Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956156
D. Kujundzic, S. Jefferts, T. Heavner, T. Parker
The combination of a low-velocity intense source (LVIS) for Rubidium (Rb) atoms, along with a Ramsey cavity presents interesting alternatives to either traditional beam-type clocks or to the fountain geometry. The basic idea is not new, and much of the original thinking for such a clock has been described previously by Buell and Jaduszliwer [1999]. The current study differs in significant detail from their device. First, the device we describe is much larger having been optimized for laboratory use as a local oscillator rather than use as a transportable standard. Also, the use of phase modulation allows local oscillator locking at much less than the Ramsey interrogation time. Magnetic deflection of the atoms reduces the complexity of the device while simultaneously diminishing instabilities associated with resonant light. A less significant difference is the use of Rb in place of Cs. The clock should produce stabilities of /spl sigma//sub y/(/spl tau/)/spl sim/10/sup -14/ /spl tau//sup -1/2/.
{"title":"Design studies for a high-stability laser-cooled rubidium local oscillator","authors":"D. Kujundzic, S. Jefferts, T. Heavner, T. Parker","doi":"10.1109/FREQ.2001.956156","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956156","url":null,"abstract":"The combination of a low-velocity intense source (LVIS) for Rubidium (Rb) atoms, along with a Ramsey cavity presents interesting alternatives to either traditional beam-type clocks or to the fountain geometry. The basic idea is not new, and much of the original thinking for such a clock has been described previously by Buell and Jaduszliwer [1999]. The current study differs in significant detail from their device. First, the device we describe is much larger having been optimized for laboratory use as a local oscillator rather than use as a transportable standard. Also, the use of phase modulation allows local oscillator locking at much less than the Ramsey interrogation time. Magnetic deflection of the atoms reduces the complexity of the device while simultaneously diminishing instabilities associated with resonant light. A less significant difference is the use of Rb in place of Cs. The clock should produce stabilities of /spl sigma//sub y/(/spl tau/)/spl sim/10/sup -14/ /spl tau//sup -1/2/.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115645393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956170
Xue-ren Huang, Baihua Xia, D. Zhong, Shaofeng An, Xi-wen Zhu, G. Mei
Cavity pulling effect has been fully considered in designing of various atomic frequency standards, but quite often it has been neglected for passive rubidium atomic frequency standards (RAFS). This situation may be acceptable for the commonly used RAFS but it is less so for high performance one. A new type of microwave cavity with low temperature coefficient (TC) was designed with coefficient of 28.2 kHz//spl deg/C, which is positive and nearly one order smaller than that of the traditional TE/sub 111/ cavity. Analyses show that the cavity pulling effect of the cavity can be neglected under reasonable temperature stabilization condition. The main cause of the small TC of the cavity was discussed, which is due to the compensation of the positive TC of the dielectric ring in the cavity to the negative TC of the metal part of the cavity.
{"title":"A microwave cavity with low temperature coefficient for passive rubidium frequency standards","authors":"Xue-ren Huang, Baihua Xia, D. Zhong, Shaofeng An, Xi-wen Zhu, G. Mei","doi":"10.1109/FREQ.2001.956170","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956170","url":null,"abstract":"Cavity pulling effect has been fully considered in designing of various atomic frequency standards, but quite often it has been neglected for passive rubidium atomic frequency standards (RAFS). This situation may be acceptable for the commonly used RAFS but it is less so for high performance one. A new type of microwave cavity with low temperature coefficient (TC) was designed with coefficient of 28.2 kHz//spl deg/C, which is positive and nearly one order smaller than that of the traditional TE/sub 111/ cavity. Analyses show that the cavity pulling effect of the cavity can be neglected under reasonable temperature stabilization condition. The main cause of the small TC of the cavity was discussed, which is due to the compensation of the positive TC of the dielectric ring in the cavity to the negative TC of the metal part of the cavity.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122477786","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956335
F. Dickert, W. Greibl, C. Haderspock, O. Hayden, A. Rohrer, G. Scholl, U. Wolff
Mass-sensitive devices like the quartz crystal microbalance (QCM) and surface acoustic wave (SAW) devices show a major advantage as a transducer principle as every analyte can be detected due to its mass. In order to transfer QCMs and SAWS into chemical sensors a layer has to be applied in which the desired analyte is preferentially incorporated. Such coatings can vary from molecular hollows like calix[n]arenes to monolayers and molecular imprinted polymers (MIP). MIPs are produced by polymerization of carefully selected monomers around a template, the desired analyte. Such monomers can carry functional groups which interact with the analyte. When the template is removed by evaporation or washed out, it leaves behind specially adapted hollows in respect to size and interactions in which the analyte can be re-included. With these sensitive layers it was possible to achieve selectivities for poly aromatic hydrocarbons which are comparable to that of natural antibodies. Bulk imprinted MIPs allow the synthesis of,highly packed artificial, receptor sites for small organic molecules. The high amount of sites within the coating of a QCM/SAW allows detection limits down to the ppb range. Due to diffusion limitations the imprinting technique has to be adapted to the size of the analyte. The technique is not limited to single compounds, complex mixtures can also be used as templates. In this way it was possible to determine motor oil degradation. Even whole cells can act as imprinting media.
{"title":"QCM and SAW transducers allow analyte detection from nanometer- to micrometer-dimensions using imprinting techniques","authors":"F. Dickert, W. Greibl, C. Haderspock, O. Hayden, A. Rohrer, G. Scholl, U. Wolff","doi":"10.1109/FREQ.2001.956335","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956335","url":null,"abstract":"Mass-sensitive devices like the quartz crystal microbalance (QCM) and surface acoustic wave (SAW) devices show a major advantage as a transducer principle as every analyte can be detected due to its mass. In order to transfer QCMs and SAWS into chemical sensors a layer has to be applied in which the desired analyte is preferentially incorporated. Such coatings can vary from molecular hollows like calix[n]arenes to monolayers and molecular imprinted polymers (MIP). MIPs are produced by polymerization of carefully selected monomers around a template, the desired analyte. Such monomers can carry functional groups which interact with the analyte. When the template is removed by evaporation or washed out, it leaves behind specially adapted hollows in respect to size and interactions in which the analyte can be re-included. With these sensitive layers it was possible to achieve selectivities for poly aromatic hydrocarbons which are comparable to that of natural antibodies. Bulk imprinted MIPs allow the synthesis of,highly packed artificial, receptor sites for small organic molecules. The high amount of sites within the coating of a QCM/SAW allows detection limits down to the ppb range. Due to diffusion limitations the imprinting technique has to be adapted to the size of the analyte. The technique is not limited to single compounds, complex mixtures can also be used as templates. In this way it was possible to determine motor oil degradation. Even whole cells can act as imprinting media.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128375961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956354
F. Sthal, J. Boy, M. Mourey, F. Marionnet
First measurements of the phase noise versus the radius of curvature of SC-cut resonators are given. Resonators with adherent electrodes are investigated and compared with unelectroded resonators. The phase noise measurements are obtained with a crystal resonator tester specifically designed to assist in the characterization of quartz crystal resonators.
{"title":"Phase noise study of quartz crystal resonators versus the radius of curvature","authors":"F. Sthal, J. Boy, M. Mourey, F. Marionnet","doi":"10.1109/FREQ.2001.956354","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956354","url":null,"abstract":"First measurements of the phase noise versus the radius of curvature of SC-cut resonators are given. Resonators with adherent electrodes are investigated and compared with unelectroded resonators. The phase noise measurements are obtained with a crystal resonator tester specifically designed to assist in the characterization of quartz crystal resonators.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125940547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956333
B. Dulmet
This paper outlines the modeling of strong reciprocal couplings occurring on periodically corrugated piezoelectric substrates between SAWS (or STWs) propagating in their second stop band, i.e. with a wavelength close to the period of corrugations, and BAWs propagating either into or from the depth of substrate. The solution is classically expanded as series of Bloch functions allowing to obey periodic boundary conditions on the external surface. Those boundary conditions are actually taken into account by a simple integral method accessing the Fourier coefficients of the periodic part of effective stresses and induction on the free boundary of substrate. Treatment of piezoelectric effect is detailed together with issues regarding the effect of anisotropy, and results obtained on structures containing a finite number of gratings are briefly explained. The influence of the number of grooves on the energy conversion ratios is described.
{"title":"Analysis of a SAW-BAW mutual transducer of finite length on piezoelectric substrates","authors":"B. Dulmet","doi":"10.1109/FREQ.2001.956333","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956333","url":null,"abstract":"This paper outlines the modeling of strong reciprocal couplings occurring on periodically corrugated piezoelectric substrates between SAWS (or STWs) propagating in their second stop band, i.e. with a wavelength close to the period of corrugations, and BAWs propagating either into or from the depth of substrate. The solution is classically expanded as series of Bloch functions allowing to obey periodic boundary conditions on the external surface. Those boundary conditions are actually taken into account by a simple integral method accessing the Fourier coefficients of the periodic part of effective stresses and induction on the free boundary of substrate. Treatment of piezoelectric effect is detailed together with issues regarding the effect of anisotropy, and results obtained on structures containing a finite number of gratings are briefly explained. The influence of the number of grooves on the energy conversion ratios is described.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121936276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956251
T. Watanabe
The phenomenon in which etch pits and etch channels did not generate the required etching rate of an AT-cut quartz crystal wafer by carrying out etching at a rate lower than the growth speed of crystal was discovered. The high-speed chemical etching process examined, including lapping to polishing of the crystal wafers, was performed in less than 4 minutes. As a condition for which a mirror surface is possible, the ultra-clean washing method of removing contamination of the crystal wafer before etching was shown to be an important element. The manufacturing process for carrying out batch processing of the crystal wafer of #2000 finish after cutting by this high-speed chemical etching was shown, and mass production was made possible. The high-speed chemical etching. method is applied also to 2 /spl mu/m thickness thin crystal wafer production used at higher operating frequencies.
{"title":"Mass production of quartz high-speed chemical etching applied to AT-cut wafers","authors":"T. Watanabe","doi":"10.1109/FREQ.2001.956251","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956251","url":null,"abstract":"The phenomenon in which etch pits and etch channels did not generate the required etching rate of an AT-cut quartz crystal wafer by carrying out etching at a rate lower than the growth speed of crystal was discovered. The high-speed chemical etching process examined, including lapping to polishing of the crystal wafers, was performed in less than 4 minutes. As a condition for which a mirror surface is possible, the ultra-clean washing method of removing contamination of the crystal wafer before etching was shown to be an important element. The manufacturing process for carrying out batch processing of the crystal wafer of #2000 finish after cutting by this high-speed chemical etching was shown, and mass production was made possible. The high-speed chemical etching. method is applied also to 2 /spl mu/m thickness thin crystal wafer production used at higher operating frequencies.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126696585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956167
Jingbiao Chen, Junhai Zhang, Fengzhi Wang, Donghai Yang, Yi-qiu Wang
In this report, we discussed the interference phenomenon of the AC Stark effect in optical frequency standard with Ramsey spectroscopy. The analytic expression and its numerical result show that an interference fringe is superimposed on the usual AC Stark level shift dispersion line-shape. This phenomenon has never been observed before. By numerical method, we have analyzed the interesting feature of this effect in detail. A method to measure the interference of the AC Stark effect is presented. Finally, a method to observe super-steep dispersion in separated fields scheme is proposed.
{"title":"Interference phenomenon of AC Stark effect in optical Ramsey frequency standard","authors":"Jingbiao Chen, Junhai Zhang, Fengzhi Wang, Donghai Yang, Yi-qiu Wang","doi":"10.1109/FREQ.2001.956167","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956167","url":null,"abstract":"In this report, we discussed the interference phenomenon of the AC Stark effect in optical frequency standard with Ramsey spectroscopy. The analytic expression and its numerical result show that an interference fringe is superimposed on the usual AC Stark level shift dispersion line-shape. This phenomenon has never been observed before. By numerical method, we have analyzed the interesting feature of this effect in detail. A method to measure the interference of the AC Stark effect is presented. Finally, a method to observe super-steep dispersion in separated fields scheme is proposed.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124514268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956199
B. Mill
Isomorphism of ions in Ca/sub 3/Ga/sub 2/Ge/sub 4/O/sub 14/-type structure is considered and criteria of search for new compositions in four-component oxide systems are formulated. The preparation of two new groups of disordered four-component compositions is reported. Ln/sub 3/Ga/sub 3/Ge/sub 2/BeO/sub 14/, possessing wide range of homogeneity, exist with Ln = La-Eu. Substitution for Be/sup 2+/ in 2d tetrahedral site shifts Ln:Ga ratio from garnet one 3:5 to 1:1 and decreases garnet structure stability. This enables to introduce smaller, then Nd/sup 3+/, rare earth ions Sm/sup 3+/ and Eu/sup 3+/. Four-component solid solutions are found in binary section A/sub 3/B/sub x/M/sub 2/Si/sub 4-x/O/sub 14/ of silicate systems AO-BO/sub 2/-M/sub 2/O/sub 3/-SiO/sub 2/ (A=Ca, Sr, Ba; B=Ge, Ti, Sn, Zr; M=Ga, Fe). Some Ti-Ga-silicate compositions look promising for melt crystal growth. Principles of crystallization in four-component system are discussed.
{"title":"Two new lines of langasite family compositions","authors":"B. Mill","doi":"10.1109/FREQ.2001.956199","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956199","url":null,"abstract":"Isomorphism of ions in Ca/sub 3/Ga/sub 2/Ge/sub 4/O/sub 14/-type structure is considered and criteria of search for new compositions in four-component oxide systems are formulated. The preparation of two new groups of disordered four-component compositions is reported. Ln/sub 3/Ga/sub 3/Ge/sub 2/BeO/sub 14/, possessing wide range of homogeneity, exist with Ln = La-Eu. Substitution for Be/sup 2+/ in 2d tetrahedral site shifts Ln:Ga ratio from garnet one 3:5 to 1:1 and decreases garnet structure stability. This enables to introduce smaller, then Nd/sup 3+/, rare earth ions Sm/sup 3+/ and Eu/sup 3+/. Four-component solid solutions are found in binary section A/sub 3/B/sub x/M/sub 2/Si/sub 4-x/O/sub 14/ of silicate systems AO-BO/sub 2/-M/sub 2/O/sub 3/-SiO/sub 2/ (A=Ca, Sr, Ba; B=Ge, Ti, Sn, Zr; M=Ga, Fe). Some Ti-Ga-silicate compositions look promising for melt crystal growth. Principles of crystallization in four-component system are discussed.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124537158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956372
Y. Sato, M. Koyama
This paper describes the 622.08 MHz SMD-VCXO, developed for optical transmission applications. By applying WDM technology, it is possible to transmit large volume data. The CDR (Clock Data Recovery), which must be connected with each wavelength signal, is required to be smaller and of lower height by system case size restriction. To transmit the data in high speed, high clock frequency is required. Also, the jitter that causes the transmission error must be reduced. In the oscillator, the fundamental mode 155.52 MHz is oscillated, and 622.08 MHz, which is the 4/sup th/ harmonic, is selected through the band pass filter instead of the conventional resonant circuit. This SMD-VCXO is miniaturized by such a circuit construction. We confirmed that all the target specifications were achieved and jitter was achieved 0.01 UI (Unit Interval) max.
本文介绍了用于光传输应用的622.08 MHz SMD-VCXO。应用波分复用技术，可以实现大容量数据的传输。时钟数据恢复(Clock Data Recovery, CDR)必须连接到每个波长的信号，由于系统外壳尺寸的限制，要求CDR体积更小，高度更低。为了高速传输数据，需要高时钟频率。同时，必须减少引起传输误差的抖动。在振荡器中振荡基模155.52 MHz，通过带通滤波器选择4/sup /谐波622.08 MHz代替传统谐振电路。这种SMD-VCXO通过这种电路结构实现小型化。我们确认所有的目标规格都达到了，抖动达到了0.01 UI(单位间隔)最大值。
{"title":"622.08 MHz SMD-VCXO with filter [for optical transmission application]","authors":"Y. Sato, M. Koyama","doi":"10.1109/FREQ.2001.956372","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956372","url":null,"abstract":"This paper describes the 622.08 MHz SMD-VCXO, developed for optical transmission applications. By applying WDM technology, it is possible to transmit large volume data. The CDR (Clock Data Recovery), which must be connected with each wavelength signal, is required to be smaller and of lower height by system case size restriction. To transmit the data in high speed, high clock frequency is required. Also, the jitter that causes the transmission error must be reduced. In the oscillator, the fundamental mode 155.52 MHz is oscillated, and 622.08 MHz, which is the 4/sup th/ harmonic, is selected through the band pass filter instead of the conventional resonant circuit. This SMD-VCXO is miniaturized by such a circuit construction. We confirmed that all the target specifications were achieved and jitter was achieved 0.01 UI (Unit Interval) max.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130901111","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956353
H. Sekimoto, Xun Gong, S. Goka, Y. Watanabe
We numerically studied the f-T behavior of the fundamental TS fast mode in a partially plated X-cut LiTaO/sub 3/ strip resonator. Using the material constants measured by Smith and Welsh [1971], the f-T curves were calculated as a function of the electrode-length and the plate-length direction /spl psi/. The results confirmed that the turnover temperature of f-T curve decreases with increasing the electrode length. Furthermore we found out that the turnover temperature changes according to the coupling between TS and TF modes through c/sub 56/, and that it therefore depends on the plate-length direction /spl psi/. An angle /spl psi/=40/spl deg/ that yields the turnover temperature in the range of 33/spl sim/6.5/spl deg/C is optimal for the material constants of Smith and Welsh because c/sub 56/ is zero. We also showed that the external loading of both series and parallel capacitances can make the adjustment of turnover temperature very flexible.
{"title":"Analysis of frequency-temperature behavior of X-cut LiTaO/sub 3/ strip resonators","authors":"H. Sekimoto, Xun Gong, S. Goka, Y. Watanabe","doi":"10.1109/FREQ.2001.956353","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956353","url":null,"abstract":"We numerically studied the f-T behavior of the fundamental TS fast mode in a partially plated X-cut LiTaO/sub 3/ strip resonator. Using the material constants measured by Smith and Welsh [1971], the f-T curves were calculated as a function of the electrode-length and the plate-length direction /spl psi/. The results confirmed that the turnover temperature of f-T curve decreases with increasing the electrode length. Furthermore we found out that the turnover temperature changes according to the coupling between TS and TF modes through c/sub 56/, and that it therefore depends on the plate-length direction /spl psi/. An angle /spl psi/=40/spl deg/ that yields the turnover temperature in the range of 33/spl sim/6.5/spl deg/C is optimal for the material constants of Smith and Welsh because c/sub 56/ is zero. We also showed that the external loading of both series and parallel capacitances can make the adjustment of turnover temperature very flexible.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132696467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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