Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8547493
Shu-Tsung Hsu, C. Lien
The issue of typhoons has received considerable critical attention since the associated strong winds generally damaged PV modules severely. Previous IEC standards examined the effect of static uniform-loads (IEC 61215-2:2016) or dynamic uniform-loads (IEC TS 62782:2016) on PV module in low wind-velocity, but overlooked the moment effect or non-uniform loads due to wind actions on PV module, especially in high wind-velocity. Therefore, the challenge is how to improve the current mechanical loads system to meet the test requirements due to strong wind such as typhoon’s action on PV module. This work has successfully developed a new test capacity named non-uniform mechanic loads (NUML) system, which owns eighteen (3x6) independent pneumatic cylinders with maximum loading up to ±12000 Pa (pressure load”+”, suction load”-“). NUML system can operate the different wind effect by the simulated data named mean surface-pressure pattern (MSPP) for PV module. All MSPPs can also be evaluated directly by wind-tunnel experiment and CFD simulation. Results of this study revealed that such severity wind-test for PV module strongly relied on the choices of major environmental factors such as wind velocity (V), wind direction angle (β) and inclined angle (α). In addition, the failures of the module and its fixtures, after NUML test, are closely related to the external forces such as MSPP (V, α, β).
{"title":"Evaluations of Wind Effect on PV Module by Non-uniform Mechanical Loads System and Mean-Surface Pressure Pattern","authors":"Shu-Tsung Hsu, C. Lien","doi":"10.1109/PVSC.2018.8547493","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547493","url":null,"abstract":"The issue of typhoons has received considerable critical attention since the associated strong winds generally damaged PV modules severely. Previous IEC standards examined the effect of static uniform-loads (IEC 61215-2:2016) or dynamic uniform-loads (IEC TS 62782:2016) on PV module in low wind-velocity, but overlooked the moment effect or non-uniform loads due to wind actions on PV module, especially in high wind-velocity. Therefore, the challenge is how to improve the current mechanical loads system to meet the test requirements due to strong wind such as typhoon’s action on PV module. This work has successfully developed a new test capacity named non-uniform mechanic loads (NUML) system, which owns eighteen (3x6) independent pneumatic cylinders with maximum loading up to ±12000 Pa (pressure load”+”, suction load”-“). NUML system can operate the different wind effect by the simulated data named mean surface-pressure pattern (MSPP) for PV module. All MSPPs can also be evaluated directly by wind-tunnel experiment and CFD simulation. Results of this study revealed that such severity wind-test for PV module strongly relied on the choices of major environmental factors such as wind velocity (V), wind direction angle (β) and inclined angle (α). In addition, the failures of the module and its fixtures, after NUML test, are closely related to the external forces such as MSPP (V, α, β).","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"52 7 1","pages":"0405-0408"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75985020","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8548165
Takeo Konishi, K. Kôyama, K. Ohdaira, H. Matsumura
For further reduction of the fabrication cost of interdigitated back-contact (IBC) crystalline-silicon (c-Si) heterojunction (SHJ) solar cells, we investigated the performance of SHJ solar cells with directly metallized electrodes on catalytic chemical vapor deposited (Cat-CVD) amorphous Si (a-Si) films without insertion of any transparent conductive oxide (TCO) layers. From the evaluation of the current density–voltage (–V) characteristics of solar cells fabricated with various metal-electrodes such as silver (Ag), aluminum (Al), palladium (Pd), and nickel (Ni), and with post-annealing after forming the metal-electrodes, it is found that Al is most suitable as the metal for electrode, and that if Al is used the post-annealing up to 150 °C is effective for improving the cell performance. From the secondary ion mass spectrometry (SIMS) experiments, it is revealed that Al did not seriously diffuse into Cat-CVD a-Si for the annealing below 150 °C, and that thickness of p-a-Si>20 nm is effective to prevent reduction ofVOC due to Al diffusion. The results demonstrate that Al direct metallization on Cat-CVD a-Si films is applicable for IBC-SHJ solar cells by taking care of postannealing temperature up to 150 °C and the thickness of p-a-Si.
{"title":"Performance of silicon heterojunction solar cells with various metal-electrodes directly formed on a-Si films without insertion of TCO","authors":"Takeo Konishi, K. Kôyama, K. Ohdaira, H. Matsumura","doi":"10.1109/PVSC.2018.8548165","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8548165","url":null,"abstract":"For further reduction of the fabrication cost of interdigitated back-contact (IBC) crystalline-silicon (c-Si) heterojunction (SHJ) solar cells, we investigated the performance of SHJ solar cells with directly metallized electrodes on catalytic chemical vapor deposited (Cat-CVD) amorphous Si (a-Si) films without insertion of any transparent conductive oxide (TCO) layers. From the evaluation of the current density–voltage (–V) characteristics of solar cells fabricated with various metal-electrodes such as silver (Ag), aluminum (Al), palladium (Pd), and nickel (Ni), and with post-annealing after forming the metal-electrodes, it is found that Al is most suitable as the metal for electrode, and that if Al is used the post-annealing up to 150 °C is effective for improving the cell performance. From the secondary ion mass spectrometry (SIMS) experiments, it is revealed that Al did not seriously diffuse into Cat-CVD a-Si for the annealing below 150 °C, and that thickness of p-a-Si>20 nm is effective to prevent reduction ofVOC due to Al diffusion. The results demonstrate that Al direct metallization on Cat-CVD a-Si films is applicable for IBC-SHJ solar cells by taking care of postannealing temperature up to 150 °C and the thickness of p-a-Si.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"39 1","pages":"2036-2038"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87702665","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8548156
Chen Wei, Lim Li Hong Idris
A single-diode model is the most important and broadly used tool for PV module design and analysis. The model has 5 parameters to be identified from the I-V characteristics curves. However, due to the lack of explicit form of I or V with the unknown 5 parameters, parameter identification is very difficult. Recent progress in PV model identification are discussed in this paper with the simulation of MATLAB against the measured data from a real PV module. An improved Oblique Asymptote Method is then proposed and compared with existing identification methods. Test results show that the proposed method achieves lower RMSE with less knowledge of I - V data points.
{"title":"An Improved Oblique Asymptote Method for Parameter Identification of PV Panels","authors":"Chen Wei, Lim Li Hong Idris","doi":"10.1109/PVSC.2018.8548156","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8548156","url":null,"abstract":"A single-diode model is the most important and broadly used tool for PV module design and analysis. The model has 5 parameters to be identified from the I-V characteristics curves. However, due to the lack of explicit form of I or V with the unknown 5 parameters, parameter identification is very difficult. Recent progress in PV model identification are discussed in this paper with the simulation of MATLAB against the measured data from a real PV module. An improved Oblique Asymptote Method is then proposed and compared with existing identification methods. Test results show that the proposed method achieves lower RMSE with less knowledge of I - V data points.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"2 1","pages":"0386-0389"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87818651","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8547498
Benjia Dou, D. Moore, James B. Whitaker, S. Shaheen, F. Barnes, K. Zhu, Maikel F. A. M. Hest
A metal halide perovskite (MHP) solution was developed that is compatible with high speed (1 m min-1) one-step blade coating.MHP solar cells from the developed solution can produce power conversion efficiency over 18% in ambient environment without any addition of antisolvent, gas drying, vacuum treatment or high-temperature annealing. Careful control of the annealing temperature allows fabricating of a more stable MHP due to the increased crystallinity of the MHP film. This development on one-step, antisolvent (or similar processing) treatment free, blade coating technique paves the way for the rollto- roll production of high-efficiency MHP solar cells.
开发了一种金属卤化物钙钛矿(MHP)溶液，该溶液与高速(1 m min-1)一步叶片涂层兼容。该解决方案无需添加抗溶剂、气体干燥、真空处理或高温退火，在常温环境下，MHP太阳能电池的功率转换效率可达18%以上。由于MHP薄膜的结晶度增加，仔细控制退火温度可以制造更稳定的MHP。这种一步、无抗溶剂(或类似工艺)处理、叶片涂层技术的发展为高效MHP太阳能电池的卷对卷生产铺平了道路。
{"title":"One-Step High-Throughput Blade Coating of Perovskite Solar Cells","authors":"Benjia Dou, D. Moore, James B. Whitaker, S. Shaheen, F. Barnes, K. Zhu, Maikel F. A. M. Hest","doi":"10.1109/PVSC.2018.8547498","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547498","url":null,"abstract":"A metal halide perovskite (MHP) solution was developed that is compatible with high speed (1 m min-1) one-step blade coating.MHP solar cells from the developed solution can produce power conversion efficiency over 18% in ambient environment without any addition of antisolvent, gas drying, vacuum treatment or high-temperature annealing. Careful control of the annealing temperature allows fabricating of a more stable MHP due to the increased crystallinity of the MHP film. This development on one-step, antisolvent (or similar processing) treatment free, blade coating technique paves the way for the rollto- roll production of high-efficiency MHP solar cells.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"5 1","pages":"2799-2802"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87864850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8547822
C. Wu, Yen-Chun Lee, Li-Chieh Yu, M. Tsai, Hung-Sen Wu, C. Kuo, T. Kuan, C. Yu, P. Yu
We have carried out multiple analysis on the acceleration factors of LID for Cz-Si PERC cells, including temperatures, intensities and wavelengths at 396nmand 969nm. The recovery time of LID at 130 ° C under 1 SUN shrinks down to 4 hrs and the maximum degradation in Pmax is less than 3 % due the elimination of B-O LID under high carrier-injection. However, it seems that higher intensities couldn’t stop the second degradation from happening, indicating the formation of other defects. Therefore, we employ LED light source of different wavelengths and obtain that both maximum degradation of Pmax are quite different. The consequence implies that behavior of LID might be originated from the particular position (penetration depth) where carriers are located.
{"title":"Influence on light-induced degradation in Cz-Si PERC cells under light soaking of variant wavelength and intensity","authors":"C. Wu, Yen-Chun Lee, Li-Chieh Yu, M. Tsai, Hung-Sen Wu, C. Kuo, T. Kuan, C. Yu, P. Yu","doi":"10.1109/PVSC.2018.8547822","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547822","url":null,"abstract":"We have carried out multiple analysis on the acceleration factors of LID for Cz-Si PERC cells, including temperatures, intensities and wavelengths at 396nmand 969nm. The recovery time of LID at 130 ° C under 1 SUN shrinks down to 4 hrs and the maximum degradation in Pmax is less than 3 % due the elimination of B-O LID under high carrier-injection. However, it seems that higher intensities couldn’t stop the second degradation from happening, indicating the formation of other defects. Therefore, we employ LED light source of different wavelengths and obtain that both maximum degradation of Pmax are quite different. The consequence implies that behavior of LID might be originated from the particular position (penetration depth) where carriers are located.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"12 1","pages":"1361-1363"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86915360","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8547920
A. Semichaevsky
Band-to-band photoluminescence (PL) imaging is one of the experimental techniques widely used to assess nonradiative recombination rates at a fixed incident light intensity. Minority carrier lifetimes in semiconductors such as mc-Si are also affected by optical injection levels These can be measured by transient photoconductance (TPC). In this paper, PL imaging of shunts and TPC lifetime results for incident intensities of up to 50 Suns are compared for multiple samples of mc-Si.
{"title":"Photoluminescence Imaging vs. Transient Photoconductance Characterization at High Injection: Case of mc-Si","authors":"A. Semichaevsky","doi":"10.1109/PVSC.2018.8547920","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547920","url":null,"abstract":"Band-to-band photoluminescence (PL) imaging is one of the experimental techniques widely used to assess nonradiative recombination rates at a fixed incident light intensity. Minority carrier lifetimes in semiconductors such as mc-Si are also affected by optical injection levels These can be measured by transient photoconductance (TPC). In this paper, PL imaging of shunts and TPC lifetime results for incident intensities of up to 50 Suns are compared for multiple samples of mc-Si.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"9 1","pages":"3309-3311"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87170348","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8547840
Jiqi Liu, A. Curran, Justin S. Fada, Xuan Ma, Wei-Heng Huang, C. B. Jones, Erdmut Schnabel, Michael Kohl, J. Braid, R. French
The authors demonstrate a method to calculate the cross-correlation scale factor (CCSF) which rescales the time between indoor and outdoor degradation models. The CCSF is further applied to obtain the cross correlation coefficients(CCC) between the models of outdoor modules located in three climate zones and the indoor accelerated tests using damp-heat and thermal cycle exposures for five commercial PV module brands. We evaluate and compare the performances of different combinations based on the CCC, to determine the indoor accelerated test which is most closely related to real world conditions at each site. The result shows that the cross correlation coefficients among some combinations between the outdoor model and indoor model are over 0.9, and we further compare the trend of I-V features between indoor and outdoor modules to evaluate the degree of similarity of degradation mechanisms between indoor and outdoor modules. The result obtained from these two comparison methods are in good agreement with each other.
{"title":"Cross-correlation Analysis of the Indoor Accelerated and Real World Exposed Photovoltaic Systems Across Multiple Climate Zones","authors":"Jiqi Liu, A. Curran, Justin S. Fada, Xuan Ma, Wei-Heng Huang, C. B. Jones, Erdmut Schnabel, Michael Kohl, J. Braid, R. French","doi":"10.1109/PVSC.2018.8547840","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547840","url":null,"abstract":"The authors demonstrate a method to calculate the cross-correlation scale factor (CCSF) which rescales the time between indoor and outdoor degradation models. The CCSF is further applied to obtain the cross correlation coefficients(CCC) between the models of outdoor modules located in three climate zones and the indoor accelerated tests using damp-heat and thermal cycle exposures for five commercial PV module brands. We evaluate and compare the performances of different combinations based on the CCC, to determine the indoor accelerated test which is most closely related to real world conditions at each site. The result shows that the cross correlation coefficients among some combinations between the outdoor model and indoor model are over 0.9, and we further compare the trend of I-V features between indoor and outdoor modules to evaluate the degree of similarity of degradation mechanisms between indoor and outdoor modules. The result obtained from these two comparison methods are in good agreement with each other.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"35 1","pages":"3949-3954"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87171408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8547593
E. Schneller, O. Shinde, N. Dhere, K. Davis
Field exposure is essential for evaluating the reliability and durability of PV modules. In this work we characterize three crystalline silicon PV systems that have been deployed in Florida. Detailed characterization of module performance was carried out to quantify degradation rates and identify root cause degradation mechanisms.
{"title":"Degradation Analysis of PV Modules After Long-Term Exposure in Florida","authors":"E. Schneller, O. Shinde, N. Dhere, K. Davis","doi":"10.1109/PVSC.2018.8547593","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8547593","url":null,"abstract":"Field exposure is essential for evaluating the reliability and durability of PV modules. In this work we characterize three crystalline silicon PV systems that have been deployed in Florida. Detailed characterization of module performance was carried out to quantify degradation rates and identify root cause degradation mechanisms.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"7 1","pages":"0767-0770"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87751743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8548213
K. Barth, James Morgante, W. Sampath, T. Shimpi, Larry Maple
A recent detailed analysis was performed by DOE and NREL [1] that identified avenues needed to lower solar LCOE. Two key areas are identified: reduce module costs and improved module reliably and lifetime. The NREL/DOE study found that for both crystalline silicon (c-Si) and thin film PV, the encapsulation and module assembly costs were the largest single cost category for manufacturing. The capital equipment (cap-ex) costs for the module assembly are also shown to be high. Current module designs have opportunities for reliably improvements. Studies of fielded modules by NREL have shown degradation of over 1.8%/yr. Reducing degradation to 0.2%/yr. while increasing module lifetime will facilitate further cost reductions. Supported by the US Dept. of Energy’s PVRD program, Colorado State University’s Next Generation PV Center is developing a new module architecture and associated manufacturing processes to reduce costs and improve reliably.
{"title":"Advanced Encapsulation Technology for Reduced Costs, High Durability and Significantly Improved Manufacturability","authors":"K. Barth, James Morgante, W. Sampath, T. Shimpi, Larry Maple","doi":"10.1109/PVSC.2018.8548213","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8548213","url":null,"abstract":"A recent detailed analysis was performed by DOE and NREL [1] that identified avenues needed to lower solar LCOE. Two key areas are identified: reduce module costs and improved module reliably and lifetime. The NREL/DOE study found that for both crystalline silicon (c-Si) and thin film PV, the encapsulation and module assembly costs were the largest single cost category for manufacturing. The capital equipment (cap-ex) costs for the module assembly are also shown to be high. Current module designs have opportunities for reliably improvements. Studies of fielded modules by NREL have shown degradation of over 1.8%/yr. Reducing degradation to 0.2%/yr. while increasing module lifetime will facilitate further cost reductions. Supported by the US Dept. of Energy’s PVRD program, Colorado State University’s Next Generation PV Center is developing a new module architecture and associated manufacturing processes to reduce costs and improve reliably.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"21 1","pages":"0557-0560"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88216832","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-06-01DOI: 10.1109/PVSC.2018.8548141
Yu-Hsuan Lin, Sung-Yu Chen, Li-Yu Li, Shih-Peng Hsu, C. Du
In this paper, we demonstrate the aluminum rear contact with different widths grid and full-area on the p-type passivated emitter and rear cells (PERC). We analysis the rear contact and back surface field (BSF) formation on PERC cells. We observe a reduced number of voids in the Al-Si eutectic layer by using grid Al, compared with full-area Al layer. The open-circuit voltage (${V}_{{oc}}$) and short current density (${J}_{{sc}}$) of PERC+ solar cells improve up to 4 mV and near 0.19 mA/cm2 when using local grid contact.
{"title":"Influences of Aluminum Rear Contact and Back Surface Field Formation for PERC Solar Cells","authors":"Yu-Hsuan Lin, Sung-Yu Chen, Li-Yu Li, Shih-Peng Hsu, C. Du","doi":"10.1109/PVSC.2018.8548141","DOIUrl":"https://doi.org/10.1109/PVSC.2018.8548141","url":null,"abstract":"In this paper, we demonstrate the aluminum rear contact with different widths grid and full-area on the p-type passivated emitter and rear cells (PERC). We analysis the rear contact and back surface field (BSF) formation on PERC cells. We observe a reduced number of voids in the Al-Si eutectic layer by using grid Al, compared with full-area Al layer. The open-circuit voltage (${V}_{{oc}}$) and short current density (${J}_{{sc}}$) of PERC+ solar cells improve up to 4 mV and near 0.19 mA/cm2 when using local grid contact.","PeriodicalId":6558,"journal":{"name":"2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)","volume":"51 1","pages":"1037-1039"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86149969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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