Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524635
Pljonkin Anton
The autocompensation quantum key distribution system with phase coding of photon states is investigated. The principle of operation of a fiber-optic system for the distribution of quantum keys is described. The analysis of the synchronization mode and the formation of quantum keys is carried out. The description of the experimental stand of the quantum-cryptographic network is given. The description of the software of the receiving-transmitting and coding stations is given. It is shown that in the synchronization process the time interval is determined to within picoseconds. The process of creating a virtual tunnel between two stations is described. The description of the full cycle of integration of quantum keys into algorithms of data encryption of a telecommunication network is given. It is shown, how length of the quantum channel of communication influences the process of formation of quantum keys. The possibility of using 256-bit quantum keys in the AES encryption algorithm has been experimentally proven.
{"title":"Experimental Research of the Mode of Quantum Keys Distribution","authors":"Pljonkin Anton","doi":"10.1109/EWDTS.2018.8524635","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524635","url":null,"abstract":"The autocompensation quantum key distribution system with phase coding of photon states is investigated. The principle of operation of a fiber-optic system for the distribution of quantum keys is described. The analysis of the synchronization mode and the formation of quantum keys is carried out. The description of the experimental stand of the quantum-cryptographic network is given. The description of the software of the receiving-transmitting and coding stations is given. It is shown that in the synchronization process the time interval is determined to within picoseconds. The process of creating a virtual tunnel between two stations is described. The description of the full cycle of integration of quantum keys into algorithms of data encryption of a telecommunication network is given. It is shown, how length of the quantum channel of communication influences the process of formation of quantum keys. The possibility of using 256-bit quantum keys in the AES encryption algorithm has been experimentally proven.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116512119","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524137
M. Abashidze, V. Beridze
The paper deals with optimal control problems whose behavior is described by Helmholtz equation with Bitsadze-Samarski m-point nonlocal boundary conditions. The theorem about a necessary and sufficient optimality condition is given. A numerical method of the solution of an optimal problem by means of the Mathcad package is presented.
{"title":"Solution of an Optimal Control Problem for Helmholtz Equations with m- Point Nonlocal Boundary Conditions by Means Mathcad","authors":"M. Abashidze, V. Beridze","doi":"10.1109/EWDTS.2018.8524137","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524137","url":null,"abstract":"The paper deals with optimal control problems whose behavior is described by Helmholtz equation with Bitsadze-Samarski m-point nonlocal boundary conditions. The theorem about a necessary and sufficient optimality condition is given. A numerical method of the solution of an optimal problem by means of the Mathcad package is presented.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121686757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524863
V. Hahanov, M. Liubarskyi, W. Gharibi, S. Chumachenko, E. Litvinova, I. Hahanov
A class of logical X-functions (xor, not-xor) and their qubit models is introduced, that are technologically feasible for test, diagnosis, and fault simulation of SoC components. Qubit models and methods for modeling and simulation of digital devices and components are proposed. Parallel methods for logic function minimization, SoC fault diagnosis, and coverage problem solving via unitary coding of qubit data structures are offered. The architecture of services for design, test and verification of digital devices based on qubit models of logical primitives is described. A service for fault-free circuits simulation based on the qubit coverage of functional primitives is given. The models, cubit data structures and methods are focused and simulated on the classical computers by leveraging unitary coding binary states.
{"title":"Test Synthesis for Logical X-functions","authors":"V. Hahanov, M. Liubarskyi, W. Gharibi, S. Chumachenko, E. Litvinova, I. Hahanov","doi":"10.1109/EWDTS.2018.8524863","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524863","url":null,"abstract":"A class of logical X-functions (xor, not-xor) and their qubit models is introduced, that are technologically feasible for test, diagnosis, and fault simulation of SoC components. Qubit models and methods for modeling and simulation of digital devices and components are proposed. Parallel methods for logic function minimization, SoC fault diagnosis, and coverage problem solving via unitary coding of qubit data structures are offered. The architecture of services for design, test and verification of digital devices based on qubit models of logical primitives is described. A service for fault-free circuits simulation based on the qubit coverage of functional primitives is given. The models, cubit data structures and methods are focused and simulated on the classical computers by leveraging unitary coding binary states.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126201951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524784
L. Samoylov, N. Prokopenko, A. Bugakova
The analysis of dynamic errors of input circuits of A/D interface (ADI) of the instrumentation and control systems is carried out. It is shown that the main influence on the magnitudes of these errors is due to the effect of aliasing during sampling of the sensor signal in the analog multiplexer (AM) and data delay in the analog anti-aliasing filter (AAAF). The use of the Filter Solution application software and the NI LabVIEW software environment enabled us to obtain numerical evaluations of the dynamic errors: aliasing errors and errors caused by signal delay in the AAAF. The article shows that it is problematic to use the AAAFs in instrumentation systems due to the sensor signal delay.
{"title":"Estimation to Efficiency of the Using of Anti-Alias Filter in the A/D Interface of Instrumentation and Control Systems","authors":"L. Samoylov, N. Prokopenko, A. Bugakova","doi":"10.1109/EWDTS.2018.8524784","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524784","url":null,"abstract":"The analysis of dynamic errors of input circuits of A/D interface (ADI) of the instrumentation and control systems is carried out. It is shown that the main influence on the magnitudes of these errors is due to the effect of aliasing during sampling of the sensor signal in the analog multiplexer (AM) and data delay in the analog anti-aliasing filter (AAAF). The use of the Filter Solution application software and the NI LabVIEW software environment enabled us to obtain numerical evaluations of the dynamic errors: aliasing errors and errors caused by signal delay in the AAAF. The article shows that it is problematic to use the AAAFs in instrumentation systems due to the sensor signal delay.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134047123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524827
L. Sambursky, Dmitry A. Parfenov, M. Ismail-Zade, Alexander S. Boldov, Borislav S. Dubyaga
In this work, virtual testing of submicron SOI CMOS reference voltage source integrated circuit was conducted with regard to elevated temperature in the range up to + 300°C. Based on simulation results its temperature tolerance figures were estimated.
{"title":"Prediction of High-Temperature Operation (up to +300°C) of Reference Voltage Source Built with Temperature-Tolerant Production Technology","authors":"L. Sambursky, Dmitry A. Parfenov, M. Ismail-Zade, Alexander S. Boldov, Borislav S. Dubyaga","doi":"10.1109/EWDTS.2018.8524827","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524827","url":null,"abstract":"In this work, virtual testing of submicron SOI CMOS reference voltage source integrated circuit was conducted with regard to elevated temperature in the range up to + 300°C. Based on simulation results its temperature tolerance figures were estimated.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130878261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524812
A. Gulin, N. Safyannikov, O. Bureneva, A. Y. Kaydanovich
The article is devoted to the approach to the construction of original bit-stream devices, characterized by the high fault-tolerance. This property is achieved due to the original structure of the devices, fault-tolerant forms of information representation and the use of an elemental base with the high degree of technological reliability. A bit-stream multiplier-divider unit is considered as an example; its RTL description is presented. The results of the multiplier-divider unit simulation are shown; the process of the result recovery after the noise influence is presented.
{"title":"Assurance of Fault-Tolerance in Bit-Stream Computing Converters","authors":"A. Gulin, N. Safyannikov, O. Bureneva, A. Y. Kaydanovich","doi":"10.1109/EWDTS.2018.8524812","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524812","url":null,"abstract":"The article is devoted to the approach to the construction of original bit-stream devices, characterized by the high fault-tolerance. This property is achieved due to the original structure of the devices, fault-tolerant forms of information representation and the use of an elemental base with the high degree of technological reliability. A bit-stream multiplier-divider unit is considered as an example; its RTL description is presented. The results of the multiplier-divider unit simulation are shown; the process of the result recovery after the noise influence is presented.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131187473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524652
A. Sergienko
A modulation scheme is presented that combines Differential Phase Shift Keying (DPSK) and Quadrature Amplitude Modulation (QAM). One or several QAM symbols are inserted between DPSK symbols, and the phase offset of QAM symbols is determined by the preceding DPSK symbol. Such signal can be treated as a transmission of overlapping signal blocks suitable for noncoherent reception. Along with Generalized Likelihood Ratio Test (GLRT) algorithm, simplified reception method is presented that is based on the use of demodulated DPSK symbols as pilot signals for demodulation of QAM symbols. Also, the technique is proposed for approximate theoretical calculation of the bit error probability for this scheme in the case of uncoded transmission. The simulation results show that, at the same spectral efficiency, proposed scheme provides significant power gain compared to DPSK (about 2.4 dB for spectral efficiency of 4 bits per symbol and about 6 dB for spectral efficiency of 6 bits per symbol). Theoretical approximation demonstrates reasonable agreement with computer simulation results.
{"title":"DPSK-QAM Combination as a Signal Set for Spectrally Efficient Noncoherent Communication","authors":"A. Sergienko","doi":"10.1109/EWDTS.2018.8524652","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524652","url":null,"abstract":"A modulation scheme is presented that combines Differential Phase Shift Keying (DPSK) and Quadrature Amplitude Modulation (QAM). One or several QAM symbols are inserted between DPSK symbols, and the phase offset of QAM symbols is determined by the preceding DPSK symbol. Such signal can be treated as a transmission of overlapping signal blocks suitable for noncoherent reception. Along with Generalized Likelihood Ratio Test (GLRT) algorithm, simplified reception method is presented that is based on the use of demodulated DPSK symbols as pilot signals for demodulation of QAM symbols. Also, the technique is proposed for approximate theoretical calculation of the bit error probability for this scheme in the case of uncoded transmission. The simulation results show that, at the same spectral efficiency, proposed scheme provides significant power gain compared to DPSK (about 2.4 dB for spectral efficiency of 4 bits per symbol and about 6 dB for spectral efficiency of 6 bits per symbol). Theoretical approximation demonstrates reasonable agreement with computer simulation results.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"317 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133048580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524702
I. Gilmanshin, R. Shaimukhametov, V. Strekalov
The digital recursive filters where proposed as models of the thermal dynamics of the building. The developed wireless system of temperature sensors has been applied in collecting a large body of data. From physical consideration, the first-order recursive filters describe the thermal dynamics in the observed temperature range adequate. Evaluation of the filter parameters was performed using system identification. The proposed models are usable in electronic control systems for energy-saving heating management.
{"title":"Digital Recursive Filters for Building Thermal Modelling","authors":"I. Gilmanshin, R. Shaimukhametov, V. Strekalov","doi":"10.1109/EWDTS.2018.8524702","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524702","url":null,"abstract":"The digital recursive filters where proposed as models of the thermal dynamics of the building. The developed wireless system of temperature sensors has been applied in collecting a large body of data. From physical consideration, the first-order recursive filters describe the thermal dynamics in the observed temperature range adequate. Evaluation of the filter parameters was performed using system identification. The proposed models are usable in electronic control systems for energy-saving heating management.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132145369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524760
N. Levchenko, A. Okunev, D. Zmejev
The article proposes to solve problems related to the parallel implementation of the sparse matrices multiplication task, using the architecture of the parallel dataflow computing system “Buran”, which implements the dataflow computing model. The article describes the implementation versions of the sparse matrices multiplication task algorithm in the dataflow programming paradigm. These algorithm implementations demonstrate the simplicity of their creation and universality. The experiments conducted using the behavioural cycle-accurate simulator have shown that the increase in the efficiency of tasks that use a sparse data structure can reach several orders of magnitude when executing them on the parallel data flow computing system.
{"title":"Study of Execution Efficiency of Implementation Versions of Sparse Matrices Multiplication Algorithm on Parallel Dataflow Computing System “Buran”","authors":"N. Levchenko, A. Okunev, D. Zmejev","doi":"10.1109/EWDTS.2018.8524760","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524760","url":null,"abstract":"The article proposes to solve problems related to the parallel implementation of the sparse matrices multiplication task, using the architecture of the parallel dataflow computing system “Buran”, which implements the dataflow computing model. The article describes the implementation versions of the sparse matrices multiplication task algorithm in the dataflow programming paradigm. These algorithm implementations demonstrate the simplicity of their creation and universality. The experiments conducted using the behavioural cycle-accurate simulator have shown that the increase in the efficiency of tasks that use a sparse data structure can reach several orders of magnitude when executing them on the parallel data flow computing system.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114611561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-09-01DOI: 10.1109/EWDTS.2018.8524598
A. Tatarinova, D. Prozorov
The article presents a technique of creation of speech dataset which is applied for test of spoken document retrieval methods. The dataset includes radio news audio files with speech on Russian language, textual files with spoken words, textual files with recognition words from CMU Pocketsphinx and a set of queries with indication of relevant documents. Query words from the set is labeled with types of recognition errors which are determined word replacement, word distortion, word split and word deletion. The dataset contains expert's indication of documents which are relevant to queries.
{"title":"Building Test Speech Dataset on Russian Language for Spoken Document Retrieval Task","authors":"A. Tatarinova, D. Prozorov","doi":"10.1109/EWDTS.2018.8524598","DOIUrl":"https://doi.org/10.1109/EWDTS.2018.8524598","url":null,"abstract":"The article presents a technique of creation of speech dataset which is applied for test of spoken document retrieval methods. The dataset includes radio news audio files with speech on Russian language, textual files with spoken words, textual files with recognition words from CMU Pocketsphinx and a set of queries with indication of relevant documents. Query words from the set is labeled with types of recognition errors which are determined word replacement, word distortion, word split and word deletion. The dataset contains expert's indication of documents which are relevant to queries.","PeriodicalId":127240,"journal":{"name":"2018 IEEE East-West Design & Test Symposium (EWDTS)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124640677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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