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Effect of annealing temperature on electrical properties of Al/ZrO2/p-Si MOS capacitor 退火温度对Al/ZrO2/p-Si MOS电容器电性能的影响
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2021-04-29 DOI: 10.1080/07315171.2021.1923119
A. Singh, S. Singh
Abstract The present study reveals that ZrO2 MOS capacitor has been fabricated by RF sputtering technique. The maximum refractive index has been found to be 2.29 at 400 °C. From capacitance-voltage graph, it has been observed that the memory window and accumulation capacitance has been found to be maximum at 400 °C. The maximum memory window and accumulation capacitance has been found to be 0.50 V and 7.00 ×10−11 F, respectively. The flat band voltage shifts toward positive side at all temperatures. From current-voltage curve, it has been observed that the leakage current is found to be low at 400 °C and it is order of 10 − 7A at +20 V.
摘要:本研究采用射频溅射技术制备了ZrO2 MOS电容器。400℃时的最大折射率为2.29。从电容-电压图可以看出,在400℃时,记忆窗口和积累电容最大。最大记忆窗口和累积电容分别为0.50 V和7.00 ×10−11 F。在所有温度下,平带电压都向正极方向移动。从电流-电压曲线可以观察到,在400°C时泄漏电流很小,在+20 V时泄漏电流为10−7A数量级。
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引用次数: 1
Optical properties of [Ta2O5]1-x[TiO2]x, (x = 0.08) thin films [Ta2O5]1-x[TiO2]x, (x = 0.08)薄膜的光学性质
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2021-04-29 DOI: 10.1080/07315171.2021.1923117
A. Bhandari, N. S. Panwar
Abstract Thin films of [Ta2O5]1-x-[TiO2]x, with x = 0.08, were deposited on quartz substrates (for optical study) and p- type mono- crystalline silicon (100) surfaces (for structural characterization and electrical measurements) by RF magnetron sputtering of [Ta2O5]0.92-[TiO2]0.08, ceramic target, using argon as sputtering gas and oxygen as reactive gas. Films were deposited at room temperature and further annealed at 400, 500, 600 and 700 0C, at ambient atmosphere. The observed XRD patterns show that the as- deposited and annealed films have crystalline structure. The spectral transmissions of the [Ta2O5]1-x-[TiO2]x (x = 0.08) films were measured in UV-visible range. The low optical transmittance in as-deposited films may be due to the presence of unreacted tantalum along with Ta2O5 in the films. From the observed transmission spectra, refractive index, optical band gap, absorption coefficient, extinction coefficient, and thickness of prepared [Ta2O5]0.92-[TiO2]0.08 films, have been calculated by Swanepoel’s envelope technique.
摘要:以氩气为溅射气体,氧为反应气体,以[Ta2O5]0.92-[TiO2]0.08为材料,采用射频磁控溅射方法,在石英衬底(用于光学研究)和p型单晶硅(100)表面(用于结构表征和电学测量)上制备了x = 0.08的[Ta2O5]1-x-[TiO2]x薄膜。薄膜在室温下沉积,并在常温下分别在400、500、600和700℃退火。XRD分析结果表明,沉积和退火后的薄膜具有晶体结构。测定了[Ta2O5]1-x-[TiO2]x (x = 0.08)薄膜在紫外可见范围内的光谱透射率。沉积薄膜的低透光率可能是由于薄膜中存在未反应的钽和Ta2O5。利用斯瓦内普尔包线法计算了制备的[Ta2O5]0.92-[TiO2]0.08薄膜的透射光谱、折射率、带隙、吸收系数、消光系数和厚度。
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引用次数: 0
Physical properties of Pb(Mg1/2W1/2)O3-Pb(Ni1/3Nb2/3)O3-Pb(Zr,Ti)O3 ceramics doped with tungsten oxide for haptic display actuator 掺杂氧化钨触觉显示驱动器用Pb(mg1 / 2w /2)O3-Pb(Ni1/3Nb2/3)O3-Pb(Zr,Ti)O3陶瓷的物理性能
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2021-04-28 DOI: 10.1080/07315171.2021.1923121
Juhyun Yoo, Jongmyung Im, In-Seok Yu
Abstract In this study, for developing the low temperature sintering ceramics for speaker using piezoelectric actuator, Pb(Mg1/2W1/2)O3-Pb(Ni1/3Nb2/3)O3-Pb(Zr,Ti)O3 [PMW-PNN-PZT] ceramics doped with PbO, CuO, and WO3 as sintering aids were manufactured, and their microstructural, dielectric, and piezoelectric properties were investigated. At 0.3 wt% tungsten oxide (=WO3) added specimen sintered at 920 °C, the maximum values of piezoelectric properties were shown, respectively: the dielectric constant (εr) of 2275, piezoelectric constant (d33) of 502 pC/N, electromechanical coupling factor (kp) of 0.644, and mechanical quality factor (Qm) of 57 were suitable for the device application such as haptic display actuator using low temperature sintering multilayer ceramics.
摘要:为研制压电致动器扬声器用低温烧结陶瓷,制备了掺杂PbO、CuO和WO3的Pb(mg1 / 2w /2)O3-Pb(Ni1/3Nb2/3)O3-Pb(Zr,Ti)O3 [PMW-PNN-PZT]陶瓷,并对其显微结构、介电性能和压电性能进行了研究。当氧化钨(=WO3)添加量为0.3 wt%,烧结温度为920℃时,样品的介电常数(εr)为2275,压电常数(d33)为502 pC/N,机电耦合系数(kp)为0.644,机械品质因子(Qm)为57,均达到压电性能的最大值,适合于低温烧结多层陶瓷的触觉显示执行器等器件应用。
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引用次数: 3
Rietveld analysis and negative dielectric behavior of perovskite-like La1–xEuxMnO3 system 类钙钛矿La1-xEuxMnO3体系的Rietveld分析及负介电行为
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2020-03-26 DOI: 10.1080/07315171.2020.1810983
Shilpa Kumari, R. Rai, Pawan Kumar, P. Kumari, A. Dronov
Abstract In this article, we report the results of the Rietveld and impedance analysis of Eu doped La1–xEuxMnO3 (LEMO; x = 0.10, 0.30, and 0.50) perovskite manganites synthesized by solid-state reaction method. Structural studies through Rietveld analysis confirm that a mixed-phase nature of all LEM samples having a hexagonal unit cell structure with a less detectable impurity (Eu2O3) ceramics. The patterns are zanalyzed in detail with structural distortion and strain in LEM manganites ceramics. Dielectric constant and modulus are found to increase with increasing Eu concentration. The samples LEM-0.10 shows the negative capacitance at low frequency and temperature, respectively.
摘要本文报道了Eu掺杂La1-xEuxMnO3 (LEMO;X = 0.10, 0.30, 0.50)固相反应法制备钙钛矿锰矿。通过Rietveld分析的结构研究证实,所有LEM样品的混合相性质具有六方单元结构,具有较少可检测到的杂质(Eu2O3)陶瓷。详细分析了LEM锰酸盐陶瓷的结构变形和应变。介电常数和模量随铕浓度的增加而增加。样品LEM-0.10分别为低频和温度下的负电容。
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引用次数: 1
Coexistence of phases and interphase boundaries in BaTiO3 BaTiO3中相与相间边界的共存
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2020-03-26 DOI: 10.1080/07315171.2020.1810982
T. Liebsch, V. Sobolev
Abstract A theoretical analysis of the internal structure of interphase boundaries separating domains of coexisting phases is presented for the perovskite ferroelectric BaTiO3. The temperature dependence of interphase boundary widths and surface energies are calculated and compared with the corresponding parameters for different types of domain walls existing within the ferroelectric phases of BaTiO3.
摘要对钙钛矿型铁电材料BaTiO3的共存相边界的内部结构进行了理论分析。计算了BaTiO3铁电相中不同类型畴壁的界面宽度和表面能对温度的依赖关系,并与相应参数进行了比较。
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引用次数: 0
Microstructure and dielectric properties of 0-3 connectivity lead-free BCTS-Portland cement composites 0-3连通度无铅bcts -波特兰水泥复合材料的微观结构和介电性能
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2020-03-26 DOI: 10.1080/07315171.2020.1810986
R. Potong, R. Rianyoi, A. Chaipanich
Abstract The 0-3 connectivity lead-free barium calcium stannate titanate (BCTS)-Portland cement (PC) composites were produced by pressing and curing techniques. The effect of BCTS ceramic content on microstructure and dielectric properties of composites were studied. Scanning electron microscope images at the interfacial zone of composites showed denser microstructure between Portland cement matrix and BCTS ceramic. The dielectric constant and dielectric loss of BCTS-Portland cement composites were also found to depend on the frequency in the range tested. The dielectric results indicate that the BCTS ceramic can improve the dielectric constant (lower dielectric loss) in composites. The dielectric constant followed the cube model.
采用压制和固化技术制备了0-3连接度无铅锡钛酸钡钙(BCTS)-硅酸盐水泥(PC)复合材料。研究了BCTS陶瓷含量对复合材料微观结构和介电性能的影响。复合材料界面区的扫描电镜图像显示,硅酸盐水泥基体与BCTS陶瓷之间的微观结构更为致密。bcts -波特兰水泥复合材料的介电常数和介电损耗也与测试范围内的频率有关。电介质实验结果表明,BCTS陶瓷可以提高复合材料的介电常数(降低介电损耗)。介电常数遵循立方体模型。
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引用次数: 0
Effect of insulator layer thickness on electrical properties of Al/BiFeO3/ZrO2/p-Si for nonvolatile memory applications 绝缘层厚度对Al/BiFeO3/ZrO2/p-Si非易失性存储器电性能的影响
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2020-03-26 DOI: 10.1080/07315171.2020.1810984
Ashutosh Kumar Singh, Chandravilash Rai, S. Singh
Abstract BiFeO3 (BFO) and ZrO2 have been deposited on p-type (100) silicon substrate by sol-gel process and rf sputtering method, respectively. Metal-ferroelectric-insulator-semiconductor capacitor has been fabricated with 100 nm BFO and 10 nm ZrO2 shows maximum memory window of 1.54 V as compared to other fabricated capacitors with 5 and 15 nm insulating layer thickness. Improvement in current density has been also observed in different thickness of buffer layer of MFIS capacitors. The improved current density of order of 10-7 A/cm2 has been observed in MF(100nm)I(10nm)S structure. It has been also observed in MF(100nm)I(10nm)S structure that no charge value degrades up to 1011 iteration cycles.
摘要:采用溶胶-凝胶法和射频溅射法分别在p型(100)硅衬底上沉积了BiFeO3 (BFO)和ZrO2。用100 nm的BFO和10 nm的ZrO2制备了金属-铁电-绝缘体-半导体电容器,与其他5和15 nm的绝缘层厚度制备的电容器相比,其最大存储窗口为1.54 V。在不同的缓冲层厚度下,电流密度也有所提高。在MF(100nm)I(10nm)S结构中,电流密度提高了10-7 A/cm2。在MF(100nm)I(10nm)S结构中也观察到,在1011个迭代周期内没有电荷值退化。
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引用次数: 0
Mechanism analyses of differential and static dielectric constants in ferroelectrics 铁电体中微分和静态介电常数的机理分析
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2020-03-26 DOI: 10.1080/07315171.2020.1832393
Y. Gan, W. Cao
Abstract The dielectric constant measured by the LCR-meter is a differential-type, and is not equivalent to capacitivity. Capacitivity of ferroelectrics is the dielectric constant corresponding to electric hysteresis loop. Two kinds of dielectric constants are investigated based on the P-E loop mechanisms: turning effect of dipoles toward electric field direction, electric field-induced polarization effect, and dipole coupling effect. Numerical simulation of the theoretic equations exhibit adouble-peak of the differential dielectric constant, in which the distance between the two peaks depends on the temperature and the electric field. A much narrow static dielectric constant peak and negative peak appear corresponding to the loop. Mechanisms are analyzed schematically in detail. HIGHLIGHTS Definitions of differential- and static-dielectric constant are introduced and compared. Theoretic equations for the two dielectric constants are derived from the three effects. Variations of the two dielectric constants with E and T are demonstrated schematically. Mechanisms of the variations are explained in detail.
摘要LCR-meter测量的介电常数是微分型的,不等同于电容。铁电体的电容量是电滞回线对应的介电常数。基于P-E环机制研究了两种介电常数:偶极子向电场方向的转向效应、电场诱导极化效应和偶极子耦合效应。理论方程的数值模拟表明,微分介电常数存在双峰,双峰之间的距离与温度和电场有关。与回路相对应的静态介电常数峰和负峰较窄。并对其机理进行了详细的图解分析。重点介绍和比较了微分介电常数和静态介电常数的定义。根据这三种效应,导出了两个介电常数的理论方程。图解地说明了两个介电常数随E和T的变化。详细解释了这些变化的机理。
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引用次数: 1
To study the effect of low temperature crystal growth on the structural and ferroelectric properties of lead-free BCT-BZT ceramic 研究低温晶体生长对无铅BCT-BZT陶瓷结构和铁电性能的影响
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2020-03-26 DOI: 10.1080/07315171.2020.1810985
S. Thakur, Mamta Shandilya, M. Graça, M. Valente
Abstract Barium Zirconate Titanate-Barium Calcium Titanate (BCT-BZT) is one of the lead-free systems, which exhibits remarkable ferroelectric properties akin to lead-based perovskite materials. In this study, we have synthesized x(Ba0.85Ca0.15)TiO3-(1−x)Ba(Zr0.15Ti0.85)O3 (where x = 0.4, 0.5, 0.6) monophonic powders by hydrothermal method at 150 °C. X-ray diffraction reveals the pure tetragonal phase. Scanning electron microscopy (SEM) studies make known that the crystal growth is uniform due to low temperature, and that the ceramics are highly dense and polycrystalline. The single semicircle indicates bulk behavior. The bulk resistance decreases with the increase in temperature showing a typical semiconducting property, negative temperature coefficient of resistance (NTCR) behavior.
锆钛酸钡-钛酸钡钙(BCT-BZT)是一种无铅体系,具有类似于铅基钙钛矿材料的铁电性能。在本研究中,我们采用水热法在150℃下合成了x(Ba0.85Ca0.15)TiO3-(1−x)Ba(Zr0.15Ti0.85)O3(其中x = 0.4, 0.5, 0.6)单音粉末。x射线衍射显示为纯四方相。扫描电子显微镜(SEM)研究表明,由于温度较低,晶体生长均匀,陶瓷具有高密度和多晶性。单个半圆表示批量行为。体积电阻随温度的升高而减小,表现出典型的半导体性质,负温度电阻系数(NTCR)行为。
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引用次数: 6
Rational analysis of processes of (first-order) ferroelectric phase transition and those of ferroic hysteresis 合理分析了一阶铁电相变和铁电滞后过程
IF 0.4 4区 物理与天体物理 Q4 Materials Science Pub Date : 2020-01-24 DOI: 10.1080/07315171.2020.1799628
S. Ai, Shao-yin Zhang, Jin-Song Wang, Yuan-Zhen Cai
Abstract From the view-point of non-equilibrium (or irreversible) statistical thermodynamics, the similarities and differences between the processes of (first-order) ferroelectric phase transition and those of ferroic hysteresis were compared. They are all irreversible. The former are local and rate-dependent, at the meanwhile, the latter are non-local and rate-independent.
摘要从非平衡态(或不可逆态)统计热力学的角度,比较了(一阶)铁电相变过程与铁电滞后过程的异同。它们都是不可逆的。前者是局部的,与汇率相关;后者是非局部的,与汇率无关。
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引用次数: 0
期刊
Ferroelectrics Letters Section
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