{"title":"Electrical fundamentals","authors":"M. Tooley","doi":"10.1201/9780367822651-1","DOIUrl":"https://doi.org/10.1201/9780367822651-1","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"75 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88083031","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-11-07DOI: 10.1201/9780367822651-17
M. Tooley
{"title":"The PIC microcontroller","authors":"M. Tooley","doi":"10.1201/9780367822651-17","DOIUrl":"https://doi.org/10.1201/9780367822651-17","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"88 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77590372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"D.C. circuits","authors":"Michael H. Tooley","doi":"10.1201/9780367822651-3","DOIUrl":"https://doi.org/10.1201/9780367822651-3","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"48 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76220555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Alternating voltage and current","authors":"M. Tooley","doi":"10.1201/9780367822651-4","DOIUrl":"https://doi.org/10.1201/9780367822651-4","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"61 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84122358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2019-11-07DOI: 10.1201/9780367822651-18
M. Tooley
{"title":"Electronic applications and the Raspberry Pi","authors":"M. Tooley","doi":"10.1201/9780367822651-18","DOIUrl":"https://doi.org/10.1201/9780367822651-18","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89089533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-12-14DOI: 10.1017/cbo9781107705852.011
MICHAEL TOOLEY
{"title":"Amplifiers","authors":"MICHAEL TOOLEY","doi":"10.1017/cbo9781107705852.011","DOIUrl":"https://doi.org/10.1017/cbo9781107705852.011","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86920844","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-05-04DOI: 10.1201/9780367822651-12
M. Tooley
{"title":"The 555 timer","authors":"M. Tooley","doi":"10.1201/9780367822651-12","DOIUrl":"https://doi.org/10.1201/9780367822651-12","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"30 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87975470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-04-15DOI: 10.1109/DDECS.2009.5012117
G. Marosy, Z. Kovács, Gyula Horváth
Nowadays in embedded system design it is essential to use Hardware/Software (HW/SW) co-design. This paper is about the development of an autonomic mobile navigation with HW/SW co-design. We managed to design such a system that won the first prize at one of the greatest mars rover competitions in Hungary. The paper demonstrates how to keep the project costs and system design process time low with this methodology. The hardware-software partitioning is discussed in details. This paper is going to deal with the possible and already used technologies in details by emphasizing their advantages.
{"title":"Effective mars rover platform design with Hardware / Software co-design","authors":"G. Marosy, Z. Kovács, Gyula Horváth","doi":"10.1109/DDECS.2009.5012117","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012117","url":null,"abstract":"Nowadays in embedded system design it is essential to use Hardware/Software (HW/SW) co-design. This paper is about the development of an autonomic mobile navigation with HW/SW co-design. We managed to design such a system that won the first prize at one of the greatest mars rover competitions in Hungary. The paper demonstrates how to keep the project costs and system design process time low with this methodology. The hardware-software partitioning is discussed in details. This paper is going to deal with the possible and already used technologies in details by emphasizing their advantages.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"67 1","pages":"148-151"},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81620460","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-04-15DOI: 10.1109/DDECS.2009.5012098
A. Bosio, P. Girard, S. Pravossoudovitch, P. Bernardi, M. Reorda
This paper proposes an efficient technique for transition delay fault coverage measurement in synchronous sequential circuits. The proposed strategy is based on a combination of multi-valued algebra simulation, critical path tracing and deductive fault simulation. The main advantages of the proposed approach are that it is highly computationally efficient with respect to state-of-the-art fault simulation techniques, and that it encompasses different delay sizes in one simulation pass without resorting to an improved transition fault model. Preliminary results on ITC99 benchmarks show that the gain in terms of CPU time is up to one order of magnitude compared to previous existing techniques.
{"title":"An efficient fault simulation technique for transition faults in non-scan sequential circuits","authors":"A. Bosio, P. Girard, S. Pravossoudovitch, P. Bernardi, M. Reorda","doi":"10.1109/DDECS.2009.5012098","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012098","url":null,"abstract":"This paper proposes an efficient technique for transition delay fault coverage measurement in synchronous sequential circuits. The proposed strategy is based on a combination of multi-valued algebra simulation, critical path tracing and deductive fault simulation. The main advantages of the proposed approach are that it is highly computationally efficient with respect to state-of-the-art fault simulation techniques, and that it encompasses different delay sizes in one simulation pass without resorting to an improved transition fault model. Preliminary results on ITC99 benchmarks show that the gain in terms of CPU time is up to one order of magnitude compared to previous existing techniques.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"7 1","pages":"50-55"},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84486717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-04-15DOI: 10.1109/DDECS.2009.5012132
F. Ouchet, D. Borrione, K. Morin-Allory, L. Pierre
This paper describes VSYML, a symbolic simulator that extracts formal models from VHDL descriptions. The generated models are adequate to formal reasoning in various frameworks. VSYML is a reimplementation of its ancestor Theosim; it brings various improvements e.g., with regard to arrays and other complex data types.
{"title":"High-level symbolic simulation for automatic model extraction","authors":"F. Ouchet, D. Borrione, K. Morin-Allory, L. Pierre","doi":"10.1109/DDECS.2009.5012132","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012132","url":null,"abstract":"This paper describes VSYML, a symbolic simulator that extracts formal models from VHDL descriptions. The generated models are adequate to formal reasoning in various frameworks. VSYML is a reimplementation of its ancestor Theosim; it brings various improvements e.g., with regard to arrays and other complex data types.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"24 1","pages":"218-221"},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78287552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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