This article introduced an ultraprecision optical polishing method for optical plane elements using a special polishing mould material G-90 we made. We also discussed in detail that the polishing condition, polishing techniques characters, and physicochemical charaters of the polishing mould material how to influence the stability of optical fringes and polishing efficiency.
{"title":"Techniques for Manufacturing Ultraprecision Optical Plane Elements","authors":"M. Yin","doi":"10.1364/oft.1984.fda3","DOIUrl":"https://doi.org/10.1364/oft.1984.fda3","url":null,"abstract":"This article introduced an ultraprecision optical polishing method for optical plane elements using a special polishing mould material G-90 we made. We also discussed in detail that the polishing condition, polishing techniques characters, and physicochemical charaters of the polishing mould material how to influence the stability of optical fringes and polishing efficiency.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125643741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A reference light source (RLS) was designed to allow the measurement and removal of system wavefront errors in wavefront sensing instruments. The wavefront of the RLS is produced by collimating and re-focussing the output of a laser diode onto a 1 micron pinhole aperture. The diverging spherical wavefront is usable over a numerical aperture of .65 for wavelengths greater than 700 nm. To achieve a high quality wavefront, design constraints on the pinhole are quite severe in terms of current technology. Several pinhole fabrication techniques have been explored. Methods for testing pinhole quality include electron microscopy and optical phase conjugation techniques. The wavefront is tested for non-rotationally symmetric wavefront aberrations by rotating the RLS and analyzing the changes in the relevant Zernike terms. Rotationally symmetric aberrations may then be ascertained by comparison of wavefronts measured on several instruments. Methods and results will be discussed in detail.
{"title":"A reference wavefront for wavefront sensing instruments","authors":"L. Selberg, B. Truax","doi":"10.1364/oft.1986.tha1","DOIUrl":"https://doi.org/10.1364/oft.1986.tha1","url":null,"abstract":"A reference light source (RLS) was designed to allow the measurement and removal of system wavefront errors in wavefront sensing instruments. The wavefront of the RLS is produced by collimating and re-focussing the output of a laser diode onto a 1 micron pinhole aperture. The diverging spherical wavefront is usable over a numerical aperture of .65 for wavelengths greater than 700 nm. To achieve a high quality wavefront, design constraints on the pinhole are quite severe in terms of current technology. Several pinhole fabrication techniques have been explored. Methods for testing pinhole quality include electron microscopy and optical phase conjugation techniques. The wavefront is tested for non-rotationally symmetric wavefront aberrations by rotating the RLS and analyzing the changes in the relevant Zernike terms. Rotationally symmetric aberrations may then be ascertained by comparison of wavefronts measured on several instruments. Methods and results will be discussed in detail.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"5 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113964474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The prospect of using laser-driven nuclear fusion reactions to provide an energy source for electric power generation has resulted in a number of engineering challenges. Not the least significant of these is the so-called "first wall problem," or the extreme thermal and atomic dislocation stresses resulting from the implantation of energetic alpha particles, deuterons, tritons, and x-rays in the top few microns of any solid material directly exposed to the target reaction1. (See Figure 1). While a variety of methods have been proposed1, 2, 3 to protect the structural sections of the reactor from this bombardment, only two options are considered feasible to protect the final optical elements which turn and/or focus the laser beams onto the target.
{"title":"The Surface Dynamics of Liquid Metal Fusion Reactor Mirrors","authors":"J. Bacon, Jean Tariello","doi":"10.1364/oft.1980.ffc3","DOIUrl":"https://doi.org/10.1364/oft.1980.ffc3","url":null,"abstract":"The prospect of using laser-driven nuclear fusion reactions to provide an energy source for electric power generation has resulted in a number of engineering challenges. Not the least significant of these is the so-called \"first wall problem,\" or the extreme thermal and atomic dislocation stresses resulting from the implantation of energetic alpha particles, deuterons, tritons, and x-rays in the top few microns of any solid material directly exposed to the target reaction1. (See Figure 1). While a variety of methods have been proposed1, 2, 3 to protect the structural sections of the reactor from this bombardment, only two options are considered feasible to protect the final optical elements which turn and/or focus the laser beams onto the target.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"949 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113995578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Manufacturing of multielement coated disks for the computer industry generally demands close tolerances of both the com position and the thickness of the plated or coated material on the substrate alloy. Since these types of materials are opaque to the visible spectrum, the most convenient and reliable method for these determinations fall into the non-destructive technique of x-ray fluorescence.
{"title":"Determination of Thickness and Composition of Multielement Coatings on Computer Disks Using Energy Dispersive X-Ray Fluorescence","authors":"B. Wheeler, C. Thomas, D. Gedcke, A. Welco","doi":"10.1364/oft.1984.thdb2","DOIUrl":"https://doi.org/10.1364/oft.1984.thdb2","url":null,"abstract":"Manufacturing of multielement coated disks for the computer industry generally demands close tolerances of both the com position and the thickness of the plated or coated material on the substrate alloy. Since these types of materials are opaque to the visible spectrum, the most convenient and reliable method for these determinations fall into the non-destructive technique of x-ray fluorescence.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122617793","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Optical profilers are very good for looking at the microstructure of a surface; however, they do not provide a very large dynamic range. They are limited to slopes which don't change the optical path difference between adjacent pixels by more than a half of the measurement wavelength (this corresponds to height changes of one-quarter wave). Many possible applications of optical profilers call for measuring the height of a step which is greater than a quarter of a wavelength, or for looking at structures of rough surfaces. Using the techniques of two-wavelength phase-shifting interferometry,1-4 the dynamic range of an optical profiler can be extended without sacrificing its high measurement precision.
{"title":"From angstroms to microns: Extending the measurement range of optical profilers","authors":"K. Creath, J. Wyant","doi":"10.1364/oft.1986.thb6","DOIUrl":"https://doi.org/10.1364/oft.1986.thb6","url":null,"abstract":"Optical profilers are very good for looking at the microstructure of a surface; however, they do not provide a very large dynamic range. They are limited to slopes which don't change the optical path difference between adjacent pixels by more than a half of the measurement wavelength (this corresponds to height changes of one-quarter wave). Many possible applications of optical profilers call for measuring the height of a step which is greater than a quarter of a wavelength, or for looking at structures of rough surfaces. Using the techniques of two-wavelength phase-shifting interferometry,1-4 the dynamic range of an optical profiler can be extended without sacrificing its high measurement precision.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122775096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We describe a new technique for the fabrication of non axisymmetric mirrors and an experimental demonstration of the technique. The technique takes advantage of the ease of polishing spheres by applying appropriate external stresses to elastically deform the desired mirror shape into a sphere. The sphere is polished into the blank, and upon release of the external forces, the mirror springs back to the desired shape. We have tested this method by making an off axis paraboloid requiring 10pm deflections. The final mirror was paraboloidal to 0.03μm.
{"title":"Stressed Mirror Polishing: A Technique for Making Non Axisymmetric Mirrors","authors":"J. Nelson","doi":"10.1364/oft.1979.st22","DOIUrl":"https://doi.org/10.1364/oft.1979.st22","url":null,"abstract":"We describe a new technique for the fabrication of non axisymmetric mirrors and an experimental demonstration of the technique. The technique takes advantage of the ease of polishing spheres by applying appropriate external stresses to elastically deform the desired mirror shape into a sphere. The sphere is polished into the blank, and upon release of the external forces, the mirror springs back to the desired shape. We have tested this method by making an off axis paraboloid requiring 10pm deflections. The final mirror was paraboloidal to 0.03μm.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133866974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A new type of birefringent filter, called a dispersive birefringent filter (DBF), has been described by Yeh1. A DBF requires a material whose birefringence is dispersive in the wavelength region of interest. In the region from 5300 to 5500 Angstroms (Å), cadmium sulfide (CdS) has this property. Early calculations showed that a DBF made from CdS could be made to have a very narrow passband (approximately 2 Å) and very wide field-of-view (80 to 90 degrees half-angle). At a wavelength of 5320 Å (doubled Nd:YAG) this filter would require flat and parallel CdS plates as thin as 35 microns. When such plates were made, it was found that the absorption coefficient was several orders of magnitude larger than expected. This excessive absorption was traced to mechanically induced surface damage of the CdS. As a result, the ability to produce thin, parallel, and relatively damage-free CdS plates became crucial to the success of the DBF development effort.
{"title":"Surface Damage in Cadmium Sulfide","authors":"R. L. Hall, J. Foschaar, W. Gunning","doi":"10.1364/oft.1984.fdb1","DOIUrl":"https://doi.org/10.1364/oft.1984.fdb1","url":null,"abstract":"A new type of birefringent filter, called a dispersive birefringent filter (DBF), has been described by Yeh1. A DBF requires a material whose birefringence is dispersive in the wavelength region of interest. In the region from 5300 to 5500 Angstroms (Å), cadmium sulfide (CdS) has this property. Early calculations showed that a DBF made from CdS could be made to have a very narrow passband (approximately 2 Å) and very wide field-of-view (80 to 90 degrees half-angle). At a wavelength of 5320 Å (doubled Nd:YAG) this filter would require flat and parallel CdS plates as thin as 35 microns. When such plates were made, it was found that the absorption coefficient was several orders of magnitude larger than expected. This excessive absorption was traced to mechanically induced surface damage of the CdS. As a result, the ability to produce thin, parallel, and relatively damage-free CdS plates became crucial to the success of the DBF development effort.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125091512","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Over the past five years I have written several programs for hand-held programmable calculators. Most of these programs have dealt with specific technical questions in the fields of optical design and optical fabrication. I have collected these programs in a notebook which is divided into ten sections by catagory. Section names and the individual program titles within each section are given in Table I. No attempt has been made to cover the field of optics or any subtopic thereof. None of these programs were originally written with the idea of publication or sale. I display them as a group on this occasion as a modest example of what can be done to take advantage of the tremendous computational power that has been bequeathed to each of us by the inventors of the pocket calculator.
{"title":"Ask My (or Your) Calculator Anything","authors":"E. M. Palmer","doi":"10.1364/oft.1982.tub5","DOIUrl":"https://doi.org/10.1364/oft.1982.tub5","url":null,"abstract":"Over the past five years I have written several programs for hand-held programmable calculators. Most of these programs have dealt with specific technical questions in the fields of optical design and optical fabrication. I have collected these programs in a notebook which is divided into ten sections by catagory. Section names and the individual program titles within each section are given in Table I. No attempt has been made to cover the field of optics or any subtopic thereof. None of these programs were originally written with the idea of publication or sale. I display them as a group on this occasion as a modest example of what can be done to take advantage of the tremendous computational power that has been bequeathed to each of us by the inventors of the pocket calculator.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134068562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Cleaning a Spatial Filter Lens in its Assembly","authors":"S. Guntram","doi":"10.1364/oft.1980.fthe6","DOIUrl":"https://doi.org/10.1364/oft.1980.fthe6","url":null,"abstract":"Summary not available.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134088229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In-situ testing of large optics greatly increases the speed and accuracy of the figuring process. Rapid test data turnaround and precise contour map displays allow an optician using traditional polishing techniqes to progress rapidly to final figure. At the Optical Sciences Center we have developed a high resolution phase-measuring interferometer that we used during the final figuring stages of a 20-in. diameter, 97-in. focal length off-axis parabola and a 72-in. diameter, f/2.7 symmetric lightweight parabola. Both mirrors were tested and figured in-situ, the off-axis mirror on the table of the swing-arm generator and the 72-in. mirror in a test tower in which the mirror was supported on a rotary table equipped with a polishing arm. High resolution phase maps of each surface were obtained with resolutions of approximately 9mm/pixel and 2mm/pixel on the 72- and 20-in. mirrors, respectively. The phase contour maps were displayed on a video monitor and photographed with a 35mm camera on Tri-X film. The negatives were mounted directly as slides into circular slide mounts and displayed with a slide projector directly onto the slurry coated mirror. The optician then worked the high zones and patches using traditional polishing methods. The circular slide mounts allowed for easy alignment of the contour maps with the fiducialized mirrors. Test turnaround time from one polishing run to the next was about 2 hours allowing for rapid convergence to the final figure.
{"title":"The Use of High Resolution Phase-Measuring Interferometry in the Figuring of Large Symmetric and Asymmetric Aspheres","authors":"D. S. Anderson","doi":"10.1364/oft.1987.thaa7","DOIUrl":"https://doi.org/10.1364/oft.1987.thaa7","url":null,"abstract":"In-situ testing of large optics greatly increases the speed and accuracy of the figuring process. Rapid test data turnaround and precise contour map displays allow an optician using traditional polishing techniqes to progress rapidly to final figure. At the Optical Sciences Center we have developed a high resolution phase-measuring interferometer that we used during the final figuring stages of a 20-in. diameter, 97-in. focal length off-axis parabola and a 72-in. diameter, f/2.7 symmetric lightweight parabola. Both mirrors were tested and figured in-situ, the off-axis mirror on the table of the swing-arm generator and the 72-in. mirror in a test tower in which the mirror was supported on a rotary table equipped with a polishing arm. High resolution phase maps of each surface were obtained with resolutions of approximately 9mm/pixel and 2mm/pixel on the 72- and 20-in. mirrors, respectively. The phase contour maps were displayed on a video monitor and photographed with a 35mm camera on Tri-X film. The negatives were mounted directly as slides into circular slide mounts and displayed with a slide projector directly onto the slurry coated mirror. The optician then worked the high zones and patches using traditional polishing methods. The circular slide mounts allowed for easy alignment of the contour maps with the fiducialized mirrors. Test turnaround time from one polishing run to the next was about 2 hours allowing for rapid convergence to the final figure.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"170 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132247621","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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