Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256349
Andrea Lavarda, B. Deutschmann
This paper deals with direct power injection (DPI) simulations and it focuses on the simulation framework and post processing strategies to be performed during the design phase of automotive integrated circuits (ICs). The aim of such susceptibility simulations is to assist a designer to predict the ICs susceptibility to radio frequency interferences (RFI) during the design phase of the IC. For this purpose a complete DPI simulation model according to the standardized DPI measurement setup is introduced. Based on a simple example the methodology and several DPI simulation results are shown together with possible post processing strategies.
{"title":"Direct power injection (DPI) simulation framework and postprocessing","authors":"Andrea Lavarda, B. Deutschmann","doi":"10.1109/ISEMC.2015.7256349","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256349","url":null,"abstract":"This paper deals with direct power injection (DPI) simulations and it focuses on the simulation framework and post processing strategies to be performed during the design phase of automotive integrated circuits (ICs). The aim of such susceptibility simulations is to assist a designer to predict the ICs susceptibility to radio frequency interferences (RFI) during the design phase of the IC. For this purpose a complete DPI simulation model according to the standardized DPI measurement setup is introduced. Based on a simple example the methodology and several DPI simulation results are shown together with possible post processing strategies.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"12 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128646711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256290
Bai Jin-jun, Zhang Gang, W. Lixin, A. Duffy
In this paper, the Stochastic Collocation Method is introduced into EMC uncertainty analysis. It is demonstrated to be accurate, with high computational efficiency, compared with the Method of Moments, the perturbation method and the Monte Carlo method. The Stochastic Collocation Method requires no modification to the original solver, and it is fit for being introduced into EMC simulation software.
{"title":"Uncertainty analysis in EMC simulation based on Stochastic Collocation Method","authors":"Bai Jin-jun, Zhang Gang, W. Lixin, A. Duffy","doi":"10.1109/ISEMC.2015.7256290","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256290","url":null,"abstract":"In this paper, the Stochastic Collocation Method is introduced into EMC uncertainty analysis. It is demonstrated to be accurate, with high computational efficiency, compared with the Method of Moments, the perturbation method and the Monte Carlo method. The Stochastic Collocation Method requires no modification to the original solver, and it is fit for being introduced into EMC simulation software.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115665652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256232
Han Ye, Xing-Chang Wei, E. Li
In this paper, a semi-analytical method is proposed to accurately and efficiently calculate the impedance of grid-type power distribution network (PDN) on interposer. An equivalent plane PDN is constructed to obtain the same impedance curve as that of grid-type PDN. Furthermore, a modified resonant cavity mode is applied for the equivalent plane PDN to eliminate the deviation between the equivalent plane PDN and grid-type PDN, and to obtain the consistent impedance curves as that of 3-D full-wave simulation for the grid-type PDN. The accuracy and efficiency of the proposed method are verified by the 3-D full-wave simulation method and an available measurement result. Finally, different sizes of grid-type PDN are investigated to verify the scalability of the proposed semi-analytical method.
{"title":"A novel semi-analytical solution of impedance of grid-type power distribution network","authors":"Han Ye, Xing-Chang Wei, E. Li","doi":"10.1109/ISEMC.2015.7256232","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256232","url":null,"abstract":"In this paper, a semi-analytical method is proposed to accurately and efficiently calculate the impedance of grid-type power distribution network (PDN) on interposer. An equivalent plane PDN is constructed to obtain the same impedance curve as that of grid-type PDN. Furthermore, a modified resonant cavity mode is applied for the equivalent plane PDN to eliminate the deviation between the equivalent plane PDN and grid-type PDN, and to obtain the consistent impedance curves as that of 3-D full-wave simulation for the grid-type PDN. The accuracy and efficiency of the proposed method are verified by the 3-D full-wave simulation method and an available measurement result. Finally, different sizes of grid-type PDN are investigated to verify the scalability of the proposed semi-analytical method.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116252442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256389
D. Harberts, M. V. van Helvoort
Currently, research activities are underway to create coexistence between active implantable medical devices and Magnetic Resonance Imaging (MRI). One of the questions is if ferrite materials can be used for miniature transformers for EMI suppression. Commonly it is known that the use of magnetic materials should be minimized in and near an MRI scanner because MRI employs large magnetic fields with which any magnetic material will be subject to strong forces. In addition, magnetic materials may introduce image artifacts and reduce diagnostic image quality. The analysis presented in this paper shows that the requirements on diagnostic image quality pose higher limitations on the use of magnetic materials in medical implants than the requirements for magneto-mechanical forces. From experiments with ferrites in a 1.5-T MRI system, it is concluded that if diagnostic image quality is required for distances of at least 2 cm from the medical implant, then only 0.1 mm3 ferrite can be accepted. This amount of ferrite is too low for any practical application. Therefore, medical implants can only be coexistent with MRI if they do not contain ferrites.
目前，研究活动正在进行中，以创造主动植入式医疗设备和磁共振成像(MRI)之间的共存。其中一个问题是铁氧体材料是否可以用于抑制电磁干扰的微型变压器。众所周知，磁性材料的使用应尽量减少在核磁共振成像扫描仪内和附近，因为核磁共振成像使用大磁场，任何磁性材料将受到强大的力量。此外，磁性材料可能会引入图像伪影，降低诊断图像质量。本文的分析表明，对诊断图像质量的要求对医用植入物中磁性材料的使用构成了比磁机械力要求更高的限制。从铁氧体在1.5 t MRI系统中的实验中得出的结论是，如果距离医用植入物至少2 cm的距离需要诊断图像质量，那么只能接受0.1 mm3的铁氧体。这个数量的铁氧体对于任何实际应用来说都太低了。因此，医用植入物只有在不含铁氧体的情况下才能与MRI共存。
{"title":"MRI image distortion due to magnetic materials in medical implants","authors":"D. Harberts, M. V. van Helvoort","doi":"10.1109/ISEMC.2015.7256389","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256389","url":null,"abstract":"Currently, research activities are underway to create coexistence between active implantable medical devices and Magnetic Resonance Imaging (MRI). One of the questions is if ferrite materials can be used for miniature transformers for EMI suppression. Commonly it is known that the use of magnetic materials should be minimized in and near an MRI scanner because MRI employs large magnetic fields with which any magnetic material will be subject to strong forces. In addition, magnetic materials may introduce image artifacts and reduce diagnostic image quality. The analysis presented in this paper shows that the requirements on diagnostic image quality pose higher limitations on the use of magnetic materials in medical implants than the requirements for magneto-mechanical forces. From experiments with ferrites in a 1.5-T MRI system, it is concluded that if diagnostic image quality is required for distances of at least 2 cm from the medical implant, then only 0.1 mm3 ferrite can be accepted. This amount of ferrite is too low for any practical application. Therefore, medical implants can only be coexistent with MRI if they do not contain ferrites.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114472212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256402
Jing Jin, Hao Xie, Gang Zhao, Jian Wang, Manxi Wang, W. Yin
Effects of radar pulse interference with high power on the communication data link system on a warship platform are investigated with the help of Simulink simulation platform and in-house developed MATLAB algorithm. Based on the established model of communication data link system, FDTD simulation is at first employed for simulating the induced voltage on the wire antenna of date link system in the presence of a radar pulse radiation. The communication quality of the system is further evaluated for different interference waveforms of the incident radar pulse with high power. It is numerically shown that the transmitted information, in some cases, could not be restored at the receiver, which can provide certain guidance for evaluating complex electromagnetic environment effects on the warship platform on the local communication system.
{"title":"Characterization of EMI effects in communication data link system in the presence of high-power radar radiation","authors":"Jing Jin, Hao Xie, Gang Zhao, Jian Wang, Manxi Wang, W. Yin","doi":"10.1109/ISEMC.2015.7256402","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256402","url":null,"abstract":"Effects of radar pulse interference with high power on the communication data link system on a warship platform are investigated with the help of Simulink simulation platform and in-house developed MATLAB algorithm. Based on the established model of communication data link system, FDTD simulation is at first employed for simulating the induced voltage on the wire antenna of date link system in the presence of a radar pulse radiation. The communication quality of the system is further evaluated for different interference waveforms of the incident radar pulse with high power. It is numerically shown that the transmitted information, in some cases, could not be restored at the receiver, which can provide certain guidance for evaluating complex electromagnetic environment effects on the warship platform on the local communication system.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114917430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256245
M. Kruger, M. Magdowski, R. Vick, T. Schallschmidt, T. Rinkleff
The aim of this investigation is the model-based description of an asynchronous motor by a general equivalent circuit that can be used in SPICE. The model incorporates the dynamic behavior of the motor including possible mechanical loads and the high-frequency behavior at the connecting terminals. The parametrization is explained and some comparative measurements with a real motor are presented and discussed. The presented method allows simulating an entire drivetrain of an electric or hybrid vehicle, which consists of a traction battery, an inverter and at least one electrical machine, including electromagnetic compatibility phenomena like fast transients of the stator current.
{"title":"Transient simulation of the low-frequency and high-frequency behavior of asynchronous machines in SPICE","authors":"M. Kruger, M. Magdowski, R. Vick, T. Schallschmidt, T. Rinkleff","doi":"10.1109/ISEMC.2015.7256245","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256245","url":null,"abstract":"The aim of this investigation is the model-based description of an asynchronous motor by a general equivalent circuit that can be used in SPICE. The model incorporates the dynamic behavior of the motor including possible mechanical loads and the high-frequency behavior at the connecting terminals. The parametrization is explained and some comparative measurements with a real motor are presented and discussed. The presented method allows simulating an entire drivetrain of an electric or hybrid vehicle, which consists of a traction battery, an inverter and at least one electrical machine, including electromagnetic compatibility phenomena like fast transients of the stator current.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126712427","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256204
A. Gorbunova, A. Baev, M. Konovalyuk, Y. Kuznetsov
The near-field measurements of the stochastic fields radiating by digital electronic devices can be used for the localization of the stochastic electromagnetic interference (EMI) sources on the surface of device under test. The characterization of the space distribution for the wide sense cyclostationary (WSCS) stochastic field in the observation plane can be accomplished by a cross correlation between the reference and all remaining knots. The proposed Tikhonov regularization algorithm in conjunction with L-curve method provides a stable inverse reconstruction of the multi-dipole model distribution in the object plane. Parametric identification procedure based on the model order selection and two-dimensional Matrix Pencil Algorithm with subsequent fitting by Minimum Least Square technique gives the geometrical configuration of the WSCS sources. Implemented simulations and measurement experiments verified the choice of the proposed signal processing EMI sources localization algorithm.
{"title":"Localization of cyclostationary EMI sources based on near-field measurements","authors":"A. Gorbunova, A. Baev, M. Konovalyuk, Y. Kuznetsov","doi":"10.1109/ISEMC.2015.7256204","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256204","url":null,"abstract":"The near-field measurements of the stochastic fields radiating by digital electronic devices can be used for the localization of the stochastic electromagnetic interference (EMI) sources on the surface of device under test. The characterization of the space distribution for the wide sense cyclostationary (WSCS) stochastic field in the observation plane can be accomplished by a cross correlation between the reference and all remaining knots. The proposed Tikhonov regularization algorithm in conjunction with L-curve method provides a stable inverse reconstruction of the multi-dipole model distribution in the object plane. Parametric identification procedure based on the model order selection and two-dimensional Matrix Pencil Algorithm with subsequent fitting by Minimum Least Square technique gives the geometrical configuration of the WSCS sources. Implemented simulations and measurement experiments verified the choice of the proposed signal processing EMI sources localization algorithm.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"159 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122171273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256213
L. Diaz, C. Miry, A. Reineix, C. Guiffaut, A. Tatematsu
A thin wire model for FDTD simulations is proposed for the study of transient potential rises and currents in a grounding grid. The model is an extension of the formalism of Holland, and it is compared with the thin wire model of Baba, Nagaoka, and Ametani, using a case study previously validated with measurements. Special interest is drawn on the computation of the potential close to the surface of conductors. To do so, an approximated formula based on the previous work of Noda and Yokoyama is proposed. The results are compared in terms of transient potential rises and currents in a grounding grid. The comparisons are in good agreement.
{"title":"FDTD transient analysis of grounding grids a comparison of two different thin wire models","authors":"L. Diaz, C. Miry, A. Reineix, C. Guiffaut, A. Tatematsu","doi":"10.1109/ISEMC.2015.7256213","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256213","url":null,"abstract":"A thin wire model for FDTD simulations is proposed for the study of transient potential rises and currents in a grounding grid. The model is an extension of the formalism of Holland, and it is compared with the thin wire model of Baba, Nagaoka, and Ametani, using a case study previously validated with measurements. Special interest is drawn on the computation of the potential close to the surface of conductors. To do so, an approximated formula based on the previous work of Noda and Yokoyama is proposed. The results are compared in terms of transient potential rises and currents in a grounding grid. The comparisons are in good agreement.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123352190","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256159
C. Suttner, S. Tenbohlen, W. Ebbinghaus
The application of Rogowski sensors in protection and control equipment has many benefits compared to traditional instrument transformers. However, the signal levels of these sensors are small compared to possible disturbances, which raises questions regarding the immunity of such applications to switching transients. This contribution investigates a protection application with Rogowski sensors from the EMC point of view. Therefore, the disturbances that are generated by the primary parts of the switchgear are described. The propagation path of the interference is presented and differences to conventional applications are discussed. The effectiveness of different EMC measures is evaluated, based on the disturbance voltages occurring at the input terminals of the protection device.
{"title":"Impact of Rogowski sensors on the EMC performance of medium voltage power substations","authors":"C. Suttner, S. Tenbohlen, W. Ebbinghaus","doi":"10.1109/ISEMC.2015.7256159","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256159","url":null,"abstract":"The application of Rogowski sensors in protection and control equipment has many benefits compared to traditional instrument transformers. However, the signal levels of these sensors are small compared to possible disturbances, which raises questions regarding the immunity of such applications to switching transients. This contribution investigates a protection application with Rogowski sensors from the EMC point of view. Therefore, the disturbances that are generated by the primary parts of the switchgear are described. The propagation path of the interference is presented and differences to conventional applications are discussed. The effectiveness of different EMC measures is evaluated, based on the disturbance voltages occurring at the input terminals of the protection device.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"134 1-3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123574670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256300
Ahmed Elkalsh, A. Vukovic, P. Sewell, T. Benson
This paper presents a coupled electromagnetic-thermal model for modelling arc discharge typical of lightning strike phenomena. The model is implemented in the Transmission Line Modelling (TLM) method and tested on a canonical case where a plasma conducting channel is established between two metal electrodes.
{"title":"Coupled arc discharge models in the TLM method","authors":"Ahmed Elkalsh, A. Vukovic, P. Sewell, T. Benson","doi":"10.1109/ISEMC.2015.7256300","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256300","url":null,"abstract":"This paper presents a coupled electromagnetic-thermal model for modelling arc discharge typical of lightning strike phenomena. The model is implemented in the Transmission Line Modelling (TLM) method and tested on a canonical case where a plasma conducting channel is established between two metal electrodes.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125256015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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