Pub Date : 2023-07-20DOI: 10.24425/mms.2021.135996
M. Marszalec, M. Lusawa, T. Osuch
In this paper a new method of frequency jumps detection in data from atomic clock comparisons is proposed. The presented approach is based on histogram analysis for different time intervals averaging phasetime data recorded over a certain period of time. Our method allows identification of multiple frequency jumps for long data series as well to almost real-time jump detection in combination with advanced filtering. Several methods of preliminary data processing have been tested (simple averaging, moving average and Vondrak filtration), to achieve flexibility in adjusting the algorithm parameters for current needs which is the key to its use in determining ensemble time scale or to control systems of physical time scales, such as UTC(PL). The best results have been achieved with the Vondrak filter.
{"title":"Efficient frequency jumps detection algorithm for atomic clock comparisons","authors":"M. Marszalec, M. Lusawa, T. Osuch","doi":"10.24425/mms.2021.135996","DOIUrl":"https://doi.org/10.24425/mms.2021.135996","url":null,"abstract":"In this paper a new method of frequency jumps detection in data from atomic clock comparisons is proposed. The presented approach is based on histogram analysis for different time intervals averaging phasetime data recorded over a certain period of time. Our method allows identification of multiple frequency jumps for long data series as well to almost real-time jump detection in combination with advanced filtering. Several methods of preliminary data processing have been tested (simple averaging, moving average and Vondrak filtration), to achieve flexibility in adjusting the algorithm parameters for current needs which is the key to its use in determining ensemble time scale or to control systems of physical time scales, such as UTC(PL). The best results have been achieved with the Vondrak filter.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49261881","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-20DOI: 10.24425/mms.2019.128357
A. Wójcik, Piotr Kościelniak, M. Mazur, T. Mathia
The paper provides statistical analysis of the photographs of four various granular materials (peas, pellets, triticale, wood chips). For analysis, the (parametric) ANOVA and the (nonparametric) Kruskal-Wallis tests were applied. Additionally, the (parametric) two-sample t-test and (non-parametric) Wilcoxon Rank-Sum Test for pairwise comparisons were performed. In each case, the Bonferroni correction was used. The analysis shows a statistical evidence of the presence of differences between the respective average discrete pixel intensity distributions (PID), induced by the histograms in each group of photos, which cannot be explained only by the existing differences among single granules of different materials. The proposed approach may contribute to the development of a fast inspection method for comparison and discrimination of granular materials differing from the reference material, in the production process.
{"title":"Morphological discrimination of granular materials by measurement of pixel intensity distribution (PID)","authors":"A. Wójcik, Piotr Kościelniak, M. Mazur, T. Mathia","doi":"10.24425/mms.2019.128357","DOIUrl":"https://doi.org/10.24425/mms.2019.128357","url":null,"abstract":"The paper provides statistical analysis of the photographs of four various granular materials (peas, pellets, triticale, wood chips). For analysis, the (parametric) ANOVA and the (nonparametric) Kruskal-Wallis tests were applied. Additionally, the (parametric) two-sample t-test and (non-parametric) Wilcoxon Rank-Sum Test for pairwise comparisons were performed. In each case, the Bonferroni correction was used. The analysis shows a statistical evidence of the presence of differences between the respective average discrete pixel intensity distributions (PID), induced by the histograms in each group of photos, which cannot be explained only by the existing differences among single granules of different materials. The proposed approach may contribute to the development of a fast inspection method for comparison and discrimination of granular materials differing from the reference material, in the production process.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42602476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-20DOI: 10.24425/mms.2022.140028
Luna Ngeljaratan, Mohamed A. Moustafa
This work proposes a systematic assessment of stereophotogrammetry and noise-floor tests to characterize and quantify the uncertainty and accuracy of a vision-based tracking system. Two stereophotogrammetry sets withdifferentconfigurations,i.e.,someimagesaredesignedandtheirsensitivityisquantifiedbasedonseveral assessments.Thefirstassessmentevaluatestheimagecoordinates,stereoangleandreconstructionerrors resultingfromthestereophotogrammetryprocedure,andthesecondassessmentexpressestheuncertainty fromthevarianceandbiaserrorsmeasuredfromthenoise-floortest.Thesetwoassessmentsquantifythe uncertainty,whiletheaccuracyofthevision-basedtrackingsystemisassessedfromthreequasi-static testsonasmall-scaledspecimen.Thedifferenceineachstereophotogrammetrysetandconfiguration,as indicatedbythestereophotogrammetryandnoise-floorassessment,leadstoasignificantresulthatthefirst stereophotogrammetrysetmeasurestheRMSEof3.6mmwhilethesecondsetidentifiesonly1.6mmof RMSE.Theresultsofthisworkrecommendacarefulandsystematicassessmentofstereophotogrammetry andnoise-floortestresultstoquantifytheuncertaintybeforetherealtesttoachieveahighdisplacement accuracyofthevision-basedtrackingsystem
{"title":"Uncertainty and accuracy of vision-based tracking concerning stereophotogrammetry and noise-floor tests","authors":"Luna Ngeljaratan, Mohamed A. Moustafa","doi":"10.24425/mms.2022.140028","DOIUrl":"https://doi.org/10.24425/mms.2022.140028","url":null,"abstract":"This work proposes a systematic assessment of stereophotogrammetry and noise-floor tests to characterize and quantify the uncertainty and accuracy of a vision-based tracking system. Two stereophotogrammetry sets withdifferentconfigurations,i.e.,someimagesaredesignedandtheirsensitivityisquantifiedbasedonseveral assessments.Thefirstassessmentevaluatestheimagecoordinates,stereoangleandreconstructionerrors resultingfromthestereophotogrammetryprocedure,andthesecondassessmentexpressestheuncertainty fromthevarianceandbiaserrorsmeasuredfromthenoise-floortest.Thesetwoassessmentsquantifythe uncertainty,whiletheaccuracyofthevision-basedtrackingsystemisassessedfromthreequasi-static testsonasmall-scaledspecimen.Thedifferenceineachstereophotogrammetrysetandconfiguration,as indicatedbythestereophotogrammetryandnoise-floorassessment,leadstoasignificantresulthatthefirst stereophotogrammetrysetmeasurestheRMSEof3.6mmwhilethesecondsetidentifiesonly1.6mmof RMSE.Theresultsofthisworkrecommendacarefulandsystematicassessmentofstereophotogrammetry andnoise-floortestresultstoquantifytheuncertaintybeforetherealtesttoachieveahighdisplacement accuracyofthevision-basedtrackingsystem","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47718674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-20DOI: 10.24425/mms.2020.132776
{"title":"Electrochemical sensors based on TiO2–Fe2O3 coupled system","authors":"","doi":"10.24425/mms.2020.132776","DOIUrl":"https://doi.org/10.24425/mms.2020.132776","url":null,"abstract":"","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48570023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-20DOI: 10.24425/mms.2021.135993
Nan Ren, Zaiming Fu, Shengcun Lei, Hanglin Liu, Shulin Tian
High-speed serial standards are rapidly developing, and with a requirement for effective compliance and characterization measurement methods. Jitter decomposition consists in troubleshooting steps based on jitter components from decomposition results. In order to verify algorithms with different deterministic jitter (DJ) in actual circuits, jitter generation model by cross-point calibration and timing modulation for jitter decomposition is presented in this paper. The generated jitter is pre-processed by cross-point calibration which improves the accuracy of jitter generation. Precisely controllable DJ and random jitter (RJ) are generated by timing modulation such as data-dependent jitter (DDJ), duty cycle distortion (DCD), bounded uncorrelated jitter (BUJ), and period jitter (PJ). The benefit of the cross-point calibration was verified by comparing generation of controllable jitter with and without cross-point calibration. The accuracy and advantage of the proposed method were demonstrated by comparing with the method of jitter generation by analog modulation. Then, the validity of the proposed method was demonstrated by hardware experiments where the jitter frequency had an accuracy of ± 20 ppm, the jitter amplitude ranged from 10 ps to 8.33 ns, a step of 2 ps or 10 ps, and jitter amplitude was independent of jitter frequency and data rate.
{"title":"Jitter generation model based on timing modulation and cross point calibration for jitter decomposition","authors":"Nan Ren, Zaiming Fu, Shengcun Lei, Hanglin Liu, Shulin Tian","doi":"10.24425/mms.2021.135993","DOIUrl":"https://doi.org/10.24425/mms.2021.135993","url":null,"abstract":"High-speed serial standards are rapidly developing, and with a requirement for effective compliance and characterization measurement methods. Jitter decomposition consists in troubleshooting steps based on jitter components from decomposition results. In order to verify algorithms with different deterministic jitter (DJ) in actual circuits, jitter generation model by cross-point calibration and timing modulation for jitter decomposition is presented in this paper. The generated jitter is pre-processed by cross-point calibration which improves the accuracy of jitter generation. Precisely controllable DJ and random jitter (RJ) are generated by timing modulation such as data-dependent jitter (DDJ), duty cycle distortion (DCD), bounded uncorrelated jitter (BUJ), and period jitter (PJ). The benefit of the cross-point calibration was verified by comparing generation of controllable jitter with and without cross-point calibration. The accuracy and advantage of the proposed method were demonstrated by comparing with the method of jitter generation by analog modulation. Then, the validity of the proposed method was demonstrated by hardware experiments where the jitter frequency had an accuracy of ± 20 ppm, the jitter amplitude ranged from 10 ps to 8.33 ns, a step of 2 ps or 10 ps, and jitter amplitude was independent of jitter frequency and data rate.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48907428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-20DOI: 10.24425/MMS.2020.131723
Weibin Zhu, Shengjin Ye, Yao Huang, Z. Xue
The contradiction between the restriction of grating manufacturing technology and high-resolution measurement requirements has been the focus of attention. The precision requirement of angle calculation during the digital subdivision processing of a Moiré signal is focused on, the causes of errors in the solution of arcsine function are analysed, and an improved coordinate rotation digital computer (CORDIC) with double-rotation iteration is proposed by discussing the principle of the conventional CORDIC in detail herein. Because the iterative number and data width of the improved CORDIC are limited by the finite digital circuit resources and thus determine the calculation accuracy directly, subsequently the overall quantization error (OQE) of the improved CORDIC is analysed. The approximate error and rounding error of the algorithm are deduced, and the error models of iterative number and data width are established. The validity and application value of the improved CORDIC are proved through simulations and experiments involving a subdividing circuit. The corresponding relation between the approximate error, rounding error and iteration number, as well as the bit width are proved by quantization. The error of subdivision with the improved CORDIC, obtained through a calibration experiment, is within ±0.5′′ and the mean variance is 0.2′′. The results of the research can be applied directly to a digital subdivision system to guide the parameter setting in the iterative process, which is of crucial importance in the quantitative analysis of error separation and error synthesis.
{"title":"An improved cordic for digital subdivision of Moiré signal","authors":"Weibin Zhu, Shengjin Ye, Yao Huang, Z. Xue","doi":"10.24425/MMS.2020.131723","DOIUrl":"https://doi.org/10.24425/MMS.2020.131723","url":null,"abstract":"The contradiction between the restriction of grating manufacturing technology and high-resolution measurement requirements has been the focus of attention. The precision requirement of angle calculation during the digital subdivision processing of a Moiré signal is focused on, the causes of errors in the solution of arcsine function are analysed, and an improved coordinate rotation digital computer (CORDIC) with double-rotation iteration is proposed by discussing the principle of the conventional CORDIC in detail herein. Because the iterative number and data width of the improved CORDIC are limited by the finite digital circuit resources and thus determine the calculation accuracy directly, subsequently the overall quantization error (OQE) of the improved CORDIC is analysed. The approximate error and rounding error of the algorithm are deduced, and the error models of iterative number and data width are established. The validity and application value of the improved CORDIC are proved through simulations and experiments involving a subdividing circuit. The corresponding relation between the approximate error, rounding error and iteration number, as well as the bit width are proved by quantization. The error of subdivision with the improved CORDIC, obtained through a calibration experiment, is within ±0.5′′ and the mean variance is 0.2′′. The results of the research can be applied directly to a digital subdivision system to guide the parameter setting in the iterative process, which is of crucial importance in the quantitative analysis of error separation and error synthesis.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46875697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-20DOI: 10.24425/MMS.2019.126337
L. Kish
The main points of the UPoN-2018 talk and some valuable comments from the Audience are briefly summarized. The talk surveyed the major issues with the notion of zero-point thermal noise in resistors and its visibility; moreover it gave some new arguments. The new arguments support the old view of Kleen that the known measurement data “showing” zero-point Johnson noise are instrumental artifacts caused by the energy-time uncertainty principle. We pointed out that, during the spectral analysis of blackbody radiation, another uncertainty principle is relevant, that is, the location-momentum uncertainty principle that causes only the widening of spectral lines instead of the zero-point noise artifact. This is the reason why the Planck formula is correctly confirmed by the blackbody radiation experiments. Finally a conjecture about the zero-point noise spectrum of wide-band amplifiers is shown, but that is yet to be tested experimentally.
{"title":"Zero-point thermal noise in resistors? A conclusion","authors":"L. Kish","doi":"10.24425/MMS.2019.126337","DOIUrl":"https://doi.org/10.24425/MMS.2019.126337","url":null,"abstract":"The main points of the UPoN-2018 talk and some valuable comments from the Audience are briefly summarized. The talk surveyed the major issues with the notion of zero-point thermal noise in resistors and its visibility; moreover it gave some new arguments. The new arguments support the old view of Kleen that the known measurement data “showing” zero-point Johnson noise are instrumental artifacts caused by the energy-time uncertainty principle. We pointed out that, during the spectral analysis of blackbody radiation, another uncertainty principle is relevant, that is, the location-momentum uncertainty principle that causes only the widening of spectral lines instead of the zero-point noise artifact. This is the reason why the Planck formula is correctly confirmed by the blackbody radiation experiments. Finally a conjecture about the zero-point noise spectrum of wide-band amplifiers is shown, but that is yet to be tested experimentally.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44762212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-20DOI: 10.24425/MMS.2019.128355
F. Witos, Z. Opilski, G. Szerszeń, M. Setkiewicz
A computer measurement system, designed and built by authors, dedicated to location and description of partial discharges (PD) in oil power transformers examined by means of the acoustic emission (AE) method is presented. The measurement system is equipped with 8 measurement channels and ensures: monitoring of signals, registration of data in real time within a band of 25–1000 kHz in laboratory and real conditions, basic and advanced analysis of recorded signals. The basic analysis carried out in the time, frequency and time-frequency domains deals with general properties of the AE signals coming from PDs. The advanced analysis, performed in the discrimination threshold domain, results in identification of signals coming from different acoustic sources as well as location of these sources in the examined transformers in terms of defined by authors descriptors and maps of these descriptors on the side walls of the tested transformer tank. Examples of typical results of laboratory tests carried out with the use of the built-in measurement system are presented.
{"title":"The 8AE-PD computer measurement system for registration and analysis of acoustic emission signals generated by partial discharges in oil power transformers","authors":"F. Witos, Z. Opilski, G. Szerszeń, M. Setkiewicz","doi":"10.24425/MMS.2019.128355","DOIUrl":"https://doi.org/10.24425/MMS.2019.128355","url":null,"abstract":"A computer measurement system, designed and built by authors, dedicated to location and description of partial discharges (PD) in oil power transformers examined by means of the acoustic emission (AE) method is presented. The measurement system is equipped with 8 measurement channels and ensures: monitoring of signals, registration of data in real time within a band of 25–1000 kHz in laboratory and real conditions, basic and advanced analysis of recorded signals. The basic analysis carried out in the time, frequency and time-frequency domains deals with general properties of the AE signals coming from PDs. The advanced analysis, performed in the discrimination threshold domain, results in identification of signals coming from different acoustic sources as well as location of these sources in the examined transformers in terms of defined by authors descriptors and maps of these descriptors on the side walls of the tested transformer tank. Examples of typical results of laboratory tests carried out with the use of the built-in measurement system are presented.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46274336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-20DOI: 10.24425/mms.2021.136612
D. Su, Wanhua Zhao
When machine tool spindles are running at a high rotation speed, thermal deformation will be introduced due to the generation of large amounts of heat, and machining accuracy will be influenced as a result, which is a generalized issue in numerous industries. In this paper, a new approach based on machine vision is presented for measurements of spindle thermal error. The measuring system is composed of a Complementary Metal-Oxide-Semiconductor (CMOS) camera, a backlight source and a PC. Images are captured at different rotation angles during end milling process. Meanwhile, the Canny edge detection and Gaussian sub-pixel fitting methods are applied to obtain the bottom edge of the end mill which is then used to calculate the lowest point coordinate of the tool. Finally, thermal extension of the spindle is obtained according to the change of the lowest point at different time steps of the machining process. This method is validated through comparison with experimental results from capacitive displacement sensors. Moreover, spindle thermal extension during the processing can be precisely measured and used for compensation in order to improve machining accuracy through the proposed method.
{"title":"New approach to spindle thermal extension measuring based on machine vision for the vertical maching centre","authors":"D. Su, Wanhua Zhao","doi":"10.24425/mms.2021.136612","DOIUrl":"https://doi.org/10.24425/mms.2021.136612","url":null,"abstract":"When machine tool spindles are running at a high rotation speed, thermal deformation will be introduced due to the generation of large amounts of heat, and machining accuracy will be influenced as a result, which is a generalized issue in numerous industries. In this paper, a new approach based on machine vision is presented for measurements of spindle thermal error. The measuring system is composed of a Complementary Metal-Oxide-Semiconductor (CMOS) camera, a backlight source and a PC. Images are captured at different rotation angles during end milling process. Meanwhile, the Canny edge detection and Gaussian sub-pixel fitting methods are applied to obtain the bottom edge of the end mill which is then used to calculate the lowest point coordinate of the tool. Finally, thermal extension of the spindle is obtained according to the change of the lowest point at different time steps of the machining process. This method is validated through comparison with experimental results from capacitive displacement sensors. Moreover, spindle thermal extension during the processing can be precisely measured and used for compensation in order to improve machining accuracy through the proposed method.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46380485","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Finding an acceptable compromise between various objectives is a necessity in the design of contemporary microwave components and circuits. A primary reason is that most objectives are at least partially conflicting. For compact microwave structures, the design trade-offs are normally related to the circuit size and its electrical performance. In order to obtain comprehensive information about the best possible tradeoffs, multi-objective optimization is necessary that leads to identifying a Pareto set. Here, a framework for fast multi-objective design of compact micro-strip couplers is discussed. We use a sequential domain patching (SDP) algorithm for numerically efficient handling of the structure bandwidth and the footprint area. Low cost of the process is ensured by executing SDP at the low-fidelity model level. Due to its biobjective implementation, SDP cannot control the power split error of the coupler, the value of which may become unacceptably high along the initial Pareto set. Here, we propose a procedure for correction of the S-parameters’ characteristics of Pareto designs. The method exploits gradients of power split and bandwidth estimated using finite differentiation at the patch centres. The gradient data are used to correct the power split ratio while leaving the operational bandwidth of the structure at hand intact. The correction does not affect the computational cost of the design process because perturbations are pre-generated by SDP. The final Pareto set is obtained upon refining the corrected designs to the high-fidelity EM model level. The proposed technique is demonstrated using two compact microstrip rat-race couplers. Experimental validation is also provided.
{"title":"COMPUTATIONALLY EFFICIENT TWO-OBJECTIVE OPTIMIZATION OF COMPACT MICROWAVE COUPLERS THROUGH CORRECTED DOMAIN PATCHING","authors":"S. Koziel, A. Bekasiewicz","doi":"10.24425/118166","DOIUrl":"https://doi.org/10.24425/118166","url":null,"abstract":"Finding an acceptable compromise between various objectives is a necessity in the design of contemporary microwave components and circuits. A primary reason is that most objectives are at least partially conflicting. For compact microwave structures, the design trade-offs are normally related to the circuit size and its electrical performance. In order to obtain comprehensive information about the best possible tradeoffs, multi-objective optimization is necessary that leads to identifying a Pareto set. Here, a framework for fast multi-objective design of compact micro-strip couplers is discussed. We use a sequential domain patching (SDP) algorithm for numerically efficient handling of the structure bandwidth and the footprint area. Low cost of the process is ensured by executing SDP at the low-fidelity model level. Due to its biobjective implementation, SDP cannot control the power split error of the coupler, the value of which may become unacceptably high along the initial Pareto set. Here, we propose a procedure for correction of the S-parameters’ characteristics of Pareto designs. The method exploits gradients of power split and bandwidth estimated using finite differentiation at the patch centres. The gradient data are used to correct the power split ratio while leaving the operational bandwidth of the structure at hand intact. The correction does not affect the computational cost of the design process because perturbations are pre-generated by SDP. The final Pareto set is obtained upon refining the corrected designs to the high-fidelity EM model level. The proposed technique is demonstrated using two compact microstrip rat-race couplers. Experimental validation is also provided.","PeriodicalId":18394,"journal":{"name":"Metrology and Measurement Systems","volume":" ","pages":""},"PeriodicalIF":1.0,"publicationDate":"2023-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42817615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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