Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256274
F. Grassi, G. Spadacini, S. Pignari
This work investigates the main properties of the time-domain response of a commercial probe for bulk current injection (BCI) excited with impulsive waveforms. To this end, circuit modeling of the injection device and the calibration jig is exploited to quantify the distortion experienced by the input pulse due to the frequency-dependent behavior of the probe. Suitable feeding conditions are then identified to compensate for those effects, and assure injection of impulsive waveforms with desired characteristics. Circuit simulation of a simple setup is then used to analyze the effects on pulse shape due to cable length, probe positioning, and mismatching at the terminations of the wiring structure interconnecting the equipment under test to auxiliary equipment.
{"title":"Time-domain response of bulk current injection probes to impulsive stress waveforms","authors":"F. Grassi, G. Spadacini, S. Pignari","doi":"10.1109/ISEMC.2015.7256274","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256274","url":null,"abstract":"This work investigates the main properties of the time-domain response of a commercial probe for bulk current injection (BCI) excited with impulsive waveforms. To this end, circuit modeling of the injection device and the calibration jig is exploited to quantify the distortion experienced by the input pulse due to the frequency-dependent behavior of the probe. Suitable feeding conditions are then identified to compensate for those effects, and assure injection of impulsive waveforms with desired characteristics. Circuit simulation of a simple setup is then used to analyze the effects on pulse shape due to cable length, probe positioning, and mismatching at the terminations of the wiring structure interconnecting the equipment under test to auxiliary equipment.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128999772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256211
J. Hansen, C. Potratz
Physical Equivalent Circuits of electronic devices are very useful for EMC root-cause analysis, because they boil down complex coupling paths into rather simple circuit schematics, displaying only relevant inductive and capacitive structures. However, their derivation can be extremely time-consuming and requires thorough understanding of the device under test. Recently, a method was proposed to derive such a circuit with the aid of a computer. Whereas the design of an inductive network is relatively straight forward, correct placement of only the relevant capacities is difficult. In frequency range of interest, there are often too few resonances to determine capacitances uniquely, revealing that capacity placement has typical properties of an ill-posed problem. Engineering intuition states that often, only few capacitances dominate the root-causes of an EMC spectrum. We present a regularization method that allows to quickly determine the C matrix with fewest number of entries via an iterative least squares minimization. We are thus able to compute a unique physically meaningful capacitance matrix of a physical equivalent circuit.
{"title":"Capacity extraction in physical equivalent networks","authors":"J. Hansen, C. Potratz","doi":"10.1109/ISEMC.2015.7256211","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256211","url":null,"abstract":"Physical Equivalent Circuits of electronic devices are very useful for EMC root-cause analysis, because they boil down complex coupling paths into rather simple circuit schematics, displaying only relevant inductive and capacitive structures. However, their derivation can be extremely time-consuming and requires thorough understanding of the device under test. Recently, a method was proposed to derive such a circuit with the aid of a computer. Whereas the design of an inductive network is relatively straight forward, correct placement of only the relevant capacities is difficult. In frequency range of interest, there are often too few resonances to determine capacitances uniquely, revealing that capacity placement has typical properties of an ill-posed problem. Engineering intuition states that often, only few capacitances dominate the root-causes of an EMC spectrum. We present a regularization method that allows to quickly determine the C matrix with fewest number of entries via an iterative least squares minimization. We are thus able to compute a unique physically meaningful capacitance matrix of a physical equivalent circuit.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"87 37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130363296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256368
Stanislav Scheier, Dominik Deelmann, S. Frei, C. Widemann, W. Mathis
Nonlinear voltage sensitive protection elements, e.g. Multi-Layer Varistor (MLV) or Transient Voltage Suppressor (TVS) are useful to protect IC pins from ESD on System Level. Such elements might exhibit a significant voltage overshoot for fast transients. This work describes a combined time and frequency domain characterization method and its application to an MLV. Impedance measurements with VNA at different DC-bias points are used for model identification and parameterization. The static nonlinear IV-behavior of nonlinear model part at higher voltages and currents is extrapolated with a TLP IV-curve. The model is successfully validated with ESD pulses in time domain. The transient behavior including the occurring voltage overshoot can be reproduced with high accuracy.
{"title":"A combined time and frequency domain characterization method for modeling of overvoltage protection elements","authors":"Stanislav Scheier, Dominik Deelmann, S. Frei, C. Widemann, W. Mathis","doi":"10.1109/ISEMC.2015.7256368","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256368","url":null,"abstract":"Nonlinear voltage sensitive protection elements, e.g. Multi-Layer Varistor (MLV) or Transient Voltage Suppressor (TVS) are useful to protect IC pins from ESD on System Level. Such elements might exhibit a significant voltage overshoot for fast transients. This work describes a combined time and frequency domain characterization method and its application to an MLV. Impedance measurements with VNA at different DC-bias points are used for model identification and parameterization. The static nonlinear IV-behavior of nonlinear model part at higher voltages and currents is extrapolated with a TLP IV-curve. The model is successfully validated with ESD pulses in time domain. The transient behavior including the occurring voltage overshoot can be reproduced with high accuracy.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"304 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130802841","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256264
R. Blečić, R. Gillon, B. Nauwelaers, A. Barić
Radiation characteristics of an input decoupling network for switching DC-DC converters are analyzed by a set of electromagnetic (EM) simulations. Input decoupling network is a part of a DC-DC converter with a dominant contribution to its radiated emissions. The impact of geometrical parameters of an input decoupling network such as the dimensions of metal plates on a printed circuit board (PCB), thickness of a PCB, number of layers, number of vias and radius of vias on the maximum radiated fields is analyzed. Design guidelines for minimizing radiated emissions of an input decoupling network for switching DC-DC converters are summarized.
{"title":"Radiation of input decoupling network typically used in switching DC-DC converters","authors":"R. Blečić, R. Gillon, B. Nauwelaers, A. Barić","doi":"10.1109/ISEMC.2015.7256264","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256264","url":null,"abstract":"Radiation characteristics of an input decoupling network for switching DC-DC converters are analyzed by a set of electromagnetic (EM) simulations. Input decoupling network is a part of a DC-DC converter with a dominant contribution to its radiated emissions. The impact of geometrical parameters of an input decoupling network such as the dimensions of metal plates on a printed circuit board (PCB), thickness of a PCB, number of layers, number of vias and radius of vias on the maximum radiated fields is analyzed. Design guidelines for minimizing radiated emissions of an input decoupling network for switching DC-DC converters are summarized.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128976662","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256362
N. Zhang, W. Nah
The novel extended mixed-mode S-parameters of the three-conductor lines are proposed in this paper based on the mode analysis. The extended mixed-mode S-parameters do not contain the cross-mode S-parameters due to the independent differential-mode and common-mode analysis. In addition, two new conversion matrices containing the current division factor are also proposed to convert the extended mixed-mode S-parameters to the standard S-parameters. Finally, the validity of the proposed theory is verified by the EM simulations of a shielded cable.
{"title":"Verification of novel extended mixed-mode S-parameters on three-conductor lines","authors":"N. Zhang, W. Nah","doi":"10.1109/ISEMC.2015.7256362","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256362","url":null,"abstract":"The novel extended mixed-mode S-parameters of the three-conductor lines are proposed in this paper based on the mode analysis. The extended mixed-mode S-parameters do not contain the cross-mode S-parameters due to the independent differential-mode and common-mode analysis. In addition, two new conversion matrices containing the current division factor are also proposed to convert the extended mixed-mode S-parameters to the standard S-parameters. Finally, the validity of the proposed theory is verified by the EM simulations of a shielded cable.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127239449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256399
R. Zielinski
According to the Frequency Allocation Table, in the frequency range 10.7-11.7 GHz, on the surface of the Earth, only Fixed Services (FS) of the Point to Point type can operate. This frequency range has been also used, for a long time, by Satellite Broadcasting (BSS). This situation may cause EMC problems. The necessary models of transmitters, receivers and antennas bases on existing standards and used by these systems were presented in [1]. The preparation of the interference evaluation procedures taking into account the location of the stations and propagation phenomena is a subject of this paper.
{"title":"EMC analysis between Fixed Service and Broadcasting Satellite service in the band 10.7 – 11.7 GHz Interference evaluation","authors":"R. Zielinski","doi":"10.1109/ISEMC.2015.7256399","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256399","url":null,"abstract":"According to the Frequency Allocation Table, in the frequency range 10.7-11.7 GHz, on the surface of the Earth, only Fixed Services (FS) of the Point to Point type can operate. This frequency range has been also used, for a long time, by Satellite Broadcasting (BSS). This situation may cause EMC problems. The necessary models of transmitters, receivers and antennas bases on existing standards and used by these systems were presented in [1]. The preparation of the interference evaluation procedures taking into account the location of the stations and propagation phenomena is a subject of this paper.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127338732","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256249
A. Ruddle, L. Low
In-service monitoring of magnetic field emissions from vehicle electrical powertrain components could provide useful information relating to the development of possible faults. Such changes may also have implications for human exposure to low frequency magnetic fields, but the permanent installation of magnetic field sensors in occupant locations is not practicable. This paper outlines a simulation-based investigation of issues relating to the estimation of occupant exposure to magnetic fields using magnetic field measurements made in the vicinity of powertrain components and identifies processing implications.
{"title":"Feasibility of estimating in-service vehicle occupant exposure to electrical powertrain magnetic fields using non-local magnetic field measurements","authors":"A. Ruddle, L. Low","doi":"10.1109/ISEMC.2015.7256249","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256249","url":null,"abstract":"In-service monitoring of magnetic field emissions from vehicle electrical powertrain components could provide useful information relating to the development of possible faults. Such changes may also have implications for human exposure to low frequency magnetic fields, but the permanent installation of magnetic field sensors in occupant locations is not practicable. This paper outlines a simulation-based investigation of issues relating to the estimation of occupant exposure to magnetic fields using magnetic field measurements made in the vicinity of powertrain components and identifies processing implications.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121624812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256176
L. Nuño
Health protection reference levels were established for electric and magnetic fields. However, the corresponding reference levels for voltages and currents in cables could not be established in the general case, since they strongly depend on each particular situation. In this paper, health protection reference levels for voltages and currents are obtained for the relevant case of typical domestic electrical installations. Then, voltages and currents of most common signals in these installations are compared with these reference levels.
{"title":"Health protection reference levels for voltages and currents in typical domestic electrical installations","authors":"L. Nuño","doi":"10.1109/ISEMC.2015.7256176","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256176","url":null,"abstract":"Health protection reference levels were established for electric and magnetic fields. However, the corresponding reference levels for voltages and currents in cables could not be established in the general case, since they strongly depend on each particular situation. In this paper, health protection reference levels for voltages and currents are obtained for the relevant case of typical domestic electrical installations. Then, voltages and currents of most common signals in these installations are compared with these reference levels.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"150 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120870578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256246
P. Hillenbrand, S. Tenbohlen, C. Keller, K. Spanos
This contribution presents results from an investigation into conducted emissions of an automotive inverter in a component level EMC test setup with unshielded cables. The primary goal of the investigation is to develop a profound understanding of the shape of the disturbance voltage's frequency spectrum at the line impedance stabilization network. Complying with that objective, common-mode currents are identified as the dominating noise currents, especially at the operating point of the inverter representing the worst case scenario regarding EMC performance. To support this conclusion, an AC simulation of a single-phase common-mode equivalent circuit of the system is presented. The resonances occurring in the noise spectrum and its overall shape are explained by the simulation within the frequency range of 100 kHz to 110 MHz. In addition, CY capacitors are used as common-mode filter elements. Based on the validated simulation model, the influence of the filter capacitors and their parasitic inductances are investigated.
{"title":"Understanding conducted emissions from an automotive inverter using a common-mode model","authors":"P. Hillenbrand, S. Tenbohlen, C. Keller, K. Spanos","doi":"10.1109/ISEMC.2015.7256246","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256246","url":null,"abstract":"This contribution presents results from an investigation into conducted emissions of an automotive inverter in a component level EMC test setup with unshielded cables. The primary goal of the investigation is to develop a profound understanding of the shape of the disturbance voltage's frequency spectrum at the line impedance stabilization network. Complying with that objective, common-mode currents are identified as the dominating noise currents, especially at the operating point of the inverter representing the worst case scenario regarding EMC performance. To support this conclusion, an AC simulation of a single-phase common-mode equivalent circuit of the system is presented. The resonances occurring in the noise spectrum and its overall shape are explained by the simulation within the frequency range of 100 kHz to 110 MHz. In addition, CY capacitors are used as common-mode filter elements. Based on the validated simulation model, the influence of the filter capacitors and their parasitic inductances are investigated.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121162663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256283
Timuçin Karaca, B. Deutschmann, G. Winkler
Computer aided design and simulations are an integral part in the development process of integrated circuits. In order to evaluate the electromagnetic compatibility (EMC) of integrated circuits in simulation, simulation models of the EMC measurement setup and the EMC measurement device are needed. In this work, an electromagnetic interference (EMI) receiver simulation model is presented. The EMI-reciever simulation model is intended to analyze electromagnetic emission (EME) of integrated circuits from transient simulations. The model is explained in detail and emulates an CISPR-16 conform test receiver. It is implemented using an STFT algorithm, and evaluates simulation output in CISPR Band-B/C/D with peak, average and quasi-peak detector. A quasi-peak detector model for pulsed disturbances is described, that significantly reduces simulation time compared to traditional implementations. The presented EMI-receiver model is verified with different test setups.
{"title":"EMI-receiver simulation model with quasi-peak detector","authors":"Timuçin Karaca, B. Deutschmann, G. Winkler","doi":"10.1109/ISEMC.2015.7256283","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256283","url":null,"abstract":"Computer aided design and simulations are an integral part in the development process of integrated circuits. In order to evaluate the electromagnetic compatibility (EMC) of integrated circuits in simulation, simulation models of the EMC measurement setup and the EMC measurement device are needed. In this work, an electromagnetic interference (EMI) receiver simulation model is presented. The EMI-reciever simulation model is intended to analyze electromagnetic emission (EME) of integrated circuits from transient simulations. The model is explained in detail and emulates an CISPR-16 conform test receiver. It is implemented using an STFT algorithm, and evaluates simulation output in CISPR Band-B/C/D with peak, average and quasi-peak detector. A quasi-peak detector model for pulsed disturbances is described, that significantly reduces simulation time compared to traditional implementations. The presented EMI-receiver model is verified with different test setups.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123053064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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