Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256230
Chi-Hsuan Cheng, Tzong-Lin Wu
In this paper, an analysis method for multiconductor-transmission-line (MTL) systems by applying modal decomposition and Kirchhoff's circuit laws is proposed. By defining the input impedance matrix in each section of the structure, this method can be applied to the cases in which number of conductor changes, or additional terminations are included. Following the flowchart, the modal current as well as the line voltage/current can be all obtained. Two structures are simulated for validation, where good agreement can be seen in both the cases. This analysis method can be applied to estimate voltage/current distribution, crosstalk, and mode conversion, which is helpful to solve the signal integrity (SI) and electromagnetic interference (EMI) problem when designing.
{"title":"Effective current distribution analysis method for multiconductor-transmission-line (MTL) system with arbirary conductor number variation","authors":"Chi-Hsuan Cheng, Tzong-Lin Wu","doi":"10.1109/ISEMC.2015.7256230","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256230","url":null,"abstract":"In this paper, an analysis method for multiconductor-transmission-line (MTL) systems by applying modal decomposition and Kirchhoff's circuit laws is proposed. By defining the input impedance matrix in each section of the structure, this method can be applied to the cases in which number of conductor changes, or additional terminations are included. Following the flowchart, the modal current as well as the line voltage/current can be all obtained. Two structures are simulated for validation, where good agreement can be seen in both the cases. This analysis method can be applied to estimate voltage/current distribution, crosstalk, and mode conversion, which is helpful to solve the signal integrity (SI) and electromagnetic interference (EMI) problem when designing.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126184635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256234
J. L. Lansink Rotgerink, H. Schippers
A closed-form expression for near-end crosstalk between an unshielded and a double shielded wire is derived. Analysis in the frequency domain of such crosstalk expressions leads to generic crosstalk predictions. These predictions contain regions of different frequency dependencies separated by transition frequencies.
{"title":"Generic prediction of crosstalk between shielded wires","authors":"J. L. Lansink Rotgerink, H. Schippers","doi":"10.1109/ISEMC.2015.7256234","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256234","url":null,"abstract":"A closed-form expression for near-end crosstalk between an unshielded and a double shielded wire is derived. Analysis in the frequency domain of such crosstalk expressions leads to generic crosstalk predictions. These predictions contain regions of different frequency dependencies separated by transition frequencies.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"185 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124698749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256142
Stefan Schottke, Stephan Rademacher, Jan Meyer, P. Schegner
Switching frequencies of modern, energy-efficient power electronics are commonly located within the frequency range between 2 kHz and 150 kHz, also referred to as supraharmonics. Due to the increasing use of this equipment, rising emission levels and a rising number of interference cases have been observed recently. While first studies exist about the emission and interaction of equipment, little is known about the propagation of supraharmonics via cables and transformers. This paper presents recent research results in order to identify the transfer characteristic of a distribution transformer at higher frequencies based on measurements. After a description of the used transformer, the measurement setup and the performed measurements are described in detail. In order to provide test conditions, which are as close to reality as possible, a two-frequency test signal is used. The last part of the paper discusses the results of the measurements, covering injection on the MV and the LV side as well as single or three-phase supraharmonics among others. The results are quantified by indices representing the transfer (ratio between the same phases at both sides) and the coupling between different phases. The presented results provide a comprehensive basis for the development of respective simulation models.
{"title":"Transfer characteristic of a MV/LV transformer in the frequency range between 2 kHz and 150 kHz","authors":"Stefan Schottke, Stephan Rademacher, Jan Meyer, P. Schegner","doi":"10.1109/ISEMC.2015.7256142","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256142","url":null,"abstract":"Switching frequencies of modern, energy-efficient power electronics are commonly located within the frequency range between 2 kHz and 150 kHz, also referred to as supraharmonics. Due to the increasing use of this equipment, rising emission levels and a rising number of interference cases have been observed recently. While first studies exist about the emission and interaction of equipment, little is known about the propagation of supraharmonics via cables and transformers. This paper presents recent research results in order to identify the transfer characteristic of a distribution transformer at higher frequencies based on measurements. After a description of the used transformer, the measurement setup and the performed measurements are described in detail. In order to provide test conditions, which are as close to reality as possible, a two-frequency test signal is used. The last part of the paper discusses the results of the measurements, covering injection on the MV and the LV side as well as single or three-phase supraharmonics among others. The results are quantified by indices representing the transfer (ratio between the same phases at both sides) and the coupling between different phases. The presented results provide a comprehensive basis for the development of respective simulation models.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128251132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256288
S. Moon, Jihyun Lee, Jaeyoul Lee
In this work, we proposed a novel approach for electrostatic discharge (ESD) noise stress analysis using transfer impedance analysis in a platform for a large-scale integration chip. In the electronic industry an ESD test is widely taken to evaluate the noise immunity of a designed electronic device. In this ESD test, critical hardware damage or functional problems may occur due to temporary electrical disturbances produced by applying an external electrical shock. By manipulating the transfer-impedance difference from a noise-induced point to power/ground points of an IC, the influence of an induced ESD noise that could significantly affect the IC's performance was analyzed. The ESD noise stress affects supply voltage to become unstable in a power delivery network (PDN) and adversely affects analog/digital circuit operations during data processing. The impedance differences in the PDN produces supply voltage instability in a designed chip. Thus, by analyzing the transfer impedance from the PCB to the power nets of a time-controller IC, the variation of supply voltage due to external ESD noise can be estimated. In order to separate noise-to-power and noise-to-ground paths on a PCB, an additional ground layer, which exists only in simulation, was used for estimating temporal voltage fluctuation due to impedance imbalance between the noise-to-power and the noise-to-ground paths. In comparison, the proposed approach was demonstrated to agree with the measurement up to 500 MHz. This estimation result indicated that the simulation approach on ESD noise immunity using transfer impedance is useful to predict the influence of electrical stress to a designed IC on a PCB. The estimation approach on ESD noise impact is expected to be applicable for the PDN design of a PCB/IC to improve its ESD noise immunity prior to its implementation.
{"title":"A novel approach for ESD-immunity analysis using channel transfer impedance on the power delivery network of a large-scale integration chip","authors":"S. Moon, Jihyun Lee, Jaeyoul Lee","doi":"10.1109/ISEMC.2015.7256288","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256288","url":null,"abstract":"In this work, we proposed a novel approach for electrostatic discharge (ESD) noise stress analysis using transfer impedance analysis in a platform for a large-scale integration chip. In the electronic industry an ESD test is widely taken to evaluate the noise immunity of a designed electronic device. In this ESD test, critical hardware damage or functional problems may occur due to temporary electrical disturbances produced by applying an external electrical shock. By manipulating the transfer-impedance difference from a noise-induced point to power/ground points of an IC, the influence of an induced ESD noise that could significantly affect the IC's performance was analyzed. The ESD noise stress affects supply voltage to become unstable in a power delivery network (PDN) and adversely affects analog/digital circuit operations during data processing. The impedance differences in the PDN produces supply voltage instability in a designed chip. Thus, by analyzing the transfer impedance from the PCB to the power nets of a time-controller IC, the variation of supply voltage due to external ESD noise can be estimated. In order to separate noise-to-power and noise-to-ground paths on a PCB, an additional ground layer, which exists only in simulation, was used for estimating temporal voltage fluctuation due to impedance imbalance between the noise-to-power and the noise-to-ground paths. In comparison, the proposed approach was demonstrated to agree with the measurement up to 500 MHz. This estimation result indicated that the simulation approach on ESD noise immunity using transfer impedance is useful to predict the influence of electrical stress to a designed IC on a PCB. The estimation approach on ESD noise impact is expected to be applicable for the PDN design of a PCB/IC to improve its ESD noise immunity prior to its implementation.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"8 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127514019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256387
Per Thaastrup Jensen, A. Mynster, Rasmus Brun Behnke, J. P. Bjerre
This paper describes an experimental approach for determining the more important EMC immunity test stressors for EMC HALT (Highly Accelerated Limit Test) immunity test on a given test object. The more relevant stressors are chosen based upon a large number of collected EMC test data, EMC design rules and design statements that are selected through a Grounded Theory research process. “Grounded” in this context has nothing to do with electrical grounding. The concept of using a Grounded Theory approach for the construction of a decision tool for EMC HALT analysis has been tested by the EMC research team of the present company. The process of retrieving the input data statements from conference papers, literature and test data has been executed, and the subsequent process of sorting and merging these statements under suitable sub-categories and Main Categories has been completed. The statements have been sorted and merged into the defined Main Categories and sub-categories through application of the joint experience and knowledge of the EMC research team members. A premature decision tool in the form of a rule check spreadsheet has been developed and briefly tested. It is concluded that the tool provides reasonable but also foreseeable guidance on decision of optimal EMC test parameters for EMC HALT analysis on a specific test object.
{"title":"Grounded theory and EMC immunity test on the use of Grounded Theory based upon collected test data and design guidelines for achievement of good EMC performance.","authors":"Per Thaastrup Jensen, A. Mynster, Rasmus Brun Behnke, J. P. Bjerre","doi":"10.1109/ISEMC.2015.7256387","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256387","url":null,"abstract":"This paper describes an experimental approach for determining the more important EMC immunity test stressors for EMC HALT (Highly Accelerated Limit Test) immunity test on a given test object. The more relevant stressors are chosen based upon a large number of collected EMC test data, EMC design rules and design statements that are selected through a Grounded Theory research process. “Grounded” in this context has nothing to do with electrical grounding. The concept of using a Grounded Theory approach for the construction of a decision tool for EMC HALT analysis has been tested by the EMC research team of the present company. The process of retrieving the input data statements from conference papers, literature and test data has been executed, and the subsequent process of sorting and merging these statements under suitable sub-categories and Main Categories has been completed. The statements have been sorted and merged into the defined Main Categories and sub-categories through application of the joint experience and knowledge of the EMC research team members. A premature decision tool in the form of a rule check spreadsheet has been developed and briefly tested. It is concluded that the tool provides reasonable but also foreseeable guidance on decision of optimal EMC test parameters for EMC HALT analysis on a specific test object.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130950912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256393
Wenjie Kong, E. Li
In this paper, an effective and efficient equivalent dipole-moment method is proposed to predict the radiated emission from PCBs mounted in a shielding cavity. The equivalent dipole-moment model consisting of magnetic and electric dipole array based on near-field scanning is used to replace the PCB to mimic the radiated emission with the presence of the shielding cavity. To improve the simulation efficiency, an optimization approach is developed to reduce the number of equivalent dipoles while keeping the modeling accuracy within an excellent degree. Synthetic results demonstrate that the proposed method can predict both magnetic near fields inside and outside the shielding cavity with a good agreement.
{"title":"Prediction of PCB radiated emission in shielding cavity using equivalent dipole modeling","authors":"Wenjie Kong, E. Li","doi":"10.1109/ISEMC.2015.7256393","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256393","url":null,"abstract":"In this paper, an effective and efficient equivalent dipole-moment method is proposed to predict the radiated emission from PCBs mounted in a shielding cavity. The equivalent dipole-moment model consisting of magnetic and electric dipole array based on near-field scanning is used to replace the PCB to mimic the radiated emission with the presence of the shielding cavity. To improve the simulation efficiency, an optimization approach is developed to reduce the number of equivalent dipoles while keeping the modeling accuracy within an excellent degree. Synthetic results demonstrate that the proposed method can predict both magnetic near fields inside and outside the shielding cavity with a good agreement.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125545610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256188
B. Audone, M. Borsero
Median filters can be successfully used to eliminate impulsive interference and noise on signal lines overcoming the difficulties of linear filters, which are not suitable to address this problem. Median and median type filters have been popular for the last forty years; they found their main applications in image and speech processing. Unfortunately they are rather unknown to the EMC community. The purpose of this paper is to illustrate the practical implementation of median filters in system applications addressed to meet the demanding requirements of EMC problems.
{"title":"Median filters to suppress interference","authors":"B. Audone, M. Borsero","doi":"10.1109/ISEMC.2015.7256188","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256188","url":null,"abstract":"Median filters can be successfully used to eliminate impulsive interference and noise on signal lines overcoming the difficulties of linear filters, which are not suitable to address this problem. Median and median type filters have been popular for the last forty years; they found their main applications in image and speech processing. Unfortunately they are rather unknown to the EMC community. The purpose of this paper is to illustrate the practical implementation of median filters in system applications addressed to meet the demanding requirements of EMC problems.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126482064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256379
R. Mestrom, A. Roc’h, Yingzhe Xi
To describe radiated emission from cables in motor drive systems, a radiating (thin) wire antenna can be used. This equivalence allows the common mode impedance of the cable in such a system to be modeled as the input impedance of the antenna. Using a method of moments implementation for solving Pocklington's equation for a vertical wire antenna above a perfectly conducting ground plane, a fast and flexible numerical model for the input impedance of the antenna is presented. Validation with measurements shows that the model captures the relevant behaviour, thus allowing it to be used effectively as a first step in the design process of motor drive systems.
{"title":"Modeling the common mode impedance of motor drive systems using the antenna wire concept","authors":"R. Mestrom, A. Roc’h, Yingzhe Xi","doi":"10.1109/ISEMC.2015.7256379","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256379","url":null,"abstract":"To describe radiated emission from cables in motor drive systems, a radiating (thin) wire antenna can be used. This equivalence allows the common mode impedance of the cable in such a system to be modeled as the input impedance of the antenna. Using a method of moments implementation for solving Pocklington's equation for a vertical wire antenna above a perfectly conducting ground plane, a fast and flexible numerical model for the input impedance of the antenna is presented. Validation with measurements shows that the model captures the relevant behaviour, thus allowing it to be used effectively as a first step in the design process of motor drive systems.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115269947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256247
H. Shim, Hongseok Kim, Y. Kwack, Minkang Moon, Hyunsuk Lee, Jinwook Song, Joungho Kim, Beomshik Kim, Eulyong Kim
In this study, an inverter model including non-ideal Insulated Gate Bipolar Transistors (IGBTs) characteristics and a busbar model using impedance measurement is proposed. A motor drive system in Hybrid Electric Vehicle (HEV) consists of a battery, an inverter, a cable, and an electric motor. The inverter is not only a voltage source, but also one of the principal noise sources in the motor drive system. Since switching operations of power devices in the inverter make Electromagnetic Interference (EMI) noise, a non-ideal model of the IGBTs is needed for accurate EMI analysis of the motor drive system. By simulating the motor drive system with proposed non-ideal inverter model, it is possible to predict accurate common mode current noises in view of whole vehicle level. The model is verified by comparison with measurement.
{"title":"Inverter modeling including non-ideal IGBT characteristics in Hybrid Electric Vehicle for accurate EMI noise prediction","authors":"H. Shim, Hongseok Kim, Y. Kwack, Minkang Moon, Hyunsuk Lee, Jinwook Song, Joungho Kim, Beomshik Kim, Eulyong Kim","doi":"10.1109/ISEMC.2015.7256247","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256247","url":null,"abstract":"In this study, an inverter model including non-ideal Insulated Gate Bipolar Transistors (IGBTs) characteristics and a busbar model using impedance measurement is proposed. A motor drive system in Hybrid Electric Vehicle (HEV) consists of a battery, an inverter, a cable, and an electric motor. The inverter is not only a voltage source, but also one of the principal noise sources in the motor drive system. Since switching operations of power devices in the inverter make Electromagnetic Interference (EMI) noise, a non-ideal model of the IGBTs is needed for accurate EMI analysis of the motor drive system. By simulating the motor drive system with proposed non-ideal inverter model, it is possible to predict accurate common mode current noises in view of whole vehicle level. The model is verified by comparison with measurement.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115283626","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256284
Corey Vyhlidal, V. Rajamani, C. Bunting, Praveen Damacharla, V. Devabhaktuni
The Quality factors of an empty and loaded reverberant cavity were measured using time domain techniques. Measurements were performed for a set of frequencies under different loading conditions achieved by varying the material type and material amount. The measured data were used to develop an artificial neural network (ANN) model that predicts the amount of material required for a desired change in Q at a certain frequency for the cavity under consideration. The results show good comparison between the measured and the predicted values, thereby supporting the benefit of the ANN paradigm for studies like this, where experiments tend to be expensive.
{"title":"Estimation of absorber performance using reverberation techniques and artificial neural network models","authors":"Corey Vyhlidal, V. Rajamani, C. Bunting, Praveen Damacharla, V. Devabhaktuni","doi":"10.1109/ISEMC.2015.7256284","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256284","url":null,"abstract":"The Quality factors of an empty and loaded reverberant cavity were measured using time domain techniques. Measurements were performed for a set of frequencies under different loading conditions achieved by varying the material type and material amount. The measured data were used to develop an artificial neural network (ANN) model that predicts the amount of material required for a desired change in Q at a certain frequency for the cavity under consideration. The results show good comparison between the measured and the predicted values, thereby supporting the benefit of the ANN paradigm for studies like this, where experiments tend to be expensive.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128023287","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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