structural Characterization of Thin Films by X-Ray Diffraction and Reflectivity","authors":"D. Brower, B. Medower, Ting C. Huang","doi":"10.1154/S0376030800023041","DOIUrl":"https://doi.org/10.1154/S0376030800023041","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"96 1","pages":"615-625"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81750688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022928
D. Dragoi, T. Watkins, K. Kozaczek
{"title":"Peak Broadening in Asymmetric X-Ray Diffraction Resulting from Chi Tilts","authors":"D. Dragoi, T. Watkins, K. Kozaczek","doi":"10.1154/S0376030800022928","DOIUrl":"https://doi.org/10.1154/S0376030800022928","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"40 1","pages":"499-503"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85496726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022588
T. Horiuchi, K. Ishida, K. Hayashi, K. Matsushige, A. Shibata
{"title":"Novel GIX2 Apparatus for Thin Film Analysis Using Color Laue Method","authors":"T. Horiuchi, K. Ishida, K. Hayashi, K. Matsushige, A. Shibata","doi":"10.1154/S0376030800022588","DOIUrl":"https://doi.org/10.1154/S0376030800022588","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"34 1","pages":"171-180"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87386569","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022850
A. Sanz-Hervás, A. Sacedon, E. Abril, J. Sánchez-Rojas, C. Villar, G. D. Benito, M. Aguilar, M. López, E. Calleja, E. Muñoz
{"title":"High Resolution X-ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs Mqw Structures","authors":"A. Sanz-Hervás, A. Sacedon, E. Abril, J. Sánchez-Rojas, C. Villar, G. D. Benito, M. Aguilar, M. López, E. Calleja, E. Muñoz","doi":"10.1154/S0376030800022850","DOIUrl":"https://doi.org/10.1154/S0376030800022850","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"29 1","pages":"439-448"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88359145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-10-01DOI: 10.1007/978-1-4615-1797-9_22
S. R. Lee, B. L. Doyle, T. Drummond, J. Medernach, R. P. Schneider
{"title":"Reciprocal space mapping of epitaxial materials using position-sensitive x-ray detection","authors":"S. R. Lee, B. L. Doyle, T. Drummond, J. Medernach, R. P. Schneider","doi":"10.1007/978-1-4615-1797-9_22","DOIUrl":"https://doi.org/10.1007/978-1-4615-1797-9_22","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"41 1","pages":"201-213"},"PeriodicalIF":0.0,"publicationDate":"1994-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78469840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-08-05DOI: 10.1007/978-1-4615-1797-9_26
L. Lowery, P. Zschack, R. J. Angelis
{"title":"Fluorine Implantation and Residual Stresses in Polysilicon Films","authors":"L. Lowery, P. Zschack, R. J. Angelis","doi":"10.1007/978-1-4615-1797-9_26","DOIUrl":"https://doi.org/10.1007/978-1-4615-1797-9_26","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"19 1","pages":"235-242"},"PeriodicalIF":0.0,"publicationDate":"1994-08-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82710005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-01-01DOI: 10.1007/978-1-4615-1797-9_3
I. Tomov, P. Chen, P. Rentzepis
{"title":"Picosecond x-ray diffraction: System and applications","authors":"I. Tomov, P. Chen, P. Rentzepis","doi":"10.1007/978-1-4615-1797-9_3","DOIUrl":"https://doi.org/10.1007/978-1-4615-1797-9_3","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"78 1","pages":"21-33"},"PeriodicalIF":0.0,"publicationDate":"1994-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75176903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1994-01-01DOI: 10.1007/978-1-4615-1797-9_64
D. Winter, B. Squires
{"title":"A new approach in performing microdiffraction analysis","authors":"D. Winter, B. Squires","doi":"10.1007/978-1-4615-1797-9_64","DOIUrl":"https://doi.org/10.1007/978-1-4615-1797-9_64","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"93 1","pages":"551-556"},"PeriodicalIF":0.0,"publicationDate":"1994-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75904800","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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