Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473578
Ning Li, Zhanhuai Li, Lijun Zhang
Software defects are usually detected by inspection,black-box testing or white-box testing. Current software defect mining work focuses on mining frequent patterns without distinguishing these different kinds of defects, and mining with respect to defect type can only give limited guidance on software development due to overly broad classification of defect type. In this paper, we present four kinds of frequent patterns from defects detected by black-box testing (called black-box defect) based on a kind of detailed classification named ODC-BD (Orthogonal Defect Classification for Blackbox Defect). The frequent patterns include the top 10 conditions (data or operation) which most easily result in defects or severe defects, the top 10 defect phenomena which most frequently occur and have a great impact on users, association rules between function modules and defect types. We aim to help project managers, black-box testers and developers improve the efficiency of software defect detection and analysis using these frequent patterns. Our study is based on 5023 defect reports from 56 large industrial projects and 2 open source projects.
软件缺陷通常通过检查、黑盒测试或白盒测试来检测。当前的软件缺陷挖掘工作关注于挖掘频繁的模式，而没有区分这些不同类型的缺陷，并且由于缺陷类型的分类过于宽泛，关于缺陷类型的挖掘只能对软件开发提供有限的指导。本文基于一种名为ODC-BD (Orthogonal defect classification for Blackbox defect)的详细分类方法，给出了黑盒测试中检测到的缺陷(称为黑盒缺陷)的四种常见模式。频繁模式包括最容易导致缺陷或严重缺陷的前10个条件(数据或操作)、最频繁发生且对用户影响最大的前10个缺陷现象、功能模块之间的关联规则和缺陷类型。我们的目标是帮助项目经理、黑盒测试人员和开发人员使用这些频繁的模式来提高软件缺陷检测和分析的效率。我们的研究是基于来自56个大型工业项目和2个开源项目的5023个缺陷报告。
{"title":"Mining Frequent Patterns from Software Defect Repositories for Black-Box Testing","authors":"Ning Li, Zhanhuai Li, Lijun Zhang","doi":"10.1109/IWISA.2010.5473578","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473578","url":null,"abstract":"Software defects are usually detected by inspection,black-box testing or white-box testing. Current software defect mining work focuses on mining frequent patterns without distinguishing these different kinds of defects, and mining with respect to defect type can only give limited guidance on software development due to overly broad classification of defect type. In this paper, we present four kinds of frequent patterns from defects detected by black-box testing (called black-box defect) based on a kind of detailed classification named ODC-BD (Orthogonal Defect Classification for Blackbox Defect). The frequent patterns include the top 10 conditions (data or operation) which most easily result in defects or severe defects, the top 10 defect phenomena which most frequently occur and have a great impact on users, association rules between function modules and defect types. We aim to help project managers, black-box testers and developers improve the efficiency of software defect detection and analysis using these frequent patterns. Our study is based on 5023 defect reports from 56 large industrial projects and 2 open source projects.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130733076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473314
Chuiwei Lu, Chao Gao, Honghua Wu, Zhao-hai Zhang, Junhua He
routing failure problem seriously declines the stability and working efficiency of P2P network. We find less routing failure are caused by malicious attacks, but most routing failure result from several reasons, such as high join/leave rate of nodes, inhomogeneous distribution of nodes, and performance deference among nodes. The paper proposed an improved de Bruijn graph, which own region aggregate and inhomogeneous characteristics, and well match the practical internet circumstance. We use the graph to descript the P2P network structure, which highly weaken the conditions that will lead to routing failure. Theoretic deduction implies that the strategy has many available merits, and can effectively deal with routing failure.
{"title":"An Optimal Strategy of Fault-Tolerant Routing Based on Inhomogeneous Directional de Bruijn Graph","authors":"Chuiwei Lu, Chao Gao, Honghua Wu, Zhao-hai Zhang, Junhua He","doi":"10.1109/IWISA.2010.5473314","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473314","url":null,"abstract":"routing failure problem seriously declines the stability and working efficiency of P2P network. We find less routing failure are caused by malicious attacks, but most routing failure result from several reasons, such as high join/leave rate of nodes, inhomogeneous distribution of nodes, and performance deference among nodes. The paper proposed an improved de Bruijn graph, which own region aggregate and inhomogeneous characteristics, and well match the practical internet circumstance. We use the graph to descript the P2P network structure, which highly weaken the conditions that will lead to routing failure. Theoretic deduction implies that the strategy has many available merits, and can effectively deal with routing failure.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130763799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473549
Jingmiao Zhang, Xianzun Meng
It is a newer research hotspot using digital image recognition technology to solve the fabric defect in textile enterprises in recent years. Adopting image-recognition technology, through the fabric digital image preprocessing and recognition，measured the fabric defects, stored the related information in order to achieve fabric defect detection automatic, improved the efficiency of defect detection. Fabric defect detection system mainly included three parts: The first, the fabric image acquisition, pre-processing part. The second, the identifier, measurement and storage defect of fabric defect. The third, control mechanism automatically accomplished defect location and identifier. Simulation experiment analysis shows that the time consumption using in image processing algorithms can meet the real-time detection requirements.
{"title":"A Fabric Defect Detection System Based on Image Recognition","authors":"Jingmiao Zhang, Xianzun Meng","doi":"10.1109/IWISA.2010.5473549","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473549","url":null,"abstract":"It is a newer research hotspot using digital image recognition technology to solve the fabric defect in textile enterprises in recent years. Adopting image-recognition technology, through the fabric digital image preprocessing and recognition，measured the fabric defects, stored the related information in order to achieve fabric defect detection automatic, improved the efficiency of defect detection. Fabric defect detection system mainly included three parts: The first, the fabric image acquisition, pre-processing part. The second, the identifier, measurement and storage defect of fabric defect. The third, control mechanism automatically accomplished defect location and identifier. Simulation experiment analysis shows that the time consumption using in image processing algorithms can meet the real-time detection requirements.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130779959","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473504
Yu-kui Li, W. Xing, Baoning Gao
Using the soda-lime glass as substrate, the improved printed cold-cathode emitters were prepared for the field emission display device. The indium-tin-oxide film over the substrate surface was divided into discrete indium-tin-oxide stripes. With the screen-printing process, the two parallel silver electrodes were fabricated on one indium-tin-oxide stripes and the carbon nanotube was prepared over the silver electrode surface. It was found that the carbon nanotube on the edge of cathode electrode would emit more electrons. For preventing the damage of carbon nanotube cathode, the previous silver slurry baking process was adopted. Then, the baked silver slurry layer and the printed carbon nanotube pastes would be simultaneous sintered. The detailed fabrication and vacuum-packaging process for the whole display device were also given. The fully-sealed display device possessed better field emission property and high display brightness for the green phosphor, whose fabrication process was simple and low-cost.
{"title":"Field Emission Property Studies and Fabrication of Diode FED with Improved Cold-Cathode Emitter","authors":"Yu-kui Li, W. Xing, Baoning Gao","doi":"10.1109/IWISA.2010.5473504","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473504","url":null,"abstract":"Using the soda-lime glass as substrate, the improved printed cold-cathode emitters were prepared for the field emission display device. The indium-tin-oxide film over the substrate surface was divided into discrete indium-tin-oxide stripes. With the screen-printing process, the two parallel silver electrodes were fabricated on one indium-tin-oxide stripes and the carbon nanotube was prepared over the silver electrode surface. It was found that the carbon nanotube on the edge of cathode electrode would emit more electrons. For preventing the damage of carbon nanotube cathode, the previous silver slurry baking process was adopted. Then, the baked silver slurry layer and the printed carbon nanotube pastes would be simultaneous sintered. The detailed fabrication and vacuum-packaging process for the whole display device were also given. The fully-sealed display device possessed better field emission property and high display brightness for the green phosphor, whose fabrication process was simple and low-cost.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130792511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473466
Yi Xiu, Zhen-kai Wan, Wenlu Cao
Parametric pattern-making technology has based on procedural process for past decades in the field of GCAD. This paper presents a new method of parametric pattern-making technology. This method firstly finds out the constraint relations among geometric entities by analyzing the rules and sequences of geometric entities in pattern-making operation and confirms the local and whole well-constraint in pattern with geometric constraint principle, secondly represents the geometric constraints in pattern as a constraint graph and depicts the data structure of constraint graph with adjacent table, finally builds a parametric pattern-making model. The solving algorithm of the model implements the entity-edited and size-driven function. The experiments show the model is feasible and effective.
{"title":"Parametric Pattern-Making Modeling Based on Constraint and Graph","authors":"Yi Xiu, Zhen-kai Wan, Wenlu Cao","doi":"10.1109/IWISA.2010.5473466","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473466","url":null,"abstract":"Parametric pattern-making technology has based on procedural process for past decades in the field of GCAD. This paper presents a new method of parametric pattern-making technology. This method firstly finds out the constraint relations among geometric entities by analyzing the rules and sequences of geometric entities in pattern-making operation and confirms the local and whole well-constraint in pattern with geometric constraint principle, secondly represents the geometric constraints in pattern as a constraint graph and depicts the data structure of constraint graph with adjacent table, finally builds a parametric pattern-making model. The solving algorithm of the model implements the entity-edited and size-driven function. The experiments show the model is feasible and effective.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131020965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473457
Xiang Zhang, Changjiang Zhang
A new feature point extraction method for the image feature point matching is proposed. The proposed method is based on the corner detection method with curvature scale space (CSS). This method can accurately extract the image corner points in different positions and directions. In order to accurately match the corner points of two images, an overall restricted condition, which combines angle difference, gray level difference, relative distance and normalized correlation coefficient of the two matched corner points, is used to improve the matching accuracy. Finally, genetic algorithm is used to obtain the optimal registration parameters. The optimal registration parameters are used to accurately match the two images. The experimental results show that the proposed method can accurately match the images and better than traditional image registration method.
{"title":"Image Registration by Curvature Shape Representation and Genetic Algorithm","authors":"Xiang Zhang, Changjiang Zhang","doi":"10.1109/IWISA.2010.5473457","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473457","url":null,"abstract":"A new feature point extraction method for the image feature point matching is proposed. The proposed method is based on the corner detection method with curvature scale space (CSS). This method can accurately extract the image corner points in different positions and directions. In order to accurately match the corner points of two images, an overall restricted condition, which combines angle difference, gray level difference, relative distance and normalized correlation coefficient of the two matched corner points, is used to improve the matching accuracy. Finally, genetic algorithm is used to obtain the optimal registration parameters. The optimal registration parameters are used to accurately match the two images. The experimental results show that the proposed method can accurately match the images and better than traditional image registration method.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"311 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131679454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473348
Jianqun Cui, Keming Jia, Libing Wu
Topology-aware application layer multicast takes the real underlying physical network connections into consideration while constructing multicast tree. The aim is to shorten end-to-end data forwarding delay, but it may lead to some end systems with high bandwidth close to the source node need to provide data forwarding service for many sub-nodes, and finally become the bottleneck of the multicast tree. To balance the requirement mentioned above, we propose a more comprehensive problem model MDDLRB (Minimum Delay, Degree-Limited Residual-Balanced) to construct application layer multicast spanning tree. Furthermore, to solve the MDDLRB problem, we present a heuristic algorithm based on delay increment and equilibrium optimization strategy. The simulation results show that the algorithm can get a better system performance.
{"title":"Residual-Balanced Spanning Tree Problem of Topology-Aware ALM","authors":"Jianqun Cui, Keming Jia, Libing Wu","doi":"10.1109/IWISA.2010.5473348","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473348","url":null,"abstract":"Topology-aware application layer multicast takes the real underlying physical network connections into consideration while constructing multicast tree. The aim is to shorten end-to-end data forwarding delay, but it may lead to some end systems with high bandwidth close to the source node need to provide data forwarding service for many sub-nodes, and finally become the bottleneck of the multicast tree. To balance the requirement mentioned above, we propose a more comprehensive problem model MDDLRB (Minimum Delay, Degree-Limited Residual-Balanced) to construct application layer multicast spanning tree. Furthermore, to solve the MDDLRB problem, we present a heuristic algorithm based on delay increment and equilibrium optimization strategy. The simulation results show that the algorithm can get a better system performance.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"BC-22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126716917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473709
Bin Zhou, Shi-dong Fan, Da Li
According to selective maintenance theory, this paper attempts to discuss the ship spare parts inventory based on different maintenance models to minimize cost of the spare parts in the context of safe operation of the ship. For the equipment which adopts corrective maintenance, a multi-period stochastic storage model strategy is applied to solve the optimal inventory. Then, this paper take a certain time, periodic interval and lead time into account to obtain the best inventory for the equipments of periodical maintenance. The last, the grey prediction method is utilized to the equipment of condition-based maintenance in order to solve the best inventory.
{"title":"Research on Ship Spare Parts Inventory Based on Selective Maintenance","authors":"Bin Zhou, Shi-dong Fan, Da Li","doi":"10.1109/IWISA.2010.5473709","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473709","url":null,"abstract":"According to selective maintenance theory, this paper attempts to discuss the ship spare parts inventory based on different maintenance models to minimize cost of the spare parts in the context of safe operation of the ship. For the equipment which adopts corrective maintenance, a multi-period stochastic storage model strategy is applied to solve the optimal inventory. Then, this paper take a certain time, periodic interval and lead time into account to obtain the best inventory for the equipments of periodical maintenance. The last, the grey prediction method is utilized to the equipment of condition-based maintenance in order to solve the best inventory.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126874716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473320
Changjiang Long, Huan Qi, Wan Peng
The pathogenesis of chronic hepatitis B is very complex, Systems biology can help us understand it by considering the body, virus and immune system as a whole. Mathematical model including HBV, hepatocytes and the immune system was established in this paper describing the interaction of virus and immune system. The model considered not only the side that hepatitis B virus can evoke the immune system, but also the other side that hepatitis B virus can suppress the immune function by leading a high death rate of hepatitis B virus-specific Cytotoxic T lymphocytes (CTLs). The condition why the immune system fails to eliminate the virus is explained by an inequality. Four kinds of chronic hepatitis, including acute-turn-chronic hepatitis, chronic hepatitis without acute phase, recurring hepatitis and chronic hepatitis (infected at birth) were simulated to show the natural history of chronic hepatitis.
{"title":"System Dynamics of Chronic Hepatitis B - Modeling the Virus and Immune System of Chronic Hepatitis B","authors":"Changjiang Long, Huan Qi, Wan Peng","doi":"10.1109/IWISA.2010.5473320","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473320","url":null,"abstract":"The pathogenesis of chronic hepatitis B is very complex, Systems biology can help us understand it by considering the body, virus and immune system as a whole. Mathematical model including HBV, hepatocytes and the immune system was established in this paper describing the interaction of virus and immune system. The model considered not only the side that hepatitis B virus can evoke the immune system, but also the other side that hepatitis B virus can suppress the immune function by leading a high death rate of hepatitis B virus-specific Cytotoxic T lymphocytes (CTLs). The condition why the immune system fails to eliminate the virus is explained by an inequality. Four kinds of chronic hepatitis, including acute-turn-chronic hepatitis, chronic hepatitis without acute phase, recurring hepatitis and chronic hepatitis (infected at birth) were simulated to show the natural history of chronic hepatitis.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123464085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-05-22DOI: 10.1109/IWISA.2010.5473392
Xin Cao, Shi-dong Fan
The paper firstly emphasizes the importance of synthetic risk assessment of ships' oil spill risk and then puts forwards that neglecting environmental hazards and management deficiencies is the congenital defect of current research. The paper builds assessment model of ships′ oil spill risk based on fuzzy neural network which relates to two emphases, namely, index system and coupling assessment model. The relevant maritime data is inputted into the network, and by training, the structure and parameters of network are optimized, so we can achieve effective safety evaluation.
{"title":"The Synthetic Assessment Modeling of Ships' Oil Spill Risk Based on Fuzzy Neural Network","authors":"Xin Cao, Shi-dong Fan","doi":"10.1109/IWISA.2010.5473392","DOIUrl":"https://doi.org/10.1109/IWISA.2010.5473392","url":null,"abstract":"The paper firstly emphasizes the importance of synthetic risk assessment of ships' oil spill risk and then puts forwards that neglecting environmental hazards and management deficiencies is the congenital defect of current research. The paper builds assessment model of ships′ oil spill risk based on fuzzy neural network which relates to two emphases, namely, index system and coupling assessment model. The relevant maritime data is inputted into the network, and by training, the structure and parameters of network are optimized, so we can achieve effective safety evaluation.","PeriodicalId":298764,"journal":{"name":"2010 2nd International Workshop on Intelligent Systems and Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121552691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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