Pub Date : 2025-12-23DOI: 10.1109/LPT.2025.3634873
Yeolheon Seong;Heedeuk Shin
Presents corrections to the paper, (Etch Rate Dependence of Optical Loss in Silicon Photonics).
对论文《硅光子学中光损耗的蚀刻速率依赖性》进行了修正。
{"title":"Corrections to “Etch Rate Dependence of Optical Loss in Silicon Photonics”","authors":"Yeolheon Seong;Heedeuk Shin","doi":"10.1109/LPT.2025.3634873","DOIUrl":"https://doi.org/10.1109/LPT.2025.3634873","url":null,"abstract":"Presents corrections to the paper, (Etch Rate Dependence of Optical Loss in Silicon Photonics).","PeriodicalId":13065,"journal":{"name":"IEEE Photonics Technology Letters","volume":"38 6","pages":"365-365"},"PeriodicalIF":2.5,"publicationDate":"2025-12-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11313735","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145808576","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-23DOI: 10.1109/LPT.2025.3647768
Zerong Hu;Yukang Xie;Hanwen Zhang;Ziyun Yang;Baiquan Liu;Shaolin Liao;Xianbo Li
This letter presents a correlation detection circuit (CDC) with a programmable threshold for noise filtering in single-photon avalanche diode (SPAD)-based light detection and ranging (LiDAR) systems. A four-bit sorter based on combinational logic and an adjustable time window is employed for level-sensitive pulse correlation detection, which increases the pulse detection rate compared to existing edge-counting techniques when there exists pulse merging in a typical OR-Tree receiver structure. The threshold of the CDC is configurable to adapt to different noise strength. Fabricated in a $0.18~mu $ m CMOS process, the proposed CDC achieves a significant improvement of the effective pulse detection rate by about 10 times in a macro-pixel containing four SPADs, where each SPAD has a typical dark count rate (DCR) of about 1 kHz.
{"title":"A Programmable Correlation Detection Circuit for SPAD-Based LiDAR Applications","authors":"Zerong Hu;Yukang Xie;Hanwen Zhang;Ziyun Yang;Baiquan Liu;Shaolin Liao;Xianbo Li","doi":"10.1109/LPT.2025.3647768","DOIUrl":"https://doi.org/10.1109/LPT.2025.3647768","url":null,"abstract":"This letter presents a correlation detection circuit (CDC) with a programmable threshold for noise filtering in single-photon avalanche diode (SPAD)-based light detection and ranging (LiDAR) systems. A four-bit sorter based on combinational logic and an adjustable time window is employed for level-sensitive pulse correlation detection, which increases the pulse detection rate compared to existing edge-counting techniques when there exists pulse merging in a typical OR-Tree receiver structure. The threshold of the CDC is configurable to adapt to different noise strength. Fabricated in a <inline-formula> <tex-math>$0.18~mu $ </tex-math></inline-formula>m CMOS process, the proposed CDC achieves a significant improvement of the effective pulse detection rate by about 10 times in a macro-pixel containing four SPADs, where each SPAD has a typical dark count rate (DCR) of about 1 kHz.","PeriodicalId":13065,"journal":{"name":"IEEE Photonics Technology Letters","volume":"38 7","pages":"455-458"},"PeriodicalIF":2.5,"publicationDate":"2025-12-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145861225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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