This study investigates the steady-state problem of SH guided waves impinging on a functionally graded piezoelectric-piezomagnetic strip structure with a circular hole and derives the corresponding analytical expressions. The incident wave field of planar SH guided waves is constructed using the guided-wave expansion method. Subsequently, by integrating the multiple-image technique, the scattering wave field that meets the requirements of the two infinitely long straight boundaries of the functionally graded strip structure is determined. The straight boundaries of the strip are assumed to satisfy stress-free, electrical-field-isolated, and magnetic-field-isolated conditions. The boundary conditions of the circular hole, including stress-free, continuous electric potential and electric displacement, as well as continuous magnetic potential and magnetic induction intensity, are used to further establish an infinite system of linear algebraic equations. Model examples are employed to explore the effects of factors such as inhomogeneity parameters, slab thickness, and the order of guided waves on the dynamic stress concentration factor (DSCF), electric field intensity concentration factor (EFICF), and magnetic field intensity concentration factor (MFICF) around the circular aperture. The results indicate that when the 0-order SH guided wave is incident, the influence of changes in inhomogeneity parameters on the stress concentration around the aperture is significant. In addition, the 0-order high-frequency SH guided wave causes the most substantial damage to the piezoelectric-piezomagnetic laminate structure, which requires special attention. As the laminate thickness increases, the stress concentration near the aperture decreases significantly. Therefore, a rational design of material parameters can effectively reduce stress concentration and protect functionally graded materials from brittle fracture.
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