Pub Date : 2024-09-25DOI: 10.1007/s40042-024-01178-5
Seok-kyu Kim, Soyeon Jeong, Jaemin Kim, Moongyu Jang
In this work, the Fermi level pinning phenomena in erbium-silicided metal–semiconductor Schottky contact is investigated for the understanding on the difficulties forming ohmic contacts between metal and semiconductor materials. The work function of erbium-silicide is extracted by using UPS (ultraviolet photoelectron spectroscopy) and I–V (current–voltage) method with metal–semiconductor diode pattern, respectively. In UPS analysis, the extracted workfunction gradually decreased with increase in the deposited erbium-silicide and saturated to 3.8 eV with 500 Å thick erbium-silicide. However, the extracted work function value of erbium-silicide by I–V method from erbium-silicide on p-type silicon substrate diode pattern is 4.4 eV which shows the strong Fermi level pinning phenomena in erbium-silicided Schottky contact. From the numerical model analysis, the main reason for Fermi level pinning in erbium-silicide is mainly attributed due to the metal induced gap state rather than chemical bonding at interface. Finally, this analysis method will be very effective for the analysis in Fermi level pinning phenomena in metal–semiconductor Schottky contacts.
本文研究了铒硅化物金属-半导体肖特基接触中的费米级针销现象,以了解金属和半导体材料之间形成欧姆接触的困难。利用紫外光电子能谱(UPS)和 I-V(电流-电压)方法,分别提取了铒硅化物与金属-半导体二极管图案的功函数。在 UPS 分析中,提取的功函数随着沉积铒硅化物的增加而逐渐降低,在厚度为 500 Å 的铒硅化物中达到饱和,为 3.8 eV。然而,用 I-V 法从 p 型硅衬底二极管图案上的硅化铒中提取的功函数值为 4.4 eV,这表明硅化铒肖特基触点中存在很强的费米级针销现象。从数值模型分析来看,铒硅化物中费米级钉化的主要原因是金属诱导的间隙态,而不是界面上的化学键。最后,这种分析方法对于分析金属-半导体肖特基接触中的费米级针销现象非常有效。
{"title":"Analysis of Fermi level pinning characteristics in erbium silicided metal–semiconductor interface","authors":"Seok-kyu Kim, Soyeon Jeong, Jaemin Kim, Moongyu Jang","doi":"10.1007/s40042-024-01178-5","DOIUrl":"10.1007/s40042-024-01178-5","url":null,"abstract":"<div><p>In this work, the Fermi level pinning phenomena in erbium-silicided metal–semiconductor Schottky contact is investigated for the understanding on the difficulties forming ohmic contacts between metal and semiconductor materials. The work function of erbium-silicide is extracted by using UPS (ultraviolet photoelectron spectroscopy) and <i>I</i>–<i>V</i> (current–voltage) method with metal–semiconductor diode pattern, respectively. In UPS analysis, the extracted workfunction gradually decreased with increase in the deposited erbium-silicide and saturated to 3.8 eV with 500 Å thick erbium-silicide. However, the extracted work function value of erbium-silicide by <i>I</i>–<i>V</i> method from erbium-silicide on p-type silicon substrate diode pattern is 4.4 eV which shows the strong Fermi level pinning phenomena in erbium-silicided Schottky contact. From the numerical model analysis, the main reason for Fermi level pinning in erbium-silicide is mainly attributed due to the metal induced gap state rather than chemical bonding at interface. Finally, this analysis method will be very effective for the analysis in Fermi level pinning phenomena in metal–semiconductor Schottky contacts.</p></div>","PeriodicalId":677,"journal":{"name":"Journal of the Korean Physical Society","volume":"85 10","pages":"793 - 797"},"PeriodicalIF":0.8,"publicationDate":"2024-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142672422","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Zinc oxide films doped with iron (Fe-doped ZnO) were fabricated via spray pyrolysis technique by utilizing zinc nitrate and ferric chloride as the source materials. The film manifests a hexagonal wurtzite crystalline structure. Variations in the atomic dimensions of ZnO matrix were observed with an escalation in dopant concentration ranging from 0 to 5 at.% (atomic percent). The incorporation of Fe into the lattice was found to influence the optical transmittance properties and resulted in a decrement of the optical bandgap from 3.28 eV to 2.90 eV. X-ray diffraction (XRD) analysis confirmed that the films are monophasic, retaining a wurtzite structure characteristic of pure ZnO. Comprehensive material characterization was conducted by utilizing a suite of analytical techniques, including scanning electron microscopy (SEM), ultraviolet–visible (UV–Vis) spectroscopy and X-ray photoelectron spectroscopy (XPS), to substantiate the successful synthesis of the nanocomposite and to evaluate various attributes such as surface area, structural and morphological features, chemical composition, and purity. The gas-sensing efficacy of the Fe-doped ZnO films towards nitrogen dioxide (NO2) was assessed, revealing a significant gas response of 31.81% at an operational temperature of 400 degrees Celsius for a NO2 concentration of 100 parts per million (ppm). This gas-sensing performance is characterized by prompt response and recovery times, recorded at 23 s and 61 s, respectively. In addition, it was determined that the sensor response is contingent upon the operating temperature.
{"title":"Synthesis and characterization of Fe-doped ZnO films for enhanced NO2 gas-sensing applications","authors":"Mahalingeshwar Vishwanath Hiremath, Naeemakhtar Momin, Mrunal Vishnu Kangralkar, Jayappa Manjanna, Balachandra Gajanan Hegde, Devidas Gaibanna Byalollikar","doi":"10.1007/s40042-024-01173-w","DOIUrl":"10.1007/s40042-024-01173-w","url":null,"abstract":"<div><p>Zinc oxide films doped with iron (Fe-doped ZnO) were fabricated via spray pyrolysis technique by utilizing zinc nitrate and ferric chloride as the source materials. The film manifests a hexagonal wurtzite crystalline structure. Variations in the atomic dimensions of ZnO matrix were observed with an escalation in dopant concentration ranging from 0 to 5 at.% (atomic percent). The incorporation of Fe into the lattice was found to influence the optical transmittance properties and resulted in a decrement of the optical bandgap from 3.28 eV to 2.90 eV. X-ray diffraction (XRD) analysis confirmed that the films are monophasic, retaining a wurtzite structure characteristic of pure ZnO. Comprehensive material characterization was conducted by utilizing a suite of analytical techniques, including scanning electron microscopy (SEM), ultraviolet–visible (UV–Vis) spectroscopy and X-ray photoelectron spectroscopy (XPS), to substantiate the successful synthesis of the nanocomposite and to evaluate various attributes such as surface area, structural and morphological features, chemical composition, and purity. The gas-sensing efficacy of the Fe-doped ZnO films towards nitrogen dioxide (NO<sub>2</sub>) was assessed, revealing a significant gas response of 31.81% at an operational temperature of 400 degrees Celsius for a NO<sub>2</sub> concentration of 100 parts per million (ppm). This gas-sensing performance is characterized by prompt response and recovery times, recorded at 23 s and 61 s, respectively. In addition, it was determined that the sensor response is contingent upon the operating temperature.</p></div>","PeriodicalId":677,"journal":{"name":"Journal of the Korean Physical Society","volume":"85 9","pages":"772 - 782"},"PeriodicalIF":0.8,"publicationDate":"2024-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142540725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-19DOI: 10.1007/s40042-024-01168-7
Pankaj Saha, Myeonghun Park
Non-trivial sound speed may occur in various interesting scenarios in cosmology and affect the growth of primordial perturbation in the early Universe. This can lead to several observable signatures in the Baryon Acoustic Oscillations, CMB anisotropies, Dark Matter–Baryon Interactions, and the large-scale structure. On the other hand, the vacuum state of curvature perturbation could be expressed as a two-mode squeezed state. In this paper, we study the effects of the non-trivial speed of sound of the perturbations on the evolution of quantum discord for the primordial curvature perturbation using the squeezed formalism. Quantum discord, a measure of the non-classical correlations or quantum correlations between two subsystems of a quantum system, is closely related to the concept of entanglement in the field of quantum information science. We show that the effective speed of sound of primordial perturbations affects the final freeze-in amplitude of the quantum discord. This should provide us with a way to discern the effective speed of sound from quantum discord. We further argue that this may help us further understand the connection between the scrambling time and the effective speed of sounds of the perturbations. These connections can usher a direction when understanding the early Universe from a quantum information point of view.
{"title":"Quantum discord in the early universe with non-trivial sound speed","authors":"Pankaj Saha, Myeonghun Park","doi":"10.1007/s40042-024-01168-7","DOIUrl":"10.1007/s40042-024-01168-7","url":null,"abstract":"<div><p>Non-trivial sound speed may occur in various interesting scenarios in cosmology and affect the growth of primordial perturbation in the early Universe. This can lead to several observable signatures in the Baryon Acoustic Oscillations, CMB anisotropies, Dark Matter–Baryon Interactions, and the large-scale structure. On the other hand, the vacuum state of curvature perturbation could be expressed as a two-mode squeezed state. In this paper, we study the effects of the non-trivial speed of sound of the perturbations on the evolution of quantum discord for the primordial curvature perturbation using the squeezed formalism. Quantum discord, a measure of the non-classical correlations or quantum correlations between two subsystems of a quantum system, is closely related to the concept of entanglement in the field of quantum information science. We show that the effective speed of sound of primordial perturbations affects the final <i>freeze-in</i> amplitude of the quantum discord. This should provide us with a way to discern the effective speed of sound from quantum discord. We further argue that this may help us further understand the connection between the scrambling time and the effective speed of sounds of the perturbations. These connections can usher a direction when understanding the early Universe from a quantum information point of view.</p></div>","PeriodicalId":677,"journal":{"name":"Journal of the Korean Physical Society","volume":"85 9","pages":"705 - 711"},"PeriodicalIF":0.8,"publicationDate":"2024-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142252836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-19DOI: 10.1007/s40042-024-01176-7
Sangsu An, Changhan Lee, Youngji Cho, Jiho Chang, Jaejin Park, Moonjin Lee
We implemented a sensor to measure the concentration of solvents in water and evaluated the accuracy of the sensor. The sensor’s measurement results were compared using cyclic voltammetry, which measures the chemical potential of the solution. A film was produced using Indium-Tin-Oxide (ITO) nanoparticles. Structural and electrical properties of the film, which are closely related to sensor operating characteristics, were investigated. X-Ray Diffraction (XRD) measurements showed that the ITO nanoparticle size is ~ 35 nm. Hall effect measurements at 300 K showed that the carrier concentration n was 4.2–9.2 × 1018 cm⁻3 and the mobility μ was 0.13–0.68 cm2/Vs. Hall measurements show that grain boundary scattering is the main factor limiting the mobility of ITO film. The response of the sensor to three representative organic solvents methanol (MeOH), ethanol (EtOH), and isopropyl alcohol (IPA) was evaluated at various concentrations of each substance. The electrochemical potential of the analyte was determined using cyclic voltammetry (CV) measurements, and the sensor response was calculated using a simple model. The measurement results of the ITO sensor and the results obtained using CV measurement were consistent with each other within a maximum offset values of 4.9%.
我们设计了一种传感器来测量水中的溶剂浓度,并评估了传感器的准确性。我们使用循环伏安法对传感器的测量结果进行了比较,循环伏安法测量的是溶液的化学势。使用氧化铟锡(ITO)纳米粒子制作了一层薄膜。薄膜的结构和电气特性与传感器的工作特性密切相关,研究人员对薄膜的结构和电气特性进行了调查。X 射线衍射 (XRD) 测量显示,ITO 纳米粒子的尺寸约为 35 纳米。在 300 K 下进行的霍尔效应测量表明,载流子浓度 n 为 4.2-9.2 × 1018 cm-3,迁移率 μ 为 0.13-0.68 cm2/Vs。霍尔测量结果表明,晶界散射是限制 ITO 薄膜迁移率的主要因素。在每种物质的不同浓度下,对传感器对三种代表性有机溶剂甲醇(MeOH)、乙醇(EtOH)和异丙醇(IPA)的响应进行了评估。分析物的电化学势是通过循环伏安法(CV)测量确定的,传感器的响应则是通过一个简单的模型计算得出的。ITO 传感器的测量结果与使用 CV 测量得到的结果一致,最大偏移值为 4.9%。
{"title":"Study on the accuracy of Indium-Tin-Oxide (ITO) nanoparticle sensor based on solvent detection characteristics in water","authors":"Sangsu An, Changhan Lee, Youngji Cho, Jiho Chang, Jaejin Park, Moonjin Lee","doi":"10.1007/s40042-024-01176-7","DOIUrl":"10.1007/s40042-024-01176-7","url":null,"abstract":"<div><p>We implemented a sensor to measure the concentration of solvents in water and evaluated the accuracy of the sensor. The sensor’s measurement results were compared using cyclic voltammetry, which measures the chemical potential of the solution. A film was produced using Indium-Tin-Oxide (ITO) nanoparticles. Structural and electrical properties of the film, which are closely related to sensor operating characteristics, were investigated. X-Ray Diffraction (XRD) measurements showed that the ITO nanoparticle size is ~ 35 nm. Hall effect measurements at 300 K showed that the carrier concentration <i>n</i> was 4.2–9.2 × 10<sup>18</sup> cm⁻<sup>3</sup> and the mobility <i>μ</i> was 0.13–0.68 cm<sup>2</sup>/Vs. Hall measurements show that grain boundary scattering is the main factor limiting the mobility of ITO film. The response of the sensor to three representative organic solvents methanol (MeOH), ethanol (EtOH), and isopropyl alcohol (IPA) was evaluated at various concentrations of each substance. The electrochemical potential of the analyte was determined using cyclic voltammetry (CV) measurements, and the sensor response was calculated using a simple model. The measurement results of the ITO sensor and the results obtained using CV measurement were consistent with each other within a maximum offset values of 4.9%.</p></div>","PeriodicalId":677,"journal":{"name":"Journal of the Korean Physical Society","volume":"85 10","pages":"861 - 866"},"PeriodicalIF":0.8,"publicationDate":"2024-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142252837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-18DOI: 10.1007/s40042-024-01177-6
Joonho Jang
Twisted trilayer graphene hosts two moiré superlattices originating from two interfaces between graphene layers. However, the system is generally unstable to lattice relaxation at small twist angles and is expected to show a significantly modified electronic band structure. In particular, a helical trilayer graphene—whose two twisted angles have the same sign—provides an attractive platform with a flat band isolated by large energy gaps near the magic angle, but the interplay between the lattice and the electronic degrees of freedom is not well understood. Here, we performed a large-scale molecular dynamics simulation to study the lattice relaxation of helical trilayer graphenes and evaluated their electronic spectra with a tight-binding model calculation. The comparison of the electronic spectra with and without the lattice relaxation reveals how the lattice relaxation significantly modifies the electronic spectra, particularly near the charge neutrality point. We also investigated the local density of states to visualize the spatially varying electronic spectra that accord with macroscopic domain patterns of moiré lattice stackings. We propose these characteristic spectral features in the electronic degrees of freedom of a relaxed helical trilayer graphene to be confirmed by scanning probe techniques, such as scanning single-electron transistors and scanning tunneling microscopes.
{"title":"Effect of lattice relaxation on electronic spectra of helically twisted trilayer graphene: large-scale atomistic simulation approach","authors":"Joonho Jang","doi":"10.1007/s40042-024-01177-6","DOIUrl":"10.1007/s40042-024-01177-6","url":null,"abstract":"<div><p>Twisted trilayer graphene hosts two moiré superlattices originating from two interfaces between graphene layers. However, the system is generally unstable to lattice relaxation at small twist angles and is expected to show a significantly modified electronic band structure. In particular, a helical trilayer graphene—whose two twisted angles have the same sign—provides an attractive platform with a flat band isolated by large energy gaps near the magic angle, but the interplay between the lattice and the electronic degrees of freedom is not well understood. Here, we performed a large-scale molecular dynamics simulation to study the lattice relaxation of helical trilayer graphenes and evaluated their electronic spectra with a tight-binding model calculation. The comparison of the electronic spectra with and without the lattice relaxation reveals how the lattice relaxation significantly modifies the electronic spectra, particularly near the charge neutrality point. We also investigated the local density of states to visualize the spatially varying electronic spectra that accord with macroscopic domain patterns of moiré lattice stackings. We propose these characteristic spectral features in the electronic degrees of freedom of a relaxed helical trilayer graphene to be confirmed by scanning probe techniques, such as scanning single-electron transistors and scanning tunneling microscopes.</p></div>","PeriodicalId":677,"journal":{"name":"Journal of the Korean Physical Society","volume":"85 9","pages":"727 - 736"},"PeriodicalIF":0.8,"publicationDate":"2024-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142252840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-10DOI: 10.1007/s40042-024-01151-2
Donghyup Ha, SeungHyun Lee, Mitra Ghergherehchi, Sangbeen Lee, Hyojeong Choi, Ho Namgoong, Jong-Seo Chai
An X-band electron LINAC comprising 23 cells was fabricated and tuned for radiation therapy. The fabrication process used oxygen-free high-conductivity copper, which was divided into roughing and finishing stages to minimize machining errors. Resonance frequency measurements and tuning were performed for the half-cell, the unit cell with two half-cells combined, and all cells after assembly. Finally, the electric field inside the entire RF cavity was measured and tuned using a bead-pull test. The reason for the multi-step measurement and tuning was to minimize the number of tunings. Most of the tuning was done in the direction of increasing the frequency, and only a few were done in the direction of decreasing the frequency. All cells were tuned the same way. The finalized cavity had a resonance frequency of 9.306 GHz and a coupling coefficient of 1.277. Performance validation was performed through the percentage depth dose (PDD) test, confirming good agreement with the results for 6 MV X-rays.
我们制作并调谐了一个由 23 个单元组成的 X 波段电子 LINAC,用于放射治疗。制造过程使用无氧高导电铜,分为粗加工和精加工两个阶段,以尽量减少加工误差。对半电池、两个半电池组合的单元电池以及组装后的所有电池进行了共振频率测量和调谐。最后,使用拉珠测试对整个射频腔内的电场进行了测量和调谐。之所以采用多步骤测量和调谐,是为了尽量减少调谐次数。大多数调谐都是沿着频率增加的方向进行的,只有少数调谐是沿着频率降低的方向进行的。所有单元的调谐方法相同。最终确定的腔体共振频率为 9.306 千兆赫,耦合系数为 1.277。通过深度剂量百分比(PDD)测试进行了性能验证,证实与 6 MV X 射线的结果非常吻合。
{"title":"High precision tuning of RF cavity for 6 MeV SKKU X-band medical LINAC","authors":"Donghyup Ha, SeungHyun Lee, Mitra Ghergherehchi, Sangbeen Lee, Hyojeong Choi, Ho Namgoong, Jong-Seo Chai","doi":"10.1007/s40042-024-01151-2","DOIUrl":"10.1007/s40042-024-01151-2","url":null,"abstract":"<div><p>An X-band electron LINAC comprising 23 cells was fabricated and tuned for radiation therapy. The fabrication process used oxygen-free high-conductivity copper, which was divided into roughing and finishing stages to minimize machining errors. Resonance frequency measurements and tuning were performed for the half-cell, the unit cell with two half-cells combined, and all cells after assembly. Finally, the electric field inside the entire RF cavity was measured and tuned using a bead-pull test. The reason for the multi-step measurement and tuning was to minimize the number of tunings. Most of the tuning was done in the direction of increasing the frequency, and only a few were done in the direction of decreasing the frequency. All cells were tuned the same way. The finalized cavity had a resonance frequency of 9.306 GHz and a coupling coefficient of 1.277. Performance validation was performed through the percentage depth dose (PDD) test, confirming good agreement with the results for 6 MV X-rays.</p></div>","PeriodicalId":677,"journal":{"name":"Journal of the Korean Physical Society","volume":"85 7","pages":"591 - 599"},"PeriodicalIF":0.8,"publicationDate":"2024-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142184463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-04DOI: 10.1007/s40042-024-01171-y
Jikhyeon Ham, Sehun Kim, Seok-Kyun Son
Surface acoustic waves (SAWs) have been utilized as a platform for single-electron transistors. When superposed with the split-gate potential, propagating SAWs create moving potential wells. We demonstrate the total potential landscape using the Laplace equation and apply the one-dimensional time-independent Schrödinger equation to determine the conditions necessary for single-electron transport. Our findings reveal that the ratio between the SAW amplitude and the split-gate voltage varies with the SAW wavelength and the absolute value of the gate voltage. We propose essential conditions for single-electron transport based on the ratios derived from our calculations, which can be applied to other material systems.
{"title":"A simulation for surface acoustic waves driven electron transport in perspective of electrical potential","authors":"Jikhyeon Ham, Sehun Kim, Seok-Kyun Son","doi":"10.1007/s40042-024-01171-y","DOIUrl":"10.1007/s40042-024-01171-y","url":null,"abstract":"<div><p>Surface acoustic waves (SAWs) have been utilized as a platform for single-electron transistors. When superposed with the split-gate potential, propagating SAWs create moving potential wells. We demonstrate the total potential landscape using the Laplace equation and apply the one-dimensional time-independent Schrödinger equation to determine the conditions necessary for single-electron transport. Our findings reveal that the ratio between the SAW amplitude and the split-gate voltage varies with the SAW wavelength and the absolute value of the gate voltage. We propose essential conditions for single-electron transport based on the ratios derived from our calculations, which can be applied to other material systems.</p></div>","PeriodicalId":677,"journal":{"name":"Journal of the Korean Physical Society","volume":"85 9","pages":"746 - 750"},"PeriodicalIF":0.8,"publicationDate":"2024-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142184465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-04DOI: 10.1007/s40042-024-01165-w
Jyyoun Han, Gyuseock Ko, Do-Hoon Kim, Mubin Park, Seok-Kyun Son
Raman spectroscopy is a powerful tool to investigate the properties of materials. In particular, the ability to analyze the crystallinity, the number of layers, defects, and electronic properties of two-dimensional materials (2DMs). 2DMs make it a valuable analytical tool in numerous fields. Among 2DMs, rhombohedral stacking graphite, which has ABC-stacked layers, has a different band structure that shows peculiar electronic properties compared to Bernal stacking graphite, which has ABA-stacked layers, and exhibits the characteristics of a topological insulator, making it a unique material. Using Raman spectroscopy, Bernal and rhombohedral stacking can be easily distinguished at room temperature. In multi-layer graphene (MLG), the stacking order can be distinguished by various bands generated from Raman scattering. Additionally, changes in the excitation energy of the laser result in shifts in the Raman peaks and changes in the line shape. In this study, 633 nm and 514 nm lasers were utilized to compare the Raman bands of MLG in Bernal and rhombohedral stacking order. The 2D band, which is a second-order overtone of different in-plane vibrations, was fitted with three Lorentzian peaks to investigate how each Lorentzian peak changes according to the stacking order. Subsequently, the D + Dʺ, N, and M bands, which are weak combination bands with double resonant Raman modes, were investigated to see how they change in Bernal and rhombohedral stacking MLG with increasing laser energy. Conclusively, we present an easy method to distinguish Bernal and rhombohedral stacking in MLG at room temperature using Raman spectroscopy.
拉曼光谱是研究材料特性的强大工具。特别是,它能够分析二维材料(2DMs)的结晶度、层数、缺陷和电子特性。二维材料使其成为众多领域的重要分析工具。在二维材料中,由 ABC 层堆叠而成的斜方体堆叠石墨与由 ABA 层堆叠而成的贝纳尔堆叠石墨相比,具有不同的带状结构,显示出奇特的电子特性,表现出拓扑绝缘体的特征,成为一种独特的材料。利用拉曼光谱,可以在室温下轻松区分贝纳尔堆叠和斜方堆叠。在多层石墨烯(MLG)中,可以通过拉曼散射产生的各种波段来区分堆叠顺序。此外,激光激发能量的变化也会导致拉曼峰的移动和线形的变化。本研究利用 633 nm 和 514 nm 激光比较了伯纳尔堆积阶和斜方体堆积阶 MLG 的拉曼带。2D 波段是不同面内振动的二阶泛音,用三个洛伦兹峰进行拟合,以研究每个洛伦兹峰如何随堆积顺序而变化。随后,研究了 D + Dʺ、N 和 M 波段,它们是具有双共振拉曼模式的弱组合波段,以了解它们在伯纳尔和斜方体堆叠 MLG 中随着激光能量的增加而发生的变化。最后,我们提出了一种利用拉曼光谱在室温下区分 MLG 中伯纳尔堆叠和斜方堆叠的简便方法。
{"title":"Visualization of Raman spectroscopy for stacking orders: distinguishing Bernal and rhombohedral graphite","authors":"Jyyoun Han, Gyuseock Ko, Do-Hoon Kim, Mubin Park, Seok-Kyun Son","doi":"10.1007/s40042-024-01165-w","DOIUrl":"10.1007/s40042-024-01165-w","url":null,"abstract":"<div><p>Raman spectroscopy is a powerful tool to investigate the properties of materials. In particular, the ability to analyze the crystallinity, the number of layers, defects, and electronic properties of two-dimensional materials (2DMs). 2DMs make it a valuable analytical tool in numerous fields. Among 2DMs, rhombohedral stacking graphite, which has ABC-stacked layers, has a different band structure that shows peculiar electronic properties compared to Bernal stacking graphite, which has ABA-stacked layers, and exhibits the characteristics of a topological insulator, making it a unique material. Using Raman spectroscopy, Bernal and rhombohedral stacking can be easily distinguished at room temperature. In multi-layer graphene (MLG), the stacking order can be distinguished by various bands generated from Raman scattering. Additionally, changes in the excitation energy of the laser result in shifts in the Raman peaks and changes in the line shape. In this study, 633 nm and 514 nm lasers were utilized to compare the Raman bands of MLG in Bernal and rhombohedral stacking order. The 2D band, which is a second-order overtone of different in-plane vibrations, was fitted with three Lorentzian peaks to investigate how each Lorentzian peak changes according to the stacking order. Subsequently, the D + Dʺ, N, and M bands, which are weak combination bands with double resonant Raman modes, were investigated to see how they change in Bernal and rhombohedral stacking MLG with increasing laser energy. Conclusively, we present an easy method to distinguish Bernal and rhombohedral stacking in MLG at room temperature using Raman spectroscopy.</p></div>","PeriodicalId":677,"journal":{"name":"Journal of the Korean Physical Society","volume":"85 9","pages":"721 - 726"},"PeriodicalIF":0.8,"publicationDate":"2024-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142184470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-09-04DOI: 10.1007/s40042-024-01170-z
Seonwoo Park, Kyoung Hwa Kim, Suhyun Mun, Injun Jeon, Seon Jin Mun, Young-Hun Cho, Jeongbin Heo, Min Yang, Hyung Soo Ahn, Hunsoo Jeon, Jae Hak Lee, Kwanghee Jung, Won Jae Lee, Geon-Hee Lee, Myeong-Cheol Shin, Jong-Min Oh, Weon Ho Shin, Minkyung Kim, Sang-Mo Koo, Ye Hwan Kang
An advanced hydride vapor-phase epitaxy (HVPE) method was used to improve the sublimation sandwich method for the formation of Si layers on SiC substrates. In this study, a graphite boat structure with a vertical source and growth zones was used, and the sublimation sandwich method was improved by directly attaching two substrates (without any spacing between them) differently from that of the existing sublimation sandwich method. After the deposition of the amorphous Si layer (using sputtering) on an SiC substrate, the recrystalline Si layer was formed at a temperature of 1250 °C using a SiCln source. Consequently, an Si layer with characteristics different from those of the sputtered Si layer was grown. The formed Si layer was characterized using field-emission scanning electron microscopy, energy-dispersive spectroscopy, high-resolution X-ray diffraction, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and atomic force microscopy. Overall, we propose an advanced HVPE sublimation sandwich method for forming Si layers on SiC substrates.
利用先进的氢化物气相外延(HVPE)方法改进了在碳化硅基底上形成硅层的升华三明治法。该研究采用了具有垂直源区和生长区的石墨舟结构,并通过直接连接两个基底(基底之间没有任何间距)改进了升华三明治法,这与现有的升华三明治法不同。在碳化硅衬底上沉积非晶硅层(使用溅射法)后,使用碳化硅源在 1250 ℃ 的温度下形成再结晶硅层。因此,生长出了与溅射硅层特性不同的硅层。我们使用场发射扫描电子显微镜、能量色散光谱、高分辨率 X 射线衍射、X 射线光电子能谱、二次离子质谱和原子力显微镜对形成的硅层进行了表征。总之,我们提出了一种在碳化硅基底上形成硅层的先进 HVPE 升华夹层法。
{"title":"Advanced HVPE sublimation sandwich method for Si layer formation on SiC substrates","authors":"Seonwoo Park, Kyoung Hwa Kim, Suhyun Mun, Injun Jeon, Seon Jin Mun, Young-Hun Cho, Jeongbin Heo, Min Yang, Hyung Soo Ahn, Hunsoo Jeon, Jae Hak Lee, Kwanghee Jung, Won Jae Lee, Geon-Hee Lee, Myeong-Cheol Shin, Jong-Min Oh, Weon Ho Shin, Minkyung Kim, Sang-Mo Koo, Ye Hwan Kang","doi":"10.1007/s40042-024-01170-z","DOIUrl":"10.1007/s40042-024-01170-z","url":null,"abstract":"<div><p>An advanced hydride vapor-phase epitaxy (HVPE) method was used to improve the sublimation sandwich method for the formation of Si layers on SiC substrates. In this study, a graphite boat structure with a vertical source and growth zones was used, and the sublimation sandwich method was improved by directly attaching two substrates (without any spacing between them) differently from that of the existing sublimation sandwich method. After the deposition of the amorphous Si layer (using sputtering) on an SiC substrate, the recrystalline Si layer was formed at a temperature of 1250 °C using a SiCl<sub>n</sub> source. Consequently, an Si layer with characteristics different from those of the sputtered Si layer was grown. The formed Si layer was characterized using field-emission scanning electron microscopy, energy-dispersive spectroscopy, high-resolution X-ray diffraction, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and atomic force microscopy. Overall, we propose an advanced HVPE sublimation sandwich method for forming Si layers on SiC substrates.</p></div>","PeriodicalId":677,"journal":{"name":"Journal of the Korean Physical Society","volume":"85 10","pages":"810 - 824"},"PeriodicalIF":0.8,"publicationDate":"2024-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142184464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}