A lightweight mirror (gas-fusion bonding process) was fabricated. Blank fabrication, curve generation, grinding, polishing, tools, handling, coating and cleaning will be discussed.
{"title":"Fabrication of 32\" F/3.8 Lightweight Mirror","authors":"D. Janeczko, Rod Chapman","doi":"10.1364/oft.1988.wc8","DOIUrl":"https://doi.org/10.1364/oft.1988.wc8","url":null,"abstract":"A lightweight mirror (gas-fusion bonding process) was fabricated. Blank fabrication, curve generation, grinding, polishing, tools, handling, coating and cleaning will be discussed.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129459034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Stephan R. Clark, Michael B. North-Morris, J. Greivenkamp
Three-dimensional or x-y-z stylus profilometers are a well-established method for measuring non-rotationally symmetric aspheric surfaces.1 In this paper, the design of a three-dimensional stylus profilometer that uses an optical reference surface is presented. The benefits of using this reference structure are also discussed.
{"title":"Stylus Profilometer with an Optical Reference","authors":"Stephan R. Clark, Michael B. North-Morris, J. Greivenkamp","doi":"10.1364/oft.1998.owb.2","DOIUrl":"https://doi.org/10.1364/oft.1998.owb.2","url":null,"abstract":"Three-dimensional or x-y-z stylus profilometers are a well-established method for measuring non-rotationally symmetric aspheric surfaces.1 In this paper, the design of a three-dimensional stylus profilometer that uses an optical reference surface is presented. The benefits of using this reference structure are also discussed.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130543783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The typical lens or mirror requirement to control surface roughness is Rq (Geometric Average Roughness, Root-Mean-Square Roughness, RMS Roughness, etc.). It has been reviewed and found to have several serious flaws. These flaws result from the concept that requirements placed on an optical element should not be arbitrary but be based on form, fit or function and be complete.
{"title":"Power Spectrum Standard for Surface Roughness","authors":"D. Janeczko","doi":"10.1364/oft.1988.tha6","DOIUrl":"https://doi.org/10.1364/oft.1988.tha6","url":null,"abstract":"The typical lens or mirror requirement to control surface roughness is Rq (Geometric Average Roughness, Root-Mean-Square Roughness, RMS Roughness, etc.). It has been reviewed and found to have several serious flaws. These flaws result from the concept that requirements placed on an optical element should not be arbitrary but be based on form, fit or function and be complete.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131217075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Glass transition temperatures of thin polymer coatings (similar to the coating of a magnetic storage disc) on alumina substrates have been evaluated with dynamic light scattering methods. At this temperature the correlation time of the thermodynamical fluctuations in the polymer increases and so the spectrum of the dynamic light scattering signal changes accordingly. In practise only partial knowledge of the autocorrelation function exists, usually based on a finite series of data samples taken in a finite intervall. In the common analysis the autocorrelation function is set zero for all lags for which no estimate exists or the missing data is replaced by the already measured data of the intervall. Both procedures of course can not lead to correct autocorrelation functions or spectra. Maximum entropy methods can give the most unbiased estimates of the missing data and so lead to the "best possible" autocorrelation function/power spectra obtainable from such a limited data set.
{"title":"Maximum Entropy Analysis of Dynamic Light Scattering Signals","authors":"F. Laeri, André Noack","doi":"10.1364/oft.1988.tha11","DOIUrl":"https://doi.org/10.1364/oft.1988.tha11","url":null,"abstract":"Glass transition temperatures of thin polymer coatings (similar to the coating of a magnetic storage disc) on alumina substrates have been evaluated with dynamic light scattering methods. At this temperature the correlation time of the thermodynamical fluctuations in the polymer increases and so the spectrum of the dynamic light scattering signal changes accordingly. In practise only partial knowledge of the autocorrelation function exists, usually based on a finite series of data samples taken in a finite intervall. In the common analysis the autocorrelation function is set zero for all lags for which no estimate exists or the missing data is replaced by the already measured data of the intervall. Both procedures of course can not lead to correct autocorrelation functions or spectra. Maximum entropy methods can give the most unbiased estimates of the missing data and so lead to the \"best possible\" autocorrelation function/power spectra obtainable from such a limited data set.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129994997","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
There has traditionally been a barrier between optical designers and fabricators that has impeded progress towards efficient overall engineering/production teams. The reason for the barrier is quite understandable: each group typically faces problems best solved by art rather than science. The fabricator is subject to the uncertainties that go along with processes that require highly skilled craftsmen, while the designer often does not know how the design works, or what the best tolerances are for a particular design. Current efforts to develop deterministic fabrication processes, along with increases in the computational power available to designers, hold promise of improving the situation and reducing the barrier between the two groups.
{"title":"Software to link optical design and manufacturing","authors":"D. Sinclair","doi":"10.1364/oft.1998.otua.3","DOIUrl":"https://doi.org/10.1364/oft.1998.otua.3","url":null,"abstract":"There has traditionally been a barrier between optical designers and fabricators that has impeded progress towards efficient overall engineering/production teams. The reason for the barrier is quite understandable: each group typically faces problems best solved by art rather than science. The fabricator is subject to the uncertainties that go along with processes that require highly skilled craftsmen, while the designer often does not know how the design works, or what the best tolerances are for a particular design. Current efforts to develop deterministic fabrication processes, along with increases in the computational power available to designers, hold promise of improving the situation and reducing the barrier between the two groups.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131126822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This review paper will examine the current state of optical testing for surface figure metrology. We will look at recent trends in commercial instruments as well as new developments in the technology of optical testing. This discussion will include topics such as software versatility and processing speed, high-speed data collection, new processing algorithms, long-trace optical profilers, larger data arrays, interfaces between interferometers and design programs, and aspheric testing. We will include our most recent results from our work in sub-Nyquist interferometry for measuring aspheric surfaces. The talk will conclude with a brief discussion of the current and future challenges that are facing the optical testing community.
{"title":"Current Developments in Surface Figure Metrology","authors":"J. Greivenkamp, Russell J. Palum","doi":"10.1364/oft.1990.otha1","DOIUrl":"https://doi.org/10.1364/oft.1990.otha1","url":null,"abstract":"This review paper will examine the current state of optical testing for surface figure metrology. We will look at recent trends in commercial instruments as well as new developments in the technology of optical testing. This discussion will include topics such as software versatility and processing speed, high-speed data collection, new processing algorithms, long-trace optical profilers, larger data arrays, interfaces between interferometers and design programs, and aspheric testing. We will include our most recent results from our work in sub-Nyquist interferometry for measuring aspheric surfaces. The talk will conclude with a brief discussion of the current and future challenges that are facing the optical testing community.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125265736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
What are the minimum uncertainties the metrologist can associate with the measurement of aspheric surface? Some limits are independent of, and others specific to, the measurement approach. Both are discussed.
{"title":"Limits in Aspheric Metrology","authors":"C. Evans","doi":"10.1364/oft.1996.jthb.1","DOIUrl":"https://doi.org/10.1364/oft.1996.jthb.1","url":null,"abstract":"What are the minimum uncertainties the metrologist can associate with the measurement of aspheric surface? Some limits are independent of, and others specific to, the measurement approach. Both are discussed.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126995250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The detection, measurement and removal of subsurface damage is a major effort of the LLNL Optical Sciences and Engineering Group. We will describe and show examples of three methods we are currently using to detect and measure the depth of damage in glasses and crystalline materials: taper polishing and etching, constancy of chemical etch rate, and small specimen fracture. In addition, results will be given to show that the depth of damage can often be approximated from the surface roughness and Young's modulus.
{"title":"Subsurface Damage in Optical Materials: Origin, Measurement and Removal","authors":"P. Hed, D. Edwards, Janet B. Davis","doi":"10.1364/oft.1988.wc1","DOIUrl":"https://doi.org/10.1364/oft.1988.wc1","url":null,"abstract":"The detection, measurement and removal of subsurface damage is a major effort of the LLNL Optical Sciences and Engineering Group. We will describe and show examples of three methods we are currently using to detect and measure the depth of damage in glasses and crystalline materials: taper polishing and etching, constancy of chemical etch rate, and small specimen fracture. In addition, results will be given to show that the depth of damage can often be approximated from the surface roughness and Young's modulus.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"277 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122709236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
During the second half of the 1990's, the fabrication technologies used to make large, precision glass optics will continue to undergo profound changes, motivated by increased accuracy in metrology, increased requirements of precision, and decreasing production costs. Livermore intends to continue to benefit from these advances in its construction of the National Ignition Facility. In order to do so cost effectively, however, it is necessary to generate specifications which balance the requirements for precision with the desire to contain costs. Key to this is to specify as precisely and simply as possible what is required, balanced with the minimum necessary metrology and certification.
{"title":"Balancing cost with completeness: Specifying optics for the National Ignition Facility","authors":"D. Aikens, R. E. English","doi":"10.1364/oft.1996.owa.3","DOIUrl":"https://doi.org/10.1364/oft.1996.owa.3","url":null,"abstract":"During the second half of the 1990's, the fabrication technologies used to make large, precision glass optics will continue to undergo profound changes, motivated by increased accuracy in metrology, increased requirements of precision, and decreasing production costs. Livermore intends to continue to benefit from these advances in its construction of the National Ignition Facility. In order to do so cost effectively, however, it is necessary to generate specifications which balance the requirements for precision with the desire to contain costs. Key to this is to specify as precisely and simply as possible what is required, balanced with the minimum necessary metrology and certification.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125946486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
At the University of Arizona, Steward Observatory Mirror Lab (SOML), we have developed a method to make the convex aspheric surfaces for secondary mirrors. These mirrors are large, up to 1.7 meter in diameter, and depart from the best fit sphere by as much as 300 microns. The techniques proven on these large mirrors can be used with equal effectiveness on convex optics that are much smaller.
{"title":"Laps and Metrology for large fast aspheric convex mirrors","authors":"Bryan K. Smith, J. Burge","doi":"10.1364/oft.1998.owa.2","DOIUrl":"https://doi.org/10.1364/oft.1998.owa.2","url":null,"abstract":"At the University of Arizona, Steward Observatory Mirror Lab (SOML), we have developed a method to make the convex aspheric surfaces for secondary mirrors. These mirrors are large, up to 1.7 meter in diameter, and depart from the best fit sphere by as much as 300 microns. The techniques proven on these large mirrors can be used with equal effectiveness on convex optics that are much smaller.","PeriodicalId":354934,"journal":{"name":"Optical Fabrication and Testing","volume":"122 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122892515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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