This introductory tutorial presents an overview of simulation to manufacturing design and scheduling. A review of the modeling considerations in both application areas is provided. Finally, a number of example applications will be presented to illustrate the concepts.
{"title":"Manufacturing simulation: introduction to manufacturing simulation","authors":"Scott A. Miller, C. D. Pegden","doi":"10.5555/510378.510392","DOIUrl":"https://doi.org/10.5555/510378.510392","url":null,"abstract":"This introductory tutorial presents an overview of simulation to manufacturing design and scheduling. A review of the modeling considerations in both application areas is provided. Finally, a number of example applications will be presented to illustrate the concepts.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128937679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The work described in this paper attempts to validate the implicit assumption in traditional flow shop scheduling research that there is a buffer of infinite capacity between any two adjacent machines. The modified NEH (Nawaz, Encore and Ham) algorithm is used to generate an initial permutation schedule which is then improved by tabu search. For any given sequence, a limited equal buffer size is considered in computing job completion times. The scheduling objective is to minimize mean job flowtime. Computational results and analysis are presented. Through these simulation experiments, it was found that the improvement by tabu search can be significant and there is no need for more than 4 buffer spaces between any two adjacent machines. Future research directions are also discussed.
{"title":"Simulation in production scheduling: scheduling flow-shops with limited buffer spaces","authors":"M. Weng","doi":"10.5555/510378.510576","DOIUrl":"https://doi.org/10.5555/510378.510576","url":null,"abstract":"The work described in this paper attempts to validate the implicit assumption in traditional flow shop scheduling research that there is a buffer of infinite capacity between any two adjacent machines. The modified NEH (Nawaz, Encore and Ham) algorithm is used to generate an initial permutation schedule which is then improved by tabu search. For any given sequence, a limited equal buffer size is considered in computing job completion times. The scheduling objective is to minimize mean job flowtime. Computational results and analysis are presented. Through these simulation experiments, it was found that the improvement by tabu search can be significant and there is no need for more than 4 buffer spaces between any two adjacent machines. Future research directions are also discussed.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127176303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
P. Barry, P. Zimmerman, J. Metzger, F. Hartman, C. Porubcansky, J. Stewart
Panelists respond to three questions, "How does your DoD initiative promise to increase readiness for the fighting forces?", "Where will the distributed simulation technology in your program take us by 2005?" and "What changes in available DoD infrastructure would facilitate the use of the system(s) emerging from your program?" The panelists include senior members of the Department of Defense civilian management team working in the Modeling and Simulation field.
{"title":"DoD initiatives in distributed simulation technology: a panel discussion","authors":"P. Barry, P. Zimmerman, J. Metzger, F. Hartman, C. Porubcansky, J. Stewart","doi":"10.1109/WSC.2000.899911","DOIUrl":"https://doi.org/10.1109/WSC.2000.899911","url":null,"abstract":"Panelists respond to three questions, \"How does your DoD initiative promise to increase readiness for the fighting forces?\", \"Where will the distributed simulation technology in your program take us by 2005?\" and \"What changes in available DoD infrastructure would facilitate the use of the system(s) emerging from your program?\" The panelists include senior members of the Department of Defense civilian management team working in the Modeling and Simulation field.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"522 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123569653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Discrete event simulation is frequently time-consuming either because modern dynamic systems, such as telecommunication networks, are becoming increasingly complex and/or a great number of observations is required to yield reasonably accurate results. An interesting approach to reduce the time duration of simulation is that of concurrently running multiple replications in parallel (MRIP) on a number of processors connected via networking and averaging the results adequately. We present the results of our research on the suitability of batch-means-based procedures in such distributed stochastic simulation.
{"title":"A perspective of batching methods in a simulation environment of multiple replications in parallel","authors":"Edjair Mota, A. Wolisz, K. Pawlikowski","doi":"10.1109/WSC.2000.899845","DOIUrl":"https://doi.org/10.1109/WSC.2000.899845","url":null,"abstract":"Discrete event simulation is frequently time-consuming either because modern dynamic systems, such as telecommunication networks, are becoming increasingly complex and/or a great number of observations is required to yield reasonably accurate results. An interesting approach to reduce the time duration of simulation is that of concurrently running multiple replications in parallel (MRIP) on a number of processors connected via networking and averaging the results adequately. We present the results of our research on the suitability of batch-means-based procedures in such distributed stochastic simulation.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131551608","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Briefly describes genetic algorithms (GAs) and focuses attention on initial population generation methods for 2D knapsack problems. Based on work describing the probability that a random solution vector is feasible for 0-1 knapsack problems, we propose a simple heuristic for randomly generating good initial populations for GA applications to 2D knapsack problems. We report on an experiment comparing a current population generation technique with our proposed approach and find our proposed approach does a very good job of generating good initial populations.
{"title":"A Monte-Carlo study of genetic algorithm initial population generation methods","authors":"R. Hill","doi":"10.1145/324138.324430","DOIUrl":"https://doi.org/10.1145/324138.324430","url":null,"abstract":"Briefly describes genetic algorithms (GAs) and focuses attention on initial population generation methods for 2D knapsack problems. Based on work describing the probability that a random solution vector is feasible for 0-1 knapsack problems, we propose a simple heuristic for randomly generating good initial populations for GA applications to 2D knapsack problems. We report on an experiment comparing a current population generation technique with our proposed approach and find our proposed approach does a very good job of generating good initial populations.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125816204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This paper describes the application of prototyping and rapid development techniques to the support of real operations when meeting a specific military requirement. The Exclusion Zone Model (EZM) has been selected as a case study as it illustrates how the techniques can be applied, while highlighting the problems encountered by developers operating in a highly reactive environment.
{"title":"The exclusion zone model—a development methodology","authors":"P. Rendell, A. Cowdale","doi":"10.1145/324898.325009","DOIUrl":"https://doi.org/10.1145/324898.325009","url":null,"abstract":"This paper describes the application of prototyping and rapid development techniques to the support of real operations when meeting a specific military requirement. The Exclusion Zone Model (EZM) has been selected as a case study as it illustrates how the techniques can be applied, while highlighting the problems encountered by developers operating in a highly reactive environment.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116588115","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This paper shows which statistical techniques can be used to validate simulation models, depending on which real-life data are available. Concerning this availability, three situations are distinguished: (i) no data; (ii) only output data; and (iii) both input and output data. In case (i)-no real data-the analysts can still experiment with the simulation model to obtain simulated data; such an experiment should be guided by the statistical theory on the design of experiments. In case (ii) only output data-real and simulated output data can be compared through the well-known two-sample Student t statistic or certain other statistics. In case (iii)-input and output data-trace-driven simulation becomes possible, but validation should not proceed in the popular way (make a scatter plot with real and simulated outputs, fit a line, and test whether that line has unit slope and passes through the origin); alternative regression and bootstrap procedures are presented. Several case studies are summarized, to illustrate the three types of situations.
{"title":"Validation of models: statistical techniques and data availability","authors":"J. Kleijnen","doi":"10.1145/324138.324450","DOIUrl":"https://doi.org/10.1145/324138.324450","url":null,"abstract":"This paper shows which statistical techniques can be used to validate simulation models, depending on which real-life data are available. Concerning this availability, three situations are distinguished: (i) no data; (ii) only output data; and (iii) both input and output data. In case (i)-no real data-the analysts can still experiment with the simulation model to obtain simulated data; such an experiment should be guided by the statistical theory on the design of experiments. In case (ii) only output data-real and simulated output data can be compared through the well-known two-sample Student t statistic or certain other statistics. In case (iii)-input and output data-trace-driven simulation becomes possible, but validation should not proceed in the popular way (make a scatter plot with real and simulated outputs, fit a line, and test whether that line has unit slope and passes through the origin); alternative regression and bootstrap procedures are presented. Several case studies are summarized, to illustrate the three types of situations.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128460362","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We review progress on a project to evaluate prospective operations in a semiconductor wafer fab that employs next generation, proximity X-ray lithography to pattern the critical dimensions of computer chips. A simulation model is developed that captures the processing of wafers through an X-ray lithography cell using a synchrotron as the source of exposure radiation. The model incorporates the best current information on unit-cell design and processing times and implements a range of events that interrupt the flow of wafers processing on the cell. Performance measures estimated from the simulation include the weekly throughput for the cell and the frequency of SEMI E-10 equipment states for the corresponding exposure tool. Simulation experiments are conducted to compare the performance of a cell fabricating 200 mm wafers with that of a cell fabricating 300 mm wafers, for each of three different chip sizes. Results illustrate the anticipated dependence of average wafer throughput on wafer size and assumptions regarding the number of chips per wafer, with a maximum of approximately 3400 wafers/week for 200 mm wafers with 25/spl times/25 mm field size. Ignoring wafer-sort losses, however, a maximum throughput of approximately 410,000 chips/week is realized for 300 mm wafers with 11/spl times/22 mm fields. Remarkably, the distribution of equipment states remains relatively unchanged across simulation experiments.
{"title":"Operational simulation of an x-ray lithography cell: comparison of 200mm and 300mm wafers","authors":"K. White, W. Trybula","doi":"10.1145/324138.324540","DOIUrl":"https://doi.org/10.1145/324138.324540","url":null,"abstract":"We review progress on a project to evaluate prospective operations in a semiconductor wafer fab that employs next generation, proximity X-ray lithography to pattern the critical dimensions of computer chips. A simulation model is developed that captures the processing of wafers through an X-ray lithography cell using a synchrotron as the source of exposure radiation. The model incorporates the best current information on unit-cell design and processing times and implements a range of events that interrupt the flow of wafers processing on the cell. Performance measures estimated from the simulation include the weekly throughput for the cell and the frequency of SEMI E-10 equipment states for the corresponding exposure tool. Simulation experiments are conducted to compare the performance of a cell fabricating 200 mm wafers with that of a cell fabricating 300 mm wafers, for each of three different chip sizes. Results illustrate the anticipated dependence of average wafer throughput on wafer size and assumptions regarding the number of chips per wafer, with a maximum of approximately 3400 wafers/week for 200 mm wafers with 25/spl times/25 mm field size. Ignoring wafer-sort losses, however, a maximum throughput of approximately 410,000 chips/week is realized for 300 mm wafers with 11/spl times/22 mm fields. Remarkably, the distribution of equipment states remains relatively unchanged across simulation experiments.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132266019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Describes the context for and creation of a strategic planning model of a major US railway. The key factors in choosing a system dynamics approach are presented, and the synergy between the new model and the existing suite of planning applications is highlighted. The overall structure of the model is reviewed, including the key reinforcing and balancing loops, and model creation issues, such as level of aggregation, are discussed. The methodology followed in the data collection and calibration phases is described in detail, and samples of calibration metrics and sensitivity testing parameters are provided, as well as sample model output. Lastly, potential future uses of the model are noted.
{"title":"Evaluating strategies to improve railroad performance—a system dynamics approach","authors":"J. Homer, T. Keane, N.O. Lukiantseva, D. Bell","doi":"10.1145/324898.325034","DOIUrl":"https://doi.org/10.1145/324898.325034","url":null,"abstract":"Describes the context for and creation of a strategic planning model of a major US railway. The key factors in choosing a system dynamics approach are presented, and the synergy between the new model and the existing suite of planning applications is highlighted. The overall structure of the model is reviewed, including the key reinforcing and balancing loops, and model creation issues, such as level of aggregation, are discussed. The methodology followed in the data collection and calibration phases is described in detail, and samples of calibration metrics and sensitivity testing parameters are provided, as well as sample model output. Lastly, potential future uses of the model are noted.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132716218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Semiconductor factories are very expensive to build and operate. It is critical to understand how to design and operate them efficiently. We describe a simulation model of a planned 300mm wafer fabrication line that we are using to make strategic decisions related to the factory.
{"title":"A model of a 300mm wafer fabrication line","authors":"P. Campbell, D. Rohan, E. MacNair","doi":"10.1145/324138.324554","DOIUrl":"https://doi.org/10.1145/324138.324554","url":null,"abstract":"Semiconductor factories are very expensive to build and operate. It is critical to understand how to design and operate them efficiently. We describe a simulation model of a planned 300mm wafer fabrication line that we are using to make strategic decisions related to the factory.","PeriodicalId":287132,"journal":{"name":"Online World Conference on Soft Computing in Industrial Applications","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114924012","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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