This article introduced an ultraprecision optical polishing method for optical plane elements using a special polishing mould material G-90 we made. We also discussed in detail that the polishing condition, polishing techniques characters, and physicochemical charaters of the polishing mould material how to influence the stability of optical fringes and polishing efficiency.
{"title":"Techniques for Manufacturing Ultraprecision Optical Plane Elements","authors":"M. Yin","doi":"10.1364/oft.1984.fda3","DOIUrl":"https://doi.org/10.1364/oft.1984.fda3","url":null,"abstract":"This article introduced an ultraprecision optical polishing method for optical plane elements using a special polishing mould material G-90 we made. We also discussed in detail that the polishing condition, polishing techniques characters, and physicochemical charaters of the polishing mould material how to influence the stability of optical fringes and polishing efficiency.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125643741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A reference light source (RLS) was designed to allow the measurement and removal of system wavefront errors in wavefront sensing instruments. The wavefront of the RLS is produced by collimating and re-focussing the output of a laser diode onto a 1 micron pinhole aperture. The diverging spherical wavefront is usable over a numerical aperture of .65 for wavelengths greater than 700 nm. To achieve a high quality wavefront, design constraints on the pinhole are quite severe in terms of current technology. Several pinhole fabrication techniques have been explored. Methods for testing pinhole quality include electron microscopy and optical phase conjugation techniques. The wavefront is tested for non-rotationally symmetric wavefront aberrations by rotating the RLS and analyzing the changes in the relevant Zernike terms. Rotationally symmetric aberrations may then be ascertained by comparison of wavefronts measured on several instruments. Methods and results will be discussed in detail.
{"title":"A reference wavefront for wavefront sensing instruments","authors":"L. Selberg, B. Truax","doi":"10.1364/oft.1986.tha1","DOIUrl":"https://doi.org/10.1364/oft.1986.tha1","url":null,"abstract":"A reference light source (RLS) was designed to allow the measurement and removal of system wavefront errors in wavefront sensing instruments. The wavefront of the RLS is produced by collimating and re-focussing the output of a laser diode onto a 1 micron pinhole aperture. The diverging spherical wavefront is usable over a numerical aperture of .65 for wavelengths greater than 700 nm. To achieve a high quality wavefront, design constraints on the pinhole are quite severe in terms of current technology. Several pinhole fabrication techniques have been explored. Methods for testing pinhole quality include electron microscopy and optical phase conjugation techniques. The wavefront is tested for non-rotationally symmetric wavefront aberrations by rotating the RLS and analyzing the changes in the relevant Zernike terms. Rotationally symmetric aberrations may then be ascertained by comparison of wavefronts measured on several instruments. Methods and results will be discussed in detail.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"5 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113964474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The prospect of using laser-driven nuclear fusion reactions to provide an energy source for electric power generation has resulted in a number of engineering challenges. Not the least significant of these is the so-called "first wall problem," or the extreme thermal and atomic dislocation stresses resulting from the implantation of energetic alpha particles, deuterons, tritons, and x-rays in the top few microns of any solid material directly exposed to the target reaction1. (See Figure 1). While a variety of methods have been proposed1, 2, 3 to protect the structural sections of the reactor from this bombardment, only two options are considered feasible to protect the final optical elements which turn and/or focus the laser beams onto the target.
{"title":"The Surface Dynamics of Liquid Metal Fusion Reactor Mirrors","authors":"J. Bacon, Jean Tariello","doi":"10.1364/oft.1980.ffc3","DOIUrl":"https://doi.org/10.1364/oft.1980.ffc3","url":null,"abstract":"The prospect of using laser-driven nuclear fusion reactions to provide an energy source for electric power generation has resulted in a number of engineering challenges. Not the least significant of these is the so-called \"first wall problem,\" or the extreme thermal and atomic dislocation stresses resulting from the implantation of energetic alpha particles, deuterons, tritons, and x-rays in the top few microns of any solid material directly exposed to the target reaction1. (See Figure 1). While a variety of methods have been proposed1, 2, 3 to protect the structural sections of the reactor from this bombardment, only two options are considered feasible to protect the final optical elements which turn and/or focus the laser beams onto the target.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"949 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113995578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Manufacturing of multielement coated disks for the computer industry generally demands close tolerances of both the com position and the thickness of the plated or coated material on the substrate alloy. Since these types of materials are opaque to the visible spectrum, the most convenient and reliable method for these determinations fall into the non-destructive technique of x-ray fluorescence.
{"title":"Determination of Thickness and Composition of Multielement Coatings on Computer Disks Using Energy Dispersive X-Ray Fluorescence","authors":"B. Wheeler, C. Thomas, D. Gedcke, A. Welco","doi":"10.1364/oft.1984.thdb2","DOIUrl":"https://doi.org/10.1364/oft.1984.thdb2","url":null,"abstract":"Manufacturing of multielement coated disks for the computer industry generally demands close tolerances of both the com position and the thickness of the plated or coated material on the substrate alloy. Since these types of materials are opaque to the visible spectrum, the most convenient and reliable method for these determinations fall into the non-destructive technique of x-ray fluorescence.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122617793","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Optical profilers are very good for looking at the microstructure of a surface; however, they do not provide a very large dynamic range. They are limited to slopes which don't change the optical path difference between adjacent pixels by more than a half of the measurement wavelength (this corresponds to height changes of one-quarter wave). Many possible applications of optical profilers call for measuring the height of a step which is greater than a quarter of a wavelength, or for looking at structures of rough surfaces. Using the techniques of two-wavelength phase-shifting interferometry,1-4 the dynamic range of an optical profiler can be extended without sacrificing its high measurement precision.
{"title":"From angstroms to microns: Extending the measurement range of optical profilers","authors":"K. Creath, J. Wyant","doi":"10.1364/oft.1986.thb6","DOIUrl":"https://doi.org/10.1364/oft.1986.thb6","url":null,"abstract":"Optical profilers are very good for looking at the microstructure of a surface; however, they do not provide a very large dynamic range. They are limited to slopes which don't change the optical path difference between adjacent pixels by more than a half of the measurement wavelength (this corresponds to height changes of one-quarter wave). Many possible applications of optical profilers call for measuring the height of a step which is greater than a quarter of a wavelength, or for looking at structures of rough surfaces. Using the techniques of two-wavelength phase-shifting interferometry,1-4 the dynamic range of an optical profiler can be extended without sacrificing its high measurement precision.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122775096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We describe a new technique for the fabrication of non axisymmetric mirrors and an experimental demonstration of the technique. The technique takes advantage of the ease of polishing spheres by applying appropriate external stresses to elastically deform the desired mirror shape into a sphere. The sphere is polished into the blank, and upon release of the external forces, the mirror springs back to the desired shape. We have tested this method by making an off axis paraboloid requiring 10pm deflections. The final mirror was paraboloidal to 0.03μm.
{"title":"Stressed Mirror Polishing: A Technique for Making Non Axisymmetric Mirrors","authors":"J. Nelson","doi":"10.1364/oft.1979.st22","DOIUrl":"https://doi.org/10.1364/oft.1979.st22","url":null,"abstract":"We describe a new technique for the fabrication of non axisymmetric mirrors and an experimental demonstration of the technique. The technique takes advantage of the ease of polishing spheres by applying appropriate external stresses to elastically deform the desired mirror shape into a sphere. The sphere is polished into the blank, and upon release of the external forces, the mirror springs back to the desired shape. We have tested this method by making an off axis paraboloid requiring 10pm deflections. The final mirror was paraboloidal to 0.03μm.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133866974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Aspheric optical surfaces fill the need to generate non-standard wavefront profiles in many modern optical systems. Interferometric tests have been developed to measure the extreme phase errors, relative to a spherical reference, which occur near the outer regions of the aperture. Several null compensation techniques have been described. For example, a null lens designed to generate an aspheric reference wavefront can be used to negate the effect of the surface figure resulting in measurement of deviations from the desired asphere. Alternatively, computer generated holograms have been used in two-beam interferometers such that the wavefront from the aspheric test surface is compared to a "perfect" wavefront generated by the hologram. A second class of techniques based on shearing interferometry have also been described. For example, a lateral shear interferometer, in which two displaced wavefronts from the same test surface are interfered, does not require compensating optics or a reference surface to measure aspheric figure errors.
{"title":"Subaperture Interferometric Testing of Aspheric Optics","authors":"Rick A. Williams, O. Kwon","doi":"10.1364/oft.1987.thaa3","DOIUrl":"https://doi.org/10.1364/oft.1987.thaa3","url":null,"abstract":"Aspheric optical surfaces fill the need to generate non-standard wavefront profiles in many modern optical systems. Interferometric tests have been developed to measure the extreme phase errors, relative to a spherical reference, which occur near the outer regions of the aperture. Several null compensation techniques have been described. For example, a null lens designed to generate an aspheric reference wavefront can be used to negate the effect of the surface figure resulting in measurement of deviations from the desired asphere. Alternatively, computer generated holograms have been used in two-beam interferometers such that the wavefront from the aspheric test surface is compared to a \"perfect\" wavefront generated by the hologram. A second class of techniques based on shearing interferometry have also been described. For example, a lateral shear interferometer, in which two displaced wavefronts from the same test surface are interfered, does not require compensating optics or a reference surface to measure aspheric figure errors.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"395 1-3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114016076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The health concerns with the materials that are used in the coating industry are a reflection of the health concerns that have occured throughout all of industry. Let's take a look at where much of this concern is coming from.
涂料行业中使用的材料的健康问题反映了整个行业中出现的健康问题。让我们来看看这些担忧来自哪里。
{"title":"Optical Materials and Health Concerns","authors":"Eugene A. Port","doi":"10.1364/oft.1982.ma7","DOIUrl":"https://doi.org/10.1364/oft.1982.ma7","url":null,"abstract":"The health concerns with the materials that are used in the coating industry are a reflection of the health concerns that have occured throughout all of industry. Let's take a look at where much of this concern is coming from.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114837611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In testing optical surfaces, several very useful tests are those which depend on the slope of the surface These include the Hartmann test, Ronchi test, Foucault knife-edge test, and others.1
{"title":"Application of Zernike Polynomials to Reduction of Wavefront-Slope Data","authors":"Nancy H. Davis, T. Fritz","doi":"10.1364/oft.1979.st39","DOIUrl":"https://doi.org/10.1364/oft.1979.st39","url":null,"abstract":"In testing optical surfaces, several very useful tests are those which depend on the slope of the surface These include the Hartmann test, Ronchi test, Foucault knife-edge test, and others.1","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"149 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117302592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
There are many reasons for using thin film epoxy replicas besides significant cost savings for the individual components. These reasons are described using actual applications as examples. Substrate requirements for these applications range from a flat surface for a flat mirror, to a spherical surface for a moderately fast parabola, to an ellipsoidal surface for a highly aspheric ellipsoid. A description of the replica defects caused by surface defects in the substrate is presented. Also included is a brief description of the tooling, production lead times and cost volume relationships for these applications.
{"title":"Epoxy Replication of Aspheric Optics*","authors":"Harold M. Weissman","doi":"10.1364/oft.1980.tua6","DOIUrl":"https://doi.org/10.1364/oft.1980.tua6","url":null,"abstract":"There are many reasons for using thin film epoxy replicas besides significant cost savings for the individual components. These reasons are described using actual applications as examples. Substrate requirements for these applications range from a flat surface for a flat mirror, to a spherical surface for a moderately fast parabola, to an ellipsoidal surface for a highly aspheric ellipsoid. A description of the replica defects caused by surface defects in the substrate is presented. Also included is a brief description of the tooling, production lead times and cost volume relationships for these applications.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123455230","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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