Understanding the structural, chemical, and functional properties of materials is essential for advancing performance. Over the past two decades, transmission electron microscopy (TEM) has undergone transformative developments, with state-of-the-art imaging, diffraction, and spectroscopy establishing it as a cornerstone of materials characterization at the micro- to nanoscale. A key breakthrough has been the advent of pixelated direct electron detectors, which enable the recording of two-dimensional diffraction patterns at each probe position and have given rise to four-dimensional scanning transmission electron microscopy (4D-STEM). Analysis of 4D-STEM datasets provides rich information about strain distribution, crystallographic orientation, and variations in electric and magnetic fields across multiple length scales. Moreover, ptychographic reconstruction, achieved by decoupling the electron probe wave functions and specimen object functions, allows retrieval of quantitative phase information with atomic-scale precision, thereby surpassing the resolution limits of conventional TEM. This review summarizes the principles and recent applications of 4D-STEM, encompassing virtual detector imaging, strain and orientation mapping, electromagnetic field measurements, radial distribution function analysis, ptychography, and data acquisition strategies in functional materials. Finally, it highlights the challenges and future opportunities in advancing 4D-STEM toward deeper insights into material properties and the rational design of next-generation materials.
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