The 1970’s and 80’s generated considerable concern over scatter in optical systems. Although it was often recognized in advance that low scatter optics were required for a given application, the specifications were usually either non-existent (a best effort requirement) or inappropriate. The easiest, most available and cheapest scatter measurement was the Total Integrated Scatter (TIS) measurement. Until the mid-1980’s most of the specifications written to handle scatter concerns were either TIS (often given without angle limits) or rms roughness found from some sort of profile data (and given without the corresponding spatial frequency limits).
{"title":"Specifications for Low Scatter Optics","authors":"J. Stover","doi":"10.1364/oft.1990.othc1","DOIUrl":"https://doi.org/10.1364/oft.1990.othc1","url":null,"abstract":"The 1970’s and 80’s generated considerable concern over scatter in optical systems. Although it was often recognized in advance that low scatter optics were required for a given application, the specifications were usually either non-existent (a best effort requirement) or inappropriate. The easiest, most available and cheapest scatter measurement was the Total Integrated Scatter (TIS) measurement. Until the mid-1980’s most of the specifications written to handle scatter concerns were either TIS (often given without angle limits) or rms roughness found from some sort of profile data (and given without the corresponding spatial frequency limits).","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114062009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Recent techniques for the fabrication of fine optical components have rapidly been developed as the expansion and development of information networks around the world. Generally optical components require higher accuracies than any other parts, and the fabrication of fine optical components require special techniques additionally. So it has been very difficult to fabricate them with high efficiency and high accuracies by conventional methods.
{"title":"Micro-Fabrication Grinding of Aspheric Micro-Lens Mold with ELID (Electrolytic In-Process Dressing)","authors":"S. Moriyasu, Y. Yamagata, H. Ohmori","doi":"10.1364/FTA.1999.GA3","DOIUrl":"https://doi.org/10.1364/FTA.1999.GA3","url":null,"abstract":"Recent techniques for the fabrication of fine optical components have rapidly been developed as the expansion and development of information networks around the world. Generally optical components require higher accuracies than any other parts, and the fabrication of fine optical components require special techniques additionally. So it has been very difficult to fabricate them with high efficiency and high accuracies by conventional methods.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"453 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116078387","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Recent work has introduced the concept of scanning interference microscopy which has 3-D resolution comparable to a confocal microscope (1). This is obtained by performing interference microscopy with spatially incoherent and broadband illumination. By scanning along the optical axis, one can measure the coherence function at each point in the image. This coherence function can be processed to obtain various pieces of information. The maximum of the envelope of the coherence function corresponds to the surface height. By Fourier processing of the fringes at each point, the spectral reflectivity can be measured for that point, determining both the magnitude and the phase of the reflection as a function of wavelength. Thus a tremendous amount of information is available, but at the cost of a high processing overhead. A PC based system which provides a low cost solution with good performance will be discussed, with trade-offs between range resolution, number of points processed, and precision versus the processing time and hardware requirements analyzed. Traditionally, interferometric techniques have not been applicable to optically rough surfaces or heterogenous surfaces. This talk will discuss how scanning interference microscopy can be applied to such surfaces.
{"title":"Scanning Interference Microscopy for Surface Characterization","authors":"Byron S. Lee, T. Strand","doi":"10.1364/oft.1988.tha8","DOIUrl":"https://doi.org/10.1364/oft.1988.tha8","url":null,"abstract":"Recent work has introduced the concept of scanning interference microscopy which has 3-D resolution comparable to a confocal microscope (1). This is obtained by performing interference microscopy with spatially incoherent and broadband illumination. By scanning along the optical axis, one can measure the coherence function at each point in the image. This coherence function can be processed to obtain various pieces of information. The maximum of the envelope of the coherence function corresponds to the surface height. By Fourier processing of the fringes at each point, the spectral reflectivity can be measured for that point, determining both the magnitude and the phase of the reflection as a function of wavelength. Thus a tremendous amount of information is available, but at the cost of a high processing overhead. A PC based system which provides a low cost solution with good performance will be discussed, with trade-offs between range resolution, number of points processed, and precision versus the processing time and hardware requirements analyzed. Traditionally, interferometric techniques have not been applicable to optically rough surfaces or heterogenous surfaces. This talk will discuss how scanning interference microscopy can be applied to such surfaces.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122922450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A novel digital wavefront measuring interferomater has been developed in our group. TV camera and microcomputer are used to measure the intensities in the interference pattern and synchrously detect the phases by Fourier series method.
{"title":"Systematic Error Sources and Absolute Calibration on Digital Wavefront Measuring Interferometer","authors":"Zhu Yucong, Yang Guoguang, Dong Taihuo","doi":"10.1364/oft.1988.thb2","DOIUrl":"https://doi.org/10.1364/oft.1988.thb2","url":null,"abstract":"A novel digital wavefront measuring interferomater has been developed in our group. TV camera and microcomputer are used to measure the intensities in the interference pattern and synchrously detect the phases by Fourier series method.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129999524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The 1.2 m secondary mirror for the Sloan Digital Sky Survey Telescope (SDSS) is the first mirror to be fabricated using a new process and facility at the Steward Observatory Mirror Lab. We write this summary during the loose-abrasive grinding stage, which is guided by mechanical profilometry. At the meeting we will present the status of polishing and optical testing.
{"title":"Fabrication of the 1.2 m Secondary Mirror for the Sloan Digital Sky Survey","authors":"B. Smith, J. Burge, H. Martin","doi":"10.1364/oft.1996.ofd.5","DOIUrl":"https://doi.org/10.1364/oft.1996.ofd.5","url":null,"abstract":"The 1.2 m secondary mirror for the Sloan Digital Sky Survey Telescope (SDSS) is the first mirror to be fabricated using a new process and facility at the Steward Observatory Mirror Lab. We write this summary during the loose-abrasive grinding stage, which is guided by mechanical profilometry. At the meeting we will present the status of polishing and optical testing.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127773841","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Standardization is aimed at an internationally uniform application of terms, formulas, symbols and nomenclature to avoid misunderstandings or even unfair competition. In addition, standardization of measuring equipment avoids undetected systematic errors of different magnitude which may affect the accuracy of the measurement results obtained. Finally, standardization of measurement parameters allows measurement results obtained with instruments made by different manufacturers to be more easily compared. Standardization of test methods thus is a prerequisite for a fair quality assessment of products, and apart from being of technical and scientific interest, it is also of great commercial importance.
{"title":"ISO Standards on Optical Test Methods","authors":"K. Rosenbruch","doi":"10.1364/oft.1988.fa2","DOIUrl":"https://doi.org/10.1364/oft.1988.fa2","url":null,"abstract":"Standardization is aimed at an internationally uniform application of terms, formulas, symbols and nomenclature to avoid misunderstandings or even unfair competition. In addition, standardization of measuring equipment avoids undetected systematic errors of different magnitude which may affect the accuracy of the measurement results obtained. Finally, standardization of measurement parameters allows measurement results obtained with instruments made by different manufacturers to be more easily compared. Standardization of test methods thus is a prerequisite for a fair quality assessment of products, and apart from being of technical and scientific interest, it is also of great commercial importance.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127904117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
When manufacturing optical surfaces in brittle materials, it is often convenient to estimate the quality of the resulting surface without extensive manufacturing experiments. Such estimates include the rate of material removal, as well as typical measures of surface quality, for example surface roughness and subsurface damage. In addition, the ground surface may be in a state of residual stress which will induce an overall curvature to an optical component, especially if its aspect ratio is large. These attributes of optics manufacturing can be estimated by using a few mechanical properties of the brittle material being ground or polished.
{"title":"Fracture and material removal mechanisms from rough grinding to polishing","authors":"J. Lambropoulos","doi":"10.1364/oft.1998.omb.1","DOIUrl":"https://doi.org/10.1364/oft.1998.omb.1","url":null,"abstract":"When manufacturing optical surfaces in brittle materials, it is often convenient to estimate the quality of the resulting surface without extensive manufacturing experiments. Such estimates include the rate of material removal, as well as typical measures of surface quality, for example surface roughness and subsurface damage. In addition, the ground surface may be in a state of residual stress which will induce an overall curvature to an optical component, especially if its aspect ratio is large. These attributes of optics manufacturing can be estimated by using a few mechanical properties of the brittle material being ground or polished.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121230995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Many opto-mechanical components need abrasion and/or corrosion resistant surfaces. For some applications single point diamond turning is the preferred fabrication technique; however, wear of the diamond precludes use of some materials of choice.
{"title":"Diamond Turned Electro-Deposited Nickel Alloys","authors":"Christabel Evans, R. Polvani, A. Mayer","doi":"10.1364/oft.1990.jtuc4","DOIUrl":"https://doi.org/10.1364/oft.1990.jtuc4","url":null,"abstract":"Many opto-mechanical components need abrasion and/or corrosion resistant surfaces. For some applications single point diamond turning is the preferred fabrication technique; however, wear of the diamond precludes use of some materials of choice.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121669489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The Opticam computer-controlled optical surface generator1 uses a cylindrical grinding geometry. The radius of curvature of the generated surface is determined by the radius of the ring shape diamond-impregnated cutting head and its tilt angle. The edge of the ring cutter will coincide with the part vertex when the machine is aligned. When the cutter axis is not properly aligned with the part axis, the generated surface will deviate from its desired shape.
{"title":"Detection of Ring Tool Misalignment Using an Imaging Method","authors":"Tong Xie, J. Greivenkamp","doi":"10.1364/oft.1996.ofb.5","DOIUrl":"https://doi.org/10.1364/oft.1996.ofb.5","url":null,"abstract":"The Opticam computer-controlled optical surface generator1 uses a cylindrical grinding geometry. The radius of curvature of the generated surface is determined by the radius of the ring shape diamond-impregnated cutting head and its tilt angle. The edge of the ring cutter will coincide with the part vertex when the machine is aligned. When the cutter axis is not properly aligned with the part axis, the generated surface will deviate from its desired shape.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115806765","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
As the tolerances on optical figure get tighter and as the need to provide traceable test methods to fulfill ISO 9000 standards becomes greater, the more there is the need for a robust and reliable method to determine the residual error in interferometer test optics. This paper describes an inexpensive, quick and self-consistent method of calibrating spherical transmission optics where there is a real focus of the diverging test beam outside the transmission optic. The method is self-consistent in the sense that any given test result provides a means of calculating the variance of the result and requires no additional optic that must be calibrated or traced to another standard.
{"title":"Calibration of Interferometer Transmission Spheres","authors":"Robert E. Parks, C. Evans, Lianzhen Shao","doi":"10.1364/oft.1998.otuc.1","DOIUrl":"https://doi.org/10.1364/oft.1998.otuc.1","url":null,"abstract":"As the tolerances on optical figure get tighter and as the need to provide traceable test methods to fulfill ISO 9000 standards becomes greater, the more there is the need for a robust and reliable method to determine the residual error in interferometer test optics. This paper describes an inexpensive, quick and self-consistent method of calibrating spherical transmission optics where there is a real focus of the diverging test beam outside the transmission optic. The method is self-consistent in the sense that any given test result provides a means of calculating the variance of the result and requires no additional optic that must be calibrated or traced to another standard.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125788479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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