Pub Date : 2015-04-01DOI: 10.1109/VLSI-DAT.2015.7114528
S. Karapetyan, Ulf Schlichtmann
With the continuous scaling of transistor sizes, aging effects become more and more pronounced. Two dominant effects are negative bias temperature instability (NBTI) and hot carrier injection (HCI). Both of these mechanisms negatively impact the timing behavior of circuits. Traditionally, aging analysis has not been a part of the established circuit design flow. However, as the impact of aging effects increases, the necessity of their consideration in the design flow grows. Various device and gate level models have been developed to explore and study these effects. However, commercial tools do not yet support aging analysis on gate level, therefore aging analysis is not commonly available to industrial designers yet. This paper presents an automated methodology for fast and accurate NBTI and HCI aware timing analysis. The approach utilizes the AgeGate aging aware gate model and integrates it into a commercial static timing analysis (STA) tool (Synopsys PrimeTime). The paper presents results obtained from applying the method to various benchmark circuits. These results demonstrate that aging is relevant and that it can efficiently be analyzed using commercial tools.
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Pub Date : 1900-01-01DOI: 10.1109/VLSI-DAT.2015.7114554
P. Hsieh
Summary form only given. Information technology is the key technology that drives the technical convergence of formerly separated application domains. As the internet started in its early days with a data file transfer approach between geographically separated computers, today the internet already links a variety of devices from a broad application spectrum. While it's interesting to discuss whether new content drives new applications or new applications generate new content, it's obvious that formerly separated application domains will be integrated by services. So we experience a shift from contents to service. During his presentation Leopold will adopt a sensor solution supplier perspective towards this topic. While looking at the traditional MEMS sensor development for Automotive applications and the current boom of MEMS sensors in consumer electronics, Leopold will point towards the linking path of this previously well separated industry segments and the arising business opportunities for system and service integrators.
{"title":"IoT evolution — By crossing application domains","authors":"P. Hsieh","doi":"10.1109/VLSI-DAT.2015.7114554","DOIUrl":"https://doi.org/10.1109/VLSI-DAT.2015.7114554","url":null,"abstract":"Summary form only given. Information technology is the key technology that drives the technical convergence of formerly separated application domains. As the internet started in its early days with a data file transfer approach between geographically separated computers, today the internet already links a variety of devices from a broad application spectrum. While it's interesting to discuss whether new content drives new applications or new applications generate new content, it's obvious that formerly separated application domains will be integrated by services. So we experience a shift from contents to service. During his presentation Leopold will adopt a sensor solution supplier perspective towards this topic. While looking at the traditional MEMS sensor development for Automotive applications and the current boom of MEMS sensors in consumer electronics, Leopold will point towards the linking path of this previously well separated industry segments and the arising business opportunities for system and service integrators.","PeriodicalId":369130,"journal":{"name":"VLSI Design, Automation and Test(VLSI-DAT)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122374009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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