The binary inductive voltage dividers (BIVD) have been designed as the 2:1 ratio reference at frequencies up to 1MHz. In this paper, the BIVDs are described in detail together with the calibration of their ratio errors by a substitution method. The measurement results of the BIVDs have also been given at frequencies from 1 kHz to 1MHz.
{"title":"Self-calibration of the binary inductive voltage divider at frequencies up to 1MHz","authors":"Xianlin Pan, Zhiguo Tu, Hao Li, Shuguang Cao, Jiangtao Zhang, Deshi Zhang","doi":"10.1109/CPEM.2014.6898609","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898609","url":null,"abstract":"The binary inductive voltage dividers (BIVD) have been designed as the 2:1 ratio reference at frequencies up to 1MHz. In this paper, the BIVDs are described in detail together with the calibration of their ratio errors by a substitution method. The measurement results of the BIVDs have also been given at frequencies from 1 kHz to 1MHz.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"230 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127952752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898438
R. Lapuh, B. Voljc, M. Kokalj, B. Pinter, Z. Svetik, M. Lindic
This paper describes comparison and performance of two time-domain windowed RMS value estimators. Selection of the estimator and the window used for estimating sampled repetitive arbitrary waveform is the compromise between estimator error and resulting estimate standard deviation.
{"title":"Measurement of repetitive arbitrary waveform RMS value","authors":"R. Lapuh, B. Voljc, M. Kokalj, B. Pinter, Z. Svetik, M. Lindic","doi":"10.1109/CPEM.2014.6898438","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898438","url":null,"abstract":"This paper describes comparison and performance of two time-domain windowed RMS value estimators. Selection of the estimator and the window used for estimating sampled repetitive arbitrary waveform is the compromise between estimator error and resulting estimate standard deviation.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130139363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898270
S. Edwards
A novel method for precision scaling of currents for use in AC watt and watthour measurements. The technique pays particular attention to keeping the effect of the magnitude and phase errors of the scaling well below 1 μW/VA or 1 μWh/VAh in the watt and watthour measurements.
{"title":"A novel method of current scaling for AC watt and watthour","authors":"S. Edwards","doi":"10.1109/CPEM.2014.6898270","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898270","url":null,"abstract":"A novel method for precision scaling of currents for use in AC watt and watthour measurements. The technique pays particular attention to keeping the effect of the magnitude and phase errors of the scaling well below 1 μW/VA or 1 μWh/VAh in the watt and watthour measurements.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128953589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898586
Z. Li, Z. Zhang, Q. He, B. Han, Y. Lu, J. Xu, S. Li, C. Li, G. Wang, T. Zeng, Y. Bai
The Joule balance method to measure the Planck constant and redefine the Kilogram ultimately has been going on at the National Institute of Metrology of China (NIM) since 2007. The first prototype has been built to check the feasibility of the principle. In 2012, the relative uncertainty of the plank constant measurement result is at 10-5 level. Self-heating of the coils, swing of the coil, etc., are the main uncertainty contributions. Recently, some improvements have been done to decrease these uncertainties. The uncertainty of the Joule balance is decreased from 7.7×10-5 obtained at 2012 to 8.9×10-6 at present. The plank constant measured with Joule balance is h=6.6261041×10-34Js. The relative difference between it and CODATA2010 recommendation value is 5×10-6. At the same time, the design and key component test of the 2nd generation Joule balance are also in progress and presented here briefly.
{"title":"The progress of Joule balance at the National Institute of Metrology","authors":"Z. Li, Z. Zhang, Q. He, B. Han, Y. Lu, J. Xu, S. Li, C. Li, G. Wang, T. Zeng, Y. Bai","doi":"10.1109/CPEM.2014.6898586","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898586","url":null,"abstract":"The Joule balance method to measure the Planck constant and redefine the Kilogram ultimately has been going on at the National Institute of Metrology of China (NIM) since 2007. The first prototype has been built to check the feasibility of the principle. In 2012, the relative uncertainty of the plank constant measurement result is at 10-5 level. Self-heating of the coils, swing of the coil, etc., are the main uncertainty contributions. Recently, some improvements have been done to decrease these uncertainties. The uncertainty of the Joule balance is decreased from 7.7×10-5 obtained at 2012 to 8.9×10-6 at present. The plank constant measured with Joule balance is h=6.6261041×10-34Js. The relative difference between it and CODATA2010 recommendation value is 5×10-6. At the same time, the design and key component test of the 2nd generation Joule balance are also in progress and presented here briefly.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131009669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898585
A. Eichenberger, H. Baumann, F. Cosandier, B. Jeckelmann, Reymond Clavel, D. Genoud, D. Reber, D. Tommasini
In the context of the future definition of the mass unit, a promising approach is to link the kilogram to the Planck constant using, for example a watt balance. The Federal Institute of Metrology METAS is pursuing this route and is currently setting up a second version of the experiment. This METAS watt balance Mark II experiment is now assembled and ready for the first experimental tests. The design and the operation are described in this paper, and the first results should be available at the time of the conference.
{"title":"The METAS watt balance Mark II experiment: Progress report","authors":"A. Eichenberger, H. Baumann, F. Cosandier, B. Jeckelmann, Reymond Clavel, D. Genoud, D. Reber, D. Tommasini","doi":"10.1109/CPEM.2014.6898585","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898585","url":null,"abstract":"In the context of the future definition of the mass unit, a promising approach is to link the kilogram to the Planck constant using, for example a watt balance. The Federal Institute of Metrology METAS is pursuing this route and is currently setting up a second version of the experiment. This METAS watt balance Mark II experiment is now assembled and ready for the first experimental tests. The design and the operation are described in this paper, and the first results should be available at the time of the conference.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130994193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898440
A. Manninen, P. Helisto, H. Sipola, L. Roschier, I. Iisakka, P. Immonen
This paper describes our work with two applications of microelectromechanical systems (MEMS): a sensitive voltmeter that can be used e.g. as a null detector, and a stand-alone AC voltage reference. Both applications are based on the pull-in effect in a moving-plate capacitor.
{"title":"Null detector and AC voltage reference based on MEMS","authors":"A. Manninen, P. Helisto, H. Sipola, L. Roschier, I. Iisakka, P. Immonen","doi":"10.1109/CPEM.2014.6898440","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898440","url":null,"abstract":"This paper describes our work with two applications of microelectromechanical systems (MEMS): a sensitive voltmeter that can be used e.g. as a null detector, and a stand-alone AC voltage reference. Both applications are based on the pull-in effect in a moving-plate capacitor.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132950245","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898368
Dongxue Dai, Xiaobing He, Pan Jin, Wei Wang
This paper describes the dielectric material and the structure of the standard capacitance box (decade capacitor) developed by NIM with the capacitance range of 1pF to 0.1μF and the accuracy of 50ppm at 1 kHz. High stability and high accuracy of the standard capacitance box mainly derives from a choice of dielectric materials that are fused-silica and nano-ceramic, and each capacitor in the box contained a constant temperature control system. Special decade switch with the three-terminal full shield structure can eliminate the capacitance variance caused by the stray capacitance so that higher accuracy and lower zero capacitance can be achieved.
{"title":"Development of high accuracy standard capacitance box","authors":"Dongxue Dai, Xiaobing He, Pan Jin, Wei Wang","doi":"10.1109/CPEM.2014.6898368","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898368","url":null,"abstract":"This paper describes the dielectric material and the structure of the standard capacitance box (decade capacitor) developed by NIM with the capacitance range of 1pF to 0.1μF and the accuracy of 50ppm at 1 kHz. High stability and high accuracy of the standard capacitance box mainly derives from a choice of dielectric materials that are fused-silica and nano-ceramic, and each capacitor in the box contained a constant temperature control system. Special decade switch with the three-terminal full shield structure can eliminate the capacitance variance caused by the stray capacitance so that higher accuracy and lower zero capacitance can be achieved.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133389613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898298
M. S. Bessa, R. S. França, M. Torres
A mix of modern automated, non-invasive minimum-changing approaches was designed to improve temperature measurement speed and metrological reliability for interferometric measurements using good performance old temperature bridge system, which was based on clever combination of hybrid thermocouple plus platinum resistance measurements, good overall electrical stability, and periodic verifications. A Labview application was developed to accurate, continuous and simultaneous time acquisition of voltage signals at different sensors and system points through a multi-channel interfaceable multimeter, maintaining original features. That allows cross validation of both systems with best length calibration uncertainties and calibration practices using fixed points cells as temperature primary references.
{"title":"Upgrade of high accuracy hybrid DC temperature bridge for interferometric length measurements","authors":"M. S. Bessa, R. S. França, M. Torres","doi":"10.1109/CPEM.2014.6898298","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898298","url":null,"abstract":"A mix of modern automated, non-invasive minimum-changing approaches was designed to improve temperature measurement speed and metrological reliability for interferometric measurements using good performance old temperature bridge system, which was based on clever combination of hybrid thermocouple plus platinum resistance measurements, good overall electrical stability, and periodic verifications. A Labview application was developed to accurate, continuous and simultaneous time acquisition of voltage signals at different sensors and system points through a multi-channel interfaceable multimeter, maintaining original features. That allows cross validation of both systems with best length calibration uncertainties and calibration practices using fixed points cells as temperature primary references.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133457321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898501
N. Kaneko, T. Oe, Wan-Seop Kim, D. Chae, R. Elmquist, M. Kraft
This paper describes a study on the transportation effect using four 100 Ω standard resistors of a new construction. All resistors have been transported by air: two of the resistors in hand-carried luggage and the other two by normal air freight. The standards have been measured by three national metrology institutes, the Korean Research Institute of Standards, the National Institute of Standards and Technology in USA and the National Metrology Institute of Japan by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 μΩ/Ω and performance suitable for international comparisons of this type of resistors has been demonstrated.
{"title":"Transportation effect of Ni-Cr based metal-foil standard resistors in a trilateral comparison pilot study between KRISS, NIST, and NMIJ","authors":"N. Kaneko, T. Oe, Wan-Seop Kim, D. Chae, R. Elmquist, M. Kraft","doi":"10.1109/CPEM.2014.6898501","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898501","url":null,"abstract":"This paper describes a study on the transportation effect using four 100 Ω standard resistors of a new construction. All resistors have been transported by air: two of the resistors in hand-carried luggage and the other two by normal air freight. The standards have been measured by three national metrology institutes, the Korean Research Institute of Standards, the National Institute of Standards and Technology in USA and the National Metrology Institute of Japan by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 μΩ/Ω and performance suitable for international comparisons of this type of resistors has been demonstrated.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133126435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898502
F. Ahlers, J. Kučera, W. Poirier, B. Jeanneret, A. Satrapinski, A. Tzalenchuk, P. Vrabcek, T. Bergsten, C. Hwang, R. Yakimova, S. Kubatkin
A new joint research project (JRP) integrating metrology institutes and universities from nine countries is aimed at realization of a new generation of standards for quantum resistance metrology. The project exploits graphene's properties to simplify operation of standards without compromising the unprecedented precision delivered by semiconductor quantum Hall devices. Higher operating temperatures (above 4.2 K, and up to 8 K) and together with lower magnetic fields (below 5 T, and potentially down to 2 T) will lead to a significantly improved and cost-saving dissemination of intrinsically referenced resistance standards to all end-users relying on electrical measurements.
{"title":"The EMRP project GraphOhm - Towards quantum resistance metrology based on graphene","authors":"F. Ahlers, J. Kučera, W. Poirier, B. Jeanneret, A. Satrapinski, A. Tzalenchuk, P. Vrabcek, T. Bergsten, C. Hwang, R. Yakimova, S. Kubatkin","doi":"10.1109/CPEM.2014.6898502","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898502","url":null,"abstract":"A new joint research project (JRP) integrating metrology institutes and universities from nine countries is aimed at realization of a new generation of standards for quantum resistance metrology. The project exploits graphene's properties to simplify operation of standards without compromising the unprecedented precision delivered by semiconductor quantum Hall devices. Higher operating temperatures (above 4.2 K, and up to 8 K) and together with lower magnetic fields (below 5 T, and potentially down to 2 T) will lead to a significantly improved and cost-saving dissemination of intrinsically referenced resistance standards to all end-users relying on electrical measurements.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"86 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128875494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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