Pub Date : 1995-01-01DOI: 10.1154/S0376030800023181
W. Wong-Ng, L. Cook, F. Jiang
{"title":"X-Ray Characterization of Phase Equilibria of the Raveau and 2212 Phases in the Bi-Sr-Ca-Cu-0 System","authors":"W. Wong-Ng, L. Cook, F. Jiang","doi":"10.1154/S0376030800023181","DOIUrl":"https://doi.org/10.1154/S0376030800023181","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"17 4 1","pages":"731-738"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80574938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023004
R. W. Cheary, J. Cline, M. Anast
{"title":"Characterisation and Modelling of Peak Shifts in Conventional Powder Diffractometry","authors":"R. W. Cheary, J. Cline, M. Anast","doi":"10.1154/S0376030800023004","DOIUrl":"https://doi.org/10.1154/S0376030800023004","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"89 1","pages":"579-587"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83441679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022862
T. Yokokawa, K. Ohno, H. Murakami, Toshiharu Kobayashi, T. Yamagata, H. Harada
{"title":"Accurate Measurement of Lattice Misfit Between γ And γ' Phases in Nickel-Base Superalloys at High Temperatures","authors":"T. Yokokawa, K. Ohno, H. Murakami, Toshiharu Kobayashi, T. Yamagata, H. Harada","doi":"10.1154/S0376030800022862","DOIUrl":"https://doi.org/10.1154/S0376030800022862","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"32 1","pages":"449-456"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88438553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022904
Z. Yajima, Y. Kishi, Y. Hirose
{"title":"X-Ray Quantitative Analysis of Transformed Martensite in Austentic Stainless Steel","authors":"Z. Yajima, Y. Kishi, Y. Hirose","doi":"10.1154/S0376030800022904","DOIUrl":"https://doi.org/10.1154/S0376030800022904","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"89 1","pages":"481-489"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90960669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022436
A. Shibata
{"title":"The Evolution of X-ray Analytical Instrumentation at Rigaku Corporation","authors":"A. Shibata","doi":"10.1154/S0376030800022436","DOIUrl":"https://doi.org/10.1154/S0376030800022436","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"1 1","pages":"41-46"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88719895","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023375
A. Naziripour, A. Nelson
{"title":"Diffusivity of Pt in BaxSrl-xTiO3 by XPS Compositional Depth Profiling","authors":"A. Naziripour, A. Nelson","doi":"10.1154/S0376030800023375","DOIUrl":"https://doi.org/10.1154/S0376030800023375","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"124 1","pages":"885-889"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87927596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800022606
Arnold C. Vermeulen, R. Delhez, T. H. Keijser, E. Mittemeijer
{"title":"X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films","authors":"Arnold C. Vermeulen, R. Delhez, T. H. Keijser, E. Mittemeijer","doi":"10.1154/S0376030800022606","DOIUrl":"https://doi.org/10.1154/S0376030800022606","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"52 1","pages":"195-210"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82752058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023089
K. Hayashi, T. Horiuchi, K. Matsushige
{"title":"The in-Situ Observation of Organic Thin Films During Growth Process by Using Grazing Incidence X-Ray Diffraction and Fluorescence Methods","authors":"K. Hayashi, T. Horiuchi, K. Matsushige","doi":"10.1154/S0376030800023089","DOIUrl":"https://doi.org/10.1154/S0376030800023089","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"1 1","pages":"653-658"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76710888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023132
K. Sakurai, A. Iida
{"title":"Analysis of Specific Interfaces in Thin Films by X-Ray Fluorescence Using Interference Effect in Total Reflection","authors":"K. Sakurai, A. Iida","doi":"10.1154/S0376030800023132","DOIUrl":"https://doi.org/10.1154/S0376030800023132","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"49 1","pages":"695-700"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76779079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1995-01-01DOI: 10.1154/S0376030800023028
Hong Chen, B. Davis
{"title":"Quantitative X-Ray Diffraction Analysis of Smectites: II -- Reference Intensity Ratio Calculations for Smectite Analysis","authors":"Hong Chen, B. Davis","doi":"10.1154/S0376030800023028","DOIUrl":"https://doi.org/10.1154/S0376030800023028","url":null,"abstract":"","PeriodicalId":7518,"journal":{"name":"Advances in x-ray analysis","volume":"68 1","pages":"599-606"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73697224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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