A revision of a theoretical mechanism proposed last year based upon the known chemical and physical interactions of laser radiation, fused silica, aromatic molecules and environmental factors will be presented, as relates to other proposed mechanisms. This paper specifically addresses the interaction of toluene with 1064nm laser radiation as related to the formation of benzyl radical, and to free radical photochemistry of toluene. This will address specifically, the effects of oxygen and water in the system, the effects of hydroxyl radical in the system, the interpretation of the XPS spectra of laser damaged silica in the presence and absence of aromatic hydrocarbons and the relationship of these points to the photochemistry of silica.
{"title":"Revisiting mechanisms of molecular contamination induced laser optic damage","authors":"J. Canham","doi":"10.1117/12.753588","DOIUrl":"https://doi.org/10.1117/12.753588","url":null,"abstract":"A revision of a theoretical mechanism proposed last year based upon the known chemical and physical interactions of laser radiation, fused silica, aromatic molecules and environmental factors will be presented, as relates to other proposed mechanisms. This paper specifically addresses the interaction of toluene with 1064nm laser radiation as related to the formation of benzyl radical, and to free radical photochemistry of toluene. This will address specifically, the effects of oxygen and water in the system, the effects of hydroxyl radical in the system, the interpretation of the XPS spectra of laser damaged silica in the presence and absence of aromatic hydrocarbons and the relationship of these points to the photochemistry of silica.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129989377","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Maunier, B. Bertussi, D. Damiani, T. Donval, G. Duchateau, A. Dyan, G. Gaborit, L. Lamaignère, X. Leborgne, M. Loiseau, H. Mathis, G. Razé
In this paper, we present various laser conditioning experiments which have been performed with KDP SHG and DKDP THG samples. The different conditioning facilities used delivered laser pulses at 351 nm in the nanosecond (from 3 to 12 ns) or in the sub-ns (600 ps) regime. Finally, the efficiency of the various conditioning protocols was compared: 526 nm-6 ns and 351 nm-3 ns damage tests were performed respectively on SHG and THG samples. The results show that laser-conditioning SHG KDP samples at 351 nm either with ns or sub-ns pulses allows reducing the laser damage density so that it becomes consistent with the specification of high power lasers. They also confirm that conditioning THG DKDP samples at 351 nm using sub-ns pulses is more efficient than using ns pulses.
{"title":"Comparison of ns and sub-ns laser conditioning of KDP and DKDP crystals for high power lasers","authors":"C. Maunier, B. Bertussi, D. Damiani, T. Donval, G. Duchateau, A. Dyan, G. Gaborit, L. Lamaignère, X. Leborgne, M. Loiseau, H. Mathis, G. Razé","doi":"10.1117/12.752826","DOIUrl":"https://doi.org/10.1117/12.752826","url":null,"abstract":"In this paper, we present various laser conditioning experiments which have been performed with KDP SHG and DKDP THG samples. The different conditioning facilities used delivered laser pulses at 351 nm in the nanosecond (from 3 to 12 ns) or in the sub-ns (600 ps) regime. Finally, the efficiency of the various conditioning protocols was compared: 526 nm-6 ns and 351 nm-3 ns damage tests were performed respectively on SHG and THG samples. The results show that laser-conditioning SHG KDP samples at 351 nm either with ns or sub-ns pulses allows reducing the laser damage density so that it becomes consistent with the specification of high power lasers. They also confirm that conditioning THG DKDP samples at 351 nm using sub-ns pulses is more efficient than using ns pulses.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127772908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Exponential-decay based cavity ring-down (CRD) techniques, such as the pulsed-CRD and continuous-wave (cw) CRD employing a fast switch to shut down the laser beam, are widely used for high reflectivity measurement. In this paper the influence of the response time of the experimental apparatus on the high reflectivity measurement is investigated theoretically and experimentally. Theoretical expressions taking into account the instrumental response time are given for both pulsed- and cw-CRD techniques, respectively. By establishing a simple cw-CRD setup employing detectors with different response time, the influence of the instrumental response time on the high reflectivity measurement is experimentally investigated. By applying a multi-parameter estimation technique to determine simultaneously the cavity decay time and the overall response time of the experimental apparatus via fitting the experimental CRD signal to the corresponding theoretical model, the influence of a long instrumental response time on the reflectivity determination is eliminated. The reflectivities of the cavity mirror measured with detectors with different rise time are in excellent agreement. On the other hand, the error of high reflectivity measurement increases with the increasing rise/fall time of the apparatus in cases that the CRD signals obtained by detectors with relatively slow rise time are simply treated with a single exponential decay fitting procedure.
{"title":"Effect of instrumental response time in exponential-decay-based cavity ring-down techniques for high reflectivity measurement","authors":"Yuan Gong, Bincheng Li","doi":"10.1117/12.758948","DOIUrl":"https://doi.org/10.1117/12.758948","url":null,"abstract":"Exponential-decay based cavity ring-down (CRD) techniques, such as the pulsed-CRD and continuous-wave (cw) CRD employing a fast switch to shut down the laser beam, are widely used for high reflectivity measurement. In this paper the influence of the response time of the experimental apparatus on the high reflectivity measurement is investigated theoretically and experimentally. Theoretical expressions taking into account the instrumental response time are given for both pulsed- and cw-CRD techniques, respectively. By establishing a simple cw-CRD setup employing detectors with different response time, the influence of the instrumental response time on the high reflectivity measurement is experimentally investigated. By applying a multi-parameter estimation technique to determine simultaneously the cavity decay time and the overall response time of the experimental apparatus via fitting the experimental CRD signal to the corresponding theoretical model, the influence of a long instrumental response time on the reflectivity determination is eliminated. The reflectivities of the cavity mirror measured with detectors with different rise time are in excellent agreement. On the other hand, the error of high reflectivity measurement increases with the increasing rise/fall time of the apparatus in cases that the CRD signals obtained by detectors with relatively slow rise time are simply treated with a single exponential decay fitting procedure.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"121 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115704901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A simple and sensitive photothermal technique-photothermal detuning (PTDT), which is based on the absorption-induced shift of reflectance or transmission spectrum of an optical coating, is developed to measure the absorption of coated optical components. A PTDT theory is developed to describe the signal's dependence on the structural parameters of the optical coatings and on the geometric parameters of the experimental configuration. An experiment is performed to measure the PTDT signal of a highly reflective multilayer coating used in 532nm by using a probe beam with a wavelength of 632.8nm. By optimizing the incident angle of the probe beam, the measurement sensitivity is maximized. Good agreements between the theoretical predictions and experimental results are obtained.
{"title":"Photothermal detuning: a sensitive technique for absorption measurement of optical thin films","authors":"H. Hao, Bincheng Li, Mingqiang Liu, Yuan Gong","doi":"10.1117/12.758949","DOIUrl":"https://doi.org/10.1117/12.758949","url":null,"abstract":"A simple and sensitive photothermal technique-photothermal detuning (PTDT), which is based on the absorption-induced shift of reflectance or transmission spectrum of an optical coating, is developed to measure the absorption of coated optical components. A PTDT theory is developed to describe the signal's dependence on the structural parameters of the optical coatings and on the geometric parameters of the experimental configuration. An experiment is performed to measure the PTDT signal of a highly reflective multilayer coating used in 532nm by using a probe beam with a wavelength of 632.8nm. By optimizing the incident angle of the probe beam, the measurement sensitivity is maximized. Good agreements between the theoretical predictions and experimental results are obtained.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114607058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Previous work concluded that plasma scalds on laser-conditioned multilayer dielectric mirror coatings are a stable, benign damage morphology. Recent large-aperture measurements indicate that plasma scalds may lead to fratricide of down-stream optics by increasing beam contrast. This paper describes the results of measurements performed to examine the effect of quasi-periodic plasma scalds covering the entire clear aperture on downstream beam modulation. A collimated, linearly-polarized 1053-nm beamline was constructed that irradiated approximately 5 cm2 of the plasma scalded region. This beam was propagated ~8 meters and sampled with a 10-bit, megapixel CCD camera and analyzed for contrast (peak/average intensity). A lineout across the sample was built up by translating the optic across the beam. The contrast results were compared to a baseline wedged flat with surface figure of λ/100 and a contrast adder for the plasma scalds calculated. This was defined by. In all, optics with average plasma scald fractions of 0.9, 2.3, 4 and 14% were measured. Preliminary results indicate that plasma scald fractions of 4% and below contribute a contrast adder of less than 2.5%.
{"title":"Scattering-induced downstream beam modulation by plasma scalded mirrors","authors":"J. Schmidt, M. Runkel, K. E. Martin, C. Stolz","doi":"10.1117/12.748446","DOIUrl":"https://doi.org/10.1117/12.748446","url":null,"abstract":"Previous work concluded that plasma scalds on laser-conditioned multilayer dielectric mirror coatings are a stable, benign damage morphology. Recent large-aperture measurements indicate that plasma scalds may lead to fratricide of down-stream optics by increasing beam contrast. This paper describes the results of measurements performed to examine the effect of quasi-periodic plasma scalds covering the entire clear aperture on downstream beam modulation. A collimated, linearly-polarized 1053-nm beamline was constructed that irradiated approximately 5 cm2 of the plasma scalded region. This beam was propagated ~8 meters and sampled with a 10-bit, megapixel CCD camera and analyzed for contrast (peak/average intensity). A lineout across the sample was built up by translating the optic across the beam. The contrast results were compared to a baseline wedged flat with surface figure of λ/100 and a contrast adder for the plasma scalds calculated. This was defined by. In all, optics with average plasma scald fractions of 0.9, 2.3, 4 and 14% were measured. Preliminary results indicate that plasma scald fractions of 4% and below contribute a contrast adder of less than 2.5%.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124729922","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Melninkaitis, D. Mikšys, R. Grigonis, V. Sirutkaitis, M. Jupé, D. Ristau
S-on-1 laser-induced damage threshold (LIDT) dependence on the pulse duration at two different wavelengths was experimentally investigated in metallic and dielectric laser mirrors. LIDT's of high-reflective dielectric coatings made of alternating λ/4 layers of TiO2/SiO2 and Ta2O5/SiO2 and those of protected metallic Au and Ag coatings were tested at 800 nm and 400 nm wavelengths with Ti:Sapphire laser pulses of 46 fs, 130 fs and 1.8 ps duration. S-on-1 measurements were performed according to international ISO 11254-2 standard using 10000 pulses/per site and compared with 1-on-1 measurements.
{"title":"Comparative studies of laser-induced damage threshold measurements in highly reflecting mirrors","authors":"A. Melninkaitis, D. Mikšys, R. Grigonis, V. Sirutkaitis, M. Jupé, D. Ristau","doi":"10.1117/12.753705","DOIUrl":"https://doi.org/10.1117/12.753705","url":null,"abstract":"S-on-1 laser-induced damage threshold (LIDT) dependence on the pulse duration at two different wavelengths was experimentally investigated in metallic and dielectric laser mirrors. LIDT's of high-reflective dielectric coatings made of alternating λ/4 layers of TiO2/SiO2 and Ta2O5/SiO2 and those of protected metallic Au and Ag coatings were tested at 800 nm and 400 nm wavelengths with Ti:Sapphire laser pulses of 46 fs, 130 fs and 1.8 ps duration. S-on-1 measurements were performed according to international ISO 11254-2 standard using 10000 pulses/per site and compared with 1-on-1 measurements.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116605272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Previous ultraviolet-pulsed, laser-damage studies using model thin films with gold nanoparticles as artificial absorbing defects revealed damage morphology in a form of submicrometer-scaled craters. It was also demonstrated that for defects smaller than 20 nm, crater formation is preceded by plasma-ball formation around absorbing defects. In this work an attempt is made to verify symmetry of the plasma ball by conducting film irradiation from the side of the air/film or substrate/film interfaces. In each case, crater-formation thresholds are derived and crater morphology is analyzed by means of atomic force microscopy.
{"title":"Damage thresholds and morphology of the front- and back-irradiated SiO2 thin films containing gold nanoparticles as artificial absorbing defects","authors":"S. Papernov, A. Schmid, J. Oliver, A. Rigatti","doi":"10.1117/12.752616","DOIUrl":"https://doi.org/10.1117/12.752616","url":null,"abstract":"Previous ultraviolet-pulsed, laser-damage studies using model thin films with gold nanoparticles as artificial absorbing defects revealed damage morphology in a form of submicrometer-scaled craters. It was also demonstrated that for defects smaller than 20 nm, crater formation is preceded by plasma-ball formation around absorbing defects. In this work an attempt is made to verify symmetry of the plasma ball by conducting film irradiation from the side of the air/film or substrate/film interfaces. In each case, crater-formation thresholds are derived and crater morphology is analyzed by means of atomic force microscopy.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"6720 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129908770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Guss, I. Bass, R. Hackel, C. Mailhiot, S. Demos
In this work, we present the first successful demonstration of a non-contact technique to precisely measure the 3D spatial characteristics of laser induced surface damage sites in fused silica for large aperture laser systems by employing Optical Coherence Tomography (OCT). What makes OCT particularly interesting in the characterization of optical materials for large aperture laser systems is that its axial resolution can be maintained with working distances greater than 5 cm, whether viewing through air or through the bulk of thick optics. Specifically, when mitigating surface damage sites against further growth by CO2 laser evaporation of the damage, it is important to know the depth of subsurface cracks below the damage site. These cracks are typically obscured by the damage rubble when imaged from above the surface. The results to date clearly demonstrate that OCT is a unique and valuable tool for characterizing damage sites before and after the mitigation process. We also demonstrated its utility as an in-situ diagnostic to guide and optimize our process when mitigating surface damage sites on large, high-value optics.
{"title":"High-resolution 3D imaging of surface damage sites in fused silica with optical coherence tomography","authors":"G. Guss, I. Bass, R. Hackel, C. Mailhiot, S. Demos","doi":"10.1117/12.748452","DOIUrl":"https://doi.org/10.1117/12.748452","url":null,"abstract":"In this work, we present the first successful demonstration of a non-contact technique to precisely measure the 3D spatial characteristics of laser induced surface damage sites in fused silica for large aperture laser systems by employing Optical Coherence Tomography (OCT). What makes OCT particularly interesting in the characterization of optical materials for large aperture laser systems is that its axial resolution can be maintained with working distances greater than 5 cm, whether viewing through air or through the bulk of thick optics. Specifically, when mitigating surface damage sites against further growth by CO2 laser evaporation of the damage, it is important to know the depth of subsurface cracks below the damage site. These cracks are typically obscured by the damage rubble when imaged from above the surface. The results to date clearly demonstrate that OCT is a unique and valuable tool for characterizing damage sites before and after the mitigation process. We also demonstrated its utility as an in-situ diagnostic to guide and optimize our process when mitigating surface damage sites on large, high-value optics.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131056032","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Microstructures built into the surfaces of an optic or window, are an effective replacement for thin-film coatings in anti-reflection (AR) and narrow-band filter applications. AR microstructures exhibit particularly noteworthy performance where an average reflection loss of less than 0.2% over a four-octave range (400-1800nm) has been demonstrated, and a loss of less than 0.03% is routinely achieved for narrow-band applications. Because AR micro-textures provide a gradual change in the refractive index at a material boundary, it is expected that light can propagate through the boundary without material damage at energy levels that are much higher than that found with thin-film interference coatings. Recently, it was shown that the laser induced damage threshold (LIDT) of an inexpensive borosilicate glass window containing AR microstructures was nearly 57 J/cm2 at 1064nm (20ns pulse). This LIDT is two to three times greater than the damage threshold of single-layer sol-gel AR coatings on fused silica often reported in the literature. The development of surface relief AR textures for use in high-energy laser applications is presented. Data from scanning electron microscope (SEM) analysis, reflection measurements, and LIDT testing, is shown for high performance AR microstructures fabricated in fused silica, and borosilicate glass. Results of LIDT testing at wavelengths ranging from the near ultraviolet through the near infrared confirm the initial result that AR microstructures can operate at pulsed laser power levels at least two times higher than thin-film coatings. For near infrared applications such as laser weapons and fiber optic communications requiring high performance AR, LIDT levels for AR microstructures in fused silica are found to be at least five times greater than conventional multi-layer thin film coatings. An initial surface absorption test at 1064nm shows that AR microstructures may also exhibit improved lifetimes within continuous wave laser systems.
{"title":"High laser damage threshold surface relief micro-structures for anti-reflection applications","authors":"D. S. Hobbs, B. MacLeod","doi":"10.1117/12.754223","DOIUrl":"https://doi.org/10.1117/12.754223","url":null,"abstract":"Microstructures built into the surfaces of an optic or window, are an effective replacement for thin-film coatings in anti-reflection (AR) and narrow-band filter applications. AR microstructures exhibit particularly noteworthy performance where an average reflection loss of less than 0.2% over a four-octave range (400-1800nm) has been demonstrated, and a loss of less than 0.03% is routinely achieved for narrow-band applications. Because AR micro-textures provide a gradual change in the refractive index at a material boundary, it is expected that light can propagate through the boundary without material damage at energy levels that are much higher than that found with thin-film interference coatings. Recently, it was shown that the laser induced damage threshold (LIDT) of an inexpensive borosilicate glass window containing AR microstructures was nearly 57 J/cm2 at 1064nm (20ns pulse). This LIDT is two to three times greater than the damage threshold of single-layer sol-gel AR coatings on fused silica often reported in the literature. The development of surface relief AR textures for use in high-energy laser applications is presented. Data from scanning electron microscope (SEM) analysis, reflection measurements, and LIDT testing, is shown for high performance AR microstructures fabricated in fused silica, and borosilicate glass. Results of LIDT testing at wavelengths ranging from the near ultraviolet through the near infrared confirm the initial result that AR microstructures can operate at pulsed laser power levels at least two times higher than thin-film coatings. For near infrared applications such as laser weapons and fiber optic communications requiring high performance AR, LIDT levels for AR microstructures in fused silica are found to be at least five times greater than conventional multi-layer thin film coatings. An initial surface absorption test at 1064nm shows that AR microstructures may also exhibit improved lifetimes within continuous wave laser systems.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"72 S1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113968596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Norton, J. Adams, C. Carr, Eugene E. Donohue, M. Feit, R. Hackel, W. G. Hollingsworth, J. Jarboe, M. Matthews, A. Rubenchik, M. Spaeth
Growth of laser initiated damage plays a major role in determining optics lifetime in high power laser systems. Previous measurements have established that the lateral diameter grows exponentially. Knowledge of the growth of the site in the propagation direction is also important, especially so when considering techniques designed to mitigate damage growth, where it is required to reach all the subsurface damage. In this work, we present data on both the diameter and the depth of a growing exit surface damage sites in fused silica. Measured growth rates with both 351 nm illumination and with combined 351 nm and 1054 nm illumination are discussed.
{"title":"Growth of laser damage in fused silica: diameter to depth ratio","authors":"M. Norton, J. Adams, C. Carr, Eugene E. Donohue, M. Feit, R. Hackel, W. G. Hollingsworth, J. Jarboe, M. Matthews, A. Rubenchik, M. Spaeth","doi":"10.1117/12.748441","DOIUrl":"https://doi.org/10.1117/12.748441","url":null,"abstract":"Growth of laser initiated damage plays a major role in determining optics lifetime in high power laser systems. Previous measurements have established that the lateral diameter grows exponentially. Knowledge of the growth of the site in the propagation direction is also important, especially so when considering techniques designed to mitigate damage growth, where it is required to reach all the subsurface damage. In this work, we present data on both the diameter and the depth of a growing exit surface damage sites in fused silica. Measured growth rates with both 351 nm illumination and with combined 351 nm and 1054 nm illumination are discussed.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133656894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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