Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.18
Yi-hua Tang, Johnathan P. Harben, J. Sims
The National Conference of Standard Laboratories International (NCSLI) is scheduled to start the 10th Josephson Voltage Standard (JVS) Interlaboratory Comparison (ILC) in early 2014. NASA’s Kennedy Space Center (KSC) which began operating a 10V Programmable Josephson Voltage Standard (PJVS) in 2010 is a pivot lab candidate for the NCSLI JVS ILC. We propose to use the NASA PJVS as a transfer standard for the intercomparison in addition to using the group of Zeners that were used in the previous ILC. The superior stability of the 10V PJVS’s voltage step enables it to perform the same tasks as the Zener standards and to also improve the efficiency and effectiveness of the ILC through a direct comparison. Recently, a comparison between a conventional JVS and the NIST 10V PJVS was performed by NIST in order to verify the performance of the NIST 10V PJVS. The mean difference between the two systems at 10V was found to be -0.49 nV with a combined standard uncertainty of 1.32 nV (k = 1) or a relative combined standard uncertainty of 1.32 parts in 1010. The advantage of using the 10V PJVS is that a participating lab is able to make comparisons using its conventional JVS system against the 10V PJVS in the same manner as the measurements for Zener standards are performed. Due to the quantum nature of the 10V PJVS, its superior accuracy and stability will improve the uncertainty of a JVS comparison for the direct comparison participants to a level of a few parts in 1010 at 10 V. This would be an improvement over the 2011 ILC which reported an expanded uncertainty with 95% confidence limits of +220 nV and -150 nV.
{"title":"New 10V Programmable Josephson Voltage Standard (PJVS) and its Application for the 2014 NCSLI JVS Interlaboratory Comparison","authors":"Yi-hua Tang, Johnathan P. Harben, J. Sims","doi":"10.51843/wsproceedings.2013.18","DOIUrl":"https://doi.org/10.51843/wsproceedings.2013.18","url":null,"abstract":"The National Conference of Standard Laboratories International (NCSLI) is scheduled to start the 10th Josephson Voltage Standard (JVS) Interlaboratory Comparison (ILC) in early 2014. NASA’s Kennedy Space Center (KSC) which began operating a 10V Programmable Josephson Voltage Standard (PJVS) in 2010 is a pivot lab candidate for the NCSLI JVS ILC. We propose to use the NASA PJVS as a transfer standard for the intercomparison in addition to using the group of Zeners that were used in the previous ILC. The superior stability of the 10V PJVS’s voltage step enables it to perform the same tasks as the Zener standards and to also improve the efficiency and effectiveness of the ILC through a direct comparison. Recently, a comparison between a conventional JVS and the NIST 10V PJVS was performed by NIST in order to verify the performance of the NIST 10V PJVS. The mean difference between the two systems at 10V was found to be -0.49 nV with a combined standard uncertainty of 1.32 nV (k = 1) or a relative combined standard uncertainty of 1.32 parts in 1010. The advantage of using the 10V PJVS is that a participating lab is able to make comparisons using its conventional JVS system against the 10V PJVS in the same manner as the measurements for Zener standards are performed. Due to the quantum nature of the 10V PJVS, its superior accuracy and stability will improve the uncertainty of a JVS comparison for the direct comparison participants to a level of a few parts in 1010 at 10 V. This would be an improvement over the 2011 ILC which reported an expanded uncertainty with 95% confidence limits of +220 nV and -150 nV.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"73 3-4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114034308","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.32
F. Mercader-Trejo, Luz Elena Narvaez Hernandez, Maria Guadalupe Lopez Granada, Raul Herrera Basurto
Nowadays, modern industry that designs and maintains controlled production processes necessarily involves measurements in their decision making. Metrology, the science of measurement, is present in every aspect of our daily life. In fact, we live with metrology and do not often easily recognize its presence and importance. While technology advances, the presence of Metrology is essential for assistance and support. Metrology would be unfeasible without the existence of qualified personnel in the field of measurements. Metrology education is a key factor for the development of science and technology in any country. Aware of the needs on professional training in the field of metrology, the Polytechnic University at Santa Rosa Jáuregui (UTSRJ), a public university located in the state of Queretaro in Mexico, conducted a survey on the relevance of opening a new educational program. This new program will contribute to the industrial, scientific, technological and social development of the state of Queretaro targeted to impact the rest of the country as well. This study detected the need for trained professionals in the field of metrology, productivity and quality. With the support of representatives from the academic, industrial, research and service sectors, the curriculum design of the Industrial Metrology Engineering was carried out. This new undergraduate program is an innovative and cutting edge educational option designed to satisfy the industrial and social needs which were identified.
{"title":"Industrial Metrology Engineering: educational strategy to fulfill the needs of the industry and the society","authors":"F. Mercader-Trejo, Luz Elena Narvaez Hernandez, Maria Guadalupe Lopez Granada, Raul Herrera Basurto","doi":"10.51843/wsproceedings.2013.32","DOIUrl":"https://doi.org/10.51843/wsproceedings.2013.32","url":null,"abstract":"Nowadays, modern industry that designs and maintains controlled production processes necessarily involves measurements in their decision making. Metrology, the science of measurement, is present in every aspect of our daily life. In fact, we live with metrology and do not often easily recognize its presence and importance. While technology advances, the presence of Metrology is essential for assistance and support. Metrology would be unfeasible without the existence of qualified personnel in the field of measurements. Metrology education is a key factor for the development of science and technology in any country. Aware of the needs on professional training in the field of metrology, the Polytechnic University at Santa Rosa Jáuregui (UTSRJ), a public university located in the state of Queretaro in Mexico, conducted a survey on the relevance of opening a new educational program. This new program will contribute to the industrial, scientific, technological and social development of the state of Queretaro targeted to impact the rest of the country as well. This study detected the need for trained professionals in the field of metrology, productivity and quality. With the support of representatives from the academic, industrial, research and service sectors, the curriculum design of the Industrial Metrology Engineering was carried out. This new undergraduate program is an innovative and cutting edge educational option designed to satisfy the industrial and social needs which were identified.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132768389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.40
J. Cheung
Traditionally, thermometers are calibrated by comparison with reference thermometers, such as standard platinum resistance thermometers in liquid baths. The process is time consuming and costly since an operator is required to adjust the bath temperature and take the readings of the thermometers. The Standards and Calibration Laboratory (SCL), Hong Kong Special Administrative Region recently developed a fully automated calibration system for thermometer calibration which does not require the attention of an operator. The system makes use of a computer to control the bath temperature and take the thermometer readings by using pattern recognition techniques. Optical Character Recognition (OCR) and Liquid Level Recognition (LLR) techniques are employed to take the readings of the digital and liquid-in-glass thermometers respectively. The reading process starts with taking pictures of the display of the thermometer under test by a smart video camera. The images are analyzed by Labview based programmes to find the thermometer readings. The system can be trained to recognize various display formats of the thermometers under test. The images of the display readings are retained for proof checking when a report is produced.
{"title":"Fully Automated Thermometer Calibration System at the Standards and Calibration Laboratory (SCL)","authors":"J. Cheung","doi":"10.51843/wsproceedings.2013.40","DOIUrl":"https://doi.org/10.51843/wsproceedings.2013.40","url":null,"abstract":"Traditionally, thermometers are calibrated by comparison with reference thermometers, such as standard platinum resistance thermometers in liquid baths. The process is time consuming and costly since an operator is required to adjust the bath temperature and take the readings of the thermometers. The Standards and Calibration Laboratory (SCL), Hong Kong Special Administrative Region recently developed a fully automated calibration system for thermometer calibration which does not require the attention of an operator. The system makes use of a computer to control the bath temperature and take the thermometer readings by using pattern recognition techniques. Optical Character Recognition (OCR) and Liquid Level Recognition (LLR) techniques are employed to take the readings of the digital and liquid-in-glass thermometers respectively. The reading process starts with taking pictures of the display of the thermometer under test by a smart video camera. The images are analyzed by Labview based programmes to find the thermometer readings. The system can be trained to recognize various display formats of the thermometers under test. The images of the display readings are retained for proof checking when a report is produced.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133536581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.46
Howard Zion
“Each manufacturer shall ensure that all inspection, measuring, and test equipment, including mechanical, automated, or electronic inspection and test equipment, is suitable for its intended purposes and is capable of producing valid results.”(21 CFR 820.72).While this quote is intended for Medical Device manufacturers, the concept behind it gets to the root of good manufacturing practices for any industry with an interest in minimizing rework, scrap, recall, and/or safety problems in order to maximize profits. And everyone likes more cash. . . well, except her (as Jimmy Fallon states in the Capital One commercial). The problem is some companies don’t make the connection that the instruments that are selected and used to quantify decisions about a process or about their product may be driving one or more of the root causes of these profit pilfering penalties. We will cover different aspects of determining the suitability of instruments, including parameter, range, resolution, accuracy, process tolerances, Process Accuracy Ratio (PAR), Process Uncertainty Ratio (PUR), operator influence, storage/handling and other categories. You should expect to be able to formulate your own definition of Instrument Suitability so that you can compare it to your organization’s current definition or to help your organization develop a definition if it does not currently have one in place.
{"title":"Suitability of Instruments (Risk Mitigation and Measurement Quality Assurance)","authors":"Howard Zion","doi":"10.51843/wsproceedings.2013.46","DOIUrl":"https://doi.org/10.51843/wsproceedings.2013.46","url":null,"abstract":"“Each manufacturer shall ensure that all inspection, measuring, and test equipment, including mechanical, automated, or electronic inspection and test equipment, is suitable for its intended purposes and is capable of producing valid results.”(21 CFR 820.72).While this quote is intended for Medical Device manufacturers, the concept behind it gets to the root of good manufacturing practices for any industry with an interest in minimizing rework, scrap, recall, and/or safety problems in order to maximize profits. And everyone likes more cash. . . well, except her (as Jimmy Fallon states in the Capital One commercial). The problem is some companies don’t make the connection that the instruments that are selected and used to quantify decisions about a process or about their product may be driving one or more of the root causes of these profit pilfering penalties. We will cover different aspects of determining the suitability of instruments, including parameter, range, resolution, accuracy, process tolerances, Process Accuracy Ratio (PAR), Process Uncertainty Ratio (PUR), operator influence, storage/handling and other categories. You should expect to be able to formulate your own definition of Instrument Suitability so that you can compare it to your organization’s current definition or to help your organization develop a definition if it does not currently have one in place.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130168885","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.47
John Horwell
To explore the technical feasibility of measuring and certifying Glass Line Scales and Grid Plates on a high accuracy CMM with an integrated chromatic confocal sensor. These white light confocal sensors do not rely on back lighting, are not capable of capturing 1000’s of data points on a measured line, and have no image cleaning capability. What they do offer is a system that can calibrate artifacts up to 1000mm in length with a very low uncertainty using a measurement technique quite different than normal optical sensors.
{"title":"Measuring Line Scales and Grid Plates on a Non-Vision CMM equipped with a White Light Confocal Probe","authors":"John Horwell","doi":"10.51843/wsproceedings.2013.47","DOIUrl":"https://doi.org/10.51843/wsproceedings.2013.47","url":null,"abstract":"To explore the technical feasibility of measuring and certifying Glass Line Scales and Grid Plates on a high accuracy CMM with an integrated chromatic confocal sensor. These white light confocal sensors do not rely on back lighting, are not capable of capturing 1000’s of data points on a measured line, and have no image cleaning capability. What they do offer is a system that can calibrate artifacts up to 1000mm in length with a very low uncertainty using a measurement technique quite different than normal optical sensors.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130239587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.33
A. S. Brush
Establishing traceability of RF power measurements at power levels in excess of a few watts has historically used methods that we will categorize into two major branches. One class of methods uses low-power sensors traceable through microcalorimeters operating in the milliWatt range. This class is exemplified by the power measurement technique described by Bramall [4], in which the low power sensors are used to measure the insertion loss of attenuators or couplers, which are then cascaded to provide the required attenuation or coupling factor to enable measurement of high power using low power sensors. The other major division is the direct measurement of the higher power using high power calorimeters. The basic theory and history of flow calorimeters is described well in chapter 5 of Fantom [1], and recently available commercial flow calorimeters are described in their respective user manuals [2][7].The cascaded coupler method has been refined to the point at which, for 100 Watt measurements below 1 GHz, NIST reports the ability to calibrate transfer standards with an uncertainty of 0.67% [3][8]. This uncertainty seems adequate to provide traceability for typical power sensors giving an overall uncertainty of 3% to 4% [5], but is higher than the 0.6% required to calibrate the most accurate of high-power RF sensors [6]. The method is also reported to be, “cumbersome and lengthy”[8].Commercially available calorimeters [2][7] represent that the user will obtain measurement uncertainty in the neighborhood of 1.25%. One of the referenced models claims 0.5%, but “not including load error”, which apparently does not include offset due to a leakage path. In real calibrations performed by the authors, that unit’s total error exceeded 2% of full scale. However much better results have been shown to be possible, such as by Bird[6] showing that their lab can calibrate to 0.6% when required. In the project being reported on, the authors addressed the challenge of finding as many of the sources of error in a flow calorimeter as possible, and followed up on the findings by developing new instrumentation, process automation, and heat flow to minimize error as much as possible.
{"title":"A New Coaxial Flow Calorimeter for Accurate RF Power Measurements up to 100 Watts and 1 GHz","authors":"A. S. Brush","doi":"10.51843/wsproceedings.2013.33","DOIUrl":"https://doi.org/10.51843/wsproceedings.2013.33","url":null,"abstract":"Establishing traceability of RF power measurements at power levels in excess of a few watts has historically used methods that we will categorize into two major branches. One class of methods uses low-power sensors traceable through microcalorimeters operating in the milliWatt range. This class is exemplified by the power measurement technique described by Bramall [4], in which the low power sensors are used to measure the insertion loss of attenuators or couplers, which are then cascaded to provide the required attenuation or coupling factor to enable measurement of high power using low power sensors. The other major division is the direct measurement of the higher power using high power calorimeters. The basic theory and history of flow calorimeters is described well in chapter 5 of Fantom [1], and recently available commercial flow calorimeters are described in their respective user manuals [2][7].The cascaded coupler method has been refined to the point at which, for 100 Watt measurements below 1 GHz, NIST reports the ability to calibrate transfer standards with an uncertainty of 0.67% [3][8]. This uncertainty seems adequate to provide traceability for typical power sensors giving an overall uncertainty of 3% to 4% [5], but is higher than the 0.6% required to calibrate the most accurate of high-power RF sensors [6]. The method is also reported to be, “cumbersome and lengthy”[8].Commercially available calorimeters [2][7] represent that the user will obtain measurement uncertainty in the neighborhood of 1.25%. One of the referenced models claims 0.5%, but “not including load error”, which apparently does not include offset due to a leakage path. In real calibrations performed by the authors, that unit’s total error exceeded 2% of full scale. However much better results have been shown to be possible, such as by Bird[6] showing that their lab can calibrate to 0.6% when required. In the project being reported on, the authors addressed the challenge of finding as many of the sources of error in a flow calorimeter as possible, and followed up on the findings by developing new instrumentation, process automation, and heat flow to minimize error as much as possible.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"229 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133168948","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.43
L. Chow, Yi-Ting Chen
This paper focuses the study on different measuring (or calibration) systems during the process of metrological traceability, due to the different characteristics between the base quantity and derived quantity of the target parameter (or measurand), leading to that representation of the "measurement standard” can not be clearly and consistently made statement. The author will refer to VIM 3 (ISO / IEC Guide 99-2007) for the term of “reference”, using several practical cases of measuring (or calibration) systems related to the measurand of both base quantity and derived quantity, to further interpret and analyze such issue of metrological traceability and calibration hierarchy in terms of measurement standard. In detail, this paper discloses a newly established process for drawing the metrological traceability diagram at National Measurement Laboratory (NML, Chinese Taipei) which includes seven steps, starting from identifying the “measurand” of the expected “measurement result”, then the “reference”, which traditionally would be “measurement standard”, the “measuring system”, the measured “quantity kinds” and “quantity values” of the system, the developed “measurement model (or equation)”, finally the “reference” of the measurement result in each calibration traceable to the “measurand” of the measurement result in the previous calibration of the higher hierarchy. Such new representation of the metrological traceability diagram combines a newly mathematical approach with the conventionally schematic approach to realize the practical interpretation of “metrological traceability” to show how the unbroken calibration chain is functioning seamless and robust on each measurement system in NML.
本文主要研究在计量溯源过程中不同的测量(或校准)体系，由于目标参数(或被测物)的基量与衍生量的特性不同，导致“测量标准”的表述不能清晰一致地表述。本文将参考VIM 3 (ISO / IEC指南99-2007)中的“参考”一词，并结合几个与基础量和衍生量测量相关的测量(或校准)系统的实际案例，从测量标准的角度进一步解释和分析计量溯源性和校准层次问题。详细介绍了中国台北国家测量实验室(NML)新建立的计量溯源图绘制流程，该流程包括七个步骤，首先确定预期“测量结果”的“被测物”，然后确定“参考物”，传统上“参考物”是“测量标准”、“测量系统”、被测量的“数量种类”和系统的“量值”，制定“测量模型(或方程)”。最后，每次校准中测量结果的“参考点”可追溯到更高层次的前一次校准中测量结果的“测量点”。这种计量溯源图的新表示结合了一种新的数学方法和传统的原理图方法，实现了对“计量溯源”的实际解释，以显示在NML中，不间断的校准链如何在每个测量系统上无缝和稳健地运行。
{"title":"Further Interpretation Study on the Term of “Reference” in VIM 3","authors":"L. Chow, Yi-Ting Chen","doi":"10.51843/wsproceedings.2013.43","DOIUrl":"https://doi.org/10.51843/wsproceedings.2013.43","url":null,"abstract":"This paper focuses the study on different measuring (or calibration) systems during the process of metrological traceability, due to the different characteristics between the base quantity and derived quantity of the target parameter (or measurand), leading to that representation of the \"measurement standard” can not be clearly and consistently made statement. The author will refer to VIM 3 (ISO / IEC Guide 99-2007) for the term of “reference”, using several practical cases of measuring (or calibration) systems related to the measurand of both base quantity and derived quantity, to further interpret and analyze such issue of metrological traceability and calibration hierarchy in terms of measurement standard. In detail, this paper discloses a newly established process for drawing the metrological traceability diagram at National Measurement Laboratory (NML, Chinese Taipei) which includes seven steps, starting from identifying the “measurand” of the expected “measurement result”, then the “reference”, which traditionally would be “measurement standard”, the “measuring system”, the measured “quantity kinds” and “quantity values” of the system, the developed “measurement model (or equation)”, finally the “reference” of the measurement result in each calibration traceable to the “measurand” of the measurement result in the previous calibration of the higher hierarchy. Such new representation of the metrological traceability diagram combines a newly mathematical approach with the conventionally schematic approach to realize the practical interpretation of “metrological traceability” to show how the unbroken calibration chain is functioning seamless and robust on each measurement system in NML.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131372081","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.55
D. Deaver
Calculating uncertainties is one of the more time-consuming and sometimes daunting tasks for ISO/IEC 17025 accredited laboratories. However, the emphasis for laboratories, accreditation bodies and their assessor has been on the uncertainty budgets that support the laboratory's Calibration and Measurement Capability (CMC) that is summarized in its Scope of Accreditation. This is a summary of the calibrations the laboratory can perform using its best equipment, conditions and staff. It is difficult for laboratories that intend to be profitable in a competitive environment to invest as much time in the development of the uncertainties for the routine calibrations as they do for the CMCs. The loopholes that some accredited laboratories have used to avoid the effort of calculating uncertainty on a regular basis are being closed due to stricter enforcement by their accreditation bodies and more restrictive clarifying standards such as ILAC P14. This paper offers some practical advice for laboratories seeking to calculate uncertainties in an efficient way for the majority of their calibrations which are not to their tightest uncertainties.
{"title":"Simplified Methods for Calculating Uncertainties for Routine Calibrations","authors":"D. Deaver","doi":"10.51843/wsproceedings.2013.55","DOIUrl":"https://doi.org/10.51843/wsproceedings.2013.55","url":null,"abstract":"Calculating uncertainties is one of the more time-consuming and sometimes daunting tasks for ISO/IEC 17025 accredited laboratories. However, the emphasis for laboratories, accreditation bodies and their assessor has been on the uncertainty budgets that support the laboratory's Calibration and Measurement Capability (CMC) that is summarized in its Scope of Accreditation. This is a summary of the calibrations the laboratory can perform using its best equipment, conditions and staff. It is difficult for laboratories that intend to be profitable in a competitive environment to invest as much time in the development of the uncertainties for the routine calibrations as they do for the CMCs. The loopholes that some accredited laboratories have used to avoid the effort of calculating uncertainty on a regular basis are being closed due to stricter enforcement by their accreditation bodies and more restrictive clarifying standards such as ILAC P14. This paper offers some practical advice for laboratories seeking to calculate uncertainties in an efficient way for the majority of their calibrations which are not to their tightest uncertainties.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132043597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.14
Leif D. King
This paper will present and discuss practical and other considerations regarding ILCs in general and complex multi-parameter ILCs with multiple possible methodologies and complexities. The experiences and lessons learned from conducting an ILC for the first time with the added factors of complexity combined with the lack of experience of even participating in an ILC will also be explored. NCSLI RP-15 on ILCs was used as a framework and all discussions will be presented in relation to following and implementing its proposed framework including both the official version of RP-15 at the time as well as the draft revision nearing release.
{"title":"Multi-Parameter Electrical Inter-Laboratory Comparison: ILC Thoughts, Experiences, and RP-15","authors":"Leif D. King","doi":"10.51843/wsproceedings.2013.14","DOIUrl":"https://doi.org/10.51843/wsproceedings.2013.14","url":null,"abstract":"This paper will present and discuss practical and other considerations regarding ILCs in general and complex multi-parameter ILCs with multiple possible methodologies and complexities. The experiences and lessons learned from conducting an ILC for the first time with the added factors of complexity combined with the lack of experience of even participating in an ILC will also be explored. NCSLI RP-15 on ILCs was used as a framework and all discussions will be presented in relation to following and implementing its proposed framework including both the official version of RP-15 at the time as well as the draft revision nearing release.","PeriodicalId":445779,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2013","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122825228","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51843/wsproceedings.2013.23
Michael Dobbert
Calibration and Specification Considerations When Using Modular Instrumentation. Modular instrumentation, such as PXI or AXIe modular instruments, offers significant configuration flexibility, plus interchangeability, speed, and size advantages when it comes to deploying measurement systems. However, the architecture that enables these advantages also presents unique challenges when calibrating modular instruments. Calibration often occurs outside of the use environment. For modular instrumentation, this may mean performing calibration on a module with a different chassis and its related electronics. Additionally, the module’s ambient environmental conditions depend upon chassis fan speed, the use of slot blockers and EMC filler panels and the presence of other modules. The operating software and CPU for modular instruments are contained outside the module in an external computer, which may not travel with the module for calibration. Modular instrumentation may require multiple modules configured together to provide measurement capability. This may require calibration on the set of modules as a system or, a method to relate system level performance to the calibrated performance of individual modules. These issues affect both the calibration and the calibration report and influence how manufacturers may define specifications for modular instrumentation. This paper examines these issues in detail and considers both in situ calibration and calibration performed outside the use environment. Recommended is information to be included on the measurement report that is unique to calibration of modular instrumentation. Addressed are the requirements for assuring the ability to make traceable measurements using calibrated modular instrumentation.
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