Pub Date : 2009-04-15DOI: 10.1109/DDECS.2009.5012113
Y. Wen
This paper proposes a test scheme for measuring the ratio of a pair of capacitors of switched-capacitor (SC) circuits under test (CUT). A specific test signal called step-ramp signal (SRS) is designed. It accurately corresponds to a reference counter. With multiple gains design, a preamplifier following the CUT makes the output of the CUT larger to ensure that the output of the preamplifier is larger than that of the sampled voltage of the SRS inputted to the CUT. The difference between the output of the preamplifier and sampled voltage of the SRS is matched to a set of reference counter output codes. The ratio extracting from the codes can be simply and accurately calculated with digital circuits. This method is suitable to be implemented with Built-In Self-Test (BIST) structure for features on low chip area overhead and short test time. The demonstration is done by Ispice simulation. The accuracy of all ramp pieces of the SRS are within 0.036% and the method gives high accuracy of ratio measurement.
{"title":"Test scheme for switched-capacitor circuits by digital analyses","authors":"Y. Wen","doi":"10.1109/DDECS.2009.5012113","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012113","url":null,"abstract":"This paper proposes a test scheme for measuring the ratio of a pair of capacitors of switched-capacitor (SC) circuits under test (CUT). A specific test signal called step-ramp signal (SRS) is designed. It accurately corresponds to a reference counter. With multiple gains design, a preamplifier following the CUT makes the output of the CUT larger to ensure that the output of the preamplifier is larger than that of the sampled voltage of the SRS inputted to the CUT. The difference between the output of the preamplifier and sampled voltage of the SRS is matched to a set of reference counter output codes. The ratio extracting from the codes can be simply and accurately calculated with digital circuits. This method is suitable to be implemented with Built-In Self-Test (BIST) structure for features on low chip area overhead and short test time. The demonstration is done by Ispice simulation. The accuracy of all ramp pieces of the SRS are within 0.036% and the method gives high accuracy of ratio measurement.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86880770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-04-15DOI: 10.1109/DDECS.2009.5012119
F. Azaïs, Y. Bertrand, M. Renovell
This paper analyzes the impact of Simultaneous Switching Noise (SSN) on the timing behavior of CMOS digital blocks. The concept of Instantaneous Transfer Function is introduced to interpret noisy signals and perform timing measurements on such signals. It is shown that the average swing during switching is the key parameter to predict the noise impact on the delay of a logic path, whereas the peak of noise is not relevant. The influence of structural parameters such as the block topology is evaluated, and the unpredictable aspect of SSN impact on path delay is highlighted.
{"title":"An analysis of the timing behavior of CMOS digital blocks under Simultaneous Switching Noise conditions","authors":"F. Azaïs, Y. Bertrand, M. Renovell","doi":"10.1109/DDECS.2009.5012119","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012119","url":null,"abstract":"This paper analyzes the impact of Simultaneous Switching Noise (SSN) on the timing behavior of CMOS digital blocks. The concept of Instantaneous Transfer Function is introduced to interpret noisy signals and perform timing measurements on such signals. It is shown that the average swing during switching is the key parameter to predict the noise impact on the delay of a logic path, whereas the peak of noise is not relevant. The influence of structural parameters such as the block topology is evaluated, and the unpredictable aspect of SSN impact on path delay is highlighted.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88879308","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-04-15DOI: 10.1109/DDECS.2009.5012108
Yiorgos Sfikas, Y. Tsiatouhas
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated with it, compared to other fault models, restricts its wide adoption for memory testing. In this work we exploit the physical design (layout) of folded DRAM memory arrays to introduce a new neighborhood type for NPSF testing and a pertinent test and locate algorithm. This algorithm reduces drastically the test application time (about 58% with respect to the well known Type-1 neighborhood) aiming to make the NPSF model also a cost attractive choice. In addition, we introduce the Neighborhood Word-Line Sensitive Fault model and the corresponding test algorithm to cover those faults along with NPSFs, achieving test application time cost reduction from 33% to 41%, depending on various assumptions, with respect to the Type-1 neighborhood.
{"title":"Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing","authors":"Yiorgos Sfikas, Y. Tsiatouhas","doi":"10.1109/DDECS.2009.5012108","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012108","url":null,"abstract":"Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated with it, compared to other fault models, restricts its wide adoption for memory testing. In this work we exploit the physical design (layout) of folded DRAM memory arrays to introduce a new neighborhood type for NPSF testing and a pertinent test and locate algorithm. This algorithm reduces drastically the test application time (about 58% with respect to the well known Type-1 neighborhood) aiming to make the NPSF model also a cost attractive choice. In addition, we introduce the Neighborhood Word-Line Sensitive Fault model and the corresponding test algorithm to cover those faults along with NPSFs, achieving test application time cost reduction from 33% to 41%, depending on various assumptions, with respect to the Type-1 neighborhood.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82877964","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-04-15DOI: 10.1109/DDECS.2009.5012109
T. Reinbacher, M. Horauer, Bastian Schlich
Model checking of assembly code is a promising approach to satisfy the demand for verification in nowadays ultra-high reliable embedded systems software. Frequent interaction with its environment, e.g., by sending or reading data over the microcontrollers I/O lines, lies in the nature of embedded systems. Thus, making the long-standing problem of explicit-model checking even worse, namely the state-explosion problem. This paper presents a concept to tackle these difficulties by using a 3-valued logic in the state representation and showing its benefits in terms of state-space savings whenever logic operations are executed by the target microcontroller. To highlight the effectiveness of this approach, termed delayed nondeterminism with look ahead, an embedded program exemplifying typical microcontroller source code is analyzed and the resulting state space sizes are discussed. The introduced abstraction technique is implemented in the MCS-51 simulator component for the [mc]square model checker which is developed by the RWTH Aachen University.
{"title":"Using 3-valued memory representation for state space reduction in embedded assembly code model checking","authors":"T. Reinbacher, M. Horauer, Bastian Schlich","doi":"10.1109/DDECS.2009.5012109","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012109","url":null,"abstract":"Model checking of assembly code is a promising approach to satisfy the demand for verification in nowadays ultra-high reliable embedded systems software. Frequent interaction with its environment, e.g., by sending or reading data over the microcontrollers I/O lines, lies in the nature of embedded systems. Thus, making the long-standing problem of explicit-model checking even worse, namely the state-explosion problem. This paper presents a concept to tackle these difficulties by using a 3-valued logic in the state representation and showing its benefits in terms of state-space savings whenever logic operations are executed by the target microcontroller. To highlight the effectiveness of this approach, termed delayed nondeterminism with look ahead, an embedded program exemplifying typical microcontroller source code is analyzed and the resulting state space sizes are discussed. The introduced abstraction technique is implemented in the MCS-51 simulator component for the [mc]square model checker which is developed by the RWTH Aachen University.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87466307","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：