Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671171
C. W. Small, M. C. McGregor, R. Lee
Gas-dielectric capacitors of 5pF and 10pF have been developed for use as standards in NML and KSRI. They are stable with time, have small temperature and voltage coefficients, and have been used successfully as travelling standards.
{"title":"Stable gas-dielectric capacitors of 5pF and 10pF","authors":"C. W. Small, M. C. McGregor, R. Lee","doi":"10.1109/CPEM.1988.671171","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671171","url":null,"abstract":"Gas-dielectric capacitors of 5pF and 10pF have been developed for use as standards in NML and KSRI. They are stable with time, have small temperature and voltage coefficients, and have been used successfully as travelling standards.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115719635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671235
Zhu Xun-Zhi, Qu Jin
{"title":"The EMF-Temperature Formula of the Unsaturated Cadmium Sulfate Standard Cell from 0 to 50/spl deg/C","authors":"Zhu Xun-Zhi, Qu Jin","doi":"10.1109/CPEM.1988.671235","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671235","url":null,"abstract":"","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127421625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671302
C. Akyel, R. Bosisio
A microwave system using close-loop technics measures simultaneously the weight and the complex dielectric constant of sample materials heated by strong electric RF fields inside a resonant cavity. The uses of a micro-computer permits to relate, in real time, the moisture content of sample materials exposed to RF fields to the dynamic changes observed in the complex dielectric constant at the test frequency [1].
{"title":"Micro-Computer Controlled Moisture/Permittivity Measurements in Microwave Frequencies","authors":"C. Akyel, R. Bosisio","doi":"10.1109/CPEM.1988.671302","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671302","url":null,"abstract":"A microwave system using close-loop technics measures simultaneously the weight and the complex dielectric constant of sample materials heated by strong electric RF fields inside a resonant cavity. The uses of a micro-computer permits to relate, in real time, the moisture content of sample materials exposed to RF fields to the dynamic changes observed in the complex dielectric constant at the test frequency [1].","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121883302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671344
M. Taniguchi, M. Oki, T. Takagi
The HPMS is a technique developed by the authors which can measure the vibration or deformation of any object by means of the holographic interferogram analysis. This technique was applied to the microscopic displacement of an electric contact spring which was thermally deformed due to contact current. A deformed contact spring shape was obtained with an accuracy of 0.16/spl mu/m, and it was proved that the HPMS was a very good technique for measuring a microscopic movement of the object such as a fretting phenomenon in electric contacts.
{"title":"A Holographic Pattern Measuring System (HPMS) and Its Application to the Thermal Deformation of an Electrical Contact Spring","authors":"M. Taniguchi, M. Oki, T. Takagi","doi":"10.1109/CPEM.1988.671344","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671344","url":null,"abstract":"The HPMS is a technique developed by the authors which can measure the vibration or deformation of any object by means of the holographic interferogram analysis. This technique was applied to the microscopic displacement of an electric contact spring which was thermally deformed due to contact current. A deformed contact spring shape was obtained with an accuracy of 0.16/spl mu/m, and it was proved that the HPMS was a very good technique for measuring a microscopic movement of the object such as a fretting phenomenon in electric contacts.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121898931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671256
T. Masui, M. Morimura
An objective algorithm for the least-squares adjustment is proposed. Modification is applied to a limited number of given items in a generalized way. Exclusion is applied successively to a single item when the result of modificatioin is anomalous. Final result is a median value of modification.
{"title":"An Algorithm for the Least-Squares Adjustment Based on Classification and Generalization","authors":"T. Masui, M. Morimura","doi":"10.1109/CPEM.1988.671256","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671256","url":null,"abstract":"An objective algorithm for the least-squares adjustment is proposed. Modification is applied to a limited number of given items in a generalized way. Exclusion is applied successively to a single item when the result of modificatioin is anomalous. Final result is a median value of modification.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121954352","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671308
K. Shida, T. Wada, H. Nishinaka, K. Segawa, T. Igarashi
SI value of quantized Hall resistanee based on ETL's calculable capacitor is presented. Some improvements of previous measurement systems were prooeeded and some parts of the measurement techniques were changed. The measurements are now in progress. We will present more reliable results than the previous one in CPEM'88.
{"title":"SI Value of Qunatized Hall Resistance Based on ETL's Calculable Capacitor","authors":"K. Shida, T. Wada, H. Nishinaka, K. Segawa, T. Igarashi","doi":"10.1109/CPEM.1988.671308","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671308","url":null,"abstract":"SI value of quantized Hall resistanee based on ETL's calculable capacitor is presented. Some improvements of previous measurement systems were prooeeded and some parts of the measurement techniques were changed. The measurements are now in progress. We will present more reliable results than the previous one in CPEM'88.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121544212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671260
T. Kurihara, A. Kitai, M. Iwadate, M. Uehara
We have developed the synthesizer, YIG Tuned Oscillator (YTO), capable of setting the frequency of the microwave bands from 100 KHz to 4.5 GHz accurately using 0.1 Hz resolution and having superior spectrum purity where the SSB phase noise in 4 GHz output frequency is -129 [dBc/Hz] (10 KHz from the carrier).
{"title":"Low Phase Noise YTO Synthesizer","authors":"T. Kurihara, A. Kitai, M. Iwadate, M. Uehara","doi":"10.1109/CPEM.1988.671260","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671260","url":null,"abstract":"We have developed the synthesizer, YIG Tuned Oscillator (YTO), capable of setting the frequency of the microwave bands from 100 KHz to 4.5 GHz accurately using 0.1 Hz resolution and having superior spectrum purity where the SSB phase noise in 4 GHz output frequency is -129 [dBc/Hz] (10 KHz from the carrier).","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121781573","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671347
Y. Sato, T. Suzuki, K. Mizuno
{"title":"Quasi-Optically Coupled Harmonic Mixer in the Submillimeter Wave Region","authors":"Y. Sato, T. Suzuki, K. Mizuno","doi":"10.1109/CPEM.1988.671347","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671347","url":null,"abstract":"","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125005955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671163
M. Taguchi, S. Egashira, M. Tamari, K. Tanaka
In the measurement of current distribution on a planar conductor or antenna with a small shielded loop, the electromotive force induced on the loop is theoretically formulated and the relation between current distribution and measured values is investigated. As an experimental example a square patch microstrip antenna is given.
{"title":"Measurement of high-frequency current distribution on a planar conductor","authors":"M. Taguchi, S. Egashira, M. Tamari, K. Tanaka","doi":"10.1109/CPEM.1988.671163","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671163","url":null,"abstract":"In the measurement of current distribution on a planar conductor or antenna with a small shielded loop, the electromotive force induced on the loop is theoretically formulated and the relation between current distribution and measured values is investigated. As an experimental example a square patch microstrip antenna is given.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"221 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123285184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-06-07DOI: 10.1109/CPEM.1988.671289
H. Tanaka, F. Okada
A precise method for separating the dissipation factor associated with both dielectric losses and conductor losses of printed circuit boards through wide range of microwave frequencies is presented. This method accomplishes the separation by utilizing the difference in dependence of the two losses on the dimensions in triplate-line resonators composed of printed circuit boards.
{"title":"Precise Measurements of Dissipation Factor in Microwave Printed Boards","authors":"H. Tanaka, F. Okada","doi":"10.1109/CPEM.1988.671289","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671289","url":null,"abstract":"A precise method for separating the dissipation factor associated with both dielectric losses and conductor losses of printed circuit boards through wide range of microwave frequencies is presented. This method accomplishes the separation by utilizing the difference in dependence of the two losses on the dimensions in triplate-line resonators composed of printed circuit boards.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131306163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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