Pub Date : 2012-07-01DOI: 10.1080/10170669.2012.702135
Chia-Yu Hsu, Chen-Fu Chien, Pei-Nong Chen
As feature sizes of integrated circuits are continuously shrinking in nanotechnologies, mining potentially useful information to extract manufacturing intelligence from big data automatically collected in the wafer fabrication facilities to assist in real time decisions for yield enhancement has become practically crucial to maintain competitive advantages and support intelligent manufacturing for operational excellence. Motivated by real needs, this study aims to develop an effective approach to extract manufacturing intelligence for early detection of key equipment excursion for advanced equipment control to enhance yield and reduce potential loss. For validation, an empirical study was conducted in a leading semiconductor manufacturing company to validate the proposed approach in the developed “early warning system” of newly released equipment to reduce tool excursion and abnormal yield loss. The results have demonstrated practical viability of the proposed approach. Indeed, the developed solution has been implemented in this company.
{"title":"Manufacturing intelligence for early warning of key equipment excursion for advanced equipment control in semiconductor manufacturing","authors":"Chia-Yu Hsu, Chen-Fu Chien, Pei-Nong Chen","doi":"10.1080/10170669.2012.702135","DOIUrl":"https://doi.org/10.1080/10170669.2012.702135","url":null,"abstract":"As feature sizes of integrated circuits are continuously shrinking in nanotechnologies, mining potentially useful information to extract manufacturing intelligence from big data automatically collected in the wafer fabrication facilities to assist in real time decisions for yield enhancement has become practically crucial to maintain competitive advantages and support intelligent manufacturing for operational excellence. Motivated by real needs, this study aims to develop an effective approach to extract manufacturing intelligence for early detection of key equipment excursion for advanced equipment control to enhance yield and reduce potential loss. For validation, an empirical study was conducted in a leading semiconductor manufacturing company to validate the proposed approach in the developed “early warning system” of newly released equipment to reduce tool excursion and abnormal yield loss. The results have demonstrated practical viability of the proposed approach. Indeed, the developed solution has been implemented in this company.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121669988","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-07-01DOI: 10.1080/10170669.2012.702689
Yi-Kuei Lin, Hsien-Chang Chou, Sheng-Chiang Chen
This article is mainly to utilize the flow network analysis to calculate the system reliability, so as to assess the service quality of electronic transactions conducted by commercial banks. Banks rely on telecommunication networks leased from telecommunication companies for electronic transaction services. The telecommunication company offers the steady telecommunication network, which is one of the key factors of influencing the electronic transaction service of the bank. In this article, one of the top three banks in Taiwan is taken for case study. The multi-state flow network and the recursive sum of disjoint product algorithm are used to calculate the system reliability, and explore its relationship with the remote branches’ demand. The use of multi-state flow network for system reliability analysis to assess the service quality of commercial banks’ electronic transactions can make the important reference indicator of network structure of serving for planning the commercial bank in the future.
{"title":"Evaluation of system reliability of electronic transaction in commercial banks","authors":"Yi-Kuei Lin, Hsien-Chang Chou, Sheng-Chiang Chen","doi":"10.1080/10170669.2012.702689","DOIUrl":"https://doi.org/10.1080/10170669.2012.702689","url":null,"abstract":"This article is mainly to utilize the flow network analysis to calculate the system reliability, so as to assess the service quality of electronic transactions conducted by commercial banks. Banks rely on telecommunication networks leased from telecommunication companies for electronic transaction services. The telecommunication company offers the steady telecommunication network, which is one of the key factors of influencing the electronic transaction service of the bank. In this article, one of the top three banks in Taiwan is taken for case study. The multi-state flow network and the recursive sum of disjoint product algorithm are used to calculate the system reliability, and explore its relationship with the remote branches’ demand. The use of multi-state flow network for system reliability analysis to assess the service quality of commercial banks’ electronic transactions can make the important reference indicator of network structure of serving for planning the commercial bank in the future.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125873722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-07-01DOI: 10.1080/10170669.2012.702690
I. Hanafi, A. Khamlichi, F. M. Cabrera, P. J. Núñez López
Surface roughness parameters Ra and Rt are mostly used as an index to determine the surface finish quality in the process of machining. Because of the strong nonlinear character of relationships between the process inputs and outputs, it is difficult to accurately estimate roughness characteristics by using traditional modeling techniques. In this work, accurate prediction of the Ra and Rt values during machining of reinforced poly ether ether ketone (PEEK) CF30 with TiN coated tools is achieved. The modeling is performed by using artificial neural network approach to represent the complex relationships between cutting conditions and surface roughness parameters. The input cutting parameters include cutting speed, depth of cut and feed rate. The network was trained with pairs of inputs and outputs datasets generated by machining experimental results that were obtained according to a full factorial design of experiment table. Predictions of the ANN based model were found to fit experimental data very well with a correlation coefficient as high as 99%. Complementary results that were not used during derivation of the ANN model have enabled one to assess the validity of the obtained predictions.
{"title":"Prediction of surface roughness in turning of PEEK cf30 by using an artificial neural network","authors":"I. Hanafi, A. Khamlichi, F. M. Cabrera, P. J. Núñez López","doi":"10.1080/10170669.2012.702690","DOIUrl":"https://doi.org/10.1080/10170669.2012.702690","url":null,"abstract":"Surface roughness parameters Ra and Rt are mostly used as an index to determine the surface finish quality in the process of machining. Because of the strong nonlinear character of relationships between the process inputs and outputs, it is difficult to accurately estimate roughness characteristics by using traditional modeling techniques. In this work, accurate prediction of the Ra and Rt values during machining of reinforced poly ether ether ketone (PEEK) CF30 with TiN coated tools is achieved. The modeling is performed by using artificial neural network approach to represent the complex relationships between cutting conditions and surface roughness parameters. The input cutting parameters include cutting speed, depth of cut and feed rate. The network was trained with pairs of inputs and outputs datasets generated by machining experimental results that were obtained according to a full factorial design of experiment table. Predictions of the ANN based model were found to fit experimental data very well with a correlation coefficient as high as 99%. Complementary results that were not used during derivation of the ANN model have enabled one to assess the validity of the obtained predictions.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114597601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-07-01DOI: 10.1080/10170669.2012.700528
Hong-Dar Lin, Huan-Hua Tsai
Capacitive touch panels (CTPs) with advantages of water-proof, stain-proof, scratch-proof, and fast response are widely used in various electronic products built in touch technology functions. It is a difficult inspection task when defects imbedded on surfaces of CTPs with structural textures. This research proposes a Fourier transform-based approach to inspect surface defects of CTPs. When a CTP image with four directional and periodic lines of texture is transformed to Fourier domain, four principal bands with high-energy frequency components crisscross at the center of Fourier spectrum. A multi-crisscross filter is designed to filter out the frequency components of the principal band regions. The filtered image is then transformed back to spatial domain. Finally, the restored image is segmented by a simple threshold method and defects are located. Experimental results show the proposed method achieves a high defect detection rate and a low false alarm rate on defect inspection of touch panels.
{"title":"Automated quality inspection of surface defects on touch panels","authors":"Hong-Dar Lin, Huan-Hua Tsai","doi":"10.1080/10170669.2012.700528","DOIUrl":"https://doi.org/10.1080/10170669.2012.700528","url":null,"abstract":"Capacitive touch panels (CTPs) with advantages of water-proof, stain-proof, scratch-proof, and fast response are widely used in various electronic products built in touch technology functions. It is a difficult inspection task when defects imbedded on surfaces of CTPs with structural textures. This research proposes a Fourier transform-based approach to inspect surface defects of CTPs. When a CTP image with four directional and periodic lines of texture is transformed to Fourier domain, four principal bands with high-energy frequency components crisscross at the center of Fourier spectrum. A multi-crisscross filter is designed to filter out the frequency components of the principal band regions. The filtered image is then transformed back to spatial domain. Finally, the restored image is segmented by a simple threshold method and defects are located. Experimental results show the proposed method achieves a high defect detection rate and a low false alarm rate on defect inspection of touch panels.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134014354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-07-01DOI: 10.1080/10170669.2012.703249
Yi-Chao Huang, Jia-Nian Zheng, Chen-Fu Chien
In hospitals, rehabilitation inpatients often complain about long waiting time between the therapeutic processes. Due to the partial precedence constraints of rehabilitation therapies, the rehabilitation scheduling problem is a hybrid shop scheduling problem. This article aims to construct a decision support system for rehabilitation scheduling. Equipped with the developed genetic algorithm, this system can generate the optimal schedules for rehabilitation patients to minimize waiting time and thus enhance service quality and overall resource effectiveness of rehabilitation facilities. The developed system is also equipped with GUI (graphical user interfaces) to provide scheduling information including Gantt charts and scheduling lists to support various users including therapists and inpatients. We conducted an empirical study in a general hospital for validation. The results showed that the waiting time of each inpatient is reduced significantly and thus demonstrated the practical viability of the proposed solution to enhance the effectiveness of hospital resource management. The developed system has been implemented online in the hospital.
{"title":"Decision support system for rehabilitation scheduling to enhance the service quality and the effectiveness of hospital resource management","authors":"Yi-Chao Huang, Jia-Nian Zheng, Chen-Fu Chien","doi":"10.1080/10170669.2012.703249","DOIUrl":"https://doi.org/10.1080/10170669.2012.703249","url":null,"abstract":"In hospitals, rehabilitation inpatients often complain about long waiting time between the therapeutic processes. Due to the partial precedence constraints of rehabilitation therapies, the rehabilitation scheduling problem is a hybrid shop scheduling problem. This article aims to construct a decision support system for rehabilitation scheduling. Equipped with the developed genetic algorithm, this system can generate the optimal schedules for rehabilitation patients to minimize waiting time and thus enhance service quality and overall resource effectiveness of rehabilitation facilities. The developed system is also equipped with GUI (graphical user interfaces) to provide scheduling information including Gantt charts and scheduling lists to support various users including therapists and inpatients. We conducted an empirical study in a general hospital for validation. The results showed that the waiting time of each inpatient is reduced significantly and thus demonstrated the practical viability of the proposed solution to enhance the effectiveness of hospital resource management. The developed system has been implemented online in the hospital.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126649362","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-29DOI: 10.1080/10170669.2012.691118
H. Fazlollahtabar, E. Aghasi
In this article, we propose a two stage decision model to aid the marketing team of a company. The decision is based on customers’ satisfaction measures. These measures are related to the different services the company offers to its customers. Thus, they constitute a multi criteria evaluation of the company's performances. The first stage of our proposed mechanism is to purify the services with respect to the criteria. A stochastic multi-criteria acceptability analysis is employed to purify the services. Then a multi-objective mathematical model is utilized to determine the services with more profits. A fuzzy goal programming is applied to solve the multi-objective model. The applicability and validity of the proposed mechanism is illustrated in a case study.
{"title":"A two-stage mechanism as a decision support for marketing via customer satisfaction measures","authors":"H. Fazlollahtabar, E. Aghasi","doi":"10.1080/10170669.2012.691118","DOIUrl":"https://doi.org/10.1080/10170669.2012.691118","url":null,"abstract":"In this article, we propose a two stage decision model to aid the marketing team of a company. The decision is based on customers’ satisfaction measures. These measures are related to the different services the company offers to its customers. Thus, they constitute a multi criteria evaluation of the company's performances. The first stage of our proposed mechanism is to purify the services with respect to the criteria. A stochastic multi-criteria acceptability analysis is employed to purify the services. Then a multi-objective mathematical model is utilized to determine the services with more profits. A fuzzy goal programming is applied to solve the multi-objective model. The applicability and validity of the proposed mechanism is illustrated in a case study.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124705475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-29DOI: 10.1080/10170669.2012.684408
Yu Tsou, Hsiao-Fan Wang
To achieve worldwide environmental protection, each government and enterprise must work out policies to reduce carbon emissions and to increase recycle products. This study proposes a bi-level mixed-integer nonlinear programming (BL-MINLP) model to develop subsidy and penalty strategies for governments and enterprises engaged in the collection and recovery operations of environmental protection. The government is the leader who intends to reduce environmental impacts and seek the financial balance in environmental subsidy and penalty policies for the recovery and carbon emission. The enterprise is the follower who wants to minimize its costs of recycling and refunding subject to the unit subsidy and unit penalty decisions of the government. This study applies the Karush–Kuhn–Tucker approach to solve the trade-off problem between the government and the enterprise. Sensitivity analysis was carried out on parameters related to the recovery rate and the carbon emission from transportation to facilitate the effective control and management.
{"title":"Subsidy and penalty strategy for a green industry sector by bi-level mixed integer nonlinear programming","authors":"Yu Tsou, Hsiao-Fan Wang","doi":"10.1080/10170669.2012.684408","DOIUrl":"https://doi.org/10.1080/10170669.2012.684408","url":null,"abstract":"To achieve worldwide environmental protection, each government and enterprise must work out policies to reduce carbon emissions and to increase recycle products. This study proposes a bi-level mixed-integer nonlinear programming (BL-MINLP) model to develop subsidy and penalty strategies for governments and enterprises engaged in the collection and recovery operations of environmental protection. The government is the leader who intends to reduce environmental impacts and seek the financial balance in environmental subsidy and penalty policies for the recovery and carbon emission. The enterprise is the follower who wants to minimize its costs of recycling and refunding subject to the unit subsidy and unit penalty decisions of the government. This study applies the Karush–Kuhn–Tucker approach to solve the trade-off problem between the government and the enterprise. Sensitivity analysis was carried out on parameters related to the recovery rate and the carbon emission from transportation to facilitate the effective control and management.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"8 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114034547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-29DOI: 10.1080/10170669.2012.684409
Chau‐Shing Wang, Wen-Liang Chang
This article presents a digital image processing approach applied to estimate the probe mark area on semiconductor wafer pads. The value of mark area can be used to judge the acceptance of the wafer. Before wire bonding to the wafer, a probing needle contacts each pad to test the electrical characteristics of the chip. However, this contact leaves probe marks on the pad. A large probe mark area results in poor adhesion forces at the bond ball of the pad, thus leading to undesirable products. Traditionally, given the difficulty of calculating the area of the irregular probe mark, probe mark area calculations were substituted by calculating the area of the oval that is manually drawn to cover the probe mark area. Nevertheless, this method is inaccurate, and the results varied from person to person. In this article, we present an imaging processing approach to calculate the probe mark area utilizing high-magnification microscopes to capture probe mark images. Our approach is faster and more accurate compared to the traditional method.
{"title":"Wafer probe mark area estimation via digital image processing approach","authors":"Chau‐Shing Wang, Wen-Liang Chang","doi":"10.1080/10170669.2012.684409","DOIUrl":"https://doi.org/10.1080/10170669.2012.684409","url":null,"abstract":"This article presents a digital image processing approach applied to estimate the probe mark area on semiconductor wafer pads. The value of mark area can be used to judge the acceptance of the wafer. Before wire bonding to the wafer, a probing needle contacts each pad to test the electrical characteristics of the chip. However, this contact leaves probe marks on the pad. A large probe mark area results in poor adhesion forces at the bond ball of the pad, thus leading to undesirable products. Traditionally, given the difficulty of calculating the area of the irregular probe mark, probe mark area calculations were substituted by calculating the area of the oval that is manually drawn to cover the probe mark area. Nevertheless, this method is inaccurate, and the results varied from person to person. In this article, we present an imaging processing approach to calculate the probe mark area utilizing high-magnification microscopes to capture probe mark images. Our approach is faster and more accurate compared to the traditional method.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124038640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-29DOI: 10.1080/10170669.2012.683822
J. Lin, H. Chao, P. Julian
We use the smoothly connected property to simplify the solution process for inventory model with ramp-type demand under stock-dependent consumption rate. This article is a response to a complicated solution process of Wu et al. [“Retailer's optimal ordering policy for deteriorating items with ramp-type demand under stock-dependent consumption rate,” International Journal of Information and Management Sciences, 19, 245–262 (2008)]. They extended a minimum cost inventory model to a maximized profit problem and presented a detailed analysis for the solution procedure. However, their solution process may be too lengthy to involve many right but unnecessary results. In this article, we use the smooth connected property to dramatically simplify their solution structure. Our approach is also applied to minimum cost inventory models that were demonstrated by simplifying the paper of Deng et al. [“A note on the inventory models for deteriorating items with ramp type demand rate,” European Journal of Operational Research, 178, 112–120 (2007)]. Our findings will help ordinary readers to understand their important inventory models.
{"title":"Improved solution process for inventory model with ramp-type demand under stock-dependent consumption rate","authors":"J. Lin, H. Chao, P. Julian","doi":"10.1080/10170669.2012.683822","DOIUrl":"https://doi.org/10.1080/10170669.2012.683822","url":null,"abstract":"We use the smoothly connected property to simplify the solution process for inventory model with ramp-type demand under stock-dependent consumption rate. This article is a response to a complicated solution process of Wu et al. [“Retailer's optimal ordering policy for deteriorating items with ramp-type demand under stock-dependent consumption rate,” International Journal of Information and Management Sciences, 19, 245–262 (2008)]. They extended a minimum cost inventory model to a maximized profit problem and presented a detailed analysis for the solution procedure. However, their solution process may be too lengthy to involve many right but unnecessary results. In this article, we use the smooth connected property to dramatically simplify their solution structure. Our approach is also applied to minimum cost inventory models that were demonstrated by simplifying the paper of Deng et al. [“A note on the inventory models for deteriorating items with ramp type demand rate,” European Journal of Operational Research, 178, 112–120 (2007)]. Our findings will help ordinary readers to understand their important inventory models.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128365723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-29DOI: 10.1080/10170669.2012.684803
Sajid Ali, M. Aslam, D. Kundu, Syed Mohsin Ali Kazmi
Constructing a flexible parametric classes of probability distributions is most popular approach in Bayesian analysis for the last few decades. This study is planned in the same direction for two components’ mixture of generalized exponential (GE) probability distribution by considering heterogeneous population from industry. We have considered censored sample environment due to its popularity in reliability theory. In addition, we have worked out expressions for the maximum likelihood estimates along with their variances and constructed components of the information matrix. To examine the performance of these estimators, we have evaluated their properties for different sample sizes, censoring rates, proportions of the component of mixture, and a variety of loss functions (LFs). The Bayes estimates are evaluated under squared error, entropy, squared logarithmic, and precautionary LFs. Hazard rate of GE distribution graphically and numerically compared with mixture of other life-time distributions. To highlight the practical significance, we have included an illustrative application example based on a real-life data.
{"title":"Bayesian estimation of the mixture of generalized exponential distribution: a versatile lifetime model in industrial processes","authors":"Sajid Ali, M. Aslam, D. Kundu, Syed Mohsin Ali Kazmi","doi":"10.1080/10170669.2012.684803","DOIUrl":"https://doi.org/10.1080/10170669.2012.684803","url":null,"abstract":"Constructing a flexible parametric classes of probability distributions is most popular approach in Bayesian analysis for the last few decades. This study is planned in the same direction for two components’ mixture of generalized exponential (GE) probability distribution by considering heterogeneous population from industry. We have considered censored sample environment due to its popularity in reliability theory. In addition, we have worked out expressions for the maximum likelihood estimates along with their variances and constructed components of the information matrix. To examine the performance of these estimators, we have evaluated their properties for different sample sizes, censoring rates, proportions of the component of mixture, and a variety of loss functions (LFs). The Bayes estimates are evaluated under squared error, entropy, squared logarithmic, and precautionary LFs. Hazard rate of GE distribution graphically and numerically compared with mixture of other life-time distributions. To highlight the practical significance, we have included an illustrative application example based on a real-life data.","PeriodicalId":369256,"journal":{"name":"Journal of The Chinese Institute of Industrial Engineers","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125601623","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：