Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131599
A. Gaita, Georgian Nicolae, E. David, Andi Buzo, C. Burileanu, G. Pelz
This paper proposes a method for speeding-up the verification process of integrated circuits, featuring waveform clustering of circuit response signals. The main objective is to automatically separate the signals into distinct groups that potentially exhibit visual similarities in order to aid the visual inspection/verification. As a first step, the proposed method extracts SIFT-like features by finding stable points of the signal over the scale space and computing robust descriptors able to describe their neighborhood. The resulted descriptors are quantized in order to be used in the clustering process as bag-of-words histograms. We demonstrate the validity of our method on a circuit waveform database containing several thousands of signals belonging to ten electrical tests.
{"title":"A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification","authors":"A. Gaita, Georgian Nicolae, E. David, Andi Buzo, C. Burileanu, G. Pelz","doi":"10.1109/ETS48528.2020.9131599","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131599","url":null,"abstract":"This paper proposes a method for speeding-up the verification process of integrated circuits, featuring waveform clustering of circuit response signals. The main objective is to automatically separate the signals into distinct groups that potentially exhibit visual similarities in order to aid the visual inspection/verification. As a first step, the proposed method extracts SIFT-like features by finding stable points of the signal over the scale space and computing robust descriptors able to describe their neighborhood. The resulted descriptors are quantized in order to be used in the clustering process as bag-of-words histograms. We demonstrate the validity of our method on a circuit waveform database containing several thousands of signals belonging to ten electrical tests.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114976553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131597
Daniel Oliveira, S. Blanchard, Nathan Debardeleben, F. Santos, Gabriel Piscoya Dávila, P. Navaux, C. Cazzaniga, C. Frost, R. Baumann, P. Rech
The high performance, high efficiency, and low cost of Commercial Off-The-Shelf (COTS) devices make them attractive for applications with strict reliability constraints. Today, COTS devices are adopted in HPC and safety-critical applications such as autonomous driving. Unfortunately, the cheap natural Boron widely used in COTS chip manufacturing process makes them highly susceptible to thermal (low energy) neutrons. In this paper, we demonstrate that thermal neutrons are a significant threat to COTS device reliability. For our study, we consider an AMD APU, three NVIDIA GPUs, an Intel accelerator, and an FPGA executing a relevant set of algorithms. We consider different scenarios that impact the thermal neutron flux such as weather, concrete walls and floors, and HPC liquid cooling systems. We show that thermal neutrons FIT rate could be comparable to the high energy neutron FIT rate.
{"title":"Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications","authors":"Daniel Oliveira, S. Blanchard, Nathan Debardeleben, F. Santos, Gabriel Piscoya Dávila, P. Navaux, C. Cazzaniga, C. Frost, R. Baumann, P. Rech","doi":"10.1109/ETS48528.2020.9131597","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131597","url":null,"abstract":"The high performance, high efficiency, and low cost of Commercial Off-The-Shelf (COTS) devices make them attractive for applications with strict reliability constraints. Today, COTS devices are adopted in HPC and safety-critical applications such as autonomous driving. Unfortunately, the cheap natural Boron widely used in COTS chip manufacturing process makes them highly susceptible to thermal (low energy) neutrons. In this paper, we demonstrate that thermal neutrons are a significant threat to COTS device reliability. For our study, we consider an AMD APU, three NVIDIA GPUs, an Intel accelerator, and an FPGA executing a relevant set of algorithms. We consider different scenarios that impact the thermal neutron flux such as weather, concrete walls and floors, and HPC liquid cooling systems. We show that thermal neutrons FIT rate could be comparable to the high energy neutron FIT rate.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124943992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131601
S. Mhamdi, P. Girard, A. Virazel, A. Bosio, A. Ladhar
In this paper, we propose a new framework for cell-aware defect diagnosis of customer returns based on supervised learning. The proposed method comprehensively deals with static and dynamic defects that may occur in real circuits. A Naive Bayes classifier is used to precisely identify defect candidates. Results obtained on benchmark circuits, and comparison with a commercial cell-aware diagnosis tool, demonstrate the efficiency of the proposed approach in terms of accuracy and resolution.
{"title":"Learning-Based Cell-Aware Defect Diagnosis of Customer Returns","authors":"S. Mhamdi, P. Girard, A. Virazel, A. Bosio, A. Ladhar","doi":"10.1109/ETS48528.2020.9131601","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131601","url":null,"abstract":"In this paper, we propose a new framework for cell-aware defect diagnosis of customer returns based on supervised learning. The proposed method comprehensively deals with static and dynamic defects that may occur in real circuits. A Naive Bayes classifier is used to precisely identify defect candidates. Results obtained on benchmark circuits, and comparison with a commercial cell-aware diagnosis tool, demonstrate the efficiency of the proposed approach in terms of accuracy and resolution.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126991525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131592
G. D. Natale, O. Keren
A hardware-based control flow monitoring technique enables to detect both errors in the control flow and the instruction stream being executed on a processor. However, as was shown in recent papers, these techniques fail to detect malicious carefully-tuned manipulation of the instruction stream in a basic block. This paper presents a non-linear encoder and checker that can cope with this weakness.
{"title":"Nonlinear Codes for Control Flow Checking","authors":"G. D. Natale, O. Keren","doi":"10.1109/ETS48528.2020.9131592","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131592","url":null,"abstract":"A hardware-based control flow monitoring technique enables to detect both errors in the control flow and the instruction stream being executed on a processor. However, as was shown in recent papers, these techniques fail to detect malicious carefully-tuned manipulation of the instruction stream in a basic block. This paper presents a non-linear encoder and checker that can cope with this weakness.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131265175","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131585
Bartosz Kaczmarek, Grzegorz Mrugalski, N. Mukherjee, J. Rajski, Lukasz Rybak, J. Tyszer
As the use of electronic components grows rapidly in the automotive industry, the number of complex safety-critical devices used in advanced driver assistance systems or autonomous cars is rising with high-end models containing more than 200 embedded microcontrollers. Achieving functionally safe automotive electronics requires test solutions that address challenges posed by high quality and long-term reliability requirements mandated, for example, by the ISO 26262 standard. The paper presents test pattern generation schemes for a scan-based logic BIST optimizing test coverage and test time during in-system test applications for automotive ICs. As a part of overall safety, they help in ensuring reliable operations of vehicle's electronics throughout their lifecycles. The proposed schemes can be deployed in different modes of in-system testing, including key-off, key-on, and periodic (incremental) online tests. Experimental results obtained for automotive designs and reported herein show improvements in test quality over conventional logic BIST schemes.
{"title":"Test Sequence-Optimized BIST for Automotive Applications","authors":"Bartosz Kaczmarek, Grzegorz Mrugalski, N. Mukherjee, J. Rajski, Lukasz Rybak, J. Tyszer","doi":"10.1109/ETS48528.2020.9131585","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131585","url":null,"abstract":"As the use of electronic components grows rapidly in the automotive industry, the number of complex safety-critical devices used in advanced driver assistance systems or autonomous cars is rising with high-end models containing more than 200 embedded microcontrollers. Achieving functionally safe automotive electronics requires test solutions that address challenges posed by high quality and long-term reliability requirements mandated, for example, by the ISO 26262 standard. The paper presents test pattern generation schemes for a scan-based logic BIST optimizing test coverage and test time during in-system test applications for automotive ICs. As a part of overall safety, they help in ensuring reliable operations of vehicle's electronics throughout their lifecycles. The proposed schemes can be deployed in different modes of in-system testing, including key-off, key-on, and periodic (incremental) online tests. Experimental results obtained for automotive designs and reported herein show improvements in test quality over conventional logic BIST schemes.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"241 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134403138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131578
Amir Alipour, V. Beroulle, B. Cambou, J. Danger, G. D. Natale, D. Hély, S. Guilley, Naghmeh Karimi
Physically Unclonable Functions (PUFs) allow to extract unique fingerprints from silicon chips. The applications are numerous: chip identification, chip master key extraction, authentication protocol, unique seeding, etc. However, secure usage of PUF requires some precautions. This paper reviews industrial concerns associated with PUF operation, including those occurring before and after market. Namely, starting from PUF “secure” specifications, aligned with state-of-the-art standards, we explore innovative techniques to handle enrollment and subsequent PUF queries, in nominal as well as in adversarial environment.
{"title":"PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community","authors":"Amir Alipour, V. Beroulle, B. Cambou, J. Danger, G. D. Natale, D. Hély, S. Guilley, Naghmeh Karimi","doi":"10.1109/ETS48528.2020.9131578","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131578","url":null,"abstract":"Physically Unclonable Functions (PUFs) allow to extract unique fingerprints from silicon chips. The applications are numerous: chip identification, chip master key extraction, authentication protocol, unique seeding, etc. However, secure usage of PUF requires some precautions. This paper reviews industrial concerns associated with PUF operation, including those occurring before and after market. Namely, starting from PUF “secure” specifications, aligned with state-of-the-art standards, we explore innovative techniques to handle enrollment and subsequent PUF queries, in nominal as well as in adversarial environment.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130174933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ets48528.2020.9131572
{"title":"Copyright","authors":"","doi":"10.1109/ets48528.2020.9131572","DOIUrl":"https://doi.org/10.1109/ets48528.2020.9131572","url":null,"abstract":"","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116882603","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ets48528.2020.9131569
{"title":"ETS 2020 Foreword","authors":"","doi":"10.1109/ets48528.2020.9131569","DOIUrl":"https://doi.org/10.1109/ets48528.2020.9131569","url":null,"abstract":"","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"508 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123199258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131577
Mehmet Ince, S. Ozev
With the increasing complexity of electronic components in critical applications, pressure on single components to have zero defects is also increasing. Thus there is a need to explore built-in self-test and other non-traditional test techniques for mixed-signal circuits, such as data converters, phase locked loops and power converters. In this paper, we present an extremely low cost, digital built-in self-test methodology for Low Dropout Regulators (LDO), specifically used for defect detection. The technique relies on perturbing the LDO loop at the reference voltage input via pseudo random binary sequence which has white noise characteristics and cross correlating the output of LDO with input excitation using only digital circuits, thus inducing low power and area overhead. The built-in self-test technique together with an LDO is designed using 65nm TMSC technology. Transistor level structural fault simulations display that all inserted faults can be detected even if they do not change the DC level of the LDO output.
{"title":"Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators","authors":"Mehmet Ince, S. Ozev","doi":"10.1109/ETS48528.2020.9131577","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131577","url":null,"abstract":"With the increasing complexity of electronic components in critical applications, pressure on single components to have zero defects is also increasing. Thus there is a need to explore built-in self-test and other non-traditional test techniques for mixed-signal circuits, such as data converters, phase locked loops and power converters. In this paper, we present an extremely low cost, digital built-in self-test methodology for Low Dropout Regulators (LDO), specifically used for defect detection. The technique relies on perturbing the LDO loop at the reference voltage input via pseudo random binary sequence which has white noise characteristics and cross correlating the output of LDO with input excitation using only digital circuits, thus inducing low power and area overhead. The built-in self-test technique together with an LDO is designed using 65nm TMSC technology. Transistor level structural fault simulations display that all inserted faults can be detected even if they do not change the DC level of the LDO output.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130230611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-01DOI: 10.1109/ETS48528.2020.9131557
A. Bosio, S. Carlo, P. Girard, Ernesto Sánchez, A. Savino, L. Sekanina, Marcello Traiola, Z. Vašíček, A. Virazel
Today, the concept of approximation in computing is becoming more and more a “hot topic” to investigate how computing systems can be more energy efficient, faster, and less complex. Intuitively, instead of performing exact computations and, consequently, requiring a high amount of resources, Approximate Computing aims at selectively relaxing the specifications, trading accuracy off for efficiency. While Approximate Computing gives several promises when looking at systems' performance, energy efficiency and complexity, it poses significant challenges regarding the design, the verification, the test and the in-field reliability of Approximate Computing systems. This tutorial paper covers these aspects leveraging the experience of the authors in the field to present state-of-the-art solutions to apply during the different development phases of an Approximate Computing system.
{"title":"Design, Verification, Test and In-Field Implications of Approximate Computing Systems","authors":"A. Bosio, S. Carlo, P. Girard, Ernesto Sánchez, A. Savino, L. Sekanina, Marcello Traiola, Z. Vašíček, A. Virazel","doi":"10.1109/ETS48528.2020.9131557","DOIUrl":"https://doi.org/10.1109/ETS48528.2020.9131557","url":null,"abstract":"Today, the concept of approximation in computing is becoming more and more a “hot topic” to investigate how computing systems can be more energy efficient, faster, and less complex. Intuitively, instead of performing exact computations and, consequently, requiring a high amount of resources, Approximate Computing aims at selectively relaxing the specifications, trading accuracy off for efficiency. While Approximate Computing gives several promises when looking at systems' performance, energy efficiency and complexity, it poses significant challenges regarding the design, the verification, the test and the in-field reliability of Approximate Computing systems. This tutorial paper covers these aspects leveraging the experience of the authors in the field to present state-of-the-art solutions to apply during the different development phases of an Approximate Computing system.","PeriodicalId":267309,"journal":{"name":"2020 IEEE European Test Symposium (ETS)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125317659","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：