Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6745173
P. Sinha, M. Schneider, Scott N. Dailey, Calvin Jepson, M. de Wild-Scholten
Eco-efficiency is a management practice based on creating more value with less environmental impact. Tracking systems provide the benefit of boosting the specific yield (kWh/kWp/yr) of photovoltaic (PV) systems, therefore requiring fewer modules per kWh produced than fixed-tilt systems. Although life cycle balance of system (BOS) environmental impacts for tracking systems are higher per kWh produced than for fixed-tilt systems, this difference is counteracted by tracking systems requiring fewer modules manufactured upstream and decommissioned downstream per kWh produced than fixed-tilt systems. The life cycle carbon footprint and energy payback time/non-renewable energy payback time (EPBT/NREPBT) of utility-scale cadmium telluride (CdTe) PV systems in the U.S. Southwest range from 16-17 g CO2e/kWh and 0.6-0.7 yr, respectively, with impacts for tracking systems slightly (1-3%) lower than for fixed-tilt systems. Similarly, although tracking systems have slightly higher construction and operations and maintenance (O&M) costs per watt than fixed-tilt systems, these costs are counteracted by the improved specific yield of tracking systems, resulting in lower cost per kWh in the U.S. Southwest case study considered in this evaluation (global horizontal irradiation of 1952-2094 kWh/m2/yr). Because tracking systems have the potential to create more value (kWh/$) with less life cycle environmental impact, they provide an eco-efficient strategy for improving the sustainability of PV systems. A key factor influencing the eco-efficiency of tracking systems is the tracking energy gain relative to fixed-tilt systems, which generally ranges from 10-24% over tropical and subtropical latitudes and is determined by project design, site latitude, and the proportion of diffuse horizontal insolation to global horizontal insolation at the site.
{"title":"Eco-efficiency of CdTe photovoltaics with tracking systems","authors":"P. Sinha, M. Schneider, Scott N. Dailey, Calvin Jepson, M. de Wild-Scholten","doi":"10.1109/PVSC.2013.6745173","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6745173","url":null,"abstract":"Eco-efficiency is a management practice based on creating more value with less environmental impact. Tracking systems provide the benefit of boosting the specific yield (kWh/kWp/yr) of photovoltaic (PV) systems, therefore requiring fewer modules per kWh produced than fixed-tilt systems. Although life cycle balance of system (BOS) environmental impacts for tracking systems are higher per kWh produced than for fixed-tilt systems, this difference is counteracted by tracking systems requiring fewer modules manufactured upstream and decommissioned downstream per kWh produced than fixed-tilt systems. The life cycle carbon footprint and energy payback time/non-renewable energy payback time (EPBT/NREPBT) of utility-scale cadmium telluride (CdTe) PV systems in the U.S. Southwest range from 16-17 g CO2e/kWh and 0.6-0.7 yr, respectively, with impacts for tracking systems slightly (1-3%) lower than for fixed-tilt systems. Similarly, although tracking systems have slightly higher construction and operations and maintenance (O&M) costs per watt than fixed-tilt systems, these costs are counteracted by the improved specific yield of tracking systems, resulting in lower cost per kWh in the U.S. Southwest case study considered in this evaluation (global horizontal irradiation of 1952-2094 kWh/m2/yr). Because tracking systems have the potential to create more value (kWh/$) with less life cycle environmental impact, they provide an eco-efficient strategy for improving the sustainability of PV systems. A key factor influencing the eco-efficiency of tracking systems is the tracking energy gain relative to fixed-tilt systems, which generally ranges from 10-24% over tropical and subtropical latitudes and is determined by project design, site latitude, and the proportion of diffuse horizontal insolation to global horizontal insolation at the site.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"39 1","pages":"3374-3378"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81110936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6745034
Anastasiia Iefanova, U. Gautam, P. Poudel, Daren Davoux, J. Nepal, Venkataiah Mallam, Q. Qiao, B. Logue, M. Baroughi
A platinum counter-electrode (CE) was fabricated using spray-deposition method to provide efficient dye-sensitized solar cells (DSSCs). This method uses over 86% less Pt compared to conventional Pt counter-electrode prepared by highly efficient sputter deposition method. The cost of this new counter-electrode is estimated to be only 0.11$/Wp. Moreover, this counter-electrode exhibits a high transparency, over 80% in visible and near infrared, along with high catalytic activity, comparable with that of the conventional Pt counter-electrode. Scanning electron microscope (SEM) images show Pt nanoparticles varying in size from 5 nm to 70 nm distributed on transparent conducting oxide (TCO)/glass substrate. DSSCs based on this counter-electrode showed 6.17% power conversion efficiency, comparable to 6.46% efficiency of the corresponding reference DSSC with sputtered Pt counter-electrode.
{"title":"Low cost platinum counter electrode for dye-sensitized solar cells","authors":"Anastasiia Iefanova, U. Gautam, P. Poudel, Daren Davoux, J. Nepal, Venkataiah Mallam, Q. Qiao, B. Logue, M. Baroughi","doi":"10.1109/PVSC.2013.6745034","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6745034","url":null,"abstract":"A platinum counter-electrode (CE) was fabricated using spray-deposition method to provide efficient dye-sensitized solar cells (DSSCs). This method uses over 86% less Pt compared to conventional Pt counter-electrode prepared by highly efficient sputter deposition method. The cost of this new counter-electrode is estimated to be only 0.11$/Wp. Moreover, this counter-electrode exhibits a high transparency, over 80% in visible and near infrared, along with high catalytic activity, comparable with that of the conventional Pt counter-electrode. Scanning electron microscope (SEM) images show Pt nanoparticles varying in size from 5 nm to 70 nm distributed on transparent conducting oxide (TCO)/glass substrate. DSSCs based on this counter-electrode showed 6.17% power conversion efficiency, comparable to 6.46% efficiency of the corresponding reference DSSC with sputtered Pt counter-electrode.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"67 1","pages":"2716-2719"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82038699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6745127
J. Flicker, Jay Johnson
Arcing in PV systems has caused multiple residential and commercial rooftop fires. The National Electrical Code® (NEC) added section 690.11 to mitigate this danger by requiring arc-fault circuit interrupters (AFCI). Currently, the requirement is only for series arc-faults, but to fully protect PV installations from arc-fault-generated fires, parallel arc-faults must also be mitigated effectively. In order to de-energize a parallel arc-fault without module-level disconnects, the type of arc-fault must be identified so that proper action can be taken (e.g., opening the array for a series arc-fault and shorting for a parallel arc-fault). In this work, we investigate the electrical behavior of the PV system during series and parallel arc-faults to (a) understand the arcing power available from different faults, (b) identify electrical characteristics that differentiate the two fault types, and (c) determine the location of the fault based on current or voltage of the faulted array. This information can be used to improve arc-fault detector speed and functionality.
{"title":"Electrical simulations of series and parallel PV arc-faults","authors":"J. Flicker, Jay Johnson","doi":"10.1109/PVSC.2013.6745127","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6745127","url":null,"abstract":"Arcing in PV systems has caused multiple residential and commercial rooftop fires. The National Electrical Code® (NEC) added section 690.11 to mitigate this danger by requiring arc-fault circuit interrupters (AFCI). Currently, the requirement is only for series arc-faults, but to fully protect PV installations from arc-fault-generated fires, parallel arc-faults must also be mitigated effectively. In order to de-energize a parallel arc-fault without module-level disconnects, the type of arc-fault must be identified so that proper action can be taken (e.g., opening the array for a series arc-fault and shorting for a parallel arc-fault). In this work, we investigate the electrical behavior of the PV system during series and parallel arc-faults to (a) understand the arcing power available from different faults, (b) identify electrical characteristics that differentiate the two fault types, and (c) determine the location of the fault based on current or voltage of the faulted array. This information can be used to improve arc-fault detector speed and functionality.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"28 1","pages":"3165-3172"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83601696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6745186
A. Carroll
Silicon solar cell technology has advanced by improvements to all aspects of cell design including metallization. Improvements to metal contacts have been synergistic with other cell improvements such as passivation, lightly doped emitters, and boron doped emitters. This paper briefly recounts the history of c-Si PV metallization technology and its synergy with other cell technologies. It concludes with a perspective on various metal contact mechanisms.
{"title":"Screen printed metal contacts to Si solar cells — Formation and synergistic improvements","authors":"A. Carroll","doi":"10.1109/PVSC.2013.6745186","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6745186","url":null,"abstract":"Silicon solar cell technology has advanced by improvements to all aspects of cell design including metallization. Improvements to metal contacts have been synergistic with other cell improvements such as passivation, lightly doped emitters, and boron doped emitters. This paper briefly recounts the history of c-Si PV metallization technology and its synergy with other cell technologies. It concludes with a perspective on various metal contact mechanisms.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"6 1","pages":"3435-3440"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85510002","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6745092
N. Dhere, A. Kaul, S. Pethe, E. Schneller, N. Shiradkar
Results from outdoor exposure testing of thin-film PV modules from various US manufacturers are being presented. The modules were deployed in the hot and humid climate of Florida. The duration of the exposure ranged between 2½ to over 6 years for various technologies. PVUSA type regression analysis was carried out for the continuously measured output power from the PV arrays to study their performance variation with time. Annual energy yield was also determined for the duration of this study. Estimates of performance degradation are provided so as to assist in the compilation of degradation data for the Thin Film PV Module Task Group 8 of International Quality Assurance Task Force.
{"title":"Outdoor performance testing of thin-film PV modules in the hot and humid climate","authors":"N. Dhere, A. Kaul, S. Pethe, E. Schneller, N. Shiradkar","doi":"10.1109/PVSC.2013.6745092","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6745092","url":null,"abstract":"Results from outdoor exposure testing of thin-film PV modules from various US manufacturers are being presented. The modules were deployed in the hot and humid climate of Florida. The duration of the exposure ranged between 2½ to over 6 years for various technologies. PVUSA type regression analysis was carried out for the continuously measured output power from the PV arrays to study their performance variation with time. Annual energy yield was also determined for the duration of this study. Estimates of performance degradation are provided so as to assist in the compilation of degradation data for the Thin Film PV Module Task Group 8 of International Quality Assurance Task Force.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"6 1","pages":"2994-2997"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85551682","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6744514
M. S. Murthy, M. Bajaj, N. Sathaye, Kota V. R. M. Murali, S. Ganguly
We study, by coupled electromagnetic and semiconductor device simulation, the effect of dielectric nanoparticles embedded in the depletion region of thin film solar cells. Absorbed photon densities, calculated using an electromagnetic solver, are mapped to the nodes of an electrical mesh on which three dimensional semiconductor device equations are solved. For the first time, we include here the effects of surface recombination and interface states at the Si/dielectric interface. We predict maximum increases of 9.3% and 9.9% in short circuit current density and efficiency respectively due to enhanced scattering from the dielectric nanoparticles.
{"title":"Combined optical and electrical analysis of efficiency enhancement in solar cells with embedded dielectric nanoparticles","authors":"M. S. Murthy, M. Bajaj, N. Sathaye, Kota V. R. M. Murali, S. Ganguly","doi":"10.1109/PVSC.2013.6744514","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6744514","url":null,"abstract":"We study, by coupled electromagnetic and semiconductor device simulation, the effect of dielectric nanoparticles embedded in the depletion region of thin film solar cells. Absorbed photon densities, calculated using an electromagnetic solver, are mapped to the nodes of an electrical mesh on which three dimensional semiconductor device equations are solved. For the first time, we include here the effects of surface recombination and interface states at the Si/dielectric interface. We predict maximum increases of 9.3% and 9.9% in short circuit current density and efficiency respectively due to enhanced scattering from the dielectric nanoparticles.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"73 1","pages":"1897-1901"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85818498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6744472
J. Quiroz, M. Reno, R. Broderick
The integration of photovoltaic systems (PV) on distribution feeders may result in unfavorable increases in the number of operations of voltage regulation devices, or may decrease the effectiveness of their settings, resulting in the need for mitigation. Voltage regulation devices commonly use controllers that have time delay settings and sample power system parameters at a high frequency. Quasi-static time series (QSTS) power flow simulation is necessary to properly analyze the impact of distributed PV integration on voltage regulation device operations. It is possible to properly simulate complex control algorithms through a COM interface program, resulting in more realistic and valuable results.
{"title":"Time series simulation of voltage regulation device control modes","authors":"J. Quiroz, M. Reno, R. Broderick","doi":"10.1109/PVSC.2013.6744472","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6744472","url":null,"abstract":"The integration of photovoltaic systems (PV) on distribution feeders may result in unfavorable increases in the number of operations of voltage regulation devices, or may decrease the effectiveness of their settings, resulting in the need for mitigation. Voltage regulation devices commonly use controllers that have time delay settings and sample power system parameters at a high frequency. Quasi-static time series (QSTS) power flow simulation is necessary to properly analyze the impact of distributed PV integration on voltage regulation device operations. It is possible to properly simulate complex control algorithms through a COM interface program, resulting in more realistic and valuable results.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"32 1","pages":"1700-1705"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84030487","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6744115
B. Yang, N. R. Sorensen, P. Burton, Jason M. Taylor, A. Kilgo, D. Robinson, J. Granata
This paper describes efforts to characterize different aspects of photovoltaic connector reliability. The resistance variation over a population of connections was examined by measuring 75 connectors from three different manufacturers. The comparison shows differences in average resistance of up to 9% between manufacturers. The standard deviation of resistance among the same manufacturer ranged from 6%-11%. In a separate experiment, the corrosive effects of grime on the connector pins during damp heat accelerated testing at 85°C/85% RH were studied. We observed a small resistance increase in the first 100 hours of damp heat and no further changes up to the current 450 hours of available data. With the exception of one connector, the effects of grime on connector performance during accelerated testing could not be measured during this time period.
{"title":"Reliability model development for photovoltaic connector lifetime prediction capabilities","authors":"B. Yang, N. R. Sorensen, P. Burton, Jason M. Taylor, A. Kilgo, D. Robinson, J. Granata","doi":"10.1109/PVSC.2013.6744115","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6744115","url":null,"abstract":"This paper describes efforts to characterize different aspects of photovoltaic connector reliability. The resistance variation over a population of connections was examined by measuring 75 connectors from three different manufacturers. The comparison shows differences in average resistance of up to 9% between manufacturers. The standard deviation of resistance among the same manufacturer ranged from 6%-11%. In a separate experiment, the corrosive effects of grime on the connector pins during damp heat accelerated testing at 85°C/85% RH were studied. We observed a small resistance increase in the first 100 hours of damp heat and no further changes up to the current 450 hours of available data. With the exception of one connector, the effects of grime on connector performance during accelerated testing could not be measured during this time period.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"49 1","pages":"0139-0144"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72793934","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6745059
Jesse K. McTernan, T. Brubaker, S. Bilén
Via ground-based experiments, we were able to determine the I-V characteristic of indium tin oxide-coated glass in a simulated low Earth environment. We achieved a passive plasma contact by biasing a planar surface coated in a thin layer of indium tin oxide. We found that a thin layer of indium tin oxide-coated glass can facilitate current collection comparable to gold plating (order of magnitude) for the tested voltage range. This coated glass can also be used to cover solar panels, thus allowing a small spacecraft's limited surface area to serve a dual purpose.
{"title":"Indium tin oxide coverings on solar panels for plasma-Spacecraft connection","authors":"Jesse K. McTernan, T. Brubaker, S. Bilén","doi":"10.1109/PVSC.2013.6745059","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6745059","url":null,"abstract":"Via ground-based experiments, we were able to determine the I-V characteristic of indium tin oxide-coated glass in a simulated low Earth environment. We achieved a passive plasma contact by biasing a planar surface coated in a thin layer of indium tin oxide. We found that a thin layer of indium tin oxide-coated glass can facilitate current collection comparable to gold plating (order of magnitude) for the tested voltage range. This coated glass can also be used to cover solar panels, thus allowing a small spacecraft's limited surface area to serve a dual purpose.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"1 1","pages":"2821-2826"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73326618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-06-16DOI: 10.1109/PVSC.2013.6744986
Chia-Jung Hsu, Hsin‐Sheng Duan, Wenbing Yang, Huanping Zhou, Yang Yang
Solution-based approach to process earth-abundant Cu2ZnSn(Se, S)4 is proved to be a promising route for thin-film photovoltaic fabrication. Combining fully dissolved zinc/tin (Zn/Sn) and copper (Cu) hydrazinuim constituents in the ethanolamine (EA) and its mixture with dimethylsulfoxide (DMSO) forms the CZTS precursor, which facilitates the composition adjustment. All solutes in this precursor solution are in molecular scale intermixed with excellent homogeneity. Innovated 2-step annealing using sulfur and selenium vapor sequentially assists continuous grain growth, and prevents Mo(S, Se)2 formation. Resulting device achieves 7.5% power conversion efficiency.
{"title":"Benign solution processed Cu2ZnSn(Se, S)4 photovoltaic","authors":"Chia-Jung Hsu, Hsin‐Sheng Duan, Wenbing Yang, Huanping Zhou, Yang Yang","doi":"10.1109/PVSC.2013.6744986","DOIUrl":"https://doi.org/10.1109/PVSC.2013.6744986","url":null,"abstract":"Solution-based approach to process earth-abundant Cu2ZnSn(Se, S)4 is proved to be a promising route for thin-film photovoltaic fabrication. Combining fully dissolved zinc/tin (Zn/Sn) and copper (Cu) hydrazinuim constituents in the ethanolamine (EA) and its mixture with dimethylsulfoxide (DMSO) forms the CZTS precursor, which facilitates the composition adjustment. All solutes in this precursor solution are in molecular scale intermixed with excellent homogeneity. Innovated 2-step annealing using sulfur and selenium vapor sequentially assists continuous grain growth, and prevents Mo(S, Se)2 formation. Resulting device achieves 7.5% power conversion efficiency.","PeriodicalId":6350,"journal":{"name":"2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)","volume":"281 1","pages":"2511-2514"},"PeriodicalIF":0.0,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73394306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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