Pub Date : 2007-10-01DOI: 10.1109/EPEP.2007.4387193
F. Andriulli, H. Bağcı, F. Vipiana, G. Vecchi, E. Michielssen
A hierarchical marching-on-in-time (MOT)-based scheme to discretize and solve the time domain electric field integral equation (EFIE) is presented. The scheme is immune to time domain low-frequency breakdown phenomena and gives rise to better conditioned linear systems than the ones obtained using standard Rao-Wilton-Glisson (RWG) and loop-star bases. The proposed method is implemented on a distributed memory cluster and applied to the analysis of transient wave interactions with an 88-port printed circuit board structure and a three-layer stacked inductor.
{"title":"A Parallel Hierarchical Solver for the Integral Equation Analysis of Low Frequency Devices","authors":"F. Andriulli, H. Bağcı, F. Vipiana, G. Vecchi, E. Michielssen","doi":"10.1109/EPEP.2007.4387193","DOIUrl":"https://doi.org/10.1109/EPEP.2007.4387193","url":null,"abstract":"A hierarchical marching-on-in-time (MOT)-based scheme to discretize and solve the time domain electric field integral equation (EFIE) is presented. The scheme is immune to time domain low-frequency breakdown phenomena and gives rise to better conditioned linear systems than the ones obtained using standard Rao-Wilton-Glisson (RWG) and loop-star bases. The proposed method is implemented on a distributed memory cluster and applied to the analysis of transient wave interactions with an 88-port printed circuit board structure and a three-layer stacked inductor.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115736078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-10-01DOI: 10.1109/EPEP.2007.4387154
Seungyong Baek, Edward A. Lee, Baegin Sung
We proposed the computation method of the intra-pair skew for an imbalance differential line using the modified mixed-mode S-parameter. Since the intra-pair skew is caused by the difference of arriving time at each trace when the differential-mode signal is sent through the differential line, it is hard to calculate the intra-pair skew in differential-mode by using the standard s-parameter or mixed-mode s-parameter. The modified mixed-mode s-parameter can represent the relation between differentia-mode incident wave and output wave of each trace. Consequently, we can obtain the accurate intra-pair skew using the modified mixed-mode s-parameter at frequency-domain. The proposed computation method has been verified by the time-domain and frequency-domain simulations for imbalance transmission line.
{"title":"Computation of Intra-pair Skew for Imbalance Differential Line using Modified Mixed-mode S-parameter","authors":"Seungyong Baek, Edward A. Lee, Baegin Sung","doi":"10.1109/EPEP.2007.4387154","DOIUrl":"https://doi.org/10.1109/EPEP.2007.4387154","url":null,"abstract":"We proposed the computation method of the intra-pair skew for an imbalance differential line using the modified mixed-mode S-parameter. Since the intra-pair skew is caused by the difference of arriving time at each trace when the differential-mode signal is sent through the differential line, it is hard to calculate the intra-pair skew in differential-mode by using the standard s-parameter or mixed-mode s-parameter. The modified mixed-mode s-parameter can represent the relation between differentia-mode incident wave and output wave of each trace. Consequently, we can obtain the accurate intra-pair skew using the modified mixed-mode s-parameter at frequency-domain. The proposed computation method has been verified by the time-domain and frequency-domain simulations for imbalance transmission line.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133782196","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-10-01DOI: 10.1109/EPEP.2007.4387142
T. Winkel, R. Freeh, T. Gneiting
Long range via coupling effects are analysed for connectors with a huge signal count and high speed signals using 3D field calculations. The effect was also verified with time domain measurements. The results are discussed with respect to the impact of long range coupling on signal integrity.
{"title":"Long Range Connector Via Coupling Effects for High Speed Signals","authors":"T. Winkel, R. Freeh, T. Gneiting","doi":"10.1109/EPEP.2007.4387142","DOIUrl":"https://doi.org/10.1109/EPEP.2007.4387142","url":null,"abstract":"Long range via coupling effects are analysed for connectors with a huge signal count and high speed signals using 3D field calculations. The effect was also verified with time domain measurements. The results are discussed with respect to the impact of long range coupling on signal integrity.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127987675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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