Pub Date : 1995-01-01DOI: 10.1154/S0376030800022795
T. Ely, P. Predecki, X. Zhu, M. Eatough, R. Goehner, R. Lucernoni
{"title":"Measurement of the Refraction Correction for Asymmetric Grazing Incidence Xrd From Rough Surfaces and Powders","authors":"T. Ely, P. Predecki, X. Zhu, M. Eatough, R. Goehner, R. Lucernoni","doi":"10.1154/S0376030800022795","DOIUrl":"https://doi.org/10.1154/S0376030800022795","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"17 1","pages":"381-389"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89580587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023302
Z. Spolnik, K. Lawniczak-Jablonska
{"title":"The Study of the Electronic Structure of ZnS Doped With Co by Electron Microprobe","authors":"Z. Spolnik, K. Lawniczak-Jablonska","doi":"10.1154/S0376030800023302","DOIUrl":"https://doi.org/10.1154/S0376030800023302","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"121 1","pages":"831-835"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72691138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023223
R. Hockett
{"title":"An Update on Standards Activity for Txrf and the Challenges Ahead","authors":"R. Hockett","doi":"10.1154/S0376030800023223","DOIUrl":"https://doi.org/10.1154/S0376030800023223","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"15 1","pages":"767-770"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73920387","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
F. Weber, L. D. Silva, T. Barbee, D. Ciarlo, M. Mantler
We report on results obtained from experiments using specially prepared carbon substrates and treatment of the data by means of recently introduced theory. Medium Z grids with known parameters have been coated on top of pyrolytic carbon substrates to achieve well defined absorption geometries. The various copper grids exhibit satisfactory performance in terms of mechanical stability, homogeneity and uniformity of the coating. A detailed study of the measurement results shows that there is a more rapid increase of the associated C-K{alpha} countrate from the coated samples compared to the pure elements and is attributed to the contribution of secondary enhancement effects, including those resulting from photoelectrons generated after the primary ionization. A variety of multilayer analyzers has also been evaluated during these experiments. Only a certain combination of muitilayer component materials have been found to be appropriate for use as dispersing elements due to the reflectivity and spatial resolution requirements of our long wavelength spectrometer. Another experimental factor is the low intensity of available tube photons which is due to the selection of the target material and absorption effects in the target as well as the tube window. 12 refs., 7 figs., 2 tabs.
{"title":"Quantitative XRFA of carbon in a special matrix by the fundamental parameter method","authors":"F. Weber, L. D. Silva, T. Barbee, D. Ciarlo, M. Mantler","doi":"10.2172/264594","DOIUrl":"https://doi.org/10.2172/264594","url":null,"abstract":"We report on results obtained from experiments using specially prepared carbon substrates and treatment of the data by means of recently introduced theory. Medium Z grids with known parameters have been coated on top of pyrolytic carbon substrates to achieve well defined absorption geometries. The various copper grids exhibit satisfactory performance in terms of mechanical stability, homogeneity and uniformity of the coating. A detailed study of the measurement results shows that there is a more rapid increase of the associated C-K{alpha} countrate from the coated samples compared to the pure elements and is attributed to the contribution of secondary enhancement effects, including those resulting from photoelectrons generated after the primary ionization. A variety of multilayer analyzers has also been evaluated during these experiments. Only a certain combination of muitilayer component materials have been found to be appropriate for use as dispersing elements due to the reflectivity and spatial resolution requirements of our long wavelength spectrometer. Another experimental factor is the low intensity of available tube photons which is due to the selection of the target material and absorption effects in the target as well as the tube window. 12 refs., 7 figs., 2 tabs.","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"117 1","pages":"821-829"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89813663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022667
S. L. Lee, G. Capsimalis
{"title":"Elastic Anisotrophy and Residual Stress in Textured Production Electrolytic Chromium Coatings on Steel","authors":"S. L. Lee, G. Capsimalis","doi":"10.1154/S0376030800022667","DOIUrl":"https://doi.org/10.1154/S0376030800022667","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"45 1","pages":"257-266"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84243789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023053
I. C. Noyan, C. Goldsmith
{"title":"Inhomogeneous Deformation in Thin Films","authors":"I. C. Noyan, C. Goldsmith","doi":"10.1154/S0376030800023053","DOIUrl":"https://doi.org/10.1154/S0376030800023053","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"63 1","pages":"627-635"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89500243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S037603080002303X
M. Rodriguez, M. Eatough, F. Licci
{"title":"Rietveld Refinement of YBa2Cu3-xNixOy Prepared by Quenching and Oxygen Gettering","authors":"M. Rodriguez, M. Eatough, F. Licci","doi":"10.1154/S037603080002303X","DOIUrl":"https://doi.org/10.1154/S037603080002303X","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"17 1","pages":"607-614"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81174178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022722
M. Miyano, Y. Hirose
{"title":"X-Ray Residual Stress Measurement of Ground Tungsten Carbides with Various Cobalt Contents","authors":"M. Miyano, Y. Hirose","doi":"10.1154/S0376030800022722","DOIUrl":"https://doi.org/10.1154/S0376030800022722","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"68 1","pages":"311-318"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73496820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023351
D. Rendle, J. Taylor
{"title":"Application of Xrf to the Detection and Estimation of Metals in Toxicological Specimens","authors":"D. Rendle, J. Taylor","doi":"10.1154/S0376030800023351","DOIUrl":"https://doi.org/10.1154/S0376030800023351","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"41 1","pages":"869-879"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76466899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022540
H. Aiginger, M. Benedikt, R. Görgl
{"title":"Energy Dispersive Measurement of X-Ray Tube Spectra","authors":"H. Aiginger, M. Benedikt, R. Görgl","doi":"10.1154/S0376030800022540","DOIUrl":"https://doi.org/10.1154/S0376030800022540","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"72 1","pages":"137-147"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76168207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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