Pub Date : 2020-12-07DOI: 10.1109/OJNANO.2020.3042804
Hyangwoo Kim;Hyeonsu Cho;Byoung Don Kong;Jin-Woo Kim;Meyya Meyyappan;Chang-Ki Baek
Two-terminal (2-T) thyristor random access memory (TRAM) based on nanoscale cross-point vertical array is investigated in terms of lengths and doping concentrations of storage regions for long data retention time (Tret). For high device scalability and low program voltage (VP), lengths of the storage regions are determined by the sum of depletion widths of N- and P-storage regions. When doping concentrations of two storage regions are equal to each other at 10 18