Pub Date : 2024-08-21DOI: 10.35848/1347-4065/ad6abe
Keigo Bito, Masaki Ishiguro, Hadirah A. Radzuan, Hikaru Hiroshige, Tomohiro Motoyama, Yusui Nakamura, Joel T. Asubar, Zenji Yatabe
Uniform thickness Al2O3 thin films have been deposited by eco-friendly mist CVD. The obtained Al2O3 film has an optical band gap value of more than 6.5 eV and a refractive index of 1.64 at 633 nm. The combination of capacitance–voltage (C–V) fitting method with non-linear least-squares algorithm, frequency dispersion, photo-assisted, and proposed reverse bias-assisted C–V methods revealed interface state densities ranging from 1 × 1012 to 3 × 1013 cm−2eV−1 along the mist-Al2O3/AlGaN interface. These values are comparable to those reported for atomic layer deposited Al2O3 thin films.
{"title":"Interface state density in mist chemical vapor deposited Al2O3/AlGaN/GaN structure","authors":"Keigo Bito, Masaki Ishiguro, Hadirah A. Radzuan, Hikaru Hiroshige, Tomohiro Motoyama, Yusui Nakamura, Joel T. Asubar, Zenji Yatabe","doi":"10.35848/1347-4065/ad6abe","DOIUrl":"https://doi.org/10.35848/1347-4065/ad6abe","url":null,"abstract":"Uniform thickness Al<sub>2</sub>O<sub>3</sub> thin films have been deposited by eco-friendly mist CVD. The obtained Al<sub>2</sub>O<sub>3</sub> film has an optical band gap value of more than 6.5 eV and a refractive index of 1.64 at 633 nm. The combination of capacitance–voltage (<italic toggle=\"yes\">C</italic>–<italic toggle=\"yes\">V</italic>) fitting method with non-linear least-squares algorithm, frequency dispersion, photo-assisted, and proposed reverse bias-assisted <italic toggle=\"yes\">C</italic>–<italic toggle=\"yes\">V</italic> methods revealed interface state densities ranging from 1 × 10<sup>12</sup> to 3 × 10<sup>13</sup> cm<sup>−2</sup>eV<sup>−1</sup> along the mist-Al<sub>2</sub>O<sub>3</sub>/AlGaN interface. These values are comparable to those reported for atomic layer deposited Al<sub>2</sub>O<sub>3</sub> thin films.","PeriodicalId":14741,"journal":{"name":"Japanese Journal of Applied Physics","volume":"4 1","pages":""},"PeriodicalIF":1.5,"publicationDate":"2024-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142218182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}