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IEEE Transactions on Circuits and Systems I: Regular Papers最新文献

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IEEE Circuits and Systems Society Information
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-03-28 DOI: 10.1109/TCSI.2025.3550689
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引用次数: 0
IEEE Transactions on Circuits and Systems--I: Regular Papers Information for Authors
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-03-28 DOI: 10.1109/TCSI.2025.3550691
{"title":"IEEE Transactions on Circuits and Systems--I: Regular Papers Information for Authors","authors":"","doi":"10.1109/TCSI.2025.3550691","DOIUrl":"https://doi.org/10.1109/TCSI.2025.3550691","url":null,"abstract":"","PeriodicalId":13039,"journal":{"name":"IEEE Transactions on Circuits and Systems I: Regular Papers","volume":"72 4","pages":"1975-1975"},"PeriodicalIF":5.2,"publicationDate":"2025-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10945524","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143726573","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Circuits and Systems--I: Regular Papers Publication Information
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-03-28 DOI: 10.1109/TCSI.2025.3550693
{"title":"IEEE Transactions on Circuits and Systems--I: Regular Papers Publication Information","authors":"","doi":"10.1109/TCSI.2025.3550693","DOIUrl":"https://doi.org/10.1109/TCSI.2025.3550693","url":null,"abstract":"","PeriodicalId":13039,"journal":{"name":"IEEE Transactions on Circuits and Systems I: Regular Papers","volume":"72 4","pages":"C2-C2"},"PeriodicalIF":5.2,"publicationDate":"2025-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10945527","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143726524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Structure-Reconfigurable Wide Gain Series Resonant Converter for On-Board Charger
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-03-18 DOI: 10.1109/TCSI.2024.3505271
Deyu Wang;Xianpeng Chen;Qinglin Zhao;Zbigniew Kaczmarczyk
In this article, a structure-reconfigurable series resonant DC-DC converter is proposed for a wide gain on-board charger application. The proposed converter consists of a dual-bridge structure on the primary side which can realize 0.5 to 1 voltage gain by using a reconfigurable half/full bridge structure, and a hybrid rectifier on the secondary side which can realize 1 to infinite voltage gain by replacing two diodes with active switches. Moreover, the proposed converter employs a control scheme based on fixed frequency PWM, with the operating frequency being identical to the series resonant frequency. Accordingly, magnetizing inductance of the transformer is independent of the converter gain characteristics, which simplifies the consideration of the resonance parameters design. In addition, soft switching can be realized during the entire charging process, and high efficiency can be achieved. To avoid the voltage spike and current impact in the transition between two operation modes, a unified switching modulation strategy is applied to achieve a smooth transition and improve the control stability. Finally, a 2.5 kW prototype with an output voltage range of 200V - 500 V is established and tested to verify the effectiveness and feasibility of the proposed converter.
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引用次数: 0
IEEE Circuits and Systems Society Information
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-02-26 DOI: 10.1109/TCSI.2025.3541500
{"title":"IEEE Circuits and Systems Society Information","authors":"","doi":"10.1109/TCSI.2025.3541500","DOIUrl":"https://doi.org/10.1109/TCSI.2025.3541500","url":null,"abstract":"","PeriodicalId":13039,"journal":{"name":"IEEE Transactions on Circuits and Systems I: Regular Papers","volume":"72 3","pages":"C3-C3"},"PeriodicalIF":5.2,"publicationDate":"2025-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10905061","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143496443","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Circuits and Systems--I: Regular Papers Information for Authors
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-02-26 DOI: 10.1109/TCSI.2025.3541498
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引用次数: 0
IEEE Transactions on Circuits and Systems--I: Regular Papers Publication Information
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-02-26 DOI: 10.1109/TCSI.2025.3541496
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引用次数: 0
Ferroelectric FET-Based Bayesian Inference Engine for Disease Diagnosis
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-02-05 DOI: 10.1109/TCSI.2025.3533044
Arka Chakraborty;Musaib Rafiq;Yawar Hayat Zarkob;Yogesh Singh Chauhan;Shubham Sahay
Probabilistic/stochastic computations form the backbone of autonomous systems and classifiers. Recently, biomedical applications of probabilistic computing such as Bayesian networks for disease diagnosis, DNA sequencing, etc. have attracted significant attention owing to their high energy-efficiency. Bayesian inference is widely used for decision making based on independent (often conflicting) sources of information/evidence. A cascaded chain or tree structure of asynchronous circuit elements known as Muller C-elements can effectively implement Bayesian inference. Such circuits utilize stochastic bit streams to encode input probabilities which enhances their robustness and fault-tolerance. However, the CMOS implementations of Muller C-element are bulky and energy hungry which restricts their widespread application in resource constrained IoT and mobile devices such as UAVs, robots, space rovers, etc. In this work, for the first time, we propose a compact and energy-efficient implementation of Muller C-element utilizing a single Ferroelectric FET and use it for cancer diagnosis task by performing Bayesian inference with high accuracy on Wisconsin data set. The proposed implementation exploits the unique drain-erase, program inhibit and drain-erase inhibit characteristics of FeFETs to yield the output as the polarization-state of the ferroelectric layer. Our extensive investigation utilizing an in-house developed experimentally calibrated compact model of FeFET reveals that the proposed C-element consumes (worst-case) energy of 4.1 fJ and an area $0.07~mu m^{2}$ and outperforms the prior implementations in terms of energy-efficiency and footprint while exhibiting a comparable delay. We also propose a novel read circuitry for realising a Bayesian inference engine by cascading a network of proposed FeFET-based C-elements for practical applications. Furthermore, for the first time, we analyze the impact of cross-correlation between the stochastic input bit streams on the accuracy of the C-element based Bayesian inference implementation.
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引用次数: 0
A 0.07 pJ/b/dB 36-Gb/s PAM-3 Receiver Using Inductor-Reused CTLE and One-Tap Loop-Unrolled DFE in 22-nm CMOS
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-02-04 DOI: 10.1109/TCSI.2025.3536091
Pin-Yuan Chiu;Shen-Iuan Liu
This paper presents a 36 Gb/s (23.04 GBaud) 3-level pulse amplitude modulation (PAM-3) receiver (RX). The proposed inductor-reused continuous-time linear equalizer (CTLE) uses feedforward and inductive peaking techniques. Additionally, the number of the data slicers is reduced in the PAM-3 receiver with a loop-unrolled decision feedback equalizer (DFE). Furthermore, a baud-rate phase detector (BRPD) is presented. Fabricated in 22-nm CMOS technology, this receiver compensates for a channel loss of 20.5 dB at 11.52 GHz, achieving a bit error rate (BER) of less than $10^{-12} $ with a pseudo-random ternary sequence (PRTS) of $3^{7}mathbf {-}1$ . The measured clock integrated jitter is 267 fsrms at 720 MHz, and the retimed data exhibits 10.98 pspp jitter. The overall receiver consumes 51.7 mW, with a calculated energy efficiency of 1.44 pJ/b and a figure of merit (FoM) of 0.07 pJ/b/dB.
{"title":"A 0.07 pJ/b/dB 36-Gb/s PAM-3 Receiver Using Inductor-Reused CTLE and One-Tap Loop-Unrolled DFE in 22-nm CMOS","authors":"Pin-Yuan Chiu;Shen-Iuan Liu","doi":"10.1109/TCSI.2025.3536091","DOIUrl":"https://doi.org/10.1109/TCSI.2025.3536091","url":null,"abstract":"This paper presents a 36 Gb/s (23.04 GBaud) 3-level pulse amplitude modulation (PAM-3) receiver (RX). The proposed inductor-reused continuous-time linear equalizer (CTLE) uses feedforward and inductive peaking techniques. Additionally, the number of the data slicers is reduced in the PAM-3 receiver with a loop-unrolled decision feedback equalizer (DFE). Furthermore, a baud-rate phase detector (BRPD) is presented. Fabricated in 22-nm CMOS technology, this receiver compensates for a channel loss of 20.5 dB at 11.52 GHz, achieving a bit error rate (BER) of less than <inline-formula> <tex-math>$10^{-12} $ </tex-math></inline-formula> with a pseudo-random ternary sequence (PRTS) of <inline-formula> <tex-math>$3^{7}mathbf {-}1$ </tex-math></inline-formula>. The measured clock integrated jitter is 267 fsrms at 720 MHz, and the retimed data exhibits 10.98 pspp jitter. The overall receiver consumes 51.7 mW, with a calculated energy efficiency of 1.44 pJ/b and a figure of merit (FoM) of 0.07 pJ/b/dB.","PeriodicalId":13039,"journal":{"name":"IEEE Transactions on Circuits and Systems I: Regular Papers","volume":"72 4","pages":"1522-1532"},"PeriodicalIF":5.2,"publicationDate":"2025-02-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143726539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Polynomial Formal Verification of Multi-Valued Approximate Circuits Within Constant Cutwidth
IF 5.2 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-30 DOI: 10.1109/TCSI.2025.3531008
Mohamed Nadeem;Chandan Kumar Jha;Rolf Drechsler
Ensuring functional correctness is achieved through formal verification. As circuit complexity increases, limiting the upper bounds for time and space required for verification becomes crucial. Polynomial Formal Verification (PFV) has been introduced to tackle this problem. In modern digital system designs, approximate circuits are widely employed in error resilient applications. Therefore, ensuring the functional correctness of these circuits becomes essential. In prior works, it has been proven that approximate circuits with constant cutwidth can be verified in linear time. However, extending binary logic verification to Multi-Valued Logic (MVL) introduces challenges, particularly regarding the encoding of MVL operators. It has been shown that MVL circuits with constant cutwidth can be verified in linear time using Answer Set Programming (ASP), due to the ASP encoding capabilities of MVL operators. In this paper, we present a PFV approach of MVL approximate circuits with constant cutwidth using ASP. We then demonstrate that the verification of MVL approximate circuits with constant cutwidth can be achieved in linear time. Finally, we evaluate various MVL approximate circuits with constant cutwidth across different logic levels to show the efficacy of our approach.
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引用次数: 0
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IEEE Transactions on Circuits and Systems I: Regular Papers
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