Molded metallic mirrors manufactured by the so-called Optic-Replication Technique (ORT) are developed since a quite long time (ref 1-2-3) for various applications. Such mirrors are particularly attractive when attempt are made to consider large number of identical components associated with a low cost investment.
{"title":"Replicated Mirrors for High Fluence Laser Application","authors":"M. Novaro, M. Berger, H. Floch, A. Roussel","doi":"10.1364/oft.1990.owb3","DOIUrl":"https://doi.org/10.1364/oft.1990.owb3","url":null,"abstract":"Molded metallic mirrors manufactured by the so-called Optic-Replication Technique (ORT) are developed since a quite long time (ref 1-2-3) for various applications. Such mirrors are particularly attractive when attempt are made to consider large number of identical components associated with a low cost investment.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121368962","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The National Ignition Facility is a next generation inertial confinement laser which will need approximately 7,000 large, square aperture optics with a clear aperture of approximately 430 mm on a side. The optics utilized in the laser required a unique set of wavefront specifications because of the extremely high fluences and nonlinear processes that affect the wavefront intensity evolution at these extreme power densities. The optical wavefront specification for these large optics is subdivided into specific spatial frequency regions, the lowest part defined in terms of a RMS wavefront gradient and the higher spatial frequencies limited to not exceed a maximum Power Spectral Density (PSD) defined in greater detail elsewhere.1 In order to verify that these spatial frequency wavefront specifications have been met, the NIF Program has contracted to Veeco Process Metrology (formerly Wyko) a 24-inch phase modulating interferometer capable of extremely high spatial frequency resolution to measure PSD over an operational range of 0.03 to 1.25 mm-1.2 This instrument is a standard Fizeau configuration interferometer with a linearly polarized 650-nm DFB diode laser source and a 1024 x 1024 pixel CCD detector. The optical imaging system has two fixed zoom settings, the lowest corresponding to a spatial viewing area of 431 x 431 mm square centered within the 24-inch diameter fused silica transmission sphere. The high spatial frequency zoom setting provides a 100 mm x 100 mm square aperture with a diffraction limited imaging lens designed to have an MTF > 0.9 at 0.4 mm-1 and MTF > 0.6 at 1.25 mm-1.
国家点火装置是下一代惯性约束激光器，它将需要大约7000个大的方形孔径光学器件，单侧的清晰孔径约为430毫米。由于在这些极端功率密度下，极高的影响和非线性过程会影响波前强度演变，因此激光器中使用的光学器件需要一套独特的波前规格。这些大型光学器件的光波前规格被细分为特定的空间频率区域，最低的部分根据RMS波前梯度定义，而较高的空间频率限制在不超过最大功率谱密度(PSD)，在其他地方有更详细的定义为了验证这些空间频率波前规范已得到满足，NIF计划已与Veeco Process Metrology(原Wyko)签订了一个24英寸相位调制干涉仪的合同，该干涉仪具有极高的空间频率分辨率，能够在0.03至1.25 mm-1.2的工作范围内测量PSD。该仪器是一个标准的菲索配置干涉仪，具有线偏振650 nm DFB二极管激光源和1024 x 1024像素CCD探测器。光学成像系统有两个固定的变焦设置，最低对应于一个431 × 431毫米正方形的空间观看区域，中心在24英寸直径熔融石英传输球。高空间频率变焦设置提供了一个100mm × 100mm的方形孔径和衍射限制成像镜头，设计为在0.4 mm-1时MTF > 0.9，在1.25 mm-1时MTF > 0.6。
{"title":"Preliminary performance data from a high spatial frequency resolution 24-inch interferometer","authors":"P. Wilkins, M. McBurney, E. Novak","doi":"10.1364/oft.1998.owc.3","DOIUrl":"https://doi.org/10.1364/oft.1998.owc.3","url":null,"abstract":"The National Ignition Facility is a next generation inertial confinement laser which will need approximately 7,000 large, square aperture optics with a clear aperture of approximately 430 mm on a side. The optics utilized in the laser required a unique set of wavefront specifications because of the extremely high fluences and nonlinear processes that affect the wavefront intensity evolution at these extreme power densities. The optical wavefront specification for these large optics is subdivided into specific spatial frequency regions, the lowest part defined in terms of a RMS wavefront gradient and the higher spatial frequencies limited to not exceed a maximum Power Spectral Density (PSD) defined in greater detail elsewhere.1 In order to verify that these spatial frequency wavefront specifications have been met, the NIF Program has contracted to Veeco Process Metrology (formerly Wyko) a 24-inch phase modulating interferometer capable of extremely high spatial frequency resolution to measure PSD over an operational range of 0.03 to 1.25 mm-1.2 This instrument is a standard Fizeau configuration interferometer with a linearly polarized 650-nm DFB diode laser source and a 1024 x 1024 pixel CCD detector. The optical imaging system has two fixed zoom settings, the lowest corresponding to a spatial viewing area of 431 x 431 mm square centered within the 24-inch diameter fused silica transmission sphere. The high spatial frequency zoom setting provides a 100 mm x 100 mm square aperture with a diffraction limited imaging lens designed to have an MTF > 0.9 at 0.4 mm-1 and MTF > 0.6 at 1.25 mm-1.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129147635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Optical products will continue to be particularly interesting from an economic point of view. However, in addition to the established markets, solutions in the field of micro-technology will increase in importance. The use of complex micro-lenses in laser technology (high-performance diode lasers), in information technology (fibre couplers) and in medical technology (endoscopy) are examples of such applications.
{"title":"Diamond Turning of Optical Glass - New Technologies for the Machining of Micro-Optical Elements","authors":"F. Klocke, O. Rübenach","doi":"10.1364/oft.1998.otue.3","DOIUrl":"https://doi.org/10.1364/oft.1998.otue.3","url":null,"abstract":"Optical products will continue to be particularly interesting from an economic point of view. However, in addition to the established markets, solutions in the field of micro-technology will increase in importance. The use of complex micro-lenses in laser technology (high-performance diode lasers), in information technology (fibre couplers) and in medical technology (endoscopy) are examples of such applications.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114581243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Computer integrated manufacturing and flexible machining cells are making big inroads in the enthusiastic revival of american industry. Improved productivity, efficiency and costs along with an increased awareness of quality and ownership are key ingredients associated with marriage and implementation of the CIM/product cell concept.
{"title":"Computer Integrated Optical Fabrication Cells","authors":"W. Czajkowski, Jim Cirasuolo","doi":"10.1364/oft.1988.wb3","DOIUrl":"https://doi.org/10.1364/oft.1988.wb3","url":null,"abstract":"Computer integrated manufacturing and flexible machining cells are making big inroads in the enthusiastic revival of american industry. Improved productivity, efficiency and costs along with an increased awareness of quality and ownership are key ingredients associated with marriage and implementation of the CIM/product cell concept.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116263509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Over the past five years, several optical production methods have been perfected to the point where they can now be reliably used for cost effective production of complex optical surfaces. Most of the improvements were made in production machines that now rely heavily on the use of CNC controllers. Concurrent improvements in metrology complemented these developments.
{"title":"Modern Production Methods for Complex Surfaces","authors":"H. Karow","doi":"10.1364/oft.1998.owa.1","DOIUrl":"https://doi.org/10.1364/oft.1998.owa.1","url":null,"abstract":"Over the past five years, several optical production methods have been perfected to the point where they can now be reliably used for cost effective production of complex optical surfaces. Most of the improvements were made in production machines that now rely heavily on the use of CNC controllers. Concurrent improvements in metrology complemented these developments.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114663783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Golini, J. Lambropoulos, M. Atwood, Maynard B. Smith, F. Schmid, C. Khattak
Sapphire missile domes and plane parallel optical windows have had important military applications for many years, yet have been plagued by high manufacturing costs, primarily due to the material’s extreme fracture toughness, microhardness, abrasion resistance and critical load. Simply put, the attributes that make sapphire an attractive window material, also make it quite difficult to grind. In addition to its useful mechanical properties, sapphire has excellent thermal shock resistance, chemical stability at high temperature, a melting point in excess of 2000 degrees C, and good transmission from the UV through 3-5 microns. Studies to optimize precision microgrinding of sapphire will not only lead to more affordable tough durable multi-spectral military windows, but also will aid in an improved understanding of the grinding process for all optical materials.
{"title":"Sapphire Grinding Study","authors":"D. Golini, J. Lambropoulos, M. Atwood, Maynard B. Smith, F. Schmid, C. Khattak","doi":"10.1364/oft.1996.ofa.4","DOIUrl":"https://doi.org/10.1364/oft.1996.ofa.4","url":null,"abstract":"Sapphire missile domes and plane parallel optical windows have had important military applications for many years, yet have been plagued by high manufacturing costs, primarily due to the material’s extreme fracture toughness, microhardness, abrasion resistance and critical load. Simply put, the attributes that make sapphire an attractive window material, also make it quite difficult to grind. In addition to its useful mechanical properties, sapphire has excellent thermal shock resistance, chemical stability at high temperature, a melting point in excess of 2000 degrees C, and good transmission from the UV through 3-5 microns. Studies to optimize precision microgrinding of sapphire will not only lead to more affordable tough durable multi-spectral military windows, but also will aid in an improved understanding of the grinding process for all optical materials.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127315173","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is well known that the use of one or more chemical etching steps during the fabrication cycle of glass-like materials reduces the subsurface damage introduced by loose and bound abrasive grinding. The etchant removes the outermost layer which consists of subsurface cracks and residual elastic strain. We are interested in applying this technique to a commercial phosphate laser glass as a means of increasing its thermal fracture resistance and reducing the time required for final polishing.
{"title":"Chemo-Mechanical Polishing of Phosphate Glass as a Pretreatment to Rapid Final Polishing","authors":"A. Lindquist, S. Jacobs, V. Plotsker","doi":"10.1364/oft.1988.wc5","DOIUrl":"https://doi.org/10.1364/oft.1988.wc5","url":null,"abstract":"It is well known that the use of one or more chemical etching steps during the fabrication cycle of glass-like materials reduces the subsurface damage introduced by loose and bound abrasive grinding. The etchant removes the outermost layer which consists of subsurface cracks and residual elastic strain. We are interested in applying this technique to a commercial phosphate laser glass as a means of increasing its thermal fracture resistance and reducing the time required for final polishing.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126183949","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. Miki, N. Suzuki, M. Adachi, Y. Nakai, I. Kawaguchi
A scanning type optical precision profilometer is proposed. By Calculating the difference of the measured height at a point and its surrounding areas, it gives the roughness profile nearly independent of vertical vibrations. The height variation of a point and areas are measured from the interfered light intensity variation using a photomultiplier tube and three Si photo diodes arranged on the image plane of the interference microscope. The performance of the profilometer is checked from the roughness measurements of the aluminum substrate for hard disc, the aluminized optical flat, a Si-wafer, and the step standard calibrated by a stylus instrument. As a result, the reproducibility of 0.5nm was verified and the step height at the grain boundary of diamond-turned aluminum disc was measured as about 2.0nm. The errors, caused by the distribution of the slight reflectivity, were reduced by using the dual polarized light interference method. The filtering effect on the profile determined by the sensor arrangement is calculated and corrected by the digital signal processing. By this correction, not only the precise roughness profile but also, the figure profile can be measured independently of vertical vibrations.
{"title":"High Precision Optical Profilometer Using the Differential Method","authors":"H. Miki, N. Suzuki, M. Adachi, Y. Nakai, I. Kawaguchi","doi":"10.1364/oft.1988.tha3","DOIUrl":"https://doi.org/10.1364/oft.1988.tha3","url":null,"abstract":"A scanning type optical precision profilometer is proposed. By Calculating the difference of the measured height at a point and its surrounding areas, it gives the roughness profile nearly independent of vertical vibrations. The height variation of a point and areas are measured from the interfered light intensity variation using a photomultiplier tube and three Si photo diodes arranged on the image plane of the interference microscope. The performance of the profilometer is checked from the roughness measurements of the aluminum substrate for hard disc, the aluminized optical flat, a Si-wafer, and the step standard calibrated by a stylus instrument. As a result, the reproducibility of 0.5nm was verified and the step height at the grain boundary of diamond-turned aluminum disc was measured as about 2.0nm. The errors, caused by the distribution of the slight reflectivity, were reduced by using the dual polarized light interference method. The filtering effect on the profile determined by the sensor arrangement is calculated and corrected by the digital signal processing. By this correction, not only the precise roughness profile but also, the figure profile can be measured independently of vertical vibrations.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"210 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124710355","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
As our society becomes increasingly information-oriented, various high-tech devices are developed to support its growth. As these high-tech devices become more and more advanced and compact in the recent years, the optical and electronic part, which make up these devices also need to be more accurate and smaller. These parts are commonly ground by loose abrasive lapping and polishing, but these methods have such disadvantages as wastewater processing problem, mechanical damages, wear by scatting abrasives, dirty workplace, and difficulty in using different grains on the same machine. For these reasons, new grinding methods are required as alternatives to the finishing method using loose abrasives. To answer to such needs, the authors have proposed a lap grinding method applying the electrically in-process dressing1) (ELID-lap grinding2)) and are carrying out studies to realize efficient and highly accurate machining. The latest bonding system which is composed of metal and resin was investigated for the ELID-lap grinding in order to improve the grinding quality by addition of the vibration absorbing function during grinding operation3). In this paper, Si which is typical material for X-ray mirror, was ground using metal-resin bonded wheels with different grain sizes, and the grinding characteristics were investigated.
{"title":"Ultraprecision Smooth Surface Finishing with ELID-Iap Grinding using Metal-Resin Bonded Wheels","authors":"Nobuhide Itoh, H. Ohmori, T. Kasai, T. Karaki-Doy","doi":"10.1364/oft.1998.otuc.4","DOIUrl":"https://doi.org/10.1364/oft.1998.otuc.4","url":null,"abstract":"As our society becomes increasingly information-oriented, various high-tech devices are developed to support its growth. As these high-tech devices become more and more advanced and compact in the recent years, the optical and electronic part, which make up these devices also need to be more accurate and smaller. These parts are commonly ground by loose abrasive lapping and polishing, but these methods have such disadvantages as wastewater processing problem, mechanical damages, wear by scatting abrasives, dirty workplace, and difficulty in using different grains on the same machine. For these reasons, new grinding methods are required as alternatives to the finishing method using loose abrasives. To answer to such needs, the authors have proposed a lap grinding method applying the electrically in-process dressing1) (ELID-lap grinding2)) and are carrying out studies to realize efficient and highly accurate machining. The latest bonding system which is composed of metal and resin was investigated for the ELID-lap grinding in order to improve the grinding quality by addition of the vibration absorbing function during grinding operation3). In this paper, Si which is typical material for X-ray mirror, was ground using metal-resin bonded wheels with different grain sizes, and the grinding characteristics were investigated.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128142576","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We describe an actively stressed lap for polishing fast aspheric mirrors to high accuracy. The lap is being used to polish a 1.8-m f/1 paraboloid.
介绍了一种用于快速非球面镜面高精度抛光的主动应力圈。该lap被用来抛光一个1.8米的f/1抛物面。
{"title":"Polishing with a Stressed Lap","authors":"H. Martin, J. R. Angel","doi":"10.1364/oft.1990.jtub1","DOIUrl":"https://doi.org/10.1364/oft.1990.jtub1","url":null,"abstract":"We describe an actively stressed lap for polishing fast aspheric mirrors to high accuracy. The lap is being used to polish a 1.8-m f/1 paraboloid.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126027135","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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