A design methodology for highly reliable operation for 2T0C dynamic random access memory application based on IGZO channel-all-around ferroelectric field-effect transistors
基于 IGZO 沟道式全方位铁电场效应晶体管的 2T0C 动态随机存取存储器应用的高可靠性运行设计方法
IF 1.5
4区 物理与天体物理
Q3 PHYSICS, APPLIED
Pub Date : 2024-06-07
DOI: 10.35848/1347-4065/ad455b
Jing Liang, Peng Yuan, Yong Yu, Jinjuan Xiang, Zhengyong Zhu, Menglong Zhou, Feng Shao, Yanan Lu, Jin Dai, Sangdon Yi, Guilei Wang, Jing Zhang, Bryan Kang, Chao Zhao