Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816289
James Jauw, P. Vassiliou
This document describes the conception and development of the Amway Product Quality Tracking System (PQTS). The PQTS is an integrated product quality tracking system that allows the organization to: (1) capture product quality, reliability and warranty data from disparate data sources and incorporate that data into a single centralized database that can support powerful data analysis; (2) carry out sophisticated data analysis routines that transform data into information that can be used for decision-making; and (3) present analyzed reports and graphs in a graphically rich, multi-faceted and carefully organized presentation interface accessible via Intranet or Internet to support the decision-making of key organizational personnel. Development of this system began with an attempt to improve on labor-intensive manual methods of report creation and proceeded to the development of the fully automated system available to Amway today. A general description of the development process, an analysis of the lessons learned during system implementation and benefits to the corporation are presented.
{"title":"Field data is reliability information: implementing an automated data acquisition and analysis system","authors":"James Jauw, P. Vassiliou","doi":"10.1109/RAMS.2000.816289","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816289","url":null,"abstract":"This document describes the conception and development of the Amway Product Quality Tracking System (PQTS). The PQTS is an integrated product quality tracking system that allows the organization to: (1) capture product quality, reliability and warranty data from disparate data sources and incorporate that data into a single centralized database that can support powerful data analysis; (2) carry out sophisticated data analysis routines that transform data into information that can be used for decision-making; and (3) present analyzed reports and graphs in a graphically rich, multi-faceted and carefully organized presentation interface accessible via Intranet or Internet to support the decision-making of key organizational personnel. Development of this system began with an attempt to improve on labor-intensive manual methods of report creation and proceeded to the development of the fully automated system available to Amway today. A general description of the development process, an analysis of the lessons learned during system implementation and benefits to the corporation are presented.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122223482","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816305
S. G. Gedam, S. Beaudet
A technique for performing Monte-Carlo simulation using an Excel spreadsheet has been developed. This technique utilizes the powerful mathematical and statistical capabilities of Excel. The functional reliability block diagram (RBD) of the system under investigation is first transformed into a table in an Excel spreadsheet. Each cell within the table corresponds to a specific block in the RBD. Formulae for failure times entered into these cells are in accordance with the failure time distribution of the corresponding block and can follow exponential, normal, lognormal or Weibull distribution. The Excel pseudo random number generator is used to simulate failure times of individual units or modules in the system. Logical expressions are then used to determine system success or failure. Excel's macro feature enables repetition of the scenario thousands of times while automatically recording the failure data. Excel's graphical capabilities are later used for plotting the failure probability density function (PDF) and cumulative distribution function (CDF) of the overall system. The paper discusses the results obtainable from this method such as reliability estimate, mean and variance of failures and confidence intervals. Simulation time is dependent on the complexity of the system, computer speed, and the accuracy desired, and may range from a few minutes to a few hours.
{"title":"Monte Carlo simulation using Excel(R) spreadsheet for predicting reliability of a complex system","authors":"S. G. Gedam, S. Beaudet","doi":"10.1109/RAMS.2000.816305","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816305","url":null,"abstract":"A technique for performing Monte-Carlo simulation using an Excel spreadsheet has been developed. This technique utilizes the powerful mathematical and statistical capabilities of Excel. The functional reliability block diagram (RBD) of the system under investigation is first transformed into a table in an Excel spreadsheet. Each cell within the table corresponds to a specific block in the RBD. Formulae for failure times entered into these cells are in accordance with the failure time distribution of the corresponding block and can follow exponential, normal, lognormal or Weibull distribution. The Excel pseudo random number generator is used to simulate failure times of individual units or modules in the system. Logical expressions are then used to determine system success or failure. Excel's macro feature enables repetition of the scenario thousands of times while automatically recording the failure data. Excel's graphical capabilities are later used for plotting the failure probability density function (PDF) and cumulative distribution function (CDF) of the overall system. The paper discusses the results obtainable from this method such as reliability estimate, mean and variance of failures and confidence intervals. Simulation time is dependent on the complexity of the system, computer speed, and the accuracy desired, and may range from a few minutes to a few hours.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122295138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816296
Lu Min-yan, B. Yunfeng, Cong Min
Software-reliability measurement based on failure data can provide estimations of software reliability at its present state and predictions of software reliability in the future as testing goes on. This paper analyzes the problems existed in the measurement process and proposes a practical software-reliability measurement framework based on state of the art to give relatively better software reliability predictions. Study on the validity of the modification methods i.e. the recalibration technique and the combination method also has been done. The results show that the modification methods could give better prediction results but not always, so predictive quality analysis still needs to be done.
{"title":"A practical software-reliability measurement framework based on failure data","authors":"Lu Min-yan, B. Yunfeng, Cong Min","doi":"10.1109/RAMS.2000.816296","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816296","url":null,"abstract":"Software-reliability measurement based on failure data can provide estimations of software reliability at its present state and predictions of software reliability in the future as testing goes on. This paper analyzes the problems existed in the measurement process and proposes a practical software-reliability measurement framework based on state of the art to give relatively better software reliability predictions. Study on the validity of the modification methods i.e. the recalibration technique and the combination method also has been done. The results show that the modification methods could give better prediction results but not always, so predictive quality analysis still needs to be done.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124273103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816313
B. Scibilia, A. Kobi, R. Chassagnon, A. Barreau
The objective of this paper is to show how reliability improvement may be achieved using statistically designed experiments. Environmental stress testing has been performed on liquid crystal displays (LCDs) to identify the parameter settings that allow an increase in their lifetime. During their operating life, the LCDs are connected to electronic devices and are inserted into cases. They are used to display measurements to aircraft pilots during commercial flights. Typically the failure time was 4000 hours of flight which was considered not to be long enough. The design of experiments provided an opportunity to check whether the most likely hypothesis was correct. During the tests, degradation rates were used as a response. The effects of three factors were studied using two overlapped 2/sup 2/ orthogonal designs. A powerful spotlight located at 2.5 meters from the tested LCDs, was used to model the degradation rate. One of the factors was found to reduce dramatically the degradation rate, allowing a very substantial increase in the product lifetimes. More generally, we propose to use the slope of the degradation function as a response in designs of experiments for reliability. The advantages of doing this are that the responses are normally distributed and when the data are right censored, it does not cause as many problems as when failure times are recorded. The drawback is that the product degradation needs to be periodically monitored until an accurate estimate of the degradation rate is available, moreover the degradation function may not be linear so that a data transformation is required.
{"title":"Designed fatigue experiments to improve the reliability of liquid crystal displays","authors":"B. Scibilia, A. Kobi, R. Chassagnon, A. Barreau","doi":"10.1109/RAMS.2000.816313","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816313","url":null,"abstract":"The objective of this paper is to show how reliability improvement may be achieved using statistically designed experiments. Environmental stress testing has been performed on liquid crystal displays (LCDs) to identify the parameter settings that allow an increase in their lifetime. During their operating life, the LCDs are connected to electronic devices and are inserted into cases. They are used to display measurements to aircraft pilots during commercial flights. Typically the failure time was 4000 hours of flight which was considered not to be long enough. The design of experiments provided an opportunity to check whether the most likely hypothesis was correct. During the tests, degradation rates were used as a response. The effects of three factors were studied using two overlapped 2/sup 2/ orthogonal designs. A powerful spotlight located at 2.5 meters from the tested LCDs, was used to model the degradation rate. One of the factors was found to reduce dramatically the degradation rate, allowing a very substantial increase in the product lifetimes. More generally, we propose to use the slope of the degradation function as a response in designs of experiments for reliability. The advantages of doing this are that the responses are normally distributed and when the data are right censored, it does not cause as many problems as when failure times are recorded. The drawback is that the product degradation needs to be periodically monitored until an accurate estimate of the degradation rate is available, moreover the degradation function may not be linear so that a data transformation is required.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129931677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816330
C. K. Chan, T. Doumi, M. Tortorella
Many systems (e.g, wireless systems, routers, etc.) are designed to shut down at high operating temperatures to protect the electronics from overheating. Setting the shutdown threshold high would reduce the frequency of shutdown events, while increasing the system failure rate due to higher component junction temperatures. Setting the threshold low would reverse the relative downtime contributions from the two competing shutdown mechanisms. This work proposes a method to find an optimal threshold by minimizing the sum of the downtimes contributed by system shutdown and hot component failures. The system selected for this study is a CDMA fixed wireless system. The downtime due to component failures is estimated using a proportional hazards model with a time-dependent junction temperature as the covariate. The junction temperature of a RF output transistor in the power amplifier is used to compute the probability of shutdown. Combining the downtimes from shutdown and component failures, we demonstrate that an optimal threshold can be found by minimizing the total system downtime. The proposed method is useful for choosing a shutdown threshold at the design stage of a system.
{"title":"Power-related failure mechanisms in the analysis of wireless system availability","authors":"C. K. Chan, T. Doumi, M. Tortorella","doi":"10.1109/RAMS.2000.816330","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816330","url":null,"abstract":"Many systems (e.g, wireless systems, routers, etc.) are designed to shut down at high operating temperatures to protect the electronics from overheating. Setting the shutdown threshold high would reduce the frequency of shutdown events, while increasing the system failure rate due to higher component junction temperatures. Setting the threshold low would reverse the relative downtime contributions from the two competing shutdown mechanisms. This work proposes a method to find an optimal threshold by minimizing the sum of the downtimes contributed by system shutdown and hot component failures. The system selected for this study is a CDMA fixed wireless system. The downtime due to component failures is estimated using a proportional hazards model with a time-dependent junction temperature as the covariate. The junction temperature of a RF output transistor in the power amplifier is used to compute the probability of shutdown. Combining the downtimes from shutdown and component failures, we demonstrate that an optimal threshold can be found by minimizing the total system downtime. The proposed method is useful for choosing a shutdown threshold at the design stage of a system.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"312 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113986540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816324
J. Fragola
Forecasting the future is can never be considered as an exact science. However if the tools of risk assessment are used to develop such forecasts in a systematic and coherent fashion, and if they properly take into account the uncertainty in the achievement of the promised benefits of future designs, then, not only can the decision making process be made more tractable and orderly, but design alternatives, which are not immediately apparent, may also come to light. In this paper, the author forecasts the reliability and safety of future space transportation systems.
{"title":"Forecasting the reliability and safety of future space transportation systems","authors":"J. Fragola","doi":"10.1109/RAMS.2000.816324","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816324","url":null,"abstract":"Forecasting the future is can never be considered as an exact science. However if the tools of risk assessment are used to develop such forecasts in a systematic and coherent fashion, and if they properly take into account the uncertainty in the achievement of the promised benefits of future designs, then, not only can the decision making process be made more tractable and orderly, but design alternatives, which are not immediately apparent, may also come to light. In this paper, the author forecasts the reliability and safety of future space transportation systems.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128840100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816283
A. Berlot, S. Desbruslais, M. Meniconi
The submarine line terminal equipment (SLTE) is part of the land-based equipment of a submarine telecommunications network. It is considered to be a repairable system and is housed in the terminal station (TS). This study is concerned with the methodology for the calculation of the unavailability of the SLTE. The traditionally-accepted method of calculating the unavailability of the SLTE is to assume an unlimited number of spares in the TS. Because of the rapidly increasing capacity of submarine networks, it is becoming more important to quantify accurately the unavailability of the equipment, taking into account the exact limited number of spares provided. Furthermore, the spares replacement policy has a bearing on unavailability. The Markov method is used to model the system and to calculate the unavailability, the results are supported using Monte-Carlo simulations. Simplified formulae are derived to approximate the results. Numerical examples are presented to show the advantage of introducing a central store and to validate the approximations.
{"title":"Unavailability of a repairable system with one or two replacement options [submarine telecommunication network]","authors":"A. Berlot, S. Desbruslais, M. Meniconi","doi":"10.1109/RAMS.2000.816283","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816283","url":null,"abstract":"The submarine line terminal equipment (SLTE) is part of the land-based equipment of a submarine telecommunications network. It is considered to be a repairable system and is housed in the terminal station (TS). This study is concerned with the methodology for the calculation of the unavailability of the SLTE. The traditionally-accepted method of calculating the unavailability of the SLTE is to assume an unlimited number of spares in the TS. Because of the rapidly increasing capacity of submarine networks, it is becoming more important to quantify accurately the unavailability of the equipment, taking into account the exact limited number of spares provided. Furthermore, the spares replacement policy has a bearing on unavailability. The Markov method is used to model the system and to calculate the unavailability, the results are supported using Monte-Carlo simulations. Simplified formulae are derived to approximate the results. Numerical examples are presented to show the advantage of introducing a central store and to validate the approximations.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133392252","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816311
M. Marseguerra, E. Zio
In this paper we present an approach, based on the use of genetic algorithms, to determining the optimal system configuration, where the choices can include also k-out-of-n:G schemes. In our work, the objective function used to measure the fitness of a proposed solution is the net profit of system operation for a given mission time. The net profit is obtained by subtracting from the service revenue all the costs associated with the system implementation and operation, i.e. component acquisition and repair costs, system downtime costs, accident costs to restore external environmental conditions and refund from losses in case of an accident. The objective function so designed accounts implicitly for any availability and reliability constraints through the system downtime and accident costs, respectively. Mathematically, then, the problem becomes a search in the system configuration space of that design which maximizes the objective function. In this work, the optimization algorithm is applied to a simple system, for validation purposes. The system is chosen in such a way that the objective function can be computed analytically and the configuration which maximises it can be found by inspection. The results obtained analytically are compared to those obtained by the genetic algorithm and confirm the good performance of the methodology implemented.
{"title":"System design optimization by genetic algorithms","authors":"M. Marseguerra, E. Zio","doi":"10.1109/RAMS.2000.816311","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816311","url":null,"abstract":"In this paper we present an approach, based on the use of genetic algorithms, to determining the optimal system configuration, where the choices can include also k-out-of-n:G schemes. In our work, the objective function used to measure the fitness of a proposed solution is the net profit of system operation for a given mission time. The net profit is obtained by subtracting from the service revenue all the costs associated with the system implementation and operation, i.e. component acquisition and repair costs, system downtime costs, accident costs to restore external environmental conditions and refund from losses in case of an accident. The objective function so designed accounts implicitly for any availability and reliability constraints through the system downtime and accident costs, respectively. Mathematically, then, the problem becomes a search in the system configuration space of that design which maximizes the objective function. In this work, the optimization algorithm is applied to a simple system, for validation purposes. The system is chosen in such a way that the objective function can be computed analytically and the configuration which maximises it can be found by inspection. The results obtained analytically are compared to those obtained by the genetic algorithm and confirm the good performance of the methodology implemented.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134272084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816309
Claudio M. Rocco, A. J. Miller, J. A. Moreno, Néstor Carrasquero
This paper proposes an innovative approach using cellular evolutionary strategies (CES) to solve three types of reliability optimization problems: redundancy (number of redundant components), component reliability, and both redundancy and component reliability. In general, these problems are formulated as mixed-integer nonlinear programming problems with one or several constraints. CES combine evolution strategy techniques with concepts from cellular automata (CA) to solve optimization problems. CES were designed to find the global optimum or "near" optimum for complex multi-modal functions where traditional optimization techniques have shown poor performances, or simply have failed. The new technique has been applied to several typical problems with results better than previously reported and very close to the optimum solution.
{"title":"A cellular evolutionary approach applied to reliability optimization of complex systems","authors":"Claudio M. Rocco, A. J. Miller, J. A. Moreno, Néstor Carrasquero","doi":"10.1109/RAMS.2000.816309","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816309","url":null,"abstract":"This paper proposes an innovative approach using cellular evolutionary strategies (CES) to solve three types of reliability optimization problems: redundancy (number of redundant components), component reliability, and both redundancy and component reliability. In general, these problems are formulated as mixed-integer nonlinear programming problems with one or several constraints. CES combine evolution strategy techniques with concepts from cellular automata (CA) to solve optimization problems. CES were designed to find the global optimum or \"near\" optimum for complex multi-modal functions where traditional optimization techniques have shown poor performances, or simply have failed. The new technique has been applied to several typical problems with results better than previously reported and very close to the optimum solution.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126307897","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2000-01-24DOI: 10.1109/RAMS.2000.816317
Fengbin Sun, W.C. Chang
This paper presents a reliability evaluation on an ASIC (application specific integrated circuit) flash RAM using an accelerated life test. The accelerated stress applied on the life test is a combination of temperature and humidity using a step-stress profile. Reliability assessment is conducted by using the Peck combination model to quantify the acceleration factors, and convert the operation cycles at various high temperature and humidity conditions to the equivalent cycles at normal operation condition. The Weibull analysis is also conducted based on the cumulative equivalent test time for each PCB. Mean time to failure (MTTF) and the cumulative failure probabilities were calculated for one-year operation, five-year operation, and the 40000 power on- and-off cycles of design specification. The technique of the accelerated life test and reliability assessment presented in this paper can be used in other similar programs and reliability assessment.
{"title":"Reliability evaluation of a flash RAM using step-stress test results","authors":"Fengbin Sun, W.C. Chang","doi":"10.1109/RAMS.2000.816317","DOIUrl":"https://doi.org/10.1109/RAMS.2000.816317","url":null,"abstract":"This paper presents a reliability evaluation on an ASIC (application specific integrated circuit) flash RAM using an accelerated life test. The accelerated stress applied on the life test is a combination of temperature and humidity using a step-stress profile. Reliability assessment is conducted by using the Peck combination model to quantify the acceleration factors, and convert the operation cycles at various high temperature and humidity conditions to the equivalent cycles at normal operation condition. The Weibull analysis is also conducted based on the cumulative equivalent test time for each PCB. Mean time to failure (MTTF) and the cumulative failure probabilities were calculated for one-year operation, five-year operation, and the 40000 power on- and-off cycles of design specification. The technique of the accelerated life test and reliability assessment presented in this paper can be used in other similar programs and reliability assessment.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134163367","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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