Pub Date : 2024-08-30DOI: 10.1109/tns.2024.3452469
Jalal Mostafa, Denis Tcherniakhovski, Suren Chilingaryan, Matthias Balzer, Andreas Kopmann, Jürgen Becker
{"title":"100 Gbit/s UDP Data Acquisition on Linux Using AF_XDP: The TRISTAN Detector","authors":"Jalal Mostafa, Denis Tcherniakhovski, Suren Chilingaryan, Matthias Balzer, Andreas Kopmann, Jürgen Becker","doi":"10.1109/tns.2024.3452469","DOIUrl":"https://doi.org/10.1109/tns.2024.3452469","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"14 1","pages":""},"PeriodicalIF":1.8,"publicationDate":"2024-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142189516","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-29DOI: 10.1109/TNS.2024.3451618
Mircea Lechintan;Nikolay Djourelov
The applicability of the 48V isotope as a source of positrons for positron annihilation lifetime spectroscopy (PALS) measurements is discussed. It has been demonstrated that using such a positron source, the classical PALS setup with two detectors does not accurately determine the positron annihilation parameters of the samples being studied. This issue arises when one of the two nuclear gamma rays (of energies of 983 and 1312 keV) that are emitted almost simultaneously with the creation of a positron triggers a start signal, while the other nuclear gamma triggers a stop signal instead of the 511-keV annihilation quanta. These events manifest as prompt coincidences in the start-stop histogram, rendering the analysis of PALS spectra unreliable. To address this problem, a modification to the classical PALS spectrometer was proposed and tested. This modification involved incorporating a logic branch that significantly reduced the undesired prompt coincidences between the 983- and 1312-keV gamma rays. By conducting measurements on a series of samples utilizing 2- and 25- $mu $ m-thick Ti foils enriched with 48V, it was demonstrated that the altered setup reliably extracts accurate information on the positron annihilation states within the samples being examined.
{"title":"On the Applicability of 48V in Positron Annihilation Lifetime Spectroscopy","authors":"Mircea Lechintan;Nikolay Djourelov","doi":"10.1109/TNS.2024.3451618","DOIUrl":"10.1109/TNS.2024.3451618","url":null,"abstract":"The applicability of the 48V isotope as a source of positrons for positron annihilation lifetime spectroscopy (PALS) measurements is discussed. It has been demonstrated that using such a positron source, the classical PALS setup with two detectors does not accurately determine the positron annihilation parameters of the samples being studied. This issue arises when one of the two nuclear gamma rays (of energies of 983 and 1312 keV) that are emitted almost simultaneously with the creation of a positron triggers a start signal, while the other nuclear gamma triggers a stop signal instead of the 511-keV annihilation quanta. These events manifest as prompt coincidences in the start-stop histogram, rendering the analysis of PALS spectra unreliable. To address this problem, a modification to the classical PALS spectrometer was proposed and tested. This modification involved incorporating a logic branch that significantly reduced the undesired prompt coincidences between the 983- and 1312-keV gamma rays. By conducting measurements on a series of samples utilizing 2- and 25-\u0000<inline-formula> <tex-math>$mu $ </tex-math></inline-formula>\u0000 m-thick Ti foils enriched with 48V, it was demonstrated that the altered setup reliably extracts accurate information on the positron annihilation states within the samples being examined.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"71 10","pages":"2315-2322"},"PeriodicalIF":1.9,"publicationDate":"2024-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10659162","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142189518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-28DOI: 10.1109/tns.2024.3451312
D.L. Hansen, T. Manich, I. Zavatkay
{"title":"A Review of Single-Event Upset-Rate Calculation Methods","authors":"D.L. Hansen, T. Manich, I. Zavatkay","doi":"10.1109/tns.2024.3451312","DOIUrl":"https://doi.org/10.1109/tns.2024.3451312","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"35 1","pages":""},"PeriodicalIF":1.8,"publicationDate":"2024-08-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142189519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Measuring Performance Under Failures in the LHCb Data Acquisition Network","authors":"Eloïse Stein, Flavio Pisani, Tommaso Colombo, Cristel Pelsser","doi":"10.1109/tns.2024.3451177","DOIUrl":"https://doi.org/10.1109/tns.2024.3451177","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 1","pages":""},"PeriodicalIF":1.8,"publicationDate":"2024-08-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142189521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-27DOI: 10.1109/tns.2024.3450730
Sun Young Ryu, Shoji Ajimura, Ryo Kobayakawa, Keigo Mizutani, Masaru Yosoi, Ken Watanabe, Yuta Sada, Tomoaki Hotta, Takatsugu Ishikawa, Masayuki Niiyama, Jung Keun Ahn
{"title":"Network-distributed Data Acquisition System for Photoproduction Experiments with LEPS2","authors":"Sun Young Ryu, Shoji Ajimura, Ryo Kobayakawa, Keigo Mizutani, Masaru Yosoi, Ken Watanabe, Yuta Sada, Tomoaki Hotta, Takatsugu Ishikawa, Masayuki Niiyama, Jung Keun Ahn","doi":"10.1109/tns.2024.3450730","DOIUrl":"https://doi.org/10.1109/tns.2024.3450730","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"2 1","pages":""},"PeriodicalIF":1.8,"publicationDate":"2024-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142189523","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-27DOI: 10.1109/TNS.2024.3450607
Juan A. Clemente;Mohammadreza Rezaei;Juan C. Fabero;Hortensia Mecha;Francisco J. Franco
This article presents Listas de Eventos Localizando Anomalías al Preparar Estadísticas (LELAPE), an easy-to-use tool that aims at classifying the single-event upsets (SEUs) that were observed in radiation-ground experiments on a memory or a field-programmable gate array (FPGA) into single-bit upsets (SBUs) and multiple-cell upsets (MCUs) with various multiplicities. This tool takes as input one or several datasets obtained in radiation experiments and returns as output the list of events that were identified, without any limitation on the type of device (SRAMs, DRAMs, PSRAMs, FPGAs, and so on) or manufacturing technology (planar, FinFET, and so on). The classification method used consists in analyzing statistical anomalies found in the input dataset(s) that would not be found in a theoretical scenario where only single-bit upsets (SBUs) can occur. It will be proven that the prediction accuracy attained is very high, by using data issued from actual experiments carried out by the authors on several SRAMs under protons and neutrons with various energies. This tool has been made available to the Community through a Zenodo repository and protected by the European Union Public License (EUPL).
本文介绍了 Listas de Eventos Localizando Anomalías al Preparar Estadísticas (LELAPE)，这是一种易于使用的工具，旨在将在存储器或现场可编程门阵列（FPGA）辐照实验中观察到的单次事件颠倒（SEUs）分为单比特颠倒（SBUs）和具有不同倍数的多单元颠倒（MCUs）。该工具将辐射实验中获得的一个或多个数据集作为输入，并将识别出的事件列表作为输出返回，对器件类型（SRAM、DRAM、PSRAM、FPGA 等）或制造技术（平面、FinFET 等）没有任何限制。使用的分类方法包括分析输入数据集中发现的统计异常，这些异常在理论情况下是不会出现的，因为理论情况下只可能出现单比特中断（SBU）。通过使用作者在不同能量的质子和中子作用下对多个 SRAM 进行的实际实验所获得的数据，可以证明预测精度非常高。该工具已通过 Zenodo 存储库提供给社区使用，并受到欧盟公共许可证（EUPL）的保护。
{"title":"LELAPE: An Open-Source Tool to Classify SEUs According to Their Multiplicity in Radiation-Ground Tests on Memories","authors":"Juan A. Clemente;Mohammadreza Rezaei;Juan C. Fabero;Hortensia Mecha;Francisco J. Franco","doi":"10.1109/TNS.2024.3450607","DOIUrl":"10.1109/TNS.2024.3450607","url":null,"abstract":"This article presents Listas de Eventos Localizando Anomalías al Preparar Estadísticas (LELAPE), an easy-to-use tool that aims at classifying the single-event upsets (SEUs) that were observed in radiation-ground experiments on a memory or a field-programmable gate array (FPGA) into single-bit upsets (SBUs) and multiple-cell upsets (MCUs) with various multiplicities. This tool takes as input one or several datasets obtained in radiation experiments and returns as output the list of events that were identified, without any limitation on the type of device (SRAMs, DRAMs, PSRAMs, FPGAs, and so on) or manufacturing technology (planar, FinFET, and so on). The classification method used consists in analyzing statistical anomalies found in the input dataset(s) that would not be found in a theoretical scenario where only single-bit upsets (SBUs) can occur. It will be proven that the prediction accuracy attained is very high, by using data issued from actual experiments carried out by the authors on several SRAMs under protons and neutrons with various energies. This tool has been made available to the Community through a Zenodo repository and protected by the European Union Public License (EUPL).","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"71 10","pages":"2260-2271"},"PeriodicalIF":1.9,"publicationDate":"2024-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10649596","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142189524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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