F. Lin, Shu-zhong Zhao, Su-ping Chang, Yanling Sun, T. Xie
In this paper a multifunction surface measurement system based on focusing optical stylus interference and confocal image is researched. This system is designed on the structure of optical interference microscopy and could accomplish two measurement functions of optical stylus scanning measurement and confocal image measurement. Optical path difference would vary with the surface and interference fringe from optical interference microscopy is detected by photo sensor, so optical stylus scanning measurement would be accomplished combining with the X-Y two-dimensional stage. While the reference path of the interference microscope is blocked and the confocal images of the measured surface from CCD is analyzed, confocal imaging measurement would be carried out by the nanometer scanning displacement stage. According to the performance analysis, optical stylus scanning measurement has the measurement range of 50μm and the vertical scanning resolution of 0.005μm, while confocal imaging measurement has the measurement rage of 2mm and the vertical scanning resolution of 1.5μm.
{"title":"Multifunction surface measurement system based on focusing optical stylus interference and confocal image","authors":"F. Lin, Shu-zhong Zhao, Su-ping Chang, Yanling Sun, T. Xie","doi":"10.1117/12.2181402","DOIUrl":"https://doi.org/10.1117/12.2181402","url":null,"abstract":"In this paper a multifunction surface measurement system based on focusing optical stylus interference and confocal image is researched. This system is designed on the structure of optical interference microscopy and could accomplish two measurement functions of optical stylus scanning measurement and confocal image measurement. Optical path difference would vary with the surface and interference fringe from optical interference microscopy is detected by photo sensor, so optical stylus scanning measurement would be accomplished combining with the X-Y two-dimensional stage. While the reference path of the interference microscope is blocked and the confocal images of the measured surface from CCD is analyzed, confocal imaging measurement would be carried out by the nanometer scanning displacement stage. According to the performance analysis, optical stylus scanning measurement has the measurement range of 50μm and the vertical scanning resolution of 0.005μm, while confocal imaging measurement has the measurement rage of 2mm and the vertical scanning resolution of 1.5μm.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"185 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124751691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
With the gradual promotion of Microsoft.NET platform, C# as an object-oriented programming language based on the platform has been widely used. Therefore, more attention is concentrated on how to achieve the communication between Panasonic PLC and PC efficiently and fast in C#.NET environment. In this paper, a method of using SerialPort control which could be used for achieving communication between PLC and PC is introduced. Meanwhile, the reason of abnormal thread when displayed the receiving data in form is analyzed and the programming method to solve the problem of thread safety is designed. Achieving the communication of Panasonic PLC and PC in C#.NET environment can give full play to the advantages of the .NET framework. It is practical, easy communication, high reliability and can combine with other measurement and calibration procedures effectively and conveniently. Configuration software is expensive and can only communicate with PLC separately, but these shortcomings can be solved in C#.NET environment. A well-designed user interface realized real-time monitoring of PLC parameters and achieved management and control integration. The experiment show that this method of data transfer is accurate and the program’ running is stable.
{"title":"Data communication between Panasonic PLC and PC using SerialPort control in C#.NET environment","authors":"Ting Gao, Xiaochuan Gan, Liqun Ma","doi":"10.1117/12.2181373","DOIUrl":"https://doi.org/10.1117/12.2181373","url":null,"abstract":"With the gradual promotion of Microsoft.NET platform, C# as an object-oriented programming language based on the platform has been widely used. Therefore, more attention is concentrated on how to achieve the communication between Panasonic PLC and PC efficiently and fast in C#.NET environment. In this paper, a method of using SerialPort control which could be used for achieving communication between PLC and PC is introduced. Meanwhile, the reason of abnormal thread when displayed the receiving data in form is analyzed and the programming method to solve the problem of thread safety is designed. Achieving the communication of Panasonic PLC and PC in C#.NET environment can give full play to the advantages of the .NET framework. It is practical, easy communication, high reliability and can combine with other measurement and calibration procedures effectively and conveniently. Configuration software is expensive and can only communicate with PLC separately, but these shortcomings can be solved in C#.NET environment. A well-designed user interface realized real-time monitoring of PLC parameters and achieved management and control integration. The experiment show that this method of data transfer is accurate and the program’ running is stable.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129484308","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yehua Bie, Jun Luo, Weijun Li, Xinyu Zhang, An Ji, Hongshi Sang, C. Xie
In order to observe more properties of an electrically resonant metamaterial-sensor, a single cubic unit of the matamaterial-sensor was simulated using the finite-element algorithm and Microwave Studios by CST. Meanwhile, an adaptive mesh refinement was used to ensure an accurate numerical solution with relatively short calculation time. In order to effectively conduct the simulation, some field monitors were also added to help the observation of electromagnetic properties of the unit. Through the electromagnetic simulation, the transmission and reflection spectra of the unit metamaterial-sensor were acquired. At the SRR gap, each kind of metamaterial-sensor structure presents an obvious resonant response at several THz frequency points. Simulation results indicated that the transmission was as low as 0.03 at ~0.79 THz. Other simulation results such as the surface current, the electric field, the electric energy density, and the power loss density, were also observed. By analyzing the simulation results, an idea to obtain the resonant strength in an indirect way was worked out and a way was found to realize the multispectral imaging in THz region.
{"title":"Modeling of terahertz metamaterial-sensors for simulation based on effect of resonance induction","authors":"Yehua Bie, Jun Luo, Weijun Li, Xinyu Zhang, An Ji, Hongshi Sang, C. Xie","doi":"10.1117/12.2084169","DOIUrl":"https://doi.org/10.1117/12.2084169","url":null,"abstract":"In order to observe more properties of an electrically resonant metamaterial-sensor, a single cubic unit of the matamaterial-sensor was simulated using the finite-element algorithm and Microwave Studios by CST. Meanwhile, an adaptive mesh refinement was used to ensure an accurate numerical solution with relatively short calculation time. In order to effectively conduct the simulation, some field monitors were also added to help the observation of electromagnetic properties of the unit. Through the electromagnetic simulation, the transmission and reflection spectra of the unit metamaterial-sensor were acquired. At the SRR gap, each kind of metamaterial-sensor structure presents an obvious resonant response at several THz frequency points. Simulation results indicated that the transmission was as low as 0.03 at ~0.79 THz. Other simulation results such as the surface current, the electric field, the electric energy density, and the power loss density, were also observed. By analyzing the simulation results, an idea to obtain the resonant strength in an indirect way was worked out and a way was found to realize the multispectral imaging in THz region.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130017524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Handwriting drawing board is not only a subject which can be used to write and draw, but also a method to measure and process weak signals. This design adopts 8051 single chip microprocessor as the main controller. It applies a constant-current source[1][2] to copper plate and collects the voltage value according to the resistance divider effect. Then it amplifies the signal with low-noise and high-precision amplifier[3] AD620 which is placed in the low impedance and anti-interference pen. It converts analog signal to digital signal by an 11-channel, 12-bit A/D converter TLC2543. Adoption of average filtering algorithm can effectively improve the measuring accuracy, reduce the error and make the collected voltage signal more stable. The accurate position can be detected by scanning the horizontal and vertical ordinates with the analog switch via the internal bridge of module L298 which can change the direction of X-Y axis signal scan. DM12864 is used as man-machine interface and this hominization design is convenient for man-machine communication. This collecting system has high accuracy, high stability and strong anti-interference capability. It's easy to control and has very large development space in the future.
{"title":"Design of handwriting drawing board based on common copper clad laminate","authors":"Hongyuan Wang, Wen-Hui Gao, Y. Wang","doi":"10.1117/12.2083577","DOIUrl":"https://doi.org/10.1117/12.2083577","url":null,"abstract":"Handwriting drawing board is not only a subject which can be used to write and draw, but also a method to measure and process weak signals. This design adopts 8051 single chip microprocessor as the main controller. It applies a constant-current source[1][2] to copper plate and collects the voltage value according to the resistance divider effect. Then it amplifies the signal with low-noise and high-precision amplifier[3] AD620 which is placed in the low impedance and anti-interference pen. It converts analog signal to digital signal by an 11-channel, 12-bit A/D converter TLC2543. Adoption of average filtering algorithm can effectively improve the measuring accuracy, reduce the error and make the collected voltage signal more stable. The accurate position can be detected by scanning the horizontal and vertical ordinates with the analog switch via the internal bridge of module L298 which can change the direction of X-Y axis signal scan. DM12864 is used as man-machine interface and this hominization design is convenient for man-machine communication. This collecting system has high accuracy, high stability and strong anti-interference capability. It's easy to control and has very large development space in the future.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127844206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A dual interferometry FMCW laser ranging system is presented. The auxiliary interferometer for generating the clock pulses at equally spaced optical frequencies is incorporated into the main interferometer to simplify the system configuration and to compensate the tuning linearity of the laser source. The need of widely tunable laser limits the practical application of the FMCW laser ranging for precision industrial measurement. Splicing sampled signal method is proposed to break though the tuning range of the laser source limitation against the special resolution. In the experiments, 50 μm range resolution at 8.7 m is demonstrated, and this resolution is maintained over the entire measuring range. The measuring range depending on the power and coherence length of the source can reach more than 20 m. The system structure is simple, and the requirement on the tuning range of laser source is reduced in this system.
{"title":"Improvement spatial resolution of frequency modulated continuous wave laser ranging system by splicing equal optical frequency interval sampled signal","authors":"G. Shi, Fumin Zhang, Xinghua Qu","doi":"10.1117/12.2180837","DOIUrl":"https://doi.org/10.1117/12.2180837","url":null,"abstract":"A dual interferometry FMCW laser ranging system is presented. The auxiliary interferometer for generating the clock pulses at equally spaced optical frequencies is incorporated into the main interferometer to simplify the system configuration and to compensate the tuning linearity of the laser source. The need of widely tunable laser limits the practical application of the FMCW laser ranging for precision industrial measurement. Splicing sampled signal method is proposed to break though the tuning range of the laser source limitation against the special resolution. In the experiments, 50 μm range resolution at 8.7 m is demonstrated, and this resolution is maintained over the entire measuring range. The measuring range depending on the power and coherence length of the source can reach more than 20 m. The system structure is simple, and the requirement on the tuning range of laser source is reduced in this system.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"239 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122987153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The traceability of light-scattering airborne particle counter’s counting performance has received more attention, but has failed to settle internationally. This paper puts forward a traceability method of light-scattering airborne particle counter’s counting performance on single particle size, based on Anodic Aluminum Oxide (AAO) template andScanning Electron Microscope (SEM), by reforming the traditional standard airborne particle counter, building a measurement system including AAO and SEM, and utilizing the method of statistical physics in data processing to obtain more accurate measurement results. According to the actual test results and its uncertainty analysis, the traceability method of light-scattering airborne particle counter’s counting performance based on AAO and SEM makes sense in theory, and has certain research value on a solution to the traceability problem of light-scattering airborne particle counter internationally.
{"title":"Discuss on traceability method of light-scattering airborne particle counter’s counting performance","authors":"Q. Ji, Zhi-liang Gao, Xunbiao Zhang, Jian Chen","doi":"10.1117/12.2181958","DOIUrl":"https://doi.org/10.1117/12.2181958","url":null,"abstract":"The traceability of light-scattering airborne particle counter’s counting performance has received more attention, but has failed to settle internationally. This paper puts forward a traceability method of light-scattering airborne particle counter’s counting performance on single particle size, based on Anodic Aluminum Oxide (AAO) template andScanning Electron Microscope (SEM), by reforming the traditional standard airborne particle counter, building a measurement system including AAO and SEM, and utilizing the method of statistical physics in data processing to obtain more accurate measurement results. According to the actual test results and its uncertainty analysis, the traceability method of light-scattering airborne particle counter’s counting performance based on AAO and SEM makes sense in theory, and has certain research value on a solution to the traceability problem of light-scattering airborne particle counter internationally.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"331 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115951268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Balčytis, G. Seniutinas, D. Urbonas, M. Gabalis, K. Vaškevičius, R. Petruskevicius, G. Molis, G. Valušis, S. Juodkazis
Electron and ion beam lithographies were used to fabricate and/or functionalize large scale - millimetre footprint - micro-optical elements: coupled waveguide-resonator structures on silicon-on-insulator (SOI) and THz antennas on low temperature grown LT-GaAs. Waveguide elements on SOI were made without stitching errors using a fixed beam moving stage approach. THz antennas were created using a three-step litography process. First, gold THz antennas defined by standard mask projection lithography were annealed to make an ohmic contact on LT-GaAs and post-processing with Ga-ion beam was used to define nano-gaps and inter digitised contacts for better charge collection. These approaches show the possibility to fabricate large footprint patterns with nanoscale precision features and overlay accuracy. Emerging 3D nanofabrication trends are discussed.
{"title":"High precision fabrication of antennas and sensors","authors":"A. Balčytis, G. Seniutinas, D. Urbonas, M. Gabalis, K. Vaškevičius, R. Petruskevicius, G. Molis, G. Valušis, S. Juodkazis","doi":"10.1117/12.2180814","DOIUrl":"https://doi.org/10.1117/12.2180814","url":null,"abstract":"Electron and ion beam lithographies were used to fabricate and/or functionalize large scale - millimetre footprint - micro-optical elements: coupled waveguide-resonator structures on silicon-on-insulator (SOI) and THz antennas on low temperature grown LT-GaAs. Waveguide elements on SOI were made without stitching errors using a fixed beam moving stage approach. THz antennas were created using a three-step litography process. First, gold THz antennas defined by standard mask projection lithography were annealed to make an ohmic contact on LT-GaAs and post-processing with Ga-ion beam was used to define nano-gaps and inter digitised contacts for better charge collection. These approaches show the possibility to fabricate large footprint patterns with nanoscale precision features and overlay accuracy. Emerging 3D nanofabrication trends are discussed.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"157 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121190666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Macro-micro fast coupling system of dual-stage is used for the detachment and coupling of the macro-motion system and the wafer-stage. When the macro-motion system couples with the wafer-stage, the wafer-stage is driven by macro-motor to achieve long stroke motion. In this paper, the bottom air bearings of wafer stage are analyzed when the driving force of macro motor shifts the center of mass of wafer stage in Z direction. The X, Y, Z stiffness of the coupling system are obtained by using ANSYS.
{"title":"Effects of dynamic characters of the macro-micro fast coupling system in long stroke system","authors":"Jianwei Wu, Yongjie Yuan, Jiwen Cui","doi":"10.1117/12.2181599","DOIUrl":"https://doi.org/10.1117/12.2181599","url":null,"abstract":"Macro-micro fast coupling system of dual-stage is used for the detachment and coupling of the macro-motion system and the wafer-stage. When the macro-motion system couples with the wafer-stage, the wafer-stage is driven by macro-motor to achieve long stroke motion. In this paper, the bottom air bearings of wafer stage are analyzed when the driving force of macro motor shifts the center of mass of wafer stage in Z direction. The X, Y, Z stiffness of the coupling system are obtained by using ANSYS.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121251000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The time coordinates of interaction points could be established by extracting the envelop of a transient signal waveform through Hilbert transform and formulating the line equations for the increasing and decreasing segments of an envelope using least square method. The difference of time coordinates lies in the duration time. The duration of increasing and decreasing segments and the whole duration of AC transient signal waveform could be accurately evaluated using waveform measurement and least square method. It was found through analyses and experiments that an uncertainty of less than 0.5ms could be achieved for a SNR of more than 40 dB. It was therefore concluded that the proposed method could be used to measure under-voltage waveform and further extended to do power characteristics testing including compliance test of automotive electronic devices.
{"title":"Measurement of duration of AC transient signal waveform using Hilbert transform and least square method","authors":"Puzhong Ouyang, Zhonghua Zhang","doi":"10.1117/12.2182352","DOIUrl":"https://doi.org/10.1117/12.2182352","url":null,"abstract":"The time coordinates of interaction points could be established by extracting the envelop of a transient signal waveform through Hilbert transform and formulating the line equations for the increasing and decreasing segments of an envelope using least square method. The difference of time coordinates lies in the duration time. The duration of increasing and decreasing segments and the whole duration of AC transient signal waveform could be accurately evaluated using waveform measurement and least square method. It was found through analyses and experiments that an uncertainty of less than 0.5ms could be achieved for a SNR of more than 40 dB. It was therefore concluded that the proposed method could be used to measure under-voltage waveform and further extended to do power characteristics testing including compliance test of automotive electronic devices.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127933177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An optical fiber waist-enlarged bitaper-based Michelson interferometric sensor is proposed and experimentally demonstrated for humidity measurement. The waist enlarged bitaper is created for light coupling between core mode and cladding modes propagating in the fiber interferometer. A chitason layer is plated onto the surface of the interferometer to act as a humidity-to-refractive index (RI) transducer and thus humidity measurement can be realized by monitoring the wavelength shifts of its interferogram induced by RI variations. The influence of the coating thickness and concentration of chitason on relative humidity (RH) measurement is experimentally studied. The coating sensor demonstrates an optimal humidity-sensing ability, with a humidity sensitivity and fast time-response of ~26 pm/%RH and ~5 s respectively, when it is 3-dip coated in chitason solutions of the concentration of 1 wt.%. The proposed humidity sensor is compact, cost-effective and of easy-operation, therefore it has potentials in many practical applications.
{"title":"Optical fiber waist-enlarged bitaper-based Michelson interferometric humidity sensor","authors":"P. Hu, Zhemin Chen, Sunqiang Pan, Guoshui Li, Jianfeng Zhang, Jia Cheng","doi":"10.1117/12.2180815","DOIUrl":"https://doi.org/10.1117/12.2180815","url":null,"abstract":"An optical fiber waist-enlarged bitaper-based Michelson interferometric sensor is proposed and experimentally demonstrated for humidity measurement. The waist enlarged bitaper is created for light coupling between core mode and cladding modes propagating in the fiber interferometer. A chitason layer is plated onto the surface of the interferometer to act as a humidity-to-refractive index (RI) transducer and thus humidity measurement can be realized by monitoring the wavelength shifts of its interferogram induced by RI variations. The influence of the coating thickness and concentration of chitason on relative humidity (RH) measurement is experimentally studied. The coating sensor demonstrates an optimal humidity-sensing ability, with a humidity sensitivity and fast time-response of ~26 pm/%RH and ~5 s respectively, when it is 3-dip coated in chitason solutions of the concentration of 1 wt.%. The proposed humidity sensor is compact, cost-effective and of easy-operation, therefore it has potentials in many practical applications.","PeriodicalId":380636,"journal":{"name":"Precision Engineering Measurements and Instrumentation","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134075108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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