Nadine Gerges, C. Petit-Etienne, M. Panabière, J. Boussey, Y. Ferrec, C. Gourgon
{"title":"Optimized ultraviolet grayscale process for high vertical resolution applied to spectral imagers","authors":"Nadine Gerges, C. Petit-Etienne, M. Panabière, J. Boussey, Y. Ferrec, C. Gourgon","doi":"10.1116/6.0001273","DOIUrl":"https://doi.org/10.1116/6.0001273","url":null,"abstract":"","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"34 1","pages":""},"PeriodicalIF":1.4,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75079270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Stress reduction and wafer bow accommodation for the fabrication of thin film lithium niobate on oxidized silicon","authors":"K. Prabhakar, Ryan J. Patton, R. Reano","doi":"10.1116/6.0001283","DOIUrl":"https://doi.org/10.1116/6.0001283","url":null,"abstract":"","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"27 1","pages":""},"PeriodicalIF":1.4,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85222461","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multiplexing implementation of rubbing-induced site-selective growth of MoS2 feature arrays","authors":"Mingze Chen, S. Ki, Xiaogan Liang","doi":"10.1116/6.0001268","DOIUrl":"https://doi.org/10.1116/6.0001268","url":null,"abstract":"","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"150 1","pages":""},"PeriodicalIF":1.4,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77419315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yağmur Demircan Yalçın, A. Bastiaens, Jean-Philippe Frimat, R. Luttge
This study presents sensing of network bursts in a three-dimensional (3D) cell culture system consisting of a microbioreactor and a multielectrode array (MEA), i.e., brain-on-chip, to interpret neural network dynamics in a label-free manner. While our initial results reported an increased single spiking activity already over the course of days 7, 14, and 21 in vitro , the advanced long-term analysis of the data set (including a last timepoint at day 79) here demonstrates a proof-of-principle for following bursting patterns upon maturation of the network in the microbioreactor as an add-on device for a commercial MEA recording system. These quantitative electrophysiological findings, including mean bursting rate, mean burst duration, and network burst dynamics, confirm a 2D to 3D transition in coherence with the literature.
{"title":"Long-term brain-on-chip: Multielectrode array recordings in 3D neural cell cultures","authors":"Yağmur Demircan Yalçın, A. Bastiaens, Jean-Philippe Frimat, R. Luttge","doi":"10.1116/6.0001297","DOIUrl":"https://doi.org/10.1116/6.0001297","url":null,"abstract":"This study presents sensing of network bursts in a three-dimensional (3D) cell culture system consisting of a microbioreactor and a multielectrode array (MEA), i.e., brain-on-chip, to interpret neural network dynamics in a label-free manner. While our initial results reported an increased single spiking activity already over the course of days 7, 14, and 21 in vitro , the advanced long-term analysis of the data set (including a last timepoint at day 79) here demonstrates a proof-of-principle for following bursting patterns upon maturation of the network in the microbioreactor as an add-on device for a commercial MEA recording system. These quantitative electrophysiological findings, including mean bursting rate, mean burst duration, and network burst dynamics, confirm a 2D to 3D transition in coherence with the literature.","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"65 1","pages":""},"PeriodicalIF":1.4,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82092828","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Diffusion coefficient of charge carriers in disordered semiconductors retaining a combination of exponential and Gaussian mobility-gap states: Application to amorphous selenium","authors":"Dilshad Hossain, M. Z. Kabir","doi":"10.1116/6.0001516","DOIUrl":"https://doi.org/10.1116/6.0001516","url":null,"abstract":"","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"55 1","pages":""},"PeriodicalIF":1.4,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85147939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Baum, C. Meinecke, T. Blaudeck, C. Helke, D. Reuter, K. Hiller, S. Hermann, S. E. Schulz, H. Kuhn
{"title":"Bridging the gap: Perspectives of nanofabrication technologies for application-oriented research","authors":"M. Baum, C. Meinecke, T. Blaudeck, C. Helke, D. Reuter, K. Hiller, S. Hermann, S. E. Schulz, H. Kuhn","doi":"10.1116/6.0001299","DOIUrl":"https://doi.org/10.1116/6.0001299","url":null,"abstract":"","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"15 1","pages":""},"PeriodicalIF":1.4,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72993691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. P. de Castro, T. A. de Assis, R. Rivelino, F. Mota, C. D. de Castilho
{"title":"Using static linear response theory to describe field emission field enhancement and a field-induced insulator-conductor transition","authors":"C. P. de Castro, T. A. de Assis, R. Rivelino, F. Mota, C. D. de Castilho","doi":"10.1116/6.0001550","DOIUrl":"https://doi.org/10.1116/6.0001550","url":null,"abstract":"","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"117 1","pages":""},"PeriodicalIF":1.4,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86178595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Hiraiwa, K. Horikawa, H. Kawarada, M. Kado, K. Danno
{"title":"Postdeposition annealing effect on atomic-layer-deposited Al2O3 gate insulator on (001) β-Ga2O3","authors":"A. Hiraiwa, K. Horikawa, H. Kawarada, M. Kado, K. Danno","doi":"10.1116/6.0001360","DOIUrl":"https://doi.org/10.1116/6.0001360","url":null,"abstract":"","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"106 5 1","pages":""},"PeriodicalIF":1.4,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83939794","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Miroshnik, B. Rummel, Andrew B. Li, G. Balakrishnan, T. Sinno, S. Han
{"title":"Maintaining atomically smooth GaAs surfaces after high-temperature processing for precise interdiffusion analysis and materials engineering","authors":"L. Miroshnik, B. Rummel, Andrew B. Li, G. Balakrishnan, T. Sinno, S. Han","doi":"10.1116/6.0001399","DOIUrl":"https://doi.org/10.1116/6.0001399","url":null,"abstract":"","PeriodicalId":17495,"journal":{"name":"Journal of Vacuum Science & Technology B","volume":"2 1","pages":""},"PeriodicalIF":1.4,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87559297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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