Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967640
D. Gope, V. Jandhyala
A fast multilevel direct solver for the method of moments applied to electrically small structures is presented. The approach is based on a combination of low-rank decompositions and fill-in control. It is particularly advantageous for multiple right-hand-side problems such as those encountered in digital circuit and IC analyses, as is demonstrated by numerical simulation results presented.
{"title":"An iteration-free fast multilevel solver for dense method of moment systems","authors":"D. Gope, V. Jandhyala","doi":"10.1109/EPEP.2001.967640","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967640","url":null,"abstract":"A fast multilevel direct solver for the method of moments applied to electrically small structures is presented. The approach is based on a combination of low-rank decompositions and fill-in control. It is particularly advantageous for multiple right-hand-side problems such as those encountered in digital circuit and IC analyses, as is demonstrated by numerical simulation results presented.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126341488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967662
O.P. Mandhana
This paper presents an efficient design methodology to realize the output impedance at the high performance microprocessor core equal to or less than the target impedance to reduce the mid-frequency core noise. Based on the frequency domain analysis of the lumped model of the package power distribution network (PPDN), a systematic method of estimating capacitance and associated parasitics of decoupling capacitors used in the distributed model of the PPDN is described. The simulation results of the analytical method show good correlation with the SPICE simulation results of the distributed PPDN model to reduce the output impedance at the core.
{"title":"Design oriented analysis of package power distribution system considering target impedance for high performance microprocessors","authors":"O.P. Mandhana","doi":"10.1109/EPEP.2001.967662","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967662","url":null,"abstract":"This paper presents an efficient design methodology to realize the output impedance at the high performance microprocessor core equal to or less than the target impedance to reduce the mid-frequency core noise. Based on the frequency domain analysis of the lumped model of the package power distribution network (PPDN), a systematic method of estimating capacitance and associated parasitics of decoupling capacitors used in the distributed model of the PPDN is described. The simulation results of the analytical method show good correlation with the SPICE simulation results of the distributed PPDN model to reduce the output impedance at the core.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134382917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967625
Jongjoo Lee, Joungho Kim
Picosecond electric-pulse propagation properties on microstrip meander lines on a printed circuit board were measured using a novel optical photoconductive near-field mapping probe. The time-varying, 2-D spatial tangential near-field distribution images were successfully obtained.
{"title":"Picosecond-pulse propagation measurement on microstrip meander lines using a novel optical near-field mapping probe","authors":"Jongjoo Lee, Joungho Kim","doi":"10.1109/EPEP.2001.967625","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967625","url":null,"abstract":"Picosecond electric-pulse propagation properties on microstrip meander lines on a printed circuit board were measured using a novel optical photoconductive near-field mapping probe. The time-varying, 2-D spatial tangential near-field distribution images were successfully obtained.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129607763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967671
B. Rubin
A TDR setup for measuring differential transmission lines is modeled using both 2D quasi-static and 3D full-wave tools. We investigate the interaction between the coaxial probe and structure, explain parasitic effects, and show why a single-ended probe cannot be used to directly measure the characteristic impedance.
{"title":"Understanding modeling and measurements of differential transmission lines","authors":"B. Rubin","doi":"10.1109/EPEP.2001.967671","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967671","url":null,"abstract":"A TDR setup for measuring differential transmission lines is modeled using both 2D quasi-static and 3D full-wave tools. We investigate the interaction between the coaxial probe and structure, explain parasitic effects, and show why a single-ended probe cannot be used to directly measure the characteristic impedance.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"123 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132226911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967642
P. Pongpaibool, A. Kamo, Takayuki Watanabe, H. Asai
The finite-difference time-domain (FDTD) method has been widely used for solving various types of electromagnetic problems such as anisotropic and nonlinear problems. The FDTD method provides accurate predictions of field behaviors. In this paper, a new algorithm for two-dimensional (2-D) finite-different time-domain (FDTD) is presented in order to increase the maximum time step size and reduce the simulation time by simulating in parallel computation.
{"title":"An alternating implicit block overlapped FDTD (AIBO-FDTD) method and its estimation with parallel computation","authors":"P. Pongpaibool, A. Kamo, Takayuki Watanabe, H. Asai","doi":"10.1109/EPEP.2001.967642","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967642","url":null,"abstract":"The finite-difference time-domain (FDTD) method has been widely used for solving various types of electromagnetic problems such as anisotropic and nonlinear problems. The FDTD method provides accurate predictions of field behaviors. In this paper, a new algorithm for two-dimensional (2-D) finite-different time-domain (FDTD) is presented in order to increase the maximum time step size and reduce the simulation time by simulating in parallel computation.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132278592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967644
Heeseok Lee, Nanhoon Kim, Joungho Kim
The finite-difference time-domain (FDTD) method was used to determine the propagation characteristic of the meander delay line popular in boards or packages. For unit cell modeling, the periodicity of the meander pattern was utilized based on the Floquet's theorem.
{"title":"Unit cell modeling of meander delay line based on finite-difference time-domain method and Floquet's theorem","authors":"Heeseok Lee, Nanhoon Kim, Joungho Kim","doi":"10.1109/EPEP.2001.967644","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967644","url":null,"abstract":"The finite-difference time-domain (FDTD) method was used to determine the propagation characteristic of the meander delay line popular in boards or packages. For unit cell modeling, the periodicity of the meander pattern was utilized based on the Floquet's theorem.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"414 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132381034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967605
Luc Knockaert, D. Zutter, F. Olyslager, E. Laermans, J. D. Geest
In this paper we present a generalization of the simultaneous diagonalization technique by means of congruence transformations to the general reciprocal lossy multiconductor transmission line case. The method paves the way to solving the inverse problem, i.e. given a lossy multiconductor transmission line system of a given length, recover the transmission line parameters from the impedance or scattering descriptions.
{"title":"Recovering lossy multiconductor transmission line parameters from impedance or scattering representations","authors":"Luc Knockaert, D. Zutter, F. Olyslager, E. Laermans, J. D. Geest","doi":"10.1109/EPEP.2001.967605","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967605","url":null,"abstract":"In this paper we present a generalization of the simultaneous diagonalization technique by means of congruence transformations to the general reciprocal lossy multiconductor transmission line case. The method paves the way to solving the inverse problem, i.e. given a lossy multiconductor transmission line system of a given length, recover the transmission line parameters from the impedance or scattering descriptions.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126131909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967606
Chen Wang, J. Fan, J. Knighten, N. Smith, R. Alexander, J. Drewniak
Vias in differential transmission lines have been modeled using the finite-difference time-domain (FDTD) method. The velocity that the differential signal propagated through the vias was estimated. Differential S-parameters were calculated up to 50 GHz. Below 10 GHz, the differential signal can propagate through vias without much reflection and distortion. However, as frequency increases, the reflection from the vias and the loss of differential power become significant.
{"title":"The effects of via transitions on differential signals","authors":"Chen Wang, J. Fan, J. Knighten, N. Smith, R. Alexander, J. Drewniak","doi":"10.1109/EPEP.2001.967606","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967606","url":null,"abstract":"Vias in differential transmission lines have been modeled using the finite-difference time-domain (FDTD) method. The velocity that the differential signal propagated through the vias was estimated. Differential S-parameters were calculated up to 50 GHz. Below 10 GHz, the differential signal can propagate through vias without much reflection and distortion. However, as frequency increases, the reflection from the vias and the loss of differential power become significant.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122504488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967603
S. Haga, K. Nakano, T. Sudo
Radiating mechanism and reduction measures have been studied using test LSI and PCB. Among LSI operation modes, I/O buffer operation radiates the greatest amount of emission and shows that LSI mounting area behaves an opening from the electromagnetic viewpoint. The measure, decreasing extent of electromagnetic field at LSI mounting area, have been verified effective.
{"title":"Effects of decreasing extent of electromagnetic field at LSI mounting area on radiated emission from PCB","authors":"S. Haga, K. Nakano, T. Sudo","doi":"10.1109/EPEP.2001.967603","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967603","url":null,"abstract":"Radiating mechanism and reduction measures have been studied using test LSI and PCB. Among LSI operation modes, I/O buffer operation radiates the greatest amount of emission and shows that LSI mounting area behaves an opening from the electromagnetic viewpoint. The measure, decreasing extent of electromagnetic field at LSI mounting area, have been verified effective.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124054360","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2001-10-29DOI: 10.1109/EPEP.2001.967598
S. Gunther
The power dissipation of modern processors is steadily increasing, keeping pace with growing transistor counts and increasing clock frequencies. In an effort to counteract this trend, integrated circuit designers are aggressively employing design optimizations to minimize circuit power consumption. Power reduction was a key focus of the Intel Pentium 4 processor design team, and the design team focused from the beginning on reducing power consumption without compromising other design targets. Many techniques, both innovative and pre-existing, were applied across all functional units in the processor in an effort to eliminate unnecessary power consumption. The mass adoption of these techniques resulted in a significant reduction in both maximum and typical processor power dissipation.
{"title":"Architectural approaches to reducing power related system costs","authors":"S. Gunther","doi":"10.1109/EPEP.2001.967598","DOIUrl":"https://doi.org/10.1109/EPEP.2001.967598","url":null,"abstract":"The power dissipation of modern processors is steadily increasing, keeping pace with growing transistor counts and increasing clock frequencies. In an effort to counteract this trend, integrated circuit designers are aggressively employing design optimizations to minimize circuit power consumption. Power reduction was a key focus of the Intel Pentium 4 processor design team, and the design team focused from the beginning on reducing power consumption without compromising other design targets. Many techniques, both innovative and pre-existing, were applied across all functional units in the processor in an effort to eliminate unnecessary power consumption. The mass adoption of these techniques resulted in a significant reduction in both maximum and typical processor power dissipation.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"214 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124249061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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