Pub Date : 2021-08-23DOI: 10.1108/ssmt-01-2021-0001
Xiuqi Wang, F. Sun, B. Han, Yi-Bin Cao, Jinyang Du, Long Shao, Guo-huai Liu
Purpose The purpose of this paper is to investigate the wetting behaviors of Sn-5Sb-CuNiAg solders on copper substrates in different soldering processes and the effects of alloying elements on the wettability. Design/methodology/approach Sn-5Sb-CuNiAg solder balls (750 µm in diameter) were spread and wetted on 40 × 40 × 1 mm copper plates, in different fluxes, soldering temperatures and time. The contact angles were obtained by a home-made measuring instrument. The samples were polished and deep etched before analyzed by scanning electron microscopy. Energy dispersive X-ray spectroscopy was used to identify the composition of the joints. Findings The effects of different soldering processes and alloying elements on the wetting behaviors of Sn-5Sb-CuNiAg solders on copper substrates were calculated and expounded. The rosin-based flux could effectively remove oxidation layers and improve the wettability of Sn-5Sb-CuNiAg solders. Then with the increase of soldering temperature and time, the contact angles decreased gradually. The soldering processes suited for Sn-5Sb-CuNiAg solders were RMA218, 280°C and 30 s. Considered the effects of alloying elements, the wettability of Sn-5Sb-0.5Cu-0.1Ni-0.5Ag was relatively favorable on copper substrates. Besides, Ni could accumulate at the solder/Cu interface and form a jagged (Cu,Ni)6Sn5 IMC. Originality/value This work was carried out with our handmade experiment equipment and the production of the quinary lead-free solder alloy used in wetting tests belongs to us. The investigated Sn-5Sb-CuNiAg alloys exhibited higher melting point and preferable wettability, that was one of the candidates for high-temperature lead-free solders to replace high-Pb solders, and applied extremely to high temperature and frequency working environments of the third-generation semiconductors components, with a greater potential research and development value.
{"title":"Wetting characteristics of Sn-5Sb-CuNiAg lead-free solders on the copper substrate","authors":"Xiuqi Wang, F. Sun, B. Han, Yi-Bin Cao, Jinyang Du, Long Shao, Guo-huai Liu","doi":"10.1108/ssmt-01-2021-0001","DOIUrl":"https://doi.org/10.1108/ssmt-01-2021-0001","url":null,"abstract":"\u0000Purpose\u0000The purpose of this paper is to investigate the wetting behaviors of Sn-5Sb-CuNiAg solders on copper substrates in different soldering processes and the effects of alloying elements on the wettability.\u0000\u0000\u0000Design/methodology/approach\u0000Sn-5Sb-CuNiAg solder balls (750 µm in diameter) were spread and wetted on 40 × 40 × 1 mm copper plates, in different fluxes, soldering temperatures and time. The contact angles were obtained by a home-made measuring instrument. The samples were polished and deep etched before analyzed by scanning electron microscopy. Energy dispersive X-ray spectroscopy was used to identify the composition of the joints.\u0000\u0000\u0000Findings\u0000The effects of different soldering processes and alloying elements on the wetting behaviors of Sn-5Sb-CuNiAg solders on copper substrates were calculated and expounded. The rosin-based flux could effectively remove oxidation layers and improve the wettability of Sn-5Sb-CuNiAg solders. Then with the increase of soldering temperature and time, the contact angles decreased gradually. The soldering processes suited for Sn-5Sb-CuNiAg solders were RMA218, 280°C and 30 s. Considered the effects of alloying elements, the wettability of Sn-5Sb-0.5Cu-0.1Ni-0.5Ag was relatively favorable on copper substrates. Besides, Ni could accumulate at the solder/Cu interface and form a jagged (Cu,Ni)6Sn5 IMC.\u0000\u0000\u0000Originality/value\u0000This work was carried out with our handmade experiment equipment and the production of the quinary lead-free solder alloy used in wetting tests belongs to us. The investigated Sn-5Sb-CuNiAg alloys exhibited higher melting point and preferable wettability, that was one of the candidates for high-temperature lead-free solders to replace high-Pb solders, and applied extremely to high temperature and frequency working environments of the third-generation semiconductors components, with a greater potential research and development value.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43387464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-08-12DOI: 10.1108/ssmt-06-2021-0034
Xu Han, Xiaoyan Li, P. Yao
Purpose This study aims to investigate the effect of ultrasound on interfacial microstructures and growth kinetics of intermetallic compounds (IMCs) at different temperatures. Design/methodology/approach To investigate the effect of ultrasound on IMCs growth quantitatively, the cross-sectional area of IMCs layers over a confirmed length was obtained for calculating the thickness of the IMCs layer. Findings The generation of dimensional difference in normal direction between Cu6Sn5 and its adjacent Cu6Sn5, formation of bossed Cu6Sn5 and non-interfacial Cu6Sn5 in ultrasonic solder joints made the interfacial Cu6Sn5 layer present a non-scallop-like morphology different from that of traditional solder joints. At 260°C and 290°C, the Cu3Sn layer presented a wave-like shape. In contrast, at 320°C, the Cu3Sn in ultrasonic solder joints consisted of non-interfacial Cu3Sn and interfacial Cu3Sn with a branch-like shape. The Cu6Sn5/Cu3Sn boundary and Cu3Sn/Cu interface presented a sawtooth-like shape under the effect of ultrasound. The predominant mechanism of ultrasonic-assisted growth of Cu6Sn5 growth at 260°C, 290°C and 320°C involved the grain boundary diffusion accompanied by grain coarsening. The Cu3Sn growth was controlled by volume diffusion during the ultrasonic soldering process at 260°C and 290°C. The diffusion mechanism of Cu3Sn growth transformed to grain boundary diffusion accompanied by grain coarsening when the ultrasonic soldering temperature was increased to 320°C. Originality/value The microstructural evolution and growth kinetics of IMCs in ultrasonically prepared ultrasonic solder joints at different temperatures have rarely been reported in previous studies. In this study, the effect of ultrasound on microstructural evolution and growth kinetics of IMCs was systematically investigated.
{"title":"Microstructures evolution and growth kinetics of intermetallic compounds in Cu/Sn/Cu system during ultrasonic soldering process","authors":"Xu Han, Xiaoyan Li, P. Yao","doi":"10.1108/ssmt-06-2021-0034","DOIUrl":"https://doi.org/10.1108/ssmt-06-2021-0034","url":null,"abstract":"\u0000Purpose\u0000This study aims to investigate the effect of ultrasound on interfacial microstructures and growth kinetics of intermetallic compounds (IMCs) at different temperatures.\u0000\u0000Design/methodology/approach\u0000To investigate the effect of ultrasound on IMCs growth quantitatively, the cross-sectional area of IMCs layers over a confirmed length was obtained for calculating the thickness of the IMCs layer.\u0000\u0000Findings\u0000The generation of dimensional difference in normal direction between Cu6Sn5 and its adjacent Cu6Sn5, formation of bossed Cu6Sn5 and non-interfacial Cu6Sn5 in ultrasonic solder joints made the interfacial Cu6Sn5 layer present a non-scallop-like morphology different from that of traditional solder joints. At 260°C and 290°C, the Cu3Sn layer presented a wave-like shape. In contrast, at 320°C, the Cu3Sn in ultrasonic solder joints consisted of non-interfacial Cu3Sn and interfacial Cu3Sn with a branch-like shape. The Cu6Sn5/Cu3Sn boundary and Cu3Sn/Cu interface presented a sawtooth-like shape under the effect of ultrasound. The predominant mechanism of ultrasonic-assisted growth of Cu6Sn5 growth at 260°C, 290°C and 320°C involved the grain boundary diffusion accompanied by grain coarsening. The Cu3Sn growth was controlled by volume diffusion during the ultrasonic soldering process at 260°C and 290°C. The diffusion mechanism of Cu3Sn growth transformed to grain boundary diffusion accompanied by grain coarsening when the ultrasonic soldering temperature was increased to 320°C.\u0000\u0000Originality/value\u0000The microstructural evolution and growth kinetics of IMCs in ultrasonically prepared ultrasonic solder joints at different temperatures have rarely been reported in previous studies. In this study, the effect of ultrasound on microstructural evolution and growth kinetics of IMCs was systematically investigated.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48649479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-08-12DOI: 10.1108/ssmt-04-2021-0013
A. Sezer, Aytaç Altan
Purpose In the production processes of electronic devices, production activities are interrupted due to the problems caused by soldering defects during the assembly of surface-mounted elements on printed circuit boards (PCBs), and this leads to an increase in production costs. In solder paste applications, defects that may occur in electronic cards are usually noticed at the last stage of the production process. This situation reduces the efficiency of production and causes delays in the delivery schedule of critical systems. This study aims to overcome these problems, optimization based deep learning model has been proposed by using 2D signal processing methods. Design/methodology/approach An optimization-based deep learning model is proposed by using image-processing techniques to detect solder paste defects on PCBs with high performance at an early stage. Convolutional neural network, one of the deep learning methods, is trained using the data set obtained for this study, and pad regions on PCB are classified. Findings A total of six types of classes used in the study consist of uncorrectable soldering, missing soldering, excess soldering, short circuit, undefined object and correct soldering, which are frequently used in the literature. The validity of the model has been tested on the data set consisting of 648 test data. Originality/value The effect of image processing and optimization methods on model performance is examined. With the help of the proposed model, defective solder paste areas on PCBs are detected, and these regions are visualized by taking them into a frame.
{"title":"Detection of solder paste defects with an optimization‐based deep learning model using image processing techniques","authors":"A. Sezer, Aytaç Altan","doi":"10.1108/ssmt-04-2021-0013","DOIUrl":"https://doi.org/10.1108/ssmt-04-2021-0013","url":null,"abstract":"\u0000Purpose\u0000In the production processes of electronic devices, production activities are interrupted due to the problems caused by soldering defects during the assembly of surface-mounted elements on printed circuit boards (PCBs), and this leads to an increase in production costs. In solder paste applications, defects that may occur in electronic cards are usually noticed at the last stage of the production process. This situation reduces the efficiency of production and causes delays in the delivery schedule of critical systems. This study aims to overcome these problems, optimization based deep learning model has been proposed by using 2D signal processing methods.\u0000\u0000Design/methodology/approach\u0000An optimization-based deep learning model is proposed by using image-processing techniques to detect solder paste defects on PCBs with high performance at an early stage. Convolutional neural network, one of the deep learning methods, is trained using the data set obtained for this study, and pad regions on PCB are classified.\u0000\u0000Findings\u0000A total of six types of classes used in the study consist of uncorrectable soldering, missing soldering, excess soldering, short circuit, undefined object and correct soldering, which are frequently used in the literature. The validity of the model has been tested on the data set consisting of 648 test data.\u0000\u0000Originality/value\u0000The effect of image processing and optimization methods on model performance is examined. With the help of the proposed model, defective solder paste areas on PCBs are detected, and these regions are visualized by taking them into a frame.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47818013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-08-04DOI: 10.1108/ssmt-03-2021-0007
Yuqiao Cen, Jingxi He, Daehan Won
Purpose This paper aims to study the component pick-and-place (P&P) defect patterns for different root causes based on automated optical inspection data and develop a root cause identification model using machine learning. Design/methodology/approach This study conducts experiments to simulate the P&P machine errors including nozzle size and nozzle pick-up position. The component placement qualities with different errors are inspected. This study uses various machine learning methods to develop a root cause identification model based on the inspection result. Findings The experimental results revealed that the wrong nozzle size could increase the mean and the standard deviation of component placement offset and the probability of component drop during the transfer process. Moreover, nozzle pick-up position can affect the rotated component placement offset. These root causes of defects can be traced back using machine learning methods. Practical implications This study provides operators in surface mount technology assembly lines to understand the P&P machine error symptoms. The developed model can trace back the root causes of defects automatically in real line production. Originality/value The findings are expected to lead the regular preventive maintenance to data-driven predictive and reactive maintenance.
{"title":"Defect patterns study of pick-and-place machine using automated optical inspection data","authors":"Yuqiao Cen, Jingxi He, Daehan Won","doi":"10.1108/ssmt-03-2021-0007","DOIUrl":"https://doi.org/10.1108/ssmt-03-2021-0007","url":null,"abstract":"\u0000Purpose\u0000This paper aims to study the component pick-and-place (P&P) defect patterns for different root causes based on automated optical inspection data and develop a root cause identification model using machine learning.\u0000\u0000\u0000Design/methodology/approach\u0000This study conducts experiments to simulate the P&P machine errors including nozzle size and nozzle pick-up position. The component placement qualities with different errors are inspected. This study uses various machine learning methods to develop a root cause identification model based on the inspection result.\u0000\u0000\u0000Findings\u0000The experimental results revealed that the wrong nozzle size could increase the mean and the standard deviation of component placement offset and the probability of component drop during the transfer process. Moreover, nozzle pick-up position can affect the rotated component placement offset. These root causes of defects can be traced back using machine learning methods.\u0000\u0000\u0000Practical implications\u0000This study provides operators in surface mount technology assembly lines to understand the P&P machine error symptoms. The developed model can trace back the root causes of defects automatically in real line production.\u0000\u0000\u0000Originality/value\u0000The findings are expected to lead the regular preventive maintenance to data-driven predictive and reactive maintenance.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-08-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42940104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-30DOI: 10.1108/ssmt-04-2021-0014
Supriyono, Tzu-Chia Chen, L. M. Yapanto, Z. A. Latipov, A. Zekiy, L. A. Melnikova, L. Thangavelu, A. Surendar, N. Repnikov, Z. Arzehgar
Purpose In this paper, a lifetime estimation model for the solder joint is proposed which is capable of considering both severe and running mechanical shocks which is the real case in electric converters in the automotive and aerospace applications. This paper aims to asses the reliability of the solder joint under mixed exposure of mechanical loads. Design/methodology/approach Mechanical failure process may put at risk the perfect performance of any kinds of electronic systems regardless of the applications they are prepared for. Observation of solder joint health in an electronic assembly under simultaneous exposure of severe and running shocks is an open problem. Three commonly used soldering compositions are considered while the electronic assembly is exposed to three well-known driving cycles. Findings The results show that the best performance is achieved using SAC405 soldering alloy in comparison with Sn63Pb37 and SAC387 solder alloy. Consideration of mixed exposure to the mechanical loads leads to much more accurate lifetime estimation of the solder joint in the electronic assemblies. Originality/value The originality of the paper is confirmed.
{"title":"Reliability modeling and assessment of solder joints of electronic assemblies under mixed exposure to mechanical loads","authors":"Supriyono, Tzu-Chia Chen, L. M. Yapanto, Z. A. Latipov, A. Zekiy, L. A. Melnikova, L. Thangavelu, A. Surendar, N. Repnikov, Z. Arzehgar","doi":"10.1108/ssmt-04-2021-0014","DOIUrl":"https://doi.org/10.1108/ssmt-04-2021-0014","url":null,"abstract":"\u0000Purpose\u0000In this paper, a lifetime estimation model for the solder joint is proposed which is capable of considering both severe and running mechanical shocks which is the real case in electric converters in the automotive and aerospace applications. This paper aims to asses the reliability of the solder joint under mixed exposure of mechanical loads.\u0000\u0000\u0000Design/methodology/approach\u0000Mechanical failure process may put at risk the perfect performance of any kinds of electronic systems regardless of the applications they are prepared for. Observation of solder joint health in an electronic assembly under simultaneous exposure of severe and running shocks is an open problem. Three commonly used soldering compositions are considered while the electronic assembly is exposed to three well-known driving cycles.\u0000\u0000\u0000Findings\u0000The results show that the best performance is achieved using SAC405 soldering alloy in comparison with Sn63Pb37 and SAC387 solder alloy. Consideration of mixed exposure to the mechanical loads leads to much more accurate lifetime estimation of the solder joint in the electronic assemblies.\u0000\u0000\u0000Originality/value\u0000The originality of the paper is confirmed.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-07-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42243585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-28DOI: 10.1108/ssmt-02-2021-0006
M. Said, M. Nazeri, N. M. Sharif, A. A. Mohamad
Purpose This paper aims to investigate the morphology and tensile properties of SAC305 solder alloy under the influence of microwave hybrid heating (MHH) for soldering at different microwave parameters. Design/methodology/approach Si wafer was used as susceptor in MHH for solder reflow. Microwave operating power for medium and high ranging from 40 to 140 s reflow time was used to investigate their effect on the microstructure and strength of SAC305/Cu solder joints. The morphology and elemental composition of the intermetallic compound (IMC) joint were evaluated on the top surface and cross-sectional view. Findings IMC formation transformed from scallop-like to elongated scallop-like structure for medium operating power and scallop-like to planar-like structure for high operating power when exposed to longer reflow time. Compositional and phase analysis confirmed that the observed IMCs consist of Cu6Sn5, Cu3Sn and Ag3Sn. A thinner IMC layer was formed at medium operating power, 80 s (2.4 µm), and high operating power, 40 s (2.5 µm). The ultimate tensile strength at high operating power, 40 s (45.5 MPa), was 44.9% greater than that at medium operating power, 80 s (31.4 MPa). Originality/value Microwave parameters with the influence of Si wafer in MHH in soldering have been developed and optimized. A microwave temperature profile was established to select the appropriate parameter for solder reflow. For this MHH soldering method, the higher operating power and shorter reflow time are preferable.
{"title":"Effect of microwave operating power and reflow time on the microstructure and tensile properties of Sn–3.0Ag–0.5Cu/Cu solder joints","authors":"M. Said, M. Nazeri, N. M. Sharif, A. A. Mohamad","doi":"10.1108/ssmt-02-2021-0006","DOIUrl":"https://doi.org/10.1108/ssmt-02-2021-0006","url":null,"abstract":"\u0000Purpose\u0000This paper aims to investigate the morphology and tensile properties of SAC305 solder alloy under the influence of microwave hybrid heating (MHH) for soldering at different microwave parameters.\u0000\u0000\u0000Design/methodology/approach\u0000Si wafer was used as susceptor in MHH for solder reflow. Microwave operating power for medium and high ranging from 40 to 140 s reflow time was used to investigate their effect on the microstructure and strength of SAC305/Cu solder joints. The morphology and elemental composition of the intermetallic compound (IMC) joint were evaluated on the top surface and cross-sectional view.\u0000\u0000\u0000Findings\u0000IMC formation transformed from scallop-like to elongated scallop-like structure for medium operating power and scallop-like to planar-like structure for high operating power when exposed to longer reflow time. Compositional and phase analysis confirmed that the observed IMCs consist of Cu6Sn5, Cu3Sn and Ag3Sn. A thinner IMC layer was formed at medium operating power, 80 s (2.4 µm), and high operating power, 40 s (2.5 µm). The ultimate tensile strength at high operating power, 40 s (45.5 MPa), was 44.9% greater than that at medium operating power, 80 s (31.4 MPa).\u0000\u0000\u0000Originality/value\u0000Microwave parameters with the influence of Si wafer in MHH in soldering have been developed and optimized. A microwave temperature profile was established to select the appropriate parameter for solder reflow. For this MHH soldering method, the higher operating power and shorter reflow time are preferable.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42121421","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-22DOI: 10.1108/SSMT-12-2020-0055
Leonid Anatolevich Olenev, R. Zakieva, N. Smirnova, R. Shichiyakh, K. Ershov, Nisith Geetha
Purpose This study aims to present a more accurate lifetime prediction model considering solder chemical composition. Design/methodology/approach Thermal cycling and standard creep tests as well as finite element simulation were used. Findings The study found lower error in the solder joint lifetime evaluation. The higher the Ag content is, the higher the lifetime is achieved. Originality/value It is confirmed.
{"title":"Accurate composition dependent thermo mechanical lifetime estimation of hour glass type solder joint in electronic assemblies","authors":"Leonid Anatolevich Olenev, R. Zakieva, N. Smirnova, R. Shichiyakh, K. Ershov, Nisith Geetha","doi":"10.1108/SSMT-12-2020-0055","DOIUrl":"https://doi.org/10.1108/SSMT-12-2020-0055","url":null,"abstract":"\u0000Purpose\u0000This study aims to present a more accurate lifetime prediction model considering solder chemical composition.\u0000\u0000\u0000Design/methodology/approach\u0000Thermal cycling and standard creep tests as well as finite element simulation were used.\u0000\u0000\u0000Findings\u0000The study found lower error in the solder joint lifetime evaluation. The higher the Ag content is, the higher the lifetime is achieved.\u0000\u0000\u0000Originality/value\u0000It is confirmed.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46546313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Purpose The simulated temperature profile of the printed circuit board assembly (PCBA) during reflow soldering process deviates from the actual profile. To reduce this relative deviation, a new strategy based on the Kriging response surface and the Multi-Objective Genetic Algorithm (MOGA) optimizing method is proposed. Design/methodology/approach The simulated temperature profile of the PCBA during reflow soldering process deviates from the actual profile. To reduce this relative deviation, a new strategy based on the Kriging response surface and the MOGA optimizing method is proposed. Findings Several critical influencing parameters such as temperature and the convective heat transfer coefficient of the specific temperature zones are selected as the correction parameters. The hyper Latins sampling method is implemented to distribute the design points, and the Kriging response surface model of the soldering process is constructed. The updated model is achieved and validated by the test. The relative derivation is reduced from the initial value of 43.4%–11.8% in terms of the time above the liquidus line. Originality/value A new strategy based on the Kriging response surface and the MOGA optimizing method is proposed.
{"title":"Model updating of a temperature field simulation of a printed circuit board assembly based on the Kriging model","authors":"Yin Yutian, Zhou Hongda, Chen Cai, Zheng Yi, Shen Hongqiao, Gong Yubing","doi":"10.1108/SSMT-01-2021-0002","DOIUrl":"https://doi.org/10.1108/SSMT-01-2021-0002","url":null,"abstract":"\u0000Purpose\u0000The simulated temperature profile of the printed circuit board assembly (PCBA) during reflow soldering process deviates from the actual profile. To reduce this relative deviation, a new strategy based on the Kriging response surface and the Multi-Objective Genetic Algorithm (MOGA) optimizing method is proposed.\u0000\u0000\u0000Design/methodology/approach\u0000The simulated temperature profile of the PCBA during reflow soldering process deviates from the actual profile. To reduce this relative deviation, a new strategy based on the Kriging response surface and the MOGA optimizing method is proposed.\u0000\u0000\u0000Findings\u0000Several critical influencing parameters such as temperature and the convective heat transfer coefficient of the specific temperature zones are selected as the correction parameters. The hyper Latins sampling method is implemented to distribute the design points, and the Kriging response surface model of the soldering process is constructed. The updated model is achieved and validated by the test. The relative derivation is reduced from the initial value of 43.4%–11.8% in terms of the time above the liquidus line.\u0000\u0000\u0000Originality/value\u0000A new strategy based on the Kriging response surface and the MOGA optimizing method is proposed.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":"1 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62406681","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-06-24DOI: 10.1108/ssmt-01-2021-0003
R. Kakitani, C. A. P. Silva, B. Silva, Amauri Garcia, N. Cheung, J. Spinelli
Purpose Overall, selection maps about the extent of the eutectic growth projects the solidification velocities leading to given microstructures. This is because of limitations of most of the set of results when obtained for single thermal gradients within the experimental spectrum. In these cases, associations only with the solidification velocity could give the false impression that reaching a given velocity would be enough to reproduce a result. However, that velocity must necessarily be accompanied by a specific thermal gradient during transient solidification. Therefore, the purpose of this paper is to not only project velocity but also include the gradients acting for each velocity. Design/methodology/approach Compilation of solidification velocity, v, thermal gradient, G, and cooling rate, Ṫ, data for Sn-Cu and Sn-Bi solder alloys of interest is presented. These data are placed in the form of coupled growth zones according to the correlated microstructures in the literature. In addition, results generated in this work for Sn-(0.5, 0.7, 2.0, 2.8)% Cu and Sn-(34, 52, 58)% Bi alloys solidified under non-stationary conditions are added. Findings When analyzing the cooling rate (Ṫ = G.v) and velocity separately, in or around the eutectic composition, a consensus cannot be reached on the resulting microstructure. The (v vs. G) + cooling rate diagrams allow comprehensive analyzes of the combined v and G effects on the subsequent microstructure of the Sn-Cu and Sn-Bi alloys. Originality/value The present paper is devoted to the establishment of (v vs. G) + cooling rate diagrams. These plots may allow comprehensive analyses of the combined v and G effects on the subsequent microstructure of the Sn-Cu and Sn-Bi alloys. This microstructure-processing mapping approach is promising to predict phase competition and resulting microstructures in soldering of Sn-Cu and Sn-Bi alloys. These two classes of alloys are of interest to the soldering industry, whereas manipulation of their microstructures is considered of utmost importance for the metallurgical quality of the product.
{"title":"Local solidification thermal parameters affecting the eutectic extent in Sn-Cu and Sn-Bi solder alloys","authors":"R. Kakitani, C. A. P. Silva, B. Silva, Amauri Garcia, N. Cheung, J. Spinelli","doi":"10.1108/ssmt-01-2021-0003","DOIUrl":"https://doi.org/10.1108/ssmt-01-2021-0003","url":null,"abstract":"\u0000Purpose\u0000Overall, selection maps about the extent of the eutectic growth projects the solidification velocities leading to given microstructures. This is because of limitations of most of the set of results when obtained for single thermal gradients within the experimental spectrum. In these cases, associations only with the solidification velocity could give the false impression that reaching a given velocity would be enough to reproduce a result. However, that velocity must necessarily be accompanied by a specific thermal gradient during transient solidification. Therefore, the purpose of this paper is to not only project velocity but also include the gradients acting for each velocity.\u0000\u0000\u0000Design/methodology/approach\u0000Compilation of solidification velocity, v, thermal gradient, G, and cooling rate, Ṫ, data for Sn-Cu and Sn-Bi solder alloys of interest is presented. These data are placed in the form of coupled growth zones according to the correlated microstructures in the literature. In addition, results generated in this work for Sn-(0.5, 0.7, 2.0, 2.8)% Cu and Sn-(34, 52, 58)% Bi alloys solidified under non-stationary conditions are added.\u0000\u0000\u0000Findings\u0000When analyzing the cooling rate (Ṫ = G.v) and velocity separately, in or around the eutectic composition, a consensus cannot be reached on the resulting microstructure. The (v vs. G) + cooling rate diagrams allow comprehensive analyzes of the combined v and G effects on the subsequent microstructure of the Sn-Cu and Sn-Bi alloys.\u0000\u0000\u0000Originality/value\u0000The present paper is devoted to the establishment of (v vs. G) + cooling rate diagrams. These plots may allow comprehensive analyses of the combined v and G effects on the subsequent microstructure of the Sn-Cu and Sn-Bi alloys. This microstructure-processing mapping approach is promising to predict phase competition and resulting microstructures in soldering of Sn-Cu and Sn-Bi alloys. These two classes of alloys are of interest to the soldering industry, whereas manipulation of their microstructures is considered of utmost importance for the metallurgical quality of the product.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49080948","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-06-07DOI: 10.1108/SSMT-12-2020-0057
V. Carvalho, Bruno Arcipreste, D. Soares, Luís Ribas, Nelson Rodrigues, S. Teixeira, J. Teixeira
Purpose This study aims to determine the minimum force required to pull out a surface mount component in printed circuit boards (PCBs) during the wave soldering process through both experimental and numerical procedures. Design/methodology/approach An efficient experimental technique was proposed to determine the minimum force required to pull out a surface mount component in PCBs during the wave soldering process. Findings The results showed that the pullout force is approximately 0.4 N. Comparing this value with the simulated force exerted by the solder wave on the component ( ≅ 0.001158 N), it can be concluded that the solder wave does not exert sufficient force to remove a component. Originality/value This study provides a deep understanding of the wave soldering process regarding the component pullout, a critical issue that usually occurs in the microelectronics industry during this soldering process. By applying both accurate experimental and numerical approaches, this study showed that more tests are needed to evaluate the main cause of this problem, as well as new insights were provided into the depositing process of glue dots on PCBs.
{"title":"Experimental measurements of the shear force on surface mount components simulating the wave soldering process","authors":"V. Carvalho, Bruno Arcipreste, D. Soares, Luís Ribas, Nelson Rodrigues, S. Teixeira, J. Teixeira","doi":"10.1108/SSMT-12-2020-0057","DOIUrl":"https://doi.org/10.1108/SSMT-12-2020-0057","url":null,"abstract":"\u0000Purpose\u0000This study aims to determine the minimum force required to pull out a surface mount component in printed circuit boards (PCBs) during the wave soldering process through both experimental and numerical procedures.\u0000\u0000\u0000Design/methodology/approach\u0000An efficient experimental technique was proposed to determine the minimum force required to pull out a surface mount component in PCBs during the wave soldering process.\u0000\u0000\u0000Findings\u0000The results showed that the pullout force is approximately 0.4 N. Comparing this value with the simulated force exerted by the solder wave on the component (\u0000\u0000≅ 0.001158 N), it can be concluded that the solder wave does not exert sufficient force to remove a component.\u0000\u0000\u0000Originality/value\u0000This study provides a deep understanding of the wave soldering process regarding the component pullout, a critical issue that usually occurs in the microelectronics industry during this soldering process. By applying both accurate experimental and numerical approaches, this study showed that more tests are needed to evaluate the main cause of this problem, as well as new insights were provided into the depositing process of glue dots on PCBs.\u0000","PeriodicalId":49499,"journal":{"name":"Soldering & Surface Mount Technology","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2021-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45548608","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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