A team of undergraduate engineers in Optics were tasked to build a Dual-Angle Imaging System (DAISy) to measure the physical thickness of a dielectric film on silicon. This paper details their working prototype design.
{"title":"Dual-Angle Imaging System (DAISy) for Determining the Thickness of a Dielectric Thin Film","authors":"Yang Deng, Diana Magana, Zheng Tan, J. Kruschwitz","doi":"10.1364/OIC.2019.THC.4","DOIUrl":"https://doi.org/10.1364/OIC.2019.THC.4","url":null,"abstract":"A team of undergraduate engineers in Optics were tasked to build a Dual-Angle Imaging System (DAISy) to measure the physical thickness of a dielectric film on silicon. This paper details their working prototype design.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"456 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120880722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We perform theoretical and experimental demonstration of a-posteriori control of the central wavelength of bandpass filters. This approach relies on chalcogenide-based photosensitive layers. Examples of single- and multiple-cavity Fabry-Perot filters is provided.
{"title":"Laser-induced control of the central wavelength of bandpass filters","authors":"A. Bourgade, F. Lemarquis, T. Begou, J. Lumeau","doi":"10.1364/OIC.2019.WA.2","DOIUrl":"https://doi.org/10.1364/OIC.2019.WA.2","url":null,"abstract":"We perform theoretical and experimental demonstration of a-posteriori control of the central wavelength of bandpass filters. This approach relies on chalcogenide-based photosensitive layers. Examples of single- and multiple-cavity Fabry-Perot filters is provided.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124418824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Kestutis Juěkevičius, Gabrielius Rimšelis, R. Buzelis
In this work we are analyzing a way to use argon plasma etching method in order to make the prototype of high LIDT (Laser Induced Damage Threshold) fixed beam expander suitable for UV laser micromachining systems. We tested 5 most popular fused silicas (FS) in photonics market - Corning 7980 0F, Corning 8655 0F, Suprasil 300, Suprasil 1 and JGS1. Different thickness (from 0 nm to 150 nm) of commercially polished various fused silica glasses were removed and optical-physical properties were investigated. Each substrate was tested in the LIDT measuring setup. Experimental results showed that optimal etching depth for various fused silica substrates is - 100 ± 7 nm. LIDT (1000-on-1 at 355 nm) of developed beam expander with etched substrates was 17.7±2.9 J/cm2. In comparison, LIDT of beam expander with non-etched FS substrates has only 4.9 ± 1.7 J/cm2.
{"title":"Optical elements with significantly increased resistance to laser radiation","authors":"Kestutis Juěkevičius, Gabrielius Rimšelis, R. Buzelis","doi":"10.1364/OIC.2019.TE.6","DOIUrl":"https://doi.org/10.1364/OIC.2019.TE.6","url":null,"abstract":"In this work we are analyzing a way to use argon plasma etching method in order to make the prototype of high LIDT (Laser Induced Damage Threshold) fixed beam expander suitable for UV laser micromachining systems. We tested 5 most popular fused silicas (FS) in photonics market - Corning 7980 0F, Corning 8655 0F, Suprasil 300, Suprasil 1 and JGS1. Different thickness (from 0 nm to 150 nm) of commercially polished various fused silica glasses were removed and optical-physical properties were investigated. Each substrate was tested in the LIDT measuring setup. Experimental results showed that optimal etching depth for various fused silica substrates is - 100 ± 7 nm. LIDT (1000-on-1 at 355 nm) of developed beam expander with etched substrates was 17.7±2.9 J/cm2. In comparison, LIDT of beam expander with non-etched FS substrates has only 4.9 ± 1.7 J/cm2.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115286937","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Optical and mechanical properties from Infra-Red Anti-Reflective coatings deposited using YbF3 and ZnS as layer materials in an Ion Beam Sputtering system.
以YbF3和ZnS为层状材料在离子束溅射系统中沉积红外增透涂层的光学和机械性能。
{"title":"Infra-Red Multi-Layer Coatings Using YbF3 and ZnS in an Ion Beam Sputtering System","authors":"A. Ribeaud, J. Pistner, H. Hagedorn, S. Joseph","doi":"10.1364/OIC.2019.MC.7","DOIUrl":"https://doi.org/10.1364/OIC.2019.MC.7","url":null,"abstract":"Optical and mechanical properties from Infra-Red Anti-Reflective coatings deposited using YbF3 and ZnS as layer materials in an Ion Beam Sputtering system.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115829044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Laser induced diverse silicon nano-porous structures were studied to comprehend its light absorption capabilities within visible range of light. In addition, various characterization methods like SEM, light-spectroscopy, and EDX were employed for sound comprehension.
{"title":"Enhanced Optical Absorption Achieved via Laser Induced Nano-porous Silicon Thin-Film for Photovoltaic Devices","authors":"Chirag Paladiya, Amirkianoosh Kiani","doi":"10.1364/OIC.2019.MD.7","DOIUrl":"https://doi.org/10.1364/OIC.2019.MD.7","url":null,"abstract":"Laser induced diverse silicon nano-porous structures were studied to comprehend its light absorption capabilities within visible range of light. In addition, various characterization methods like SEM, light-spectroscopy, and EDX were employed for sound comprehension.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115925896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Chorel, T. Lanternier, E. Lavastre, B. Bousquet, J. Daurios, J. Néauport
By determining and evaluating the uncertainties on the LIDTint, we are able to recommend the best configuration to laser damage test monolayers in short pulse regime.
通过确定和评估LIDTint的不确定度，我们能够推荐短脉冲激光损伤测试单层的最佳配置。
{"title":"Recommendations on laser damage testing of monolayers in short pulse regime to determine accurate intrinsic LIDT","authors":"M. Chorel, T. Lanternier, E. Lavastre, B. Bousquet, J. Daurios, J. Néauport","doi":"10.1364/OIC.2019.THA.9","DOIUrl":"https://doi.org/10.1364/OIC.2019.THA.9","url":null,"abstract":"By determining and evaluating the uncertainties on the LIDTint, we are able to recommend the best configuration to laser damage test monolayers in short pulse regime.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121881126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The roughness evolution of Nb2O5 and SiO2 thin films and multilayers, deposited with low energy Plasma Ion-Assistance, is investigated and modelled. The models are used to predict the light scattering of a longwave pass filter.
{"title":"Roughness Evolution and Light Scattering Simulation in Multilayer Coatings Deposited with Plasma Ion-Assistance","authors":"D. Tonova, S. Bruynooghe, D. Isfort","doi":"10.1364/OIC.2019.TE.3","DOIUrl":"https://doi.org/10.1364/OIC.2019.TE.3","url":null,"abstract":"The roughness evolution of Nb2O5 and SiO2 thin films and multilayers, deposited with low energy Plasma Ion-Assistance, is investigated and modelled. The models are used to predict the light scattering of a longwave pass filter.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116813686","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Le Yang, E. Randel, G. Vajente, A. Ananyeva, E. Gustafson, A. Markosyan, R. Bassiri, M. Fejer, C. Menoni
Amorphous tantala (Ta2O5) thin films were deposited by reactive ion beam sputtering with simultaneous low energy assist Ar+ or Ar++O2+ bombardment. The films absorption and mechanical losses are not significantly affected by the ion bombardment.
{"title":"Optical properties and mechanical loss of amorphous Ta2O5 thin films bombarded with low energy assist ions","authors":"Le Yang, E. Randel, G. Vajente, A. Ananyeva, E. Gustafson, A. Markosyan, R. Bassiri, M. Fejer, C. Menoni","doi":"10.1364/OIC.2019.FA.6","DOIUrl":"https://doi.org/10.1364/OIC.2019.FA.6","url":null,"abstract":"Amorphous tantala (Ta2O5) thin films were deposited by reactive ion beam sputtering with simultaneous low energy assist Ar+ or Ar++O2+ bombardment. The films absorption and mechanical losses are not significantly affected by the ion bombardment.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115621320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hongfei Jiao, Xinshang Niu, Jinlong Zhang, Xinbin Cheng, Zhanshan Wang
We design a superior non-polarizing beam splitter using a special depolarized initial film structure. The structure fabricated by electron-beam evaporation retains T>98.57%@990nm and R>99.52%@976nm when the angle of incidence is 45 degree.
{"title":"Design and fabrication of superior non-polarizing beam splitter applied in laser beam combining technology","authors":"Hongfei Jiao, Xinshang Niu, Jinlong Zhang, Xinbin Cheng, Zhanshan Wang","doi":"10.1364/OIC.2019.MA.2","DOIUrl":"https://doi.org/10.1364/OIC.2019.MA.2","url":null,"abstract":"We design a superior non-polarizing beam splitter using a special depolarized initial film structure. The structure fabricated by electron-beam evaporation retains T>98.57%@990nm and R>99.52%@976nm when the angle of incidence is 45 degree.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"159 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115587250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Lequime, V. Khodnevych, M. Zerrad, M. Lintz, C. Amra
We present a theoretical model allowing to calculate the field back-scattered by a rough surface illuminated by a low divergence Gaussian beam, as well as first experimental results obtained in this configuration using a coherent detection scheme.
{"title":"Coherent detection of the light back-scattered by a rough surface","authors":"M. Lequime, V. Khodnevych, M. Zerrad, M. Lintz, C. Amra","doi":"10.1364/OIC.2019.TE.7","DOIUrl":"https://doi.org/10.1364/OIC.2019.TE.7","url":null,"abstract":"We present a theoretical model allowing to calculate the field back-scattered by a rough surface illuminated by a low divergence Gaussian beam, as well as first experimental results obtained in this configuration using a coherent detection scheme.","PeriodicalId":119323,"journal":{"name":"Optical Interference Coatings Conference (OIC) 2019","volume":"5-6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121067572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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