Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956249
C. A. Adams
In the early 1960's while working in the Crystal Design Laboratory at Hewlett-Packard, Don Hammond, the manager, and the author began to look into a new mounting system for quartz crystals. Their goal was to design a package that could be cleaned by H/sub 2/ firing at elevated temperatures, baked at temperatures greater than 300/spl deg/C, sealed while in vacuum with leak rates that were less than any container available at that time and be impervious to He diffusion. Cost was of secondary concern. The first crystal unit that they were to design the system for was for their LC cut temperature sensor operating over the range -50/spl deg/C to +250/spl deg/C. The unit was a 28 MHz 3rd OT unit that was required to fit into a package no larger than a TO-5 configuration and maintain its He integrity for the life of the product. The brazed mounting system described in this paper was a manageable process. Both HP and later Agilent Technologies put nearly 500,000 units in the field with this design. Its MTBF was greater than 1,000,000 hours with specifications that were always at the leading edge.
{"title":"Mounting and metallic brazing of crystal units, design history","authors":"C. A. Adams","doi":"10.1109/FREQ.2001.956249","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956249","url":null,"abstract":"In the early 1960's while working in the Crystal Design Laboratory at Hewlett-Packard, Don Hammond, the manager, and the author began to look into a new mounting system for quartz crystals. Their goal was to design a package that could be cleaned by H/sub 2/ firing at elevated temperatures, baked at temperatures greater than 300/spl deg/C, sealed while in vacuum with leak rates that were less than any container available at that time and be impervious to He diffusion. Cost was of secondary concern. The first crystal unit that they were to design the system for was for their LC cut temperature sensor operating over the range -50/spl deg/C to +250/spl deg/C. The unit was a 28 MHz 3rd OT unit that was required to fit into a package no larger than a TO-5 configuration and maintain its He integrity for the life of the product. The brazed mounting system described in this paper was a manageable process. Both HP and later Agilent Technologies put nearly 500,000 units in the field with this design. Its MTBF was greater than 1,000,000 hours with specifications that were always at the leading edge.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131982413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956201
G. Mansfeld, S. Alekseev, I. Kotelyansky
The report is devoted to the study of the attenuation of bulk acoustic waves in crystals of LGT (La/sub 3/Ga/sub 5/ /sub .5/TaO/sub 0.5/O/sub 14/) - one of the most perspective materials for bulk acoustic wave piezoelectric resonators. Two methods of the experimental study and measurements of attenuation coefficient were used. The first method used was a modified bulk acoustic wave composite resonator spectroscopy method previously applied to the study of langasite. A composite resonator structure is a multifrequency bulk acoustic wave resonator. The resonances in the structure were spaced in frequency domain by few MHz and were observed in a wide frequency region from half up to a few GHz. So it was possible to find total acoustic losses in the structure from the data on resonant peaks width in a wide frequency domain. The new modified version of HBAR spectroscopy is based on the measurements of only parallel resonance bandwidth of composite resonator structures at each resonance frequency. Losses in transducers and those due to surface roughness were evaluated and either neglected or (if necessary) subtracted from the total losses. It was found that the frequency dependences in the whole band for most BAW polarizations are not ideally square (as it is required in Akhiezer theory), but at high frequencies limit their behavior is very close to the square law. The second method used in the work was a traditional echo-pulse method. For most experiments the acoustic losses obtained by two methods at high frequency region were close to each other. Here we concentrate our attention on modified HBAR spectroscopy method and on the discussion of the attenuation in LGT. All the peculiarities observed experimentally are discussed, attenuation constants data and Qf product values for most interesting directions are presented.
{"title":"Bulk acoustic wave attenuation in langatate","authors":"G. Mansfeld, S. Alekseev, I. Kotelyansky","doi":"10.1109/FREQ.2001.956201","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956201","url":null,"abstract":"The report is devoted to the study of the attenuation of bulk acoustic waves in crystals of LGT (La/sub 3/Ga/sub 5/ /sub .5/TaO/sub 0.5/O/sub 14/) - one of the most perspective materials for bulk acoustic wave piezoelectric resonators. Two methods of the experimental study and measurements of attenuation coefficient were used. The first method used was a modified bulk acoustic wave composite resonator spectroscopy method previously applied to the study of langasite. A composite resonator structure is a multifrequency bulk acoustic wave resonator. The resonances in the structure were spaced in frequency domain by few MHz and were observed in a wide frequency region from half up to a few GHz. So it was possible to find total acoustic losses in the structure from the data on resonant peaks width in a wide frequency domain. The new modified version of HBAR spectroscopy is based on the measurements of only parallel resonance bandwidth of composite resonator structures at each resonance frequency. Losses in transducers and those due to surface roughness were evaluated and either neglected or (if necessary) subtracted from the total losses. It was found that the frequency dependences in the whole band for most BAW polarizations are not ideally square (as it is required in Akhiezer theory), but at high frequencies limit their behavior is very close to the square law. The second method used in the work was a traditional echo-pulse method. For most experiments the acoustic losses obtained by two methods at high frequency region were close to each other. Here we concentrate our attention on modified HBAR spectroscopy method and on the discussion of the attenuation in LGT. All the peculiarities observed experimentally are discussed, attenuation constants data and Qf product values for most interesting directions are presented.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128733104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956340
E. Kamiyama, T. Itoh, Y. Murakami, Y. Ueoka, T. Uno
Effects of the electric twins in quartz crystal resonators were investigated theoretically and experimentally. In the theoretical study a simple one-dimensional model predicted drastic changes in amplitude distribution, center value of serial resonant frequency (Fs) and its temperature dependence. In the experimental study, electric twins were formed artificially in the usual AT-cut quartz crystal resonators. The twin formation was confirmed by HF etching. Using the X-ray topograph method, we observed vibrating quartz resonators and saw that vibration generated at electrodes propagated into the outside region isotropically, but did not propagate into the region of the electric twin. When we compared Fs values measured before and after forming the twins, we found a clear dependence of Fs shift on the distance between the electrodes and the twins. We also found that twins significantly changed the temperature dependence of Fs. These effects can be useful in new applications.
{"title":"Effect of electric twins on acoustic waves in a quartz resonator","authors":"E. Kamiyama, T. Itoh, Y. Murakami, Y. Ueoka, T. Uno","doi":"10.1109/FREQ.2001.956340","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956340","url":null,"abstract":"Effects of the electric twins in quartz crystal resonators were investigated theoretically and experimentally. In the theoretical study a simple one-dimensional model predicted drastic changes in amplitude distribution, center value of serial resonant frequency (Fs) and its temperature dependence. In the experimental study, electric twins were formed artificially in the usual AT-cut quartz crystal resonators. The twin formation was confirmed by HF etching. Using the X-ray topograph method, we observed vibrating quartz resonators and saw that vibration generated at electrodes propagated into the outside region isotropically, but did not propagate into the region of the electric twin. When we compared Fs values measured before and after forming the twins, we found a clear dependence of Fs shift on the distance between the electrodes and the twins. We also found that twins significantly changed the temperature dependence of Fs. These effects can be useful in new applications.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133696170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956194
R. Fachberger, T. Holzheu, E. Riha, E. Born, P. Pongratz, H. Cerva
Material properties of Langasite (LGS) and its homologous compounds, e.g., Langatate (LGT) have been investigated employing lattice constants measurements revealing that the micro structured growth striations affect the a and c-parameter of the unit cell. Thus deviations off the congruent melt composition of the crystal are assumed. Transmission electron microscopy (TEM) combined with energy dispersive X-ray spectroscopy (EDX) exhibit amorphous inclusions having a nearly identical chemical composition as the surrounding crystal. X-ray topography (XRT) has been applied to correlate the crystal quality of 3" LGS and LGT wafers including defects and transverse growth banding (TGB) with SAW frequency shifts. Evaluation of the RF-signal of SAW test devices showed frequency deviations of about 1000 ppm even within one wafer. The pattern of the frequency shifts is related to the orientation of the TGB. Local accumulations of defects, e.g., dislocations, however, did not cause observable interference with the SAW frequency.
{"title":"Langasite and langatate nonuniform material properties correlated to the performance of SAW devices","authors":"R. Fachberger, T. Holzheu, E. Riha, E. Born, P. Pongratz, H. Cerva","doi":"10.1109/FREQ.2001.956194","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956194","url":null,"abstract":"Material properties of Langasite (LGS) and its homologous compounds, e.g., Langatate (LGT) have been investigated employing lattice constants measurements revealing that the micro structured growth striations affect the a and c-parameter of the unit cell. Thus deviations off the congruent melt composition of the crystal are assumed. Transmission electron microscopy (TEM) combined with energy dispersive X-ray spectroscopy (EDX) exhibit amorphous inclusions having a nearly identical chemical composition as the surrounding crystal. X-ray topography (XRT) has been applied to correlate the crystal quality of 3\" LGS and LGT wafers including defects and transverse growth banding (TGB) with SAW frequency shifts. Evaluation of the RF-signal of SAW test devices showed frequency deviations of about 1000 ppm even within one wafer. The pattern of the frequency shifts is related to the orientation of the TGB. Local accumulations of defects, e.g., dislocations, however, did not cause observable interference with the SAW frequency.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133878563","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956179
L. Maleki, V. Iltchenko
We describe a new method for the generation of terahertz radiation with low linewidth and high stability, over virtually any desired span of this region of the spectrum. The technique is based on the use of a high-Q optical microresonator with whispering gallery modes. The resonator has a special geometry that allows well separated modes. The proposed device has the added features of small size with low power requirements, and thus is suitable for space and mobile platform applications.
{"title":"Proposed high performance source for the generation of high stability THz signals","authors":"L. Maleki, V. Iltchenko","doi":"10.1109/FREQ.2001.956179","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956179","url":null,"abstract":"We describe a new method for the generation of terahertz radiation with low linewidth and high stability, over virtually any desired span of this region of the spectrum. The technique is based on the use of a high-Q optical microresonator with whispering gallery modes. The resonator has a special geometry that allows well separated modes. The proposed device has the added features of small size with low power requirements, and thus is suitable for space and mobile platform applications.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134304182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956381
I. Abramzon, R. Boroditsky
The work is devoted to research in frequency stability of miniature integrated OCXO packaged in TO-8 vacuum holder. Since a number of electronic components and materials are involved in the unit design such investigations are of primary interest. The paper describes results of a long-term stability (aging) test of the OCXO during the period of about 2 years. Besides aging, various experiments including retrace and frequency hysteresis measurements are described. Experiments proved that the hybrid technology is suitable for fabrication of high stability miniature OCXO.
{"title":"Long-term stability (aging) of evacuated hybrid OCXO","authors":"I. Abramzon, R. Boroditsky","doi":"10.1109/FREQ.2001.956381","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956381","url":null,"abstract":"The work is devoted to research in frequency stability of miniature integrated OCXO packaged in TO-8 vacuum holder. Since a number of electronic components and materials are involved in the unit design such investigations are of primary interest. The paper describes results of a long-term stability (aging) test of the OCXO during the period of about 2 years. Besides aging, various experiments including retrace and frequency hysteresis measurements are described. Experiments proved that the hybrid technology is suitable for fabrication of high stability miniature OCXO.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116201330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956338
Yoonkee Kim, J. Vig
Noise limits the accuracy with which the frequency of an oscillator can be determined. Similarly, in a resonant sensor, noise limits the measurement resolution, i.e., it limits the minimum quantity of a measurand that can be measured with a specified uncertainty. In some sensor applications, such as in quartz crystal microbalances (e.g., chemical sensors), the sensor crystals are not hermetically sealed. The noise [/spl sigma//sub y/(/spl tau/) at several /spl tau/] of hermetically sealed 5 MHz fundamental mode AT-cut quartz resonators was measured at laboratory ambient temperature, and in an oven near the turnover temperatures (83/spl deg/C). Then the hermetic seals were broken and the resonators were measured again at ambient and turnover temperatures. As one would expect, breaking the hermetic seal increased the equivalent series resistance and the aging of the resonators. When the resonators were in the oven near their turnover temperatures, the unsealed resonators' (drift-removed) short-term stability was not significantly different from that of the sealed ones. In fact, in some cases, the unsealed resonators exhibited better short term stability. The noise due to temperature fluctuations at laboratory ambient temperatures dominated the effects of breaking the hermetic seal.
{"title":"Noise in sensor crystals: hermetically sealed and unsealed","authors":"Yoonkee Kim, J. Vig","doi":"10.1109/FREQ.2001.956338","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956338","url":null,"abstract":"Noise limits the accuracy with which the frequency of an oscillator can be determined. Similarly, in a resonant sensor, noise limits the measurement resolution, i.e., it limits the minimum quantity of a measurand that can be measured with a specified uncertainty. In some sensor applications, such as in quartz crystal microbalances (e.g., chemical sensors), the sensor crystals are not hermetically sealed. The noise [/spl sigma//sub y/(/spl tau/) at several /spl tau/] of hermetically sealed 5 MHz fundamental mode AT-cut quartz resonators was measured at laboratory ambient temperature, and in an oven near the turnover temperatures (83/spl deg/C). Then the hermetic seals were broken and the resonators were measured again at ambient and turnover temperatures. As one would expect, breaking the hermetic seal increased the equivalent series resistance and the aging of the resonators. When the resonators were in the oven near their turnover temperatures, the unsealed resonators' (drift-removed) short-term stability was not significantly different from that of the sealed ones. In fact, in some cases, the unsealed resonators exhibited better short term stability. The noise due to temperature fluctuations at laboratory ambient temperatures dominated the effects of breaking the hermetic seal.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116210752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956187
L. Nelson, J. Levine
This work is made in an effort to determine and understand the limitations of GPS carrier-phase frequency transfer between the National Institute of Standards and Technology (NIST) in Boulder, Colorado and the Physikalisch-Technische Bundesanstalt (PTB) in Braunschweig, Germany. We compare two analytical software packages and report on possible reasons for differences in results. Specifically we look at bias fixing, merging routines, data outages, and sampling and analysis period effects. We hope to determine and reduce the contributions of these effects and lower the overall error budget of the carrier-phase GPS comparison technique.
{"title":"Understanding limitations of GPS carrier phase frequency transfer on a transatlantic baseline","authors":"L. Nelson, J. Levine","doi":"10.1109/FREQ.2001.956187","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956187","url":null,"abstract":"This work is made in an effort to determine and understand the limitations of GPS carrier-phase frequency transfer between the National Institute of Standards and Technology (NIST) in Boulder, Colorado and the Physikalisch-Technische Bundesanstalt (PTB) in Braunschweig, Germany. We compare two analytical software packages and report on possible reasons for differences in results. Specifically we look at bias fixing, merging routines, data outages, and sampling and analysis period effects. We hope to determine and reduce the contributions of these effects and lower the overall error budget of the carrier-phase GPS comparison technique.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125911488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956339
Rong Liu, B. Paden, K. Turner
In this paper, a frequency stability analysis and design method for MEMS resonators is presented. The frequency characteristics of a laterally vibrating resonator are analyzed. With the fabrication error on the sidewall of the structure being considered, the first and second order frequency sensitivities to the fabrication error are derived. A simple relationship between the proof mass area and perimeter, and the beam width, is developed for single material structures, which expresses that the proof mass perimeter times the beam width should equal six times the area of the proof mass. Design examples are given for the single material and multi-layer structures. The results and principles presented in the paper can be used to analyze and design other MEMS resonators.
{"title":"MEMS resonators that are robust to process-induced feature width variations","authors":"Rong Liu, B. Paden, K. Turner","doi":"10.1109/FREQ.2001.956339","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956339","url":null,"abstract":"In this paper, a frequency stability analysis and design method for MEMS resonators is presented. The frequency characteristics of a laterally vibrating resonator are analyzed. With the fabrication error on the sidewall of the structure being considered, the first and second order frequency sensitivities to the fabrication error are derived. A simple relationship between the proof mass area and perimeter, and the beam width, is developed for single material structures, which expresses that the proof mass perimeter times the beam width should equal six times the area of the proof mass. Design examples are given for the single material and multi-layer structures. The results and principles presented in the paper can be used to analyze and design other MEMS resonators.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121458837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-06-06DOI: 10.1109/FREQ.2001.956378
Wei Zhou, L. Bai, Z. Xuan, Hui Zhou, C. Wen
In OCXO an accurate and stable temperature control to the crystal is very important. Constant boiling points of some substances can be used to supply a constant temperature condition to the crystal. Compared with the conventional OCXO, the same or better specifications can be obtained. This new method is suitable for a wider environment of temperature.
{"title":"An experimental study of OCXO based on a new temperature control method","authors":"Wei Zhou, L. Bai, Z. Xuan, Hui Zhou, C. Wen","doi":"10.1109/FREQ.2001.956378","DOIUrl":"https://doi.org/10.1109/FREQ.2001.956378","url":null,"abstract":"In OCXO an accurate and stable temperature control to the crystal is very important. Constant boiling points of some substances can be used to supply a constant temperature condition to the crystal. Compared with the conventional OCXO, the same or better specifications can be obtained. This new method is suitable for a wider environment of temperature.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115441763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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