Yanmin Zhu, Yuxing Li, Jianqing Huang, Yunping Zhang, Yuen-Wa Ho, James Kar‐Hei Fang, E. Lam
Global concern about microplastic (MP) and nanoplastic (NP) particles is continuously rising with their proliferation worldwide. Effective identification methods for MP and NP pollution monitoring are highly needed, but due to different requirements and technical challenges, much of the work is still in progress. Herein, the advanced optical imaging systems that are successfully applied or have the potential for MP identification are focused on. Compared with chemical and thermal analyses, optical methods have the unique advantages of being nondestructive and noncontact and allow fast detection without complex sample preprocessing. Furthermore, they are capable of revealing the morphology, anisotropy, and material characteristics of MP for their quick and robust detection. This review aims to present a comprehensive discussion of the relevant optical imaging systems, emphasizing their operating principles, strengths, and drawbacks. Multiple comparisons and analyses among these technologies are conducted in order to provide practical guidelines for researchers. In addition, the combination of optical and other alternative technologies is described and the representative portable MP detection devices are highlighted. Together, they shed light on the prospects for long‐term MP pollution monitoring and environmental protection.
{"title":"Advanced Optical Imaging Technologies for Microplastics Identification: Progress and Challenges","authors":"Yanmin Zhu, Yuxing Li, Jianqing Huang, Yunping Zhang, Yuen-Wa Ho, James Kar‐Hei Fang, E. Lam","doi":"10.1002/adpr.202400038","DOIUrl":"https://doi.org/10.1002/adpr.202400038","url":null,"abstract":"Global concern about microplastic (MP) and nanoplastic (NP) particles is continuously rising with their proliferation worldwide. Effective identification methods for MP and NP pollution monitoring are highly needed, but due to different requirements and technical challenges, much of the work is still in progress. Herein, the advanced optical imaging systems that are successfully applied or have the potential for MP identification are focused on. Compared with chemical and thermal analyses, optical methods have the unique advantages of being nondestructive and noncontact and allow fast detection without complex sample preprocessing. Furthermore, they are capable of revealing the morphology, anisotropy, and material characteristics of MP for their quick and robust detection. This review aims to present a comprehensive discussion of the relevant optical imaging systems, emphasizing their operating principles, strengths, and drawbacks. Multiple comparisons and analyses among these technologies are conducted in order to provide practical guidelines for researchers. In addition, the combination of optical and other alternative technologies is described and the representative portable MP detection devices are highlighted. Together, they shed light on the prospects for long‐term MP pollution monitoring and environmental protection.","PeriodicalId":7263,"journal":{"name":"Advanced Photonics Research","volume":null,"pages":null},"PeriodicalIF":3.7,"publicationDate":"2024-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141815435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. S. Thöny, Manuel Bärtschi, Marietta Batzer, Manuel Baselgia, Raphael Gmünder, Amit Sharma, Tijmen Vermeij, Xavier Maeder, Stephan Waldner
Quantization effects in nanolaminate structures of oxide materials are proposed and experimentally demonstrated only recently. Herein, the material combination of amorphous silicon and SiO2 deposited by magnetron sputtering is investigated and it is shown that the quantization effect can be observed indeed. Transmission electron microscopy characterization gives evidence of continuous layers of amorphous silicon and SiO2 with well‐defined interfaces. The deposition process is described and the tunability of the refractive index and the bandgap energy is demonstrated. By doing so, the advantages of this novel material over classical optical materials are shown and feasibility is proved. As an example, a longpass optical interference filter with edge at 720 nm is deposited using quantized nanolaminates as the high and SiO2 as the low refractive index material. This filter can be deposited successfully with close match to the design. It shows a blocking range throughout the visible spectrum whereas a comparable filter based on SiO2–TiO2 only blocks 500–700 nm.
{"title":"Magnetron Sputter Deposition of Amorphous Silicon–SiO2 Quantized Nanolaminates","authors":"S. S. Thöny, Manuel Bärtschi, Marietta Batzer, Manuel Baselgia, Raphael Gmünder, Amit Sharma, Tijmen Vermeij, Xavier Maeder, Stephan Waldner","doi":"10.1002/adpr.202400057","DOIUrl":"https://doi.org/10.1002/adpr.202400057","url":null,"abstract":"Quantization effects in nanolaminate structures of oxide materials are proposed and experimentally demonstrated only recently. Herein, the material combination of amorphous silicon and SiO2 deposited by magnetron sputtering is investigated and it is shown that the quantization effect can be observed indeed. Transmission electron microscopy characterization gives evidence of continuous layers of amorphous silicon and SiO2 with well‐defined interfaces. The deposition process is described and the tunability of the refractive index and the bandgap energy is demonstrated. By doing so, the advantages of this novel material over classical optical materials are shown and feasibility is proved. As an example, a longpass optical interference filter with edge at 720 nm is deposited using quantized nanolaminates as the high and SiO2 as the low refractive index material. This filter can be deposited successfully with close match to the design. It shows a blocking range throughout the visible spectrum whereas a comparable filter based on SiO2–TiO2 only blocks 500–700 nm.","PeriodicalId":7263,"journal":{"name":"Advanced Photonics Research","volume":null,"pages":null},"PeriodicalIF":3.7,"publicationDate":"2024-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141814565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}